This application claims priority to Taiwan Application Serial Number 109109652, filed Mar. 23, 2020, which is herein incorporated by reference in its entirety.
The present disclosure relates to a display device, especially a device capable of adjusting the brightness of a display panel by a backlight circuit.
Currently, various mobile electronic devices are usually equipped with a light source sensor for detecting the ambient light sources around the mobile electronic device. The mobile electronic device executes corresponding operations or adjusts display parameters according to the brightness of the ambient light source. The position or manufacturing process of the light source sensor will affect the configuration of other components (e.g., the display panel) in the mobile electronic device, which has become a major issue in product design.
One aspect of the present disclosure is a display device, comprising a backlight circuit, a processing circuit and a clock generation circuit. The backlight circuit is configured to be driven in response to a control signal. The processing circuit is electrically connected to the backlight circuit, and is configured to generate a voltage signal and the control signal. The clock generation circuit is electrically connected to the processing circuit to receive the voltage signal. The clock generation circuit is configured to transmit a clock signal to the processing circuit according to the voltage signal and an ambient light, and the processing circuit is configured to adjust the control signal according to a clock frequency of the clock signal.
It is to be understood that both the foregoing general description and the following detailed description are by examples, and are intended to provide further explanation of the disclosure as claimed.
The present disclosure can be more fully understood by reading the following detailed description of the embodiment, with reference made to the accompanying drawings as follows:
For the embodiment below is described in detail with the accompanying drawings, embodiments are not provided to limit the scope of the present disclosure. Moreover, the operation of the described structure is not for limiting the order of implementation. Any device with equivalent functions that is produced from a structure formed by a recombination of elements is all covered by the scope of the present disclosure. Drawings are for the purpose of illustration only, and not plotted in accordance with the original size.
It will be understood that when an element is referred to as being “connected to” or “coupled to”, it can be directly connected or coupled to the other element or intervening elements may be present. In contrast, when an element to another element is referred to as being “directly connected” or “directly coupled,” there are no intervening elements present. As used herein, the term “and/or” includes an associated listed items or any and all combinations of more.
The present disclosure relates to a display device.
The position of the backlight circuit 110 corresponds to the pixel circuit (not shown in the figure) of the display panel P, and includes multiple light emitting elements (e.g., LED). The backlight circuit 110 is configured to receive a control signal Sb transmitted by the processing circuit 120, and is driven in response to the control signal Sb to project light in the direction of the pixel circuit.
The processing circuit 120 is electrically connected to the backlight circuit 110, the display panel P and the clock generation circuit 130, and is configured to generate a voltage signal Vc and the control signal Sb. The processing circuit 120 is configured to perform various calculations. In some embodiments, the processing circuit 120 may be implemented by a microcontroller, a microprocessor, a digital signal processor, an application specific integrated circuit (ASIC) or a logic circuit.
The clock generation circuit 130 is configured to receive the voltage signal Vc, and outputs the clock signal CLK1 according to the voltage signal Vc and the magnitude of the ambient light L. In this embodiment, the clock generation circuit 130 includes a light-dependent electronic component, so that the electrical characteristics of the clock generation circuit 130 changes according to the magnitude of the ambient light L, and the clock frequency of the clock signal CLK1 corresponds to the magnitude of the ambient light L. Alternatively stated, the clock generation circuit 130 is used to a part of the light source sensor in the display device 100.
The above the ambient light means the environment brightness around the display device 100. For example, when the display device 100 is in an outdoor daytime environment, the brightness of the ambient light L is higher. On the other hand, if the display device 100 is in a night and no lighting environment, the brightness of the ambient light L is lower.
The clock generation circuit 130 is configured to transmit the clock signal CLK1 to the processing circuit 120. The clock frequency of the lock signal CLK1 corresponds to the magnitude of the ambient light L. Therefore, the processing circuit 120 adjusts the control signal Sb according to the clock frequency of the clock signal CLK1. For example, when the clock frequency increases, it means that the brightness of the ambient light L is higher. At this time, the processing circuit 120 may increase the magnitude of the voltage of the control signal Sb to increase the brightness of the backlight circuit 110.
Referring to
In addition, in one embodiment, the clock generation circuit 130 can be fabricated in the manufacturing process of the display panel P. The clock generation circuit 130 is formed on the process substrate of the thin-film transistor (TFT) on the display panel P as a thin-film transistor photosensitive circuit (light source sensor) of the display device. Alternatively stated, the clock generation circuit 130 as a light source sensor does not affect the production efficiency and cost of the display device 100.
In some embodiments, the TFT process substrate is made of transistor amorphous silicon (a-Si), low temperature poly-silicon (LTPS) or indium-gallium-zinc-oxide (Indium-Gallium-Zinc-Oxide) and other technologies, which is dependent on light. In other embodiments, the manufacturing process of the display panel P can refer to U.S. Pat. No. 7,682,883, but the present disclosure is not limited to this.
As mentioned above, the clock generation circuit 130 has light dependence, and when the ambient light L changes, the electrical characteristics of the clock generation circuit 130 changes accordingly. Electrical characteristics can be the impedance of an electronic component or the threshold voltage of the transistor switch. In some embodiments, the clock generation circuit 130 includes at least one transistor switch, and the threshold voltage of the transistor switch changes according to the ambient light L. The processing circuit 120 provides a fixed magnitude of the voltage signal Vc to the clock generation circuit. When the ambient light L does not change, the clock frequency of the clock signal CLK output by the clock generation circuit 13 will remain fixed. Therefore, once the clock frequency of the clock signal CLK changes, the processing circuit 120 can determine that the ambient light L has changed. For example, when the threshold voltage of the transistor switch decreases according to the change of the ambient light L, the clock frequency of the clock signal CLK1 generated by the clock generation circuit 130 will increase.
Referring to
The circuit shown in
In the above characteristic formula, tPHL is defined as a delay time when the clock generation circuit 130 controls the clock signal CLK1 to change from the high potential to the low potential. Alternatively stated, the clock generation circuit 130 is configured to determine the delay time between the clock signal CLK1 changing from the high potential to the low potential. tPLH is defined as a delay time when the clock generation circuit 130 controls the clock signal CLK1 to change from the low potential to the high potential. Alternatively stated, the clock generation circuit 130 is configured to determine the delay time between the clock signal CLK1 changing from the low potential to the high potential. F is the frequency of the clock signal CLK1. VTn and VTp are the threshold voltage of N-type TFT and P-type TFT respectively (in this embodiment, the inverter includes N-type TFT or P-type TFT). According to the above characteristic formula, when the threshold voltage of N-type TFT and P-type TFT decreases due to the increase of the ambient light, tPHL and tPLH will decrease, and the clock frequency F will increase.
In addition, in this embodiment, the voltage-controlled oscillator 131 of the clock generation circuit 130 includes a frequency divider 132. The frequency divider 132 is configured to decrease the number of samples of the clock signal CLK1 sampled by the voltage-controlled oscillator 131 to reduce the burden of the processing circuit 120. The frequency divider 132 transmits the processed clock signal CLK1 to the processing circuit 120.
Referring to
The level shifter 125 is configured to adjust the voltage level of Vc to be consistent with the operating voltage in the clock generation circuit 130. The level shifter 126 is configured to adjust the voltage level of the clock signal CLK1 to be consistent with the operating voltage in the processing circuit 120, and is configured to transmit the processed clock signal CLK1 back to the time-to-digital converter 121 through the assisted logic circuit 127.
In some embodiments, the sensor compensator 122 further stores a correction data 122a. The correction data 122a includes a frequency setting value. For example, when the pulse peak of the voltage signal Vc is 5V, the expected frequency (i.e., the frequency setting value) generated by the clock generation circuit 130 should be 3 MHz. The processing circuit 120 is configured to correct the clock generation circuit 130 according to the correction data 122a to avoid errors caused by a “structural difference” between the transistor switches inside the clock generation circuit 130. The above structural difference is the structural difference between the transistors produced in different batches.
As shown in
Referring to
As shown in
In some other embodiments, the clock generation circuit 330 may be implemented by the other types of the voltage-controlled oscillator. Referring to
Referring to
The elements, method steps, or technical features in the foregoing embodiments may be combined with each other, and are not limited to the order of the specification description or the order of the drawings in the present disclosure.
It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present disclosure without departing from the scope or spirit of the present disclosure. In view of the foregoing, it is intended that the present disclosure cover modifications and variations of this present disclosure provided they fall within the scope of the following claims.
Number | Date | Country | Kind |
---|---|---|---|
109109652 | Mar 2020 | TW | national |