This application claims the benefit of Republic of Korea Patent Application No. 10-2022-0168717, filed on Dec. 6, 2022, which is hereby incorporated by reference in its entirety.
The present disclose relates to a display device and a method of driving the same.
With the development of information technology, the market for display devices that are media for connection between users and information is growing. Accordingly, display devices such as an LED, a quantum dot display (QDD), and a liquid crystal display (LCD) have been increasingly used.
The above display devices each include a display panel including sub-pixels, a driver which outputs a driving signal for driving of the display panel, and a power supply which generates power to be supplied to the display panel or the driver.
In such a display device, when sub-pixels formed in a display panel are supplied with driving signals, for example, a scan signal and a data signal, a selected one thereof may transmit light therethrough or may directly emit light, thereby displaying an image.
Accordingly, the present disclosure is directed to a display device and a method of driving the same that substantially obviate one or more problems due to limitations and disadvantages of the related art.
An object of the present invention is to perform offset correction of an analog-to-digital converter included in each of sensing circuit units based on a circuit used for actual sensing without using a separate voltage or a separate dummy circuit, thereby improving compensation accuracy when compared to the case of using the dummy circuit.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention. The objectives and other advantages of the invention may be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
To achieve these objects and other advantages and in accordance with the purpose of the invention, as embodied and broadly described herein, in one embodiment a a display device includes a display panel including a sub-pixel connected to a data line and a reference line, and a data driver including a panel driving circuit and a panel sensing circuit, the panel driving circuit configured to supply a data voltage to the display panel through the data line, and the panel sensing circuit including an analog-to-digital converter (ADC) and the panel sensing circuit configured to sense the display panel through the reference line, wherein during a first sensing operation of the ADC, the panel sensing circuit is configured to supply a first reference voltage to the display panel through the reference line and convert a voltage that is sensed through the reference line in response to the first reference voltage into a digital signal using the analog-to-digital converter without the panel driving circuit supplying the data voltage during the first sensing operation, and wherein during a second sensing operation of an element included in the sub-pixel, the panel sensing circuit supplies a second reference voltage to the display panel through the reference line and the panel driving circuit supplies the data voltage to the display panel through the data lineoffset correction.
In one embodiment, a method of driving a display device including a display panel comprising a sub-pixel connected to a data line and a reference line, and a data driver including a panel driving circuit and a panel sensing circuit, the panel driving circuit configured to supply a data voltage to the display panel through the data line, and the panel sensing circuit including an analog-to-digital converter (ADC) and the panel sensing circuit configured to sense the display panel through the reference line, the method comprises: turning on the display panel and displaying an image while the display panel is on; turning off the display panel; during a first sensing operation of the ADC while the display panel is off, supplying, by the panel sensing circuit, a first reference voltage to the display panel through the reference line and converting a voltage that is sensed through the reference line in response to the first reference voltage into a digital signal using the analog-to-digital converter without the panel driving circuit supplying the data voltage during the first sensing operation; and during a second sensing operation of an element included in the sub-pixel while the display panel is off, supplying, by the panel sensing circuit, a second reference voltage to the display panel through the reference line and supplying, by the panel driving circuit, the data voltage to the display panel through the data line.
In one embodiment, a display device comprises: a display panel including a sub-pixel; a data line connected to the sub-pixel; a reference line connected to the sub-pixel; a panel driving circuit connected to the sub-pixel through the data line, the panel driving circuit configured to supply a data voltage to the display panel through the data line; and a panel sensing circuit connected to the sub-pixel through the reference line, the panel sensing circuit including an analog-to-digital converter (ADC), a first switch connected to a first reference voltage, a second switch connected to a second reference voltage, and a third switch configured to connect the ADC to the reference line, wherein during a first sensing operation of the ADC, the first switch is configured to turn on to supply the first reference voltage to the sub-pixel through the reference line while the second switch is off, and the ADC is configured to convert a voltage that is sensed through the reference line in response to the first reference voltage into a digital signal while the third switch is turned on without the panel driving circuit supplying the data voltage during the first sensing operation, and wherein during a second sensing operation of an element included in the sub-pixel, the second switch is turned on to supply a second reference voltage to the sub-pixel through the reference line while the first switch is off and the panel driving circuit supplies the data voltage to the display panel through the data line after the second reference voltage is supplied to the sub-pixel. offset correction
It is to be understood that both the foregoing general description and the following detailed description of the present invention are exemplary and explanatory and are intended to provide further explanation of the invention as claimed.
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principle of the invention. In the drawings:
Reference will now be made in detail to the preferred embodiments of the present invention, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used throughout the drawings to refer to the same or like parts.
A display device according to the present invention may be implemented as a television, a video player, a personal computer (PC), a home theater, an automotive electric device, or a smartphone, but is not limited thereto. The display device according to the present invention may be implemented as an LED, a QDD, or an LCD. For convenience of description, an LED device that directly emits light based on an inorganic light-emitting diode or an organic light-emitting diode will hereinafter be taken as an example of the display device according to the present invention.
As illustrated in
The image supply (set or host system) 110 may output various driving signals together with an externally-supplied image data signal or an image data signal stored in an internal memory. The image supply 110 may supply the data signal and the various driving signals to the timing controller 120.
The timing controller 120 may output a gate timing control signal GDC for control of operation timing of the scan driver 130, a data timing control signal DDC for control of operation timing of the data driver 140, and various synchronization signals (a vertical synchronization signal Vsync and a horizontal synchronization signal Hsync). The timing controller 120 may supply a data signal DATA supplied from the image supply 110 together with the data timing control signal DDC to the data driver 140. The timing controller 120 may take the form of an integrated circuit (IC) and mounted on a printed circuit board, but is not limited thereto.
The scan driver 130 may output a scan signal (or scan voltage) in response to the gate timing control signal GDC supplied from the timing controller 120. The scan driver 130 may supply the scan signal to sub-pixels included in the display panel 150 through gate lines GL1 to GLm. The scan driver 130 may take the form of an IC or may be formed directly on the display panel 150 in a GIP manner, but is not limited thereto.
The data driver 140 may sample and latch the data signal DATA in response to the data timing control signal DDC supplied from the timing controller 120, convert the resulting digital data signal into an analog data voltage based on a gamma reference voltage, and output the converted analog data voltage. The data driver 140 may supply the data voltage to the sub-pixels included in the display panel 150 through data lines DL1 to DLn. The data driver 140 may take the form of an integrated circuit (IC) and be mounted on the display panel 150 or mounted on the printed circuit board, but is not limited thereto.
The power supply 180 may generate first power having a high potential and second power having a low potential based on an external input voltage. The power supply 180 may output the first power through a first power line EVDD and output the second power through a second power line EVSS. The power supply 180 may generate and output a voltage (for example, a scan high voltage and a scan low voltage) required to drive the scan driver 130 or a voltage (for example, a drain voltage and a half-drain voltage) required to drive the data driver 140, as well as the first power and the second power.
The display panel 150 may display an image in response to a driving signal including the scan signal and the data voltage, the first power, and the second power. The sub-pixels of the display panel 150 may directly emit light. The display panel 150 may be manufactured based on a rigid or flexible substrate of glass, silicon, polyimide, etc. For example, one sub-pixel SP may be connected to a first data line DL1, a first gate line GL1, a first power line EVDD, and a second power line EVSS, and may include a pixel circuit which is composed of a switching transistor, a driving transistor, a capacitor, an organic light-emitting diode, etc.
The sub-pixel SP used in the LED device directly emits light, and thus a circuit configuration is complicated. In addition, there are various compensation circuits for compensating for deterioration of an organic light-emitting diode that emits light as well as a driving transistor that supplies driving current necessary to drive the organic light-emitting diode. Accordingly, note that the sub-pixel SP is simply illustrated in the form of a block.
The sub-pixels which emit light may include red, green and blue sub-pixels or may include red, green, blue and white sub-pixels. For example, one pixel P may include a red sub-pixel SPR connected to the first data line DL1, a white sub-pixel SPW connected to a second data line DL2, a green sub-pixel SPG connected to a third data line DL3, and a blue sub-pixel SPB connected to a fourth data line DL4. In addition, the red sub-pixel SPR, the white sub-pixel SPW, the green sub-pixel SPG, and the blue sub-pixel SPB may be commonly connected to a first reference line VREF1. The first reference line VREF1 may be used to sense deterioration of element(s) included in one of the red sub-pixel SPR, the white sub-pixel SPW, the green sub-pixel SPG, and the blue sub-pixel SPB, which will be discussed below.
Meanwhile, the timing controller 120, the scan driver 130, the data driver 140, etc., have been described as having individual configurations. However, one or more of the timing controller 120, the scan driver 130 and the data driver 140 may be integrated into one IC depending on the implementation scheme of the LED device. In addition, in the above description, the pixel P in which the red sub-pixel SPR, the white sub-pixel SPW, the green sub-pixel SPG, and the blue sub-pixel SPB are disposed in this order is illustrated as an example. However, an arrangement order and direction of sub-pixels may vary depending on the implementation scheme of the LED device.
As illustrated in
The shift register 131 may operate based on the signals Clks and Vst output from the level shifter 135 and output scan signals Scan[1] to Scan[m] capable of turning on or off transistors formed on the display panel. The shift register 131 may be formed on the display panel in the form of a thin film in a GIP manner.
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The driving transistor DT may have a gate electrode connected to a first electrode of the capacitor CST, a first electrode connected to the first power line EVDD, and a second electrode connected to an anode of the organic light-emitting diode OLED. The capacitor CST may have the first electrode connected to the gate electrode of the driving transistor DT and a second electrode connected to the anode of the organic light-emitting diode OLED. The organic light-emitting diode OLED may have the anode connected to the second electrode of the driving transistor DT and a cathode connected to the second power line EVSS.
The switching transistor SW may have a gate electrode connected to a first scan line GL1a included in the first gate line GL1, a first electrode connected to the first data line DL1, and a second electrode connected to the gate electrode of the driving transistor DT. The sensing transistor ST may have a gate electrode connected to a second scan line GL1b included in the first gate line GL1, a first electrode connected to the first reference line VREF1, and a second electrode connected to the anode of the organic light-emitting diode OLED.
The sensing transistor ST is a type of compensation circuit which is additionally provided to compensate for deterioration (in a threshold voltage, mobility, etc.) of the driving transistor DT or organic light-emitting diode OLED. The sensing transistor ST may enable physical threshold voltage sensing based on a source follower operation of the driving transistor DT. The sensing transistor ST may operate to acquire a sensed value through a sensing node defined between the driving transistor DT and the organic light-emitting diode OLED.
Meanwhile, the first gate line GL1 may be integrated into one gate line as illustrated in
The data driver 140 may include a panel driving circuit unit 141 for driving the sub-pixel SP and a panel sensing circuit unit 145 for sensing the sub-pixel SP. The panel driving circuit unit 141 may be connected to the first data line DL1 through a first output channel DCH1 and connected to the first reference line VREF1 through a first sensing channel SCH1. The panel driving circuit unit 141 may output a data voltage for driving the sub-pixel SP, etc. through the first output channel DCH1. The panel sensing circuit unit 145 may acquire a sensing voltage sensed from the sub-pixel SP through the first sensing channel SCH1.
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The digital-to-analog converter DAC may output the sensing data voltage Sdata, the black data voltage, or the display data voltage based on the data signal DATA output from the timing controller 120. The overdriving voltage output unit ODV may additionally write a voltage (adjust a voltage upward) so that the sensing data voltage Sdata includes an overdriving voltage ODS. The overdriving voltage output unit ODV may write the overdriving voltage ODS to the sensing data voltage Sdata based on the overdriving signal ODS. The overdriving signal ODS may be output from the timing controller 120 or may be generated in the panel driving circuit 141 at predetermined intervals. A description of writing the overdriving voltage ODS to the sensing data voltage Sdata will be described below.
The panel sensing circuit unit 145 may include a sensing circuit unit SEN, etc. including a first voltage circuit unit SPRE (e.g., a first switch), a second voltage circuit unit RPRE (e.g., a second switch), a sampling circuit unit SAM (e.g., a third switch), and an analog-to-digital converter ADC to output a voltage to the sub-pixel SP and the first reference line VREF1 and perform sensing. In one embodiment, the first voltage circuit unit SPRE could be considered a first switch or a second switch, and the sampling circuit unit SAM could be considered the other one of the first switch or the second switch. The panel sensing circuit unit 145 of
The first voltage circuit unit SPRE and the second voltage circuit unit RPRE may each perform a voltage output operation for initializing a node or circuit included in the sub-pixel SP or charging the node or circuit with a voltage at a specific level. The first voltage circuit unit SPRE and the second voltage circuit unit RPRE may include the first reference voltage source VPRES and the second reference voltage source VPRER, respectively. The first voltage circuit unit SPRE may output a first reference voltage based on the first reference voltage source VPRES, and the second voltage circuit unit RPRE may output a second reference voltage based on the second reference voltage source VPRER. The reference voltage output by the first voltage circuit unit SPRE may be considered a first reference voltage or a second reference voltage and the reference voltage output by the second voltage circuit unit RPRE maybe considered the other one of the first reference voltage or the second reference voltage. The reference voltage output by the first voltage circuit unit SPRE may be defined as a voltage used in a sensing mode (compensation mode) for deterioration compensation, and the reference voltage output by the second voltage circuit unit RPRE may be defined as a voltage used in a driving mode (normal mode) for image display. In addition, the first reference voltage may be set to a voltage lower than the second reference voltage. The sampling circuit unit SAM may perform a sampling operation to obtain a sensing voltage through the first reference line VREF1. The analog-to-digital converter ADC may convert an analog sensing voltage acquired by the sampling circuit unit SAM into a digital sensing voltage, and output the converted sensing voltage.
The panel sensing circuit unit 145 may acquire a sensing voltage for compensating for deterioration of the driving transistor DT or the organic light-emitting diode OLED included in the sub-pixel SP through a sensing capacitor PCAP formed on the first reference line VREF1. The panel sensing circuit unit 145 may acquire a sensing voltage through the sampling capacitor SCAP formed in the sampling circuit unit SAM, convert the acquired analog sensing voltage into a digital sensing voltage through the analog-to-digital converter ADC, and output the converted sensing voltage. The sensing voltage output from the panel sensing circuit unit 145 may be transferred to the timing controller 120. Further, the timing controller 120 may determine whether or not the driving transistor DT or the organic light-emitting diode OLED included in the sub-pixel SP deteriorates based on the sensing voltage, and perform a compensation operation to compensate for the deterioration.
The LED device implemented according to the first embodiment of the present disclosure may operate in a driving mode (normal mode) for displaying an image on the display panel based on the panel driving circuit unit 141 and the panel sensing circuit unit 145 and a sensing mode (compensation mode) for sensing the characteristics of the element(s) included in the display panel.
In the sensing mode, sensing may be performed to compensate for deterioration of the driving transistor DT (threshold voltage or mobility compensation) or to compensate for deterioration of the organic light-emitting diode OLED (threshold voltage compensation).
Operations of the devices performed in a threshold voltage sensing period Vth Sensing of the driving transistor DT will be described below. A switch included in the first voltage circuit unit SPRE may be turned on to output the first reference voltage through the first reference line VREF1 in response to the first voltage control signal Spre at a high voltage. The switching transistor SW and the sensing transistor ST may be turned on in response to a scan signal Scan at a high voltage.
The digital-to-analog converter DAC may operate together with the overdriving voltage output unit ODV to output the sensing data voltage Sdata including the overdriving voltage ODS through the first data line DL1. In addition, a sampling switch included in the sampling circuit unit SAM may be temporarily turned on in response to the sampling control signal Samp at a high voltage.
As illustrated in
The first overdriving voltage High1 may be defined as a precharge voltage used to consider or prevent coupling between the data line and the reference line, and the second overdriving voltage High 2 may be defined as an overdriving voltage used to reduce a sensing time. The first overdriving voltage High1 may have a first high voltage level, and the second overdriving voltage High2 may have a second high voltage level that is greater than the first high voltage level. Here, reducing the sensing time may mean that a condition necessary for sensing is rapidly created.
In the first overdriving voltage High1, {circle around (1)} may be defined as a precharge voltage level, and {circle around (2)} may be defined as a time (or duty) during which the precharge voltage is applied. Since the first overdriving voltage High1 corresponds to a voltage used to consider or prevent coupling between the data line and the reference line, the voltage level and application time may be varied in response to coupling therebetween. However, when coupling between the data line and the reference line does not occur, the first overdriving voltage High1 may be omitted.
In the second overdriving voltage High2, {circle around (4)} may be defined as an overdriving voltage level, and {circle around (3)} may be defined as a time (or duty) during which the second overdriving voltage High2 is applied. Since the second overdriving voltage High2 corresponds to a voltage used to reduce a sensing time, the voltage level and application time may be varied in response to a degree of deterioration of an object to be sensed.
The time during which the first overdriving voltage High1 is applied and the time during which the second overdriving voltage High 2 is applied may be set to 1:1→2:1→3:1, etc. That is, the time during which the first overdriving voltage High1 is applied may be set to be equal to or longer than the time during which the second overdriving voltage High2 is applied.
Meanwhile, the overdriving voltage level {circle around (4)} may be determined as the voltage level {circle around (5)} for sensing the threshold voltage of the driving transistor DT×gain value. In this instance, as the overdriving voltage level {circle around (4)} increases, a slope of the sensing voltage may increase. However, ripple may be caused by overshoot.
Therefore, the overdriving voltage level {circle around (4)} may swing with the voltage level {circle around (5)} for sensing the threshold voltage of the driving transistor DT×gain value located between 1 and 2, and an adjustment value considering a degree of ripple generation may be prepared. Accordingly, the voltage level {circle around (5)} for sensing the threshold voltage of the driving transistor DT may be increased or decreased to a level corresponding to the first overdriving voltage High1, a lower level, or a higher level. Therefore, the overdriving voltage ODS may be generated to be applied at an appropriate level and for an appropriate time through a process of tracking characteristics of the display panel.
As illustrated in
Operations of the devices performed in the sensing period ADC Sensing for offset correction of the analog-to-digital converter ADC will be described below. The switch included in the first voltage circuit unit SPRE may be turned on to output the first reference voltage through the first reference line VREF1 in response to the first voltage control signal Spre at the high voltage. At this time, operating states of the devices are understood with reference to
A switch included in the second voltage circuit unit RPRE may be turned on to output the second reference voltage through the first reference line VREF1 in response to a second voltage control signal Rpre at a high voltage. At this time, operating states of the devices are understood with reference to
After the first reference line VREF1 is initialized by the first reference voltage output from the first voltage circuit unit SPRE, the second voltage circuit unit RPRE may output the second reference voltage for offset correction of the analog-to-digital converter ADC. That is, after the first reference voltage is output, the second reference voltage may be output. The sensing capacitor PCAP is charged according to the first reference voltage and the second reference voltage.
The switching transistor SW and the sensing transistor ST may be turned off in response to the scan signal Scan at a low voltage during the sensing period ADC. The digital-to-analog converter DAC may not output the sensing data voltage Sdata, etc. That is, during the sensing period ADC Sensing for offset correction of the analog-to-digital converter ADC, voltages or signals related to operations of the sub-pixels may not be generated (a non-output state).
The sampling switch included in the sampling circuit unit SAM may be temporarily turned on in response to the sampling control signal Samp at a high voltage. At this time, operating states of the devices are understood with reference to
Meanwhile, the sampling control signal Samp at a high voltage applied to the sampling circuit SAM during the sensing period ADC Sensing for offset correction of the analog-to-digital converter ADC may be referred to as a sampling control signal Sa for offset correction. While the sampling control signal Samp is at the high voltage during the sensing period ADC Sensing, the analog-to-digital converter ADC converts the sensed voltage stored in the sensing capacitor PCAP to a digital signal. Given that the first reference voltage and second reference voltage are known voltages, the digital signal may be analyzed by the timing controller 120 to determine whether the digital signal output by the analog-to-digital converter ADC is the expected digital signal and perform offset correction of the ADC responsive to the digital signal deviating (e.g., not matching) from the expected digital signal. Further, the sampling control signal Samp at a high voltage applied to the sampling circuit SAM during the threshold voltage sensing period Vth Sensing of the driving transistor DT thereafter may be referred to as a sampling control signal SV for threshold voltage compensation. In addition, the sensing period ADC Sensing for offset correction of the analog-to-digital converter ADC may be referred to as a first sensing period, and the threshold voltage sensing period Vth Sensing of the driving transistor DT may be referred to as a second sensing period.
As illustrated in
The first sub-pixel sensing period SP1S, the second sub-pixel sensing period SP2S, the third sub-pixel sensing period SP3S, and the fourth sub-pixel sensing period SP4S may include in common the threshold voltage sensing period Vth Sensing of the driving transistor DT included in each sub-pixel. Further, a first sensing period on a time axis Time such as the first sub-pixel sensing period SP1S may further include a sensing period ADC+Vth Sensing for offset correction of the analog-to-digital converter ADC.
However, this is merely one example, and the sensing period ADC Sensing for offset correction of the analog-to-digital converter ADC may be included in at least one of the first sub-pixel sensing period SP1S, the second sub-pixel sensing period SP2S, the third sub-pixel sensing period SP3S, and the fourth sub-pixel sensing period SP4S.
In addition, when the time required for sensing can be greatly reduced, the sensing period ADC Sensing for offset correction of the analog-to-digital converter ADC may be included in all the first sub-pixel sensing period SP1S to the fourth sub-pixel sensing period SP4S.
As illustrated in
However, the sensing order may be changed based on prior information (sensing data or experimental data) on deterioration characteristics of sub-pixels, etc. In addition, the sensing order may be changed for each frame. For example, in a first frame, the red sub-pixel sensing period SPRS may be performed first, and sensing for offset correction of the analog-to-digital converter ADC and threshold voltage sensing of the driving transistor DT may be performed together. Further, in a second frame, the white sub-pixel sensing period SPWS may be performed first, and sensing for offset correction of the analog-to-digital converter ADC and threshold voltage sensing of the driving transistor DT may be performed together.
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The sensing scheme according to the third embodiment of the present disclosure may use the sensing scheme according to the first embodiment or the sensing scheme according to the second embodiment described above.
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In addition, as illustrated in
In addition, according to the embodiments of the present invention, it is possible to perform offset correction for the analog-to-digital converter included in each of the sensing circuit units SEN1 to SENn based on a circuit used for actual sensing rather than a combination of the voltage source VRTA of
As described above, the present disclosure has an effect in that it is possible to perform offset correction of an analog-to-digital converter included in each of sensing circuit units based on a circuit used for actual sensing without using a separate voltage or a separate dummy circuit. In addition, since offset correction of the analog-to-digital converter is performed based on a circuit used for actual sensing rather than a dummy circuit, the present disclosure has an effect in that compensation accuracy may be improved compared to the case of using a dummy circuit. In addition, since offset correction of the analog-to-digital converters included in all channels is possible, the present disclosure has an effect in that it is possible to reduce occurrence of a deviation between channels. In addition, since a configuration related to the separate dummy circuit may be eliminated, the present invention has an effect in that it is possible to reduce the number of channels and to simplify design of the device.
It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention cover the modifications and variations of this invention provided they come within the scope of the appended claims and their equivalents.
Number | Date | Country | Kind |
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10-2022-0168717 | Dec 2022 | KR | national |
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