The present application claims priority from Japanese application JP 2012-167883 filed on Jul. 30, 2012, the content of which is hereby incorporated by reference into this application.
1. Field of the Invention
The present invention relates to a display device such as a liquid crystal display device, and more particularly to a technique effectively applied to a two-dimensional address type display device.
2. Description of the Related Art
As shown in
Regions surrounded by the scanning lines (GL) and the video lines (DL) are sub-pixel regions. In each of the sub-pixel regions, a thin film transistor (TFT) is disposed. The thin film transistor constitutes an active element whose gate, drain (or source), and source (or drain) are connected to the scanning line, the video line, and a pixel electrode (PX), respectively. Since liquid crystal is present between the pixel electrode (PX) and a counter electrode (also referred to as common electrode) (CT), a liquid crystal capacitor (Clc) is formed between the pixel electrode (PX) and the counter electrode (CT). Although a storage capacitor (Ckdd) is actually disposed between the pixel electrode (PX) and the counter electrode (CT), the storage capacitor (Ckdd) is not shown in
Each of the scanning lines (GL) is connected to a vertical scanning circuit (also referred to as gate driver) (XDV). The vertical scanning circuit (XDV) sequentially supplies a selection scanning signal to each of the scanning lines (GL).
Each of the video lines (DL) is connected to a horizontal scanning circuit (also referred to as source driver or drain driver) (YDV). The horizontal scanning circuit (YDV) outputs R, G, and B video voltages (so-called gray-scale voltages) to each of the video lines (DL) in one horizontal scanning period.
In
In a small panel such as a liquid crystal display panel used in a mobile phone or the like, it is conceivable that wirings cannot be wired in the liquid crystal display panel when the number of pixels is increased due to an increase in definition.
To solve the problem, JP 2010-078896 A and JP 2010-250134 A each disclose the use of an address decoder circuit for the vertical scanning circuit (XDV).
However, with a further increase in definition of a liquid crystal display panel, a display drive frequency also becomes high.
Then, when the address decoder circuits disclosed in JP 2010-078896 A and JP 2010-250134 A are used each as a drive circuit in a liquid crystal display panel, a drive speed may not make it in time.
The invention has been made to solve the problem in the related art, and it is an object of the invention to provide a technique enabling the prevention of malfunction in a display device using an address decoder circuit as a drive circuit even when a display drive frequency becomes high.
The above and other objects and novel features of the invention will be apparent from the description of the specification and the accompanying drawings.
Typical outlines of the invention disclosed herein will be briefly described below.
(1) A display device includes: a plurality of pixels; a plurality of first scanning lines inputting a first scanning voltage to the plurality of pixels; a plurality of second scanning lines inputting a second scanning voltage to the plurality of pixels; and a scanning line drive circuit supplying the scanning voltages to the pluralities of first and second scanning lines, wherein when N is an integer of 2 or more, the first scanning lines and the second scanning lines are grouped into kN× . . . ×k2 groups, and address decoder circuits at first to (N−1)th stages, which drive scanning lines in each of the groups at the first to (N−1)th stages, are composed of CMOS circuits.
(2) A display device includes: a plurality of pixels; a plurality of scanning lines inputting a scanning voltage to the plurality of pixels; and a scanning line drive circuit supplying the scanning voltage to the plurality of scanning lines, wherein when N is an integer of 2 or more, the scanning lines are grouped into kN× . . . ×k2 groups, and address decoder circuits at first to (N−1)th stages, which drive scanning lines in each of the groups, are composed of CMOS circuits.
(3) Moreover, the absolute value of gate voltages of a p-type transistor and an n-type transistor that constitute a CMOS circuit is made higher than that of drive pulse voltages input to the p-type transistor and the n-type transistor that constitute the CMOS circuit.
(4) Moreover, the address decoder circuit at the first stage outputs a selection scanning voltage to the scanning lines in a cycle of (k1+1) horizontal scanning periods.
A typical effect obtained by the invention disclosed herein will be briefly described below.
According to the invention, a malfunction can be prevented in a display device using an address decoder circuit as a drive circuit even when a display drive frequency becomes high.
Hereinafter, an embodiment of the invention will be described in detail with reference to the drawings.
Throughout the drawings for explaining the embodiment, components having the same function are denoted by the same reference numeral and sign, and the repetitive description thereof is omitted. The embodiment described below does not limit the interpretation of the scope of claims of the invention.
In the embodiment as shown in
In the liquid crystal display panel of the embodiment, a parallel circuit composed of a p-type MOS transistor (pTFT) and an n-type MOS transistor (nTFT) is used, instead of the thin film transistor (TFT) shown in
A gate of the p-type MOS transistor (pTFT) is connected to a first scanning line (pGL), a drain (or source) thereof is connected to a video line (DL), and a source (or drain) thereof is connected to a pixel electrode (PX). A gate of the n-type MOS transistor (nTFT) is connected to a second scanning line (nGL), a drain (or source) thereof is connected to the video line (DL), and a source (or drain) thereof is connected to the pixel electrode (PX).
Since liquid crystal is present between the pixel electrode (PX) and a counter electrode (also referred to as common electrode) (CT), a liquid crystal capacitor (Clc) is formed between the pixel electrode (PX) and the counter electrode (CT). Although a storage capacitor (Ckdd) is actually disposed between the pixel electrode (PX) and the counter electrode (CT), the storage capacitor (Ckdd) is not shown in
Each of the video lines (DL) is connected to the drive circuit (RDV) having the horizontal scanning circuit and the vertical scanning circuit incorporated therein. The drive circuit (RDV) outputs R, G, and B video voltages (so-called gray-scale voltages) to the video line (DL) in one horizontal scanning period.
In
The liquid crystal display panel of the embodiment is configured as follows: a first substrate (also referred to as TFT substrate or active matrix substrate) (not shown) on which pixel electrodes, active elements, and the like are disposed and a second substrate (also referred to as counter substrate) (not shown) on which color filters and the like are formed are overlapped with each other with a predetermined gap therebetween; the substrates are bonded together with a frame-shaped sealing material disposed between the substrates in the vicinity of peripheral portions thereof; liquid crystal is filled inside the sealing material between the substrates from a liquid crystal filling port disposed at a portion of the sealing material and sealed therein; and further a polarizer is attached to the outside of each of the substrates.
In this manner, the liquid crystal display panel of the embodiment has a structure in which liquid crystal is interposed between the pair of substrates. When the liquid crystal display panel is of a TN type or VK type, the counter electrode is disposed on the second substrate (counter substrate) side. When the liquid crystal display panel is of an IPS type, the counter electrode is disposed on the first substrate (TFT substrate) side.
Since the invention has no relationship with the internal structure of the liquid crystal display panel, detailed description of the internal structure of the liquid crystal display panel is omitted. Further, the invention can be applied to liquid crystal display panels of any structure.
Hereinafter, the liquid crystal display panel of the embodiment will be described using an example in which the number of each of the first scanning lines (pGL) and the second scanning lines (nGL) is 1280.
In the embodiment, the first scanning lines (pGL) and the second scanning lines (nGL) are grouped into k2 groups. The numbers of the first scanning lines (pGL) and the second scanning lines (nGL) in each of the groups are equal to each other and each up to k1. Here, k1 is an integer of k2 or less.
In
Moreover, the drive circuit (RDV) has a first terminal group (G0) and a second terminal group (G1). The first terminal group (G0) has terminals that output 1st to 36th positive-phase voltages and terminals that output
In the embodiment, one end of each of the first scanning lines (pGL) is connected to a parallel circuit composed of a p-type MOS transistor (TP1) and an n-type MOS transistor (TN1). Between each of the first scanning lines (pGL) and a positive-side reference power source (herein, a voltage VDD whose voltage level is High level (hereinafter referred to as H level)), a p-type MOS transistor (TP3) is connected for preventing the first scanning line (pGL) from being brought into a floating state when a non-selection scanning voltage is supplied to each of the first scanning lines (pGL).
One end of each of the second scanning lines (nGL) is connected to a parallel circuit composed of a p-type MOS transistor (TP2) and an n-type MOS transistor (TN2). Between each of the second scanning lines (nGL) and a negative-side reference power source (herein, a voltage VSS whose voltage level is Low level (hereinafter referred to as L level)), an n-type MOS transistor (TN3) is connected for preventing the second scanning line (nGL) from being brought into a floating state when a non-selection scanning voltage is supplied to each of the second scanning lines (nGL).
Here, gate wirings connected to the terminals that output the negative-phase voltages are defined as first gate wirings, while gate wirings connected to the terminals that output the positive-phase voltages are defined as second gate wirings. A gate of the p-type MOS transistor (TP1), a gate of the p-type MOS transistor (TP2), and a gate of the n-type MOS transistor (TN3) are connected to one of the first gate wirings connected to the terminals that output the negative-phase voltages in the second terminal group (G1). A gate of the n-type MOS transistor (TN1), a gate of the n-type MOS transistor (TN2), and a gate of the p-type MOS transistor (TP3) are connected to one of the second gate wirings connected to the terminals that output the positive-phase voltages in the second terminal group (G1).
A source (or drain) of the p-type MOS transistor (TP1) and a source (or drain) of the n-type MOS transistor (TN1) are connected to one of the first gate wirings connected to the terminals that output the negative-phase voltages in the first terminal group (G0). A source (or drain) of the p-type MOS transistor (TP2) and a source (or drain) of the n-type MOS transistor (TN2) are connected to one of the second gate wirings connected to the terminals that output the positive-phase voltages in the first terminal group (G0).
In
As shown by G0-1 to G0-36 in
Moreover, as shown by G1-1 to G1-36 in
That is, the drive circuit (RDV) sequentially outputs, every 36 horizontal scanning periods, the selection scanning voltage and the reverse voltage of the selection scanning voltage to a bundle of 36 first scanning lines (pGL) and a bundle of 36 second scanning lines (nGL), respectively.
When the selection scanning voltage at H level is output to one terminal selected in the terminals that output the 1st to 36th positive-phase voltages in the second terminal group (G1), the n-type MOS transistors (TN1) and n-type MOS transistors (TN2) whose gates are connected to the second gate wiring that is connected to the selected one terminal are turned on, while the p-type MOS transistors (TP3) whose gates are connected to the second gate wiring that is connected to the selected one terminal are turned off.
Moreover, when the reverse voltage at L level (that is, a reverse voltage of the selection scanning voltage at H level) is output to one terminal selected in the terminals that output the
Next, when the selection scanning voltage at H level is output to one terminal selected in the terminals that output the 1st to 36th positive-phase voltages in the first terminal group (G0), the selection scanning voltage at H level is output, via the second gate wiring and the p-type MOS transistor (TP2) and the n-type MOS transistor (TN2) that are turned on, to the second scanning line (nGL) that is connected to the selected one terminal.
At the same time, when the reverse voltage at L level (that is, a voltage obtained by reversing the selection scanning voltage at H level) is output to one terminal selected in the terminals that output the
Due to this, both the p-type MOS transistors (pTFT) and the n-type MOS transistors (nTFT) are turned on, and a video voltage is written from video lines (DL1 to DL720) to the pixel electrode (PX), whereby an image is displayed on the liquid crystal display panel.
In the embodiment, when the numbers of terminals of the first terminal group (G0) and the second terminal group (G1) are equal to each other in case of the total number 1280 of the first scanning lines (pGL) and the total number 1280 of the second scanning lines (nGL), the number of gate wirings connected to the respective terminals of the first terminal group (G0) and the second terminal group (G1) is minimized.
In the embodiment, the number of the second gate wirings connected to the terminals that output the 1st to 36th positive-phase voltages in the first terminal group (G0) is 36; the number of the first gate wirings connected to the terminals that output the
That is, when wirings are disposed from the drive circuit (RDV) to all of the first scanning lines (pGL) and all of the second scanning lines (nGL) in one-to-one correspondence, 2560 gate wirings are required. In the embodiment, however, the number of wirings is 144, so that the number of wirings can be reduced.
In the embodiment, the case where the first scanning lines (pGL) and the second scanning lines (nGL) are driven using two kinds of terminal groups, the first terminal group (G0) and the second terminal group (G1) (this is referred to as driving by a two-stage configuration), has been described. However, the first scanning lines (pGL) and the second scanning lines (nGL) can be driven by a three-or-more-stage configuration using three kinds or more of terminal groups.
When the drive circuit (RDV) has N kinds of terminal groups and the number of terminals of each of the terminal groups is kn (1≦kn≦N), the total number of gate wirings can be close to the minimum in the case where a difference between a maximum number (maximum kn) and a minimum number (minimum kn) in the numbers of terminals of the terminal groups is 3 or less.
In the embodiment and a modified example described later, two scanning lines, the first scanning line (pGL) and the second scanning line (nGL), are disposed for the reason that an active element in each pixel is composed of the parallel circuit having the p-type MOS transistor (pTFT) and the n-type MOS transistor (nTFT). If an active element in each pixel is composed only of the n-type MOS transistor (nTFT), there is no need to dispose the first scanning line (pGL), the p-type MOS transistor (TP1), the n-type MOS transistor (TN1), and the p-type MOS transistor (TP3). Hence, the terminals that output the
Similarly, if an active element in each pixel is composed only of the p-type MOS transistor (pTFT), there is no need to dispose the second scanning line (nGL), the p-type MOS transistor (TP2), the n-type MOS transistor (TN2), and the n-type MOS transistor (TN3). Hence, the terminals that output the 1st to 36th positive-phase voltages in the first terminal group (G0) and the second gate wirings that are connected to the terminals are also unnecessary.
In the embodiment, transistors constituting an address decoder circuit have a CMOS configuration including the p-type MOS transistors (TP1 to TP3) and the n-type MOS transistors (TN1 to TN3) for the reason that the rising or falling of a selection scanning voltage (or a reverse voltage of the selection scanning voltage) is made faster to increase the operating speed. For a further increase in speed, gate voltages (a selection scanning voltage and a reverse voltage of the selection scanning voltage that are output from the second terminal group (G1)) applied to the gates of the p-type MOS transistors (TP1 to TP3) and n-type MOS transistors (TN1 to TN3) may be made higher than drive pulse voltages (a selection scanning voltage and a reverse voltage of the selection scanning voltage that are output from the first terminal group (G0)). The term rising of a selection scanning voltage indicates a change in selection scanning voltage from L level to H level, while the term falling of a selection scanning voltage indicates a change in selection scanning voltage from H level to L level.
However, when the drive speed is further increased, glitch noise having a spike shape might occur between the selection scanning voltage and the reverse voltage of the selection scanning voltage that are output from the first terminal group (G0) due to a delay difference of pulse voltage or due to a relationship between the operating speeds of the transistors of the CMOS configuration, in switching between the selection scanning voltage and the reverse voltage of the selection scanning voltage that are output from the second terminal group (G1).
As shown in
When this noise occurs, the n-type MOS transistors (nTFT) whose gates are connected to the 72th second scanning line are turned on and a video voltage is written to a pixel that should not be originally written, causing a malfunction.
To solve this, a drive timing is changed as shown in
The cycles of the selection scanning voltage output from the terminals that output the positive-phase voltages and the cycles of the reverse voltage of the selection scanning voltage output from the terminals that output the negative-phase voltages in the first terminal group (G0) are changed from 36 horizontal scanning periods to 37 horizontal scanning periods. In accordance with the changing, settings are changed such that the falling (or rising) timing of the selection scanning voltage output from the terminals that output the positive-phase voltages and the rising (or falling) timing of the reverse voltage of the selection scanning voltage output from the terminals that output the negative-phase voltages in the second terminal group (G1) occur in the middle of a 37th horizontal scanning period.
Moreover, since it is unnecessary to write an image in a sub-pixel in the 37th horizontal scanning period, a video voltage is not output to the video line (DL) in the 37th horizontal scanning period, or a dummy video voltage is output thereto.
As shown by the drive timing in
In the modified example shown in
In the modified example of
The drive circuit (RDV) has the first terminal group (G0) and the second terminal group (G1). The first terminal group (G0) has terminals that output 1st to 48th positive-phase voltages and terminals that output
In the modified example shown in
Also in the modified example shown in
Also in the modified example, one end of each of the first scanning lines (pGL) is connected to a parallel circuit composed of the p-type MOS transistor (TP1) and the n-type MOS transistor (TN1). Between each of the first scanning lines (pGL) and the positive-side reference power source (herein, the voltage VDD whose voltage level is H level), the p-type MOS transistor (TP3) is connected for preventing the first scanning line (pGL) from being brought into a floating state when a non-selection scanning voltage is supplied to each of the first scanning lines (pGL).
One end of each of the second scanning lines (nGL) is connected to a parallel circuit composed of the p-type MOS transistor (TP2) and the n-type MOS transistor (TN2). Between each of the second scanning lines (nGL) and the negative-side reference power source (herein, the voltage VSS whose voltage level is L level), the n-type MOS transistor (TN3) is connected for preventing the second scanning line (nGL) from being brought into a floating state when a non-selection scanning voltage is supplied to each of the second scanning lines (nGL).
A gate of the p-type MOS transistor (TP1), a gate of the p-type MOS transistor (TP2), and a gate of the n-type MOS transistor (TN3) are connected to one of the first gate wirings connected to the terminals that output the negative-phase voltages in the second terminal group (G1). A gate of the n-type MOS transistor (TN1), a gate of the n-type MOS transistor (TN2), and a gate of the p-type MOS transistor (TP3) are connected to one of the first gate wirings connected to the terminals that output the positive-phase voltages in the second terminal group (G1).
A source (or drain) of the p-type MOS transistor (TP1) and a source (or drain) of the n-type MOS transistor (TN1) are connected to one of the first gate wirings connected to the terminals that output the negative-phase voltages in the first terminal group (G0). A source (or drain) of the p-type MOS transistor (TP2) and a source (or drain) of the n-type MOS transistor (TN2) are connected to one of the first gate wirings connected to the terminals that output the positive-phase voltages in the first terminal group (G0).
As shown in
As described above in the modified example shown in
In the above description, the p-type MOS transistors (TP1 to TP3) and the n-type MOS transistors (TN1 to TN3) are composed of p-Si thin film transistors. Although, in the embodiment described above, the invention has been described in conjunction with an embodiment in which the invention is applied to a liquid crystal display device, the invention is not limited thereto. It is needless to say that the invention can be applied to an organic EL display device or another display device having scanning lines and a scanning line drive circuit.
While there have been described what are at present considered to be certain embodiments of the invention, it will be understood that various modifications may be made thereto, and it is intended that the appended claims cover all such modifications as fall within the true spirit and scope of the invention.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2012-167883 | Jul 2012 | JP | national |