This U.S. non-provisional patent application claims priority under 35 U.S.C. § 119 from Korean Patent Application No. 10-2017-0108222, filed on Aug. 25, 2017, the contents of which are incorporated by reference herein.
The present disclosure herein relates to a display device, and more particularly, to a display device which may compensate for the charging rate of a pixel.
In general, a display device includes a display panel for displaying an image, and a driving circuit for driving the display panel. The display panel includes, for example, a plurality of gate lines, a plurality of data lines, and a plurality of pixels. Each of the pixels includes a switching transistor and a liquid crystal capacitor.
The display device may display an image by applying a gate-on voltage to the gate electrode of the switching transistor that is connected to a gate line for which the image is displayed, and then the display device applies a data signal corresponding to the image to the source electrode. As the switching transistor is turned on, the data signal applied to the liquid crystal capacitor should be maintained for a predetermined time even after the switching transistor is turned off.
Additionally, the charging rates of the plurality of pixels should be the same, but there is difficulty in maintaining uniform charging rates of the plurality of pixels. Differences in the charging rates of pixels can result a reduced quality of a display, for example, by the image having display stains.
The inventive concept is directed to a display device and method of compensating a charging rate of a pixel.
An embodiment of the inventive concept provides a data driving circuit including: a clock generating and compensating circuit configured to receive a main clock signal MCLK and generate a clock signal CLK, an output circuit configured to convert an image signal into a data signal in response to the clock signal CLK, and provide the data signal to a plurality of data lines; and wherein the clock generating and compensating circuit is configured to detect a slew rate of the data signal provided to at least one data line of the plurality of data lines, and to adjust a phase of the clock signal CLK depending on the detected slew rate.
In an embodiment of the inventive concept, the clock generating and compensating circuit may advance the phase of the clock signal when the detected slew rate is lower than a reference level.
In an embodiment of the inventive concept, the clock generating and compensating circuit may include: a clock generator configured to receive the main clock signal, and generate a plurality of sub-clock signals having phases different from each other, a slew rate detector configured to compare the slew rate of the data signal provided to the at least one data line with a reference level, and output a detection signal, and a clock output circuit configured to output, in response to the detection signal, one of the plurality of sub-clock signals as the clock signal to compensate for the slew rate of the data signal.
In an embodiment of the inventive concept, the clock output circuit may further receive a vertical synchronization signal, and output a switching signal that is active for a predetermined time within a blanking interval of the vertical synchronization signal, and the slew rate detector may compare, in response to the switching signal, the slew rate of the data signal provided to the at least one data line with the reference level, and output the detection signal.
In an embodiment of the inventive concept, when the slew rate of the data signal is lower than the reference level, the clock output circuit may output a sub-clock signal, having a phase ahead of a phase of a current clock signal, of the plurality of sub-clock signals as the clock signal from a next frame, in response to the detection signal.
In an embodiment of the inventive concept, the slew rate detector may include: an integrator configured to accumulate the amount of current of the data signal provided to the at least one data line while the switching signal is active, and output an accumulation data signal, and a comparator configured to compare the accumulation data signal with a reference voltage, and output the detection signal.
In an embodiment of the inventive concept, when a voltage level of the accumulation data signal is lower than the reference voltage, the comparator outputs the detection signal having a high level, and when the voltage level of the accumulation data signal is higher than the reference voltage, the comparator outputs the detection signal having a low level.
In an embodiment of the inventive concept, the clock generating and compensating circuit may include: a clock generator configured to receive the main clock signal, and generate a plurality of sub-clock signals having phases different from each other, a slew rate detector configured to compare the slew rate of the data signal provided to the at least one data line with a reference level, and output a detection signal corresponding to a difference between the slew rate of the data signal and the reference level, and a clock output circuit configured to output a sub-clock signal, corresponding to the detection signal, of the plurality of sub-clock signals as the clock signal.
In an embodiment of the inventive concept, the slew rate detector may include: an integrator configured to accumulate the amount of current of the data signal provided to the at least one data line while the switching signal is active, and output an accumulation data signal, a comparator configured to compare the accumulation data signal with a reference voltage, and output a comparison signal having a pulse width corresponding to a difference between the accumulation data signal and the reference voltage, and an analog-to-digital converter configured to output the detection signal corresponding to the pulse width of the comparison signal.
In an embodiment of the inventive concept, the output circuit may include: a latch circuit configured to latch the image signal, and output the latched image signal in synchronization with the clock signal, a digital-to-analog converter configured to convert a digital image signal outputted from the latch circuit into an analog image signal, and an output buffer configured to output the analog image signal as the data signal in synchronization with the clock signal.
An embodiment of the inventive concept provides a display device including: a display panel having a plurality of pixels connected respectively to a plurality of gate lines and a plurality of data lines, a gate driving circuit configured to drive the plurality of gate lines, a data driving circuit configured to drive the plurality of data lines, and a drive controller configured to control the gate driving circuit and the data driving circuit in response to a control signal and an image input signal provided from the outside, and output an image signal corresponding to the image input signal, a vertical synchronization signal, and a main clock signal. The data driving circuit may include: an output circuit configured to convert the image signal into a data signal in response to a clock signal, and provide the data signal to the plurality of data lines, and a clock generating and compensating circuit configured to receive the main clock signal and the vertical synchronization signal, and generate the clock signal. The clock generating and compensating circuit may detect a slew rate of the data signal provided to at least one data line of the plurality of data lines, and adjust a phase of the clock signal depending on the detected slew rate.
In an embodiment of the inventive concept, the clock generating and compensating circuit may advance the phase of the clock signal when the detected slew rate is lower than a reference level.
In an embodiment of the inventive concept, the clock generating and compensating circuit may include: a clock generator configured to receive the main clock signal, and generate a plurality of sub-clock signals having phases different from each other, a slew rate detector configured to compare the slew rate of the data signal provided to the at least one data line with a reference level, and output a detection signal; and a clock output circuit configured to output, in response to the detection signal, one of the plurality of sub-clock signals as the clock signal.
In an embodiment of the inventive concept, the drive controller may output the main clock signal for a predetermined time within a blanking interval of the vertical synchronization signal. The clock output circuit may output a switching signal that is active for a predetermined time within the blanking interval of the vertical synchronization signal. The slew rate detector may compare, in response to the switching signal, the slew rate of the data signal provided to the at least one data line with the reference level, and output the detection signal.
In an embodiment of the inventive concept, the clock output circuit may output a sub-clock signal, having a phase ahead of a phase of a current clock signal, of the plurality of sub-clock signals as the clock signal from a next frame, in response to the detection signal.
In an embodiment of the inventive concept, the slew rate detector may include: an integrator configured to accumulate the amount of current of the data signal provided to the at least one data line while the switching signal is active, and output an accumulation data signal, and a comparator configured to compare the accumulation data signal with a reference voltage, and output the detection signal.
In an embodiment of the inventive concept, the clock generating and compensating circuit may include: a clock generator configured to receive the main clock signal, and generate a plurality of sub-clock signals having phases different from each other, a slew rate detector configured to compare the slew rate of the data signal provided to the at least one data line with a reference level, and output a detection signal corresponding to a difference between the slew rate of the data signal and the reference level, and a clock output circuit configured to output a sub-clock signal, corresponding to the detection signal, of the plurality of sub-clock signals as the clock signal.
In an embodiment of the inventive concept, the slew rate detector may include: an integrator configured to accumulate the amount of current of the data signal provided to the at least one data line while the switching signal is active, and output an accumulation data signal, a comparator configured to compare the accumulation data signal with a reference voltage, and output a comparison signal having a pulse width corresponding to a difference between the accumulation data signal and the reference voltage, and an analog-to-digital converter configured to output the detection signal corresponding to the pulse width of the comparison signal.
In an embodiment of the inventive concept, the output circuit may include: a latch circuit configured to latch the image signal, and output the latched image signal in synchronization with the clock signal, a digital-to-analog converter configured to convert a digital signal outputted from the latch circuit into an analog signal, and an output buffer configured to output the analog signal as the data signal in synchronization with the clock signal.
In an embodiment of the inventive concept, a method of detecting and compensating for a slew rate of a data in a data driving circuit, the method includes: receiving, by a clock generating and compensating circuit, a main clock signal (MCLK) and generating the clock signal (CLK), converting, by an output circuit, an image signal into a data signal in response to receiving the clock signal (CLK), and providing the data signal to a plurality of data lines; and detecting, by the clock generating and compensating circuit, a slew rate of the data signal provided to at least one data line of the plurality of data lines, and adjusting a phase of the clock signal (CLK) depending on the detected slew rate, wherein the adjusting of the phase of the clock signal includes advancing, by the clock generating and compensating circuit, the phase of the clock signal when the detected slew rate is lower than a reference level.
The accompanying drawings are included to provide a further understanding of the inventive concept, and are incorporated in and constitute a part of this specification. The drawings illustrate some embodiments of the inventive concept and, together with the description, serve to describe principles of the inventive concept. In the drawings:
Hereinafter, embodiments of the inventive concept are described in more detail with reference to the accompanying drawings.
In the description below, like reference numerals may be used to refer to like parts, components, blocks, circuits, units or modules that have the same or similar function, throughout two or more figures. Such description, however, is provided only for the sake of ease of description. The description of the inventive concept herein does not mean that the configuration or structural details of such components or units are the same in all embodiments, and/or that the parts/modules jointly referred to are the only way to implement the teachings of the specific embodiments disclosed herein.
Referring now to
The display panel DP is not particularly limited, but may include various display panels such as a liquid crystal display panel, an organic light emitting display panel, an electrophoretic display panel, and an electrowetting display panel. The display panel may be rectangularly-shaped with two long sides and two short sides, with the gate driving circuit arranged along one of the two short sides of the rectangularly-shaped display panel.
When viewed in a plan view, the display panel DP includes a display area DA in which a plurality of pixels PX11 to PXnm are arranged, and a non-display area NDA which encloses the display area DA. On the side where the display area is arranged, the non-display area is smaller than the display area DA.
According to an embodiment of the inventive concept, the display panel DP includes a plurality of gate lines GL1 to GLn, and a plurality of data lines DL1 to DLm crossing the gate lines GL1 to GLn in a substantially perpendicular arrangement. The plurality of gate lines GL1 to GLn are connected to the gate driving circuit 110. The plurality of data lines DL1 to DLm are connected to the data driving circuits 120, 121, 122 and 123. In this embodiment, each of the data driving circuits 120 to 123 is assumed to be connected to a particular number (e.g., y number) of data lines (where, each of y, m, and n is a positive integer, and m is greater than y.). Illustrated in
In
The plurality of pixels PX11 to PXnm may be divided into a plurality of groups according to a color to be displayed. For example, the plurality of pixels PX11 to PXnm may display one of primary colors. The primary colors may include red, green, blue, and white. The primary colors, however, are not limited thereto, and may further include various colors such as yellow, cyan, and magenta.
With continued reference to
With particular reference to
In addition, the gate driving circuit 110 may be formed simultaneously with the pixels PX11 to PXnm through a thin film process. For example, the gate driving circuit 110 may be mounted in the non-display area NDA as an oxide semiconductor TFT gate driver circuit (OSG). In another embodiment of the inventive concept, the gate driving circuit 110 may include a driving chip (not illustrated), and a flexible circuit board (not illustrated) on which the driving chip is mounted. In this case, the flexible circuit board may be electrically connected to the main circuit board MCB. In another embodiment of the inventive concept, the gate driving circuit 110 may be disposed in the non-display area NDA of the display panel DP by a chip on glass (COG) technique.
The data driving circuits 120 to 123 may generate gradation voltages depending on the image data provided from the drive controller 130, on the basis of a data control signal received from the drive controller 130. The data driving circuits 120 to 123 output the gradation voltages to the plurality of data lines DL1 to DLm as data signals DS.
The data signals DS may include positive data signals having positive values with reference to a common voltage, and/or negative data signals having negative values. Some of the data signals applied to the data lines DL1 to DLm during each of the horizontal periods HP may have positive polarity, and the rest may have negative polarity. Polarity of the data signals may be inverted for each frame period as one possible way to prevent degradation of a liquid crystal. The data driving circuits 120 to 123 may generate inverted data signals by frame period in response to an inversion signal.
Each of the data driving circuits 120 to 123 may include a driving chip 120a, and a circuit board that may be a flexible circuit board 120b on which the driving chip 120a is mounted. As shown in
Each of the plurality of pixels PX11 to PXnm includes a thin film transistor and a liquid crystal capacitor. Each of the plurality of pixels PX11 to PXnm may further include a storage capacitor.
A pixel PXij is electrically connected to an i-th gate line GLi and a j-th data line DLj. The pixel PXij outputs a pixel image corresponding to a data signal received from the j-th data line DLj, in response to a gate signal G1 received from the i-th gate line GLi.
The voltage generator 140 may generate various voltages that may be provided to the gate driving circuit 110, the data driving circuits 120 to 123, and the drive controller 130. While
The voltage generator 140 may generate a gate-on voltage and a gate-off voltage for the operation of the gate driving circuit 110. The gate-on voltage may be a relatively high voltage (for example, about 40 V), and thus the temperature of the voltage generator 140 generating multiple voltages may rise.
Slew rates of the data signals that the data driving circuits 120 to 123 provide to the data lines DL1 to DLm may be affected by an ambient temperature. Ambient temperatures differ between the data driving circuit 120 adjacent to the voltage generator 140 and the data driving circuit 123 far from the voltage generator 140, among the data driving circuits 120 to 123.
While
Referring to
As described above, when each of the data driving circuits 120 to 123 has a different ambient temperature, the slew rates of data signals outputted from the data driving circuits 120 to 123 may differ. In this case, there may appear a display stain due to a difference in charging rates of the pixels. Thus, image quality of the display device may suffer.
Referring to
The clock generating and compensating circuit 210 receives a main clock signal MCLK and the vertical synchronization signal V_SYNC from the drive controller 130 illustrated in
The output circuit 220 converts, in response to the clock signals SCLK and CLK provided from the clock generating and compensating circuit 210, a data signal DATA from the drive controller 130 illustrated in
The output circuit 220 may include a shift register 221, a latch circuit 222, a digital-to-analog converter 223, and an output buffer 224. The shift register 221 sequentially activates latch clock signals SC1 to SCy in synchronization with the clock signal SCLK. The latch circuit 222 latches the data signal DATA in synchronization with the latch clock signals SC1 to SCy from the shift register 221, and provides digital image signals DA1 to DAy to the digital-to-analog converter 223 in response to the clock signal CLK.
The digital-to-analog converter 223 outputs, to the output buffer 224, the digital image signals DA1 to DAy from the latch circuit 222, as analog image signals Y1 to Yy. The output buffer 224 receives the analog image signals Y1 to Yy from the digital-to-analog converter 223, and outputs the data signals D1 to Dy to the data lines DL1 to DLy illustrated in
The clock generating and compensating circuit 210 detects a slew rate of a data signal (in this embodiment, the data signal D1 from the data line DL1) from any one of the data lines DL1 to DLy, and adjusts a phase of the clock signal CLK depending on the detected slew rate.
For example, when a slew rate of the data signal D1 is lower than a reference level, the phase of the clock signal CLK is advanced. When the phase of the clock signal CLK is advanced, output points of time of the data signals D1 to Dy outputted from the output buffer 224 are advanced. When slew rates of the data signals D1 to Dy have become lower due to a change in ambient temperature or the like, the charging rates of the pixels may be compensated for by advancing the output points of time of the data signals D1 to Dy.
In addition, each of the data driving circuits 120 to 123 illustrated in
In an embodiment of the inventive concept, there may be a lookup table (not shown) that stores slew rates of each of the data driving circuits and an associated amount of advancement of a phase of a respective clock signal for each of the data driving circuits, and the clock generating and compensating circuit may be configured to retrieve from the lookup table a value that the phase of the respective clock signal is to be advanced.
For example, the lookup table may stores slew rates and the associated amount of advancement of the phase of the respective clock signal for each of the data driving circuits based on an ambient temperature of each of the data driving circuits. Thus, the display device according to an embodiment of the inventive concept may include temperature sensors obtain ambient temperature readings of the plurality of driving circuits. In an embodiment, of the inventive concept, the ambient temperature of the driving circuits is related to its distance from the voltage generator 140, as the voltage generator 140 generates heat that may cause the ambient temperature of the driving circuits relatively close thereto to be higher than the driving circuits relatively further away from the voltage generator 140. Thus, the lookup table may store typical phase advancements for respective driving circuits at various ambient temperatures.
Referring to
The clock generator 310, which may be comprised of an integrated circuit, and/or may part of a microprocessor, receives the main clock signal MCLK and generates sub-clock signals CK1 to CK12 (in this example) having phases that are different from each other. The clock generator may be a multiphase clock that is capable of multiple outputs at various phases. In
The clock output circuit 330 receives the sub-clock signals CK1 to CK12, and outputs the clock signals SCLK and CLK in response to the detection signal S_DET and the vertical synchronization signal V_SYNC. The clock output circuit 330 outputs one of the sub-clock signals CK1 to CK12 as the clock signal CLK on the basis of the detection signal S_DET. Additionally, the clock output circuit 330 may further output a switching signal SW1 in response to the vertical synchronization signal V_SYNC. The clock output circuit 330 activates the switching signal SW1 at a first level (for example, a high level) for a predetermined time within a blanking interval of the vertical synchronization signal V_SYNC. The slew rate detector 320 may compare the slew rate of the data signal D1 with the reference level in response to the switching signal SW1, and output the detection signal S_DET.
Referring now to
The integrator 410 includes a switch 411, a resistor 412, a capacitor 413, and an amplifier 414. The switch 411 may be turned on in response to the switching signal SW1. For example, the switch 411 is turned on when the switching signal SW1 becomes activated at the first level (for example, the high level). In an embodiment of
The integrator 4l0 accumulates the data signal D1 while the switching signal SW1 is active at the first level (for example, the high level), and outputs the accumulation data signal D_I.
The comparator 420 compares the accumulation data signal D_I with a reference voltage VREF2, and outputs the detection signal S_DET. For example, when a voltage level of the accumulation data signal D_I is lower than the reference voltage VREF2, the comparator 420 outputs a detection signal S_DET of a high level, and when the voltage level of the accumulation data signal D_I is higher than the reference voltage VREF2, the comparator 420 outputs a detection signal S_DET of a low level. The voltage level of the reference voltage VREF2 may be a reference level for determining whether the slew rate of the data signal D1 is sufficiently high. When the voltage level of the accumulation data signal D_I, corresponding to the slew rate of the data signal D1, is lower than a reference level, e.g., the reference voltage VREF2, the slew rate of the data signal D1 may be compensated for, e.g., with one way as discussed herein above.
Referring to
On the other hand, when the data signal D1 transmitted through the data line DL1 has a slew rate as in a current curve Db, an accumulation data signal D_Ib outputted through the integrator 410 remains at voltage levels lower than the reference voltage VREF2, causing the detection signal S_DET to be kept at a high level.
Accordingly, when the slew rate of the data signal D1 is sufficiently high (for example, in the case of the current curve Da), the detection signal S_DET is outputted as a low level. When the slew rate of the data signal D1 is low (for example, in the case of the current curve Db), the detection signal S_DET is maintained at a high level. Compensation may be performed when the slew rate of the data signal D1 is low.
The clock output circuit 330 illustrated in
Referring to
The clock generator 310 receives the main clock signal MCLK, and generates the sub-clock signals CK1 to CK12 having phases different from each other. The clock output circuit 330 activates the switching signal SW1 at the high level for a predetermined time within the blanking interval V_BLANK of the vertical synchronization signal V_SYNC.
The slew rate detector 320 accumulates the data signal D1 while the switching signal SW1 is at the high level, and then, when a voltage level of the accumulation data signal D_I is lower than the reference voltage VREF2, the comparator 420 (
The clock output circuit 330 keeps the clock signal CLK unchanged when the detection signal S_DET received during the blanking interval V_BLANK of the vertical synchronization signal V_SYNC is at a low level at any one time. Accordingly, the clock output circuit 330 operates in a normal mode when the detection signal S_DET during the blanking interval V_BLANK is at a low level at any one time.
When the detection signal S_DET is kept at a high level during the blanking interval V_BLANK of the vertical synchronization signal V_SYNC, the clock output circuit 330 outputs a sub-clock signal, having a phase ahead of that of a clock signal CLK of a current frame Ft, of the sub-clock signals CK1 to CK12 as a clock signal CLK of a next frame Ft+1. Accordingly, the clock output circuit 330 operates in a compensation mode when the detection signal S_DET during the blanking interval V_BLANK is kept at a high level.
For example, with reference to
Referring now to
Referring to
The clock output circuit 330 illustrated in
At operation S1100, the clock generating and compensating circuit 210 receives a master clock signal MCLK.
At operation S1105, the output circuit receives an image signal. Next at operation S1110, it is determined whether the CLK signal is received by the output circuit.
If at operation S1110, the CLK signal is received by the output circuit, then at operation S1115, the output circuit converts the image signal into a data signal, and provides the data signal to a plurality of data lines, in which at least one data signal is provided to the clock generating and compensation circuit.
At operation S1120, the clock generating and compensating circuit 210 detects a slew rate by, for example, a comparator circuit comparing a level of at least one data signal with a reference level.
At operation S1125, the comparator determines whether a voltage of the at least one data signal is less than the reference level. If the voltage of the at least one data signal is not less than the reference level, there is no adjustment of the slew rate, and at operation S1135, if there is another image received by the output circuit, them operation S1110 is again performed to determine whether a clock signal output is received by the output circuit to convert the “another” image signal. Otherwise, if another image signal is not received at S1135, the image would be displayed without a slew rate adjustment.
At operation S1130, when it is determined that the value of the least one data signal is less than the reference level (operation S1125), the slew rate is adjusted by advancement of a phase of the clock signal CLK.
Finally at operation S1135, the entire operations would repeat if another image signal is received by the output circuit, or other would end.
Accordingly, a decrease in a charging rate of a pixel due to a low slew rate may be compensated for and an image display stain due to different pixel charging rates may be reduced or prevented. The display device according to the inventive concept can thus address pixel charging inequities caused by variations in the ambient temperature of the respective data driving circuits that may occur due to their relatively different distances from heat generating elements, such as a voltage generator.
At operation S1200 a clock generating and compensating circuit may receive a main clock signal MCLK and generate a clock signal CLK.
At operation S1205, there is a converting, by an output circuit, of an image signal into a data signal in response to receiving the clock signal CLK. The data signal may be applied to a plurality of data lines (e.g. DL1 to DLy).
At operation S1210, the clock generating and compensating circuit may detect a slew rate of the data signal provided to at least one data line of the plurality of data lines. A slew rate detector 320, such as shown in
At operation S1215, the comparator outputs a signal with a level based on whether or not the slew rate is less than the reference voltage, or greater than the reference voltage. For example, the level of S_DET may be a high level when a voltage level of the accumulation data signal is lower than reference voltage Vref2, and S_DET may be a low level when the accumulation signal is higher than the reference voltage Vref2.
At operation S1220, the phase of the data signal may be adjusted by advancing the phase of the clock signal. In turn, the output points of time of the data signals output from a buffer 224 (
Although the exemplary embodiments of the inventive concept have been described herein, it is to be understood by a person of ordinary skill in the art that various changes and modifications can be made by those skilled in the art within the spirit and scope, defined by the following claims or the equivalents, of the inventive concept.
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