The present application claims priority from Japanese application JP 2010-068400 filed on Mar. 24, 2010, the content of which is hereby incorporated by reference into this application.
1. Field of the Invention
The present invention relates to a display device.
2. Description of the Related Art
Display devices such as liquid crystal display devices and organic electroluminescence display devices are driven generally by a matrix method. In the matrix method, a plurality of data lines and a plurality of scanning lines run in intersecting directions. When a scanning signal is input in one of the scanning lines, this scanning line is selected and a signal is applied to a pixel that is associated with the selected scanning line from a relevant data line.
A scanning signal is generated in a scanning circuit, and forming a scanning circuit on a substrate from a thin film is a known practice. A scanning circuit usually includes a shift register, which (particularly one constituted of a thin-film transistor) is susceptible to static electricity. A known way to protect a shift register in a scanning circuit from static electricity is to provide a shielding layer, which is connected to a ground potential, above the scanning circuit (see JP 2009-27123 A).
Forming the shielding layer forms a parasitic capacitance between wiring and the shielding layer. The resultant problem is a delay of a signal that travels through the wiring covered with the shielding layer, which impairs the operational stability of the scanning circuit.
An object of the present invention is to provide a display device that has both the operational stability of a scanning circuit and a countermeasure against static electricity.
(1) A display device according to the present invention includes: a display area which includes a plurality of pixels; a plurality of data lines for supplying a data signal to the plurality of pixels; a plurality of scanning lines to which a scanning signal for selecting a group of pixels out of the plurality of pixels is input; control lines to which a pulse signal is supplied to select one of the plurality of scanning lines to which the scanning signal is input; a scanning circuit which includes transistors controlled with the pulse signal, the scanning circuit being connected to the plurality of scanning lines and being disposed outside the display area; and a conductive mesh including a plurality of conductive wires running in intersecting directions to have a plurality of intersections, in which the conductive mesh is placed above the transistors and the plurality of scanning lines except the display area, under a state in which the conductive mesh is electrically insulated from the transistors and the plurality of scanning lines, and in which, above the plurality of scanning lines, the plurality of conductive wires constituting the conductive mesh intersect each other three-dimensionally in a manner that does not make the plurality of conductive wires parallel to the plurality of scanning lines. According to the present invention, a countermeasure against static electricity is taken by placing the conductive mesh above the transistors and the scanning lines, and the operational stability of the scanning circuit is also accomplished because the conductive wires are not parallel to the scanning lines to keep the parasitic capacitance small.
(2) In the display device as described in Item (1), the conductive mesh may include a portion that is located above the control lines and that is electrically insulated from the control lines, and, in the portion, an interval between every two of the plurality of intersections of the plurality of conductive wires, the every two of the plurality of intersections being adjacent to each other in a direction orthogonal to the plurality of scanning lines, may be wider than in portions of the conductive mesh that are located above the transistors and above the plurality of scanning lines.
(3) In the display device as described in Item (1) or Item (2), at a portion of the conductive mesh that is located above the plurality of scanning lines, an integer multiple of an interval between every two of the plurality of intersections of the plurality of conductive wires, the every two of the plurality of intersections being adjacent to each other in a direction orthogonal to the plurality of scanning lines, may be equal to a pitch between every two of the plurality of pixels that are adjacent to each other.
(4) In the display device as described in any one of Items (1) to (3), the display device may be an organic electroluminescence display device, the display device may further include a pixel electrode disposed in each of the plurality of pixels, and the conductive mesh may be formed on the same layer level as the pixel electrode.
In the accompanying drawings:
An embodiment of the present invention is described below with reference to the drawings.
As illustrated in
As illustrated in
The scanning circuit 40 includes a plurality of flip-flops 44. The flip-flops 44 include thin-film transistors controlled with a pulse signal (a clock signal, for example). To give a more detailed description with reference to
A conductive mesh 46 is formed on the third insulating film 30. The conductive mesh 46 is formed on the same layer level as the pixel electrode 32. For example, the conductive mesh 46 and the pixel electrode 32 are formed at once by the same process (a process that includes forming an etching resist through photolithography and performing etching with the resist as a mask) from the same conductive film.
As illustrated in
As illustrated in
The conductive mesh 46 is disposed such that, in a portion of the conductive mesh 46 that is located above the scanning lines 38, a ratio DE1 of the conductive mesh 46 disposed to total areal dimensions of the scanning lines 38 (wiring density DE1) is 50% to 80%.
For example, in the case where the conductive mesh 46 is formed by intersecting linear conductive wires, it is desirable to adjust an interval d1 between two conductive wire intersections I that are adjacent to each other in a direction orthogonal to the scanning lines 38 within a range from 10 μm to 200 μm, and to adjust the wiring width within a range from 6 μm to 30 μm. An integer multiple of the interval d1 equals the pitch between two adjacent pixels 10.
The conductive mesh 46 is also placed in a portion above the control lines 42 while being electrically insulated from the control lines 42. The conductive mesh 46 in this portion is disposed such that a ratio DE2 of the conductive mesh 46 disposed to the total areal dimensions of the control lines 42 (wiring density DE2) is smaller than the wiring density DE1, which is the density of the conductive mesh 46 disposed in the portions above the thin-film transistors and above the scanning lines 38. In short, the wiring densities DE1 and DE2 have a relation expressed by DE1>DE2.
For the portion of the conductive mesh 46 that is placed above the region where the control lines 42 are disposed, it is desirable to adjust an interval d2 between two conductive wire intersections I that are adjacent to each other in the direction orthogonal to the scanning lines 38 within, for example, a range from 40 μm to 200 μm, and to adjust the wiring width within, for example, a range from 4 μm to 30 μm.
The interval between two conductive wire intersections I is larger in the region where the control lines 42 are disposed than in the region where the scanning lines 38 are disposed. In short, the intervals d1 and d2 satisfy a relation d1<d2. In this embodiment, the interval d1 in the direction orthogonal to the scanning lines 38 is equal to an interval D between two adjacent scanning lines 38.
If the control lines 42 and the conductive mesh 46 intersect at more points, a parasitic capacitance between the control lines 42 and the conductive mesh 42 increases, causing a data delay in the control lines 42. In the control lines 42 in particular, the delay of an output signal due to a parasitic capacitance is larger than in the flip-flops 44 and the scanning lines 38. By keeping the areal dimensions of intersections between the control lines 42 and the conductive mesh 46 small as illustrated in
According to this embodiment, a countermeasure against static electricity is taken by placing the conductive mesh 46 above the thin-film transistors (a part of the flip-flops 44) and the scanning lines 38. The operational stability of the scanning circuit 40 is also accomplished in this embodiment because the conductive wires are not parallel to the scanning lines 38 and the parasitic capacitance is thus kept small.
The present invention is not limited to the embodiment described above, and is receptive of various modifications. For instance, the structure described in the embodiment can be replaced with a structure that is practically the same as the structure of the embodiment, a structure that has the same effects, or a structure that can accomplish the same object.
Number | Date | Country | Kind |
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2010-068400 | Mar 2010 | JP | national |