This application is based upon and claims the benefit of priority from Japanese Patent Application No. 2023-032017, filed Mar. 2, 2023, the entire contents of which are incorporated herein by reference.
Embodiments described herein relate generally to a display device.
Recently, display devices to which an organic light emitting diode (OLED) is applied as a display element have been put into practical use. The display element comprises a lower electrode, an organic layer which covers the lower electrode, and an upper electrode which covers the organic layer.
Generally, organic layers have low resistance to moisture. If moisture reaches an organic layer for some reason, it can be a contributing factor to a decrease in the display quality, such as a decrease in the luminance of the display element when emitting light. In addition, if moisture enters the drive circuits located in the peripheral areas surrounding the display area, the elements which constitute the drive circuits may deteriorate, resulting in malfunctions in the operation of the display device.
In general, according to one embodiment, a display device includes a substrate, an insulating layer, a lower electrode, a rib, a partition, an upper electrode, an organic layer, a dam structure, and a conductive layer. The insulating layer is disposed above the substrate. The lower electrode is disposed above the insulating layer in a display area including pixels. The rib includes an aperture overlapping the lower electrode. The partition is disposed above the rib in the display area. The upper electrode opposes the lower electrode and connected to the partition. The organic layer is disposed between the lower electrode and the upper electrode and emitting light according to a potential difference between the lower electrode and the upper electrode. The dam structure includes at least one convex portion disposed in the peripheral area between an end portion of the substrate and the display area. The conductive layer is disposed in the peripheral area and connected to the partition. The upper electrode and the organic layer are disposed in the peripheral area as well. End portions of the upper electrode and the organic layer are located between the dam structure and the display area in plan view. An end portion of the conductive layer is located between the end portions of the upper electrode and the organic layer and the display area in plan view, and is covered by the upper electrode and organic layer.
Embodiments will be described with reference to the accompanying drawings.
Note that the disclosure is merely an example, and proper changes in keeping with the spirit of the invention, which are easily conceivable by a person of ordinary skill in the art, come within the scope of the invention as a matter of course. In addition, in some cases, in order to make the description clearer, the drawings show schematic illustration rather than as an accurate representation of what is implemented. However, such schematic illustration is merely exemplary, and in no way restricts the interpretation of the invention. In addition, in the specification and drawings, structural elements which function in the same or a similar manner to those described in connection with preceding drawings are denoted by like reference numbers, detailed description thereof being omitted unless necessary.
In the drawings, in order to facilitate understanding, an X-axis, a Y-axis and a Z-axis orthogonal to each other are shown depending on the need. A direction parallel to the X-axis is referred to as a first direction. A direction parallel to the Y-axis is referred to as a second direction. A direction parallel to the Z-axis is referred to as a third direction. Further, viewing various elements in parallel with the third direction Z is referred to as planar view.
The display devices of the embodiments are each an organic electroluminescent display device comprising an organic light emitting diode (OLED) as a display element, and is mounted on televisions, personal computers, in-vehicle devices, tablet terminals, smartphones, mobile phones and the like.
In this embodiment, the shape of the substrate 10 in plan view is rectangular. However, the shape of the substrate 10 in plan view is not limited to rectangular, but may be some other shape such as a square, circle or oval.
The display area DA comprises a plurality of pixels PX arranged in a matrix along the first direction X and the second direction Y. Each of the pixels PX includes a plurality of subpixels SP. For example, the pixel PX includes a red subpixel SP1, a green subpixel SP2, and a blue subpixel SP3. Note that the pixel PX may include a subpixel SP of some other color, such as white, together with or in place of any of the subpixels SP1, SP2, and SP3.
The subpixel SP comprises a pixel circuit 1 and a display element 20 driven by the pixel circuit 1. The pixel circuit 1 comprises a pixel switch 2, a drive transistor 3, and a capacitor 4. The pixel switch 2 and the drive transistor 3 are switching elements constituted by thin-film transistors, for example.
A gate electrode of the pixel switch 2 is connected to a scanning line GL. One of source and drain electrodes of the pixel switch 2 is connected to a signal line SL, and the other is connected to a gate electrode of the drive transistor 3 and the capacitor 4. In the drive transistor 3, one of source and drain electrodes is connected to a power line PL and the capacitor 4, and the other is connected to the display element 20.
The display element 20 is an organic light emitting diode (OLED) as a light emitting element. For example, the subpixel SP1 comprises a display element 20 which emits light in a red wavelength range, the subpixel SP2 comprises a display element 20 which emits light in a green wavelength range, and the subpixel SP3 comprises a display element 20 which emits light in a blue wavelength range.
Note that the configuration of the pixel circuit 1 is not limited to that of the example shown in the figure. For example, the pixel circuit 1 may as well be provided with more thin-film transistors and capacitors.
When the subpixels SP1, SP2, and SP3 are arranged in such a layout, rows in which the subpixels SP1 and SP2 are arranged alternately along the second direction Y and rows in which a plurality of subpixels SP3 are arranged repeatedly along the second direction Y are formed in the display area DA. These rows are arranged alternately along the first direction X.
The layout of subpixels SP1, SP2, and SP3 is not limited to the example in
A rib 5 and a partition 6 are disposed in the display area DA. The rib 5 comprises pixel apertures AP1, AP2, and AP3 in subpixels SP1, SP2, and SP3, respectively. In the example of
The partition 6 is disposed in the boundary between each adjacent pair of the subpixels SP and overlaps the rib 5 in plan view. The partition 6 includes a plurality of first partitions 6x extending along the first direction X and a plurality of second partitions 6y extending along the second direction Y. The plurality of first partitions 6x are each disposed between each respective pair of pixel apertures AP1 and AP2 adjacent to each other along the second direction Y and between each respective pair of pixel apertures AP3 adjacent to each other along the second direction Y. The second partitions 6y are each disposed between each pair of pixel apertures AP1 and AP3 adjacent to each other along the first direction X and between each pair of pixel apertures AP2 and AP3 adjacent to each other along the first direction X.
In the example of
The subpixel SP1 comprises a lower electrode LE1, an upper electrode UE1, and an organic layer OR1, each of which overlaps the pixel apertures AP1. The subpixel SP2 comprises a lower electrode LE2, an upper electrode UE2, and an organic layer OR2, each of which overlaps the pixel aperture AP2. The subpixel SP3 comprises a lower electrode LE3, an upper electrode UE3, and an organic layer OR3, each of which overlaps the pixel aperture AP3. In the example of
The lower electrode LE1, the upper electrode UE1 and the organic layer OR1 constitute the display element 20 of the subpixel SP1. The lower electrode LE2, the upper electrode UE2 and the organic layer OR2 constitute the display element 20 of the subpixel SP2. The lower electrode LE3, the upper electrode UE3, and the organic layer OR3 constitute the display element 20 of the subpixel SP3.
The lower electrode LE1 is connected to the pixel circuit 1 of the subpixel SP1 (see
In the example of
The lower electrodes LE1, LE2, and LE3 are disposed on the organic insulating layer 12. The rib 5 is disposed on the organic insulating layer 12 and the lower electrodes LE1, LE2, and LE3. End portions of the lower electrodes LE1, LE2, LE3 are covered by the rib 5.
The partition 6 includes a conductive lower portion 61 disposed on the rib 5 and an upper portion 62 disposed on the lower portion 61. The upper portion 62 has a greater width than that of the lower portion 61. With this configuration, in
The organic layer OR1 covers the lower electrode LE1 through the pixel aperture AP1. The upper electrode UE1 covers the organic layer OR1 and opposes the lower electrode LE1. The organic layer OR2 covers the lower electrode LE2 through the pixel aperture AP2. The upper electrode UE2 covers the organic layer OR2 and opposes the lower electrode LE2. The organic layer OR3 covers the lower electrode LE3 through the pixel aperture AP3. The upper electrode UE3 covers the organic layer OR3 and opposes the lower electrode LE3.
In the example of
Parts of the organic layer OR1, the upper electrode UE1 and the cap layer CP1 are located on the upper portion 62. These parts are separated from other parts of the organic layer OR1, the upper electrode UE1 and the cap layer CP1. Similarly, parts of the organic layer OR2, the upper electrode UE2 and the cap layer CP2 are located on the upper portion 62, and these parts are separated from other parts of the organic layer OR2, the upper electrode UE2 and the cap layer CP2. Further, parts of the organic layer OR3, the upper electrode UE3 and the cap layer CP3 are located on the upper portion 62, and these parts are separated from other parts of the organic layer OR3, the upper electrode UE3 and the cap layer CP3.
Sealing layers SE1, SE2, and SE3 are disposed in the subpixels SP1, SP2, and SP3, respectively. The sealing layer SE1 continuously covers the cap layer CP1 and the partition 6. The sealing layer SE2 continuously covers the cap layer CP2 and the partition 6. The sealing layer SE3 continuously covers the cap layer CP3 and the partition 6.
In the example of
The sealing layers SE1, SE2, and SE3 are covered by a resin layer 13. The resin layer 13 is covered by a sealing layer 14. Further, the sealing layer 14 is covered by a resin layer 15.
The organic insulating layer 12 and the resin layers 13 and 15 are formed of organic materials. The ribs 5 and the sealing layers 14, SE1, SE2, and SE3 are formed of an inorganic material such as silicon nitride (SiNx). The rib 5 and the sealing layers 14, SE1, SE2, and SE3 may as well be formed as a single layer of one of silicon oxide (SiOx), silicon oxynitride (SiON) or aluminum oxide (Al2O3). The rib 5 and the sealing layers 14, SE1, SE2, and SE3 may be formed as a stacked body of a combination of at least two of a silicon nitride layer, a silicon oxide layer, a silicon oxynitride layer and an aluminum oxide layer.
The upper electrodes UE1, UE2, and UE3 are formed of a metal material, such as an alloy of magnesium and silver (MgAg). When the potential of the lower electrodes LE1, LE2, and LE3 is relatively higher than that of the upper electrodes UE1, UE2, and UE3, the lower electrodes LE1, LE2, and LE3 are equivalent to anodes and the upper electrodes UE1, UE2, and UE3 are equivalent to cathodes. On the other hand, when the potential of the upper electrodes UE1, UE2, and UE3 is relatively higher than that of the lower electrodes LE1, LE2, and LE3, the upper electrodes UE1, UE2, UE3 are equivalent to the anodes and the lower electrodes LE1, LE2, and LE3 are equivalent to the cathodes.
The organic layers OR1, OR2, and OR3 include a pair of functional layers and a light-emitting layer positioned between these functional layers. For example, the organic layers OR1, OR2 and OR3 have a structure in which a hole injection layer, a hole transport layer, an electron blocking layer, an emission layer, a hole blocking layer, an electron transport layer and an electron injection layer are stacked in order.
The cap layers CP1, CP2, and CP3 are formed, for example, by a multilayer of a plurality of transparent thin films. The multilayers may include, as the plurality of thin films, thin films formed of inorganic materials and thin films formed of organic materials. These plurality of thin films have refractive indices different from each other. The materials of the thin films which constitute the plurality of layers are different from the materials of the upper electrodes UE1, UE2, and UE3, and also from the materials of the sealing layers SE1, SE2, and SE3. Note that the cap layers CP1, CP2, and CP3 may be omitted.
A common voltage is supplied to the partition 6. The common voltage is supplied to each of the upper electrodes UE1, UE2, and UE3, which are in contact with the side surfaces of the lower portion 61. To the lower electrodes LE1, LE2, LE3, pixel voltages are supplied via through the respective pixel circuits 1 of the subpixels SP1, SP2, and SP3.
When a potential difference is created between the lower electrode LE1 and the upper electrode UE1, the light-emitting layer of the organic layer OR1 emits light in the red wavelength range. When a potential difference is created between the lower electrode LE2 and the upper electrode UE2, the light-emitting layer of the organic layer OR2 emits light in the green wavelength range. When a potential difference is created between the lower electrode LE3 and the upper electrode UE3, the light-emitting layer of the organic layer OR3 emits light in the blue wavelength range.
Next, the structure that can be applied to the peripheral area SA will be described.
The first gate drive circuit GD1 and the second gate drive circuit GD2 supply scanning signals to the scanning lines GL shown in
The substrate 10 includes a first end portion E1, a second end portion E2, a third end portion E3 and a fourth end portion E4. The first end portion E1 and the second end portion E2 extend parallel to the second direction Y. The third end portion E3 and the fourth end portion E4 extend parallel to the first direction X.
In the example of
Further, the display device DSP is provided with a conductive layer CL (portion with a dotted pattern) and a dam structure DS (portion with a shaded pattern), located in the peripheral area SA. In the example in
The conductive layer CL is connected to the partition 6 disposed in the display area DA. The conductive layer CL overlaps the first gate drive circuit GD1, the second gate drive circuit GD2 and the selector circuit ST in plan view.
Note that the conductive layer CL does not necessarily need to have a shape that surrounds the display area DA. For example, the conductive layer CL may not be located between the display area DA and the third end portion E3 or between the display area DA and the fourth end portion E4.
In
The power feed line PW includes a pair of pads PD located near the third end portion E3. These pads PD are electrically connected to the terminal portion T. A common voltage is supplied to the power feed line PW via the terminal portion T and each pad PD. Further, the common voltage of the power feed line PW is supplied to the relay wiring line RL.
As shown in
As shown in
The interval between any two of convex portions R1, R2, R3 and R4 adjacent to each other is larger than the width of each of the convex portions R1, R2, R3, and R4. For example, the width of each of the convex portions R1, R2, R3, and R4 is 15 to 25 μm, and the interval between any two of convex portions R1, R2, R3, and R4 adjacent to each other is 25 to 35 μm. The height of each of the convex portions R1, R2, R3, and R4 is 3 to 4 μm.
In the example of
The insulating layers 31, 32 and 33 are each formed of an inorganic material such as silicon nitride or silicon oxide. The metal layers 41, 42, and 43 have a single-layer of a metal material such as molybdenum (Mo), tungsten (W), molybdenum-tungsten alloy (MoW), aluminum (Al) or copper (Cu), or of a stacked-layer structure of any combination of these metals.
The first gate drive circuit GD1 is formed of the metal layers 41, 42 and 43 and semiconductor layers. The second gate drive circuit GD2 and the selector circuit ST shown in
The convex portions R1, R2, R3, R4 are disposed on the insulating layer 33. The rib 5 is disposed on the peripheral area SA as well. As shown in
The conductive layer CL includes a lower portion 61 and an upper portion 62 as in the case of the partition 6 shown in
As shown in
The end portion CLa of the conductive layer CL is located between the end portion 12a of the organic insulating layer 12 and the first convex portion R1 all around the circumference thereof. In other words, as shown in
In the example of
The relay wiring line RL is mostly located on the organic insulating layer 12 and covered by the rib 5. The relay wiring line RL is formed of the same material and by the same manufacturing process as those of the lower electrodes LE1, LE2, and LE3.
The relay wiring line RL is connected to the power feed line PW at a first contact portion CN1 and to the conductive layer CL at a second contact portion CN2. With this configuration, the common voltage of the feed line PW is supplied to the conductive layer CL via the relay wiring line RL. Further, the common voltage of the conductive layer CL is supplied to the partition 6 and the upper electrodes UE1, UE2, and UE3 in the display area DA.
The first contact portion CN1 is located between the end portion 12a of the organic insulating layer 12 and the first convex portion R1. In the first contact portion CN1, a lower surface of the relay wiring line RL is in contact with the second portion P2 of the feed line PW, and an upper surface of the relay wiring line RL is covered by the rib 5.
The first contact portion CN1 is equivalent to the area where the power feed line PW and the relay wiring line RL overlap in
As shown in
In the example of
As shown in
The conductive layer CL comprises a plurality of apertures APa aligned at regular intervals along the first direction X as well as the second direction Y. In the example of
When forming the conductive layer CL and the partition 6, base layers, which give rise to the lower portion 61 and the upper portion 62, are first formed in the display area DA and the peripheral area SA, entirely, and these layers are patterned into the shape of the conductive layer CL and the partition 6 by etching. In the display area DA, there are many apertures (areas surrounded by the first and second partitions 6x and 6y) corresponding respectively to the subpixel SP1, SP2, and SP3. If the density of such apertures differs between the display area DA and the peripheral area SA, it may not be possible to achieve uniform etching progress. As a solution to this, a plurality of apertures APa may be provided in the conductive layer CL, and thus the etching progress can be made uniform between the display area DA and the peripheral area SA.
As shown in
The organic layer ORs is formed by the same manufacturing process and of the same material as those of any of the organic layers OR1, OR2, and OR3. The upper electrode UEs is formed by the same manufacturing process and of the same material as those of any one of the upper electrodes UE1, UE2, and UE3. The cap layer CPs is formed by the same manufacturing process and of the same material as those of any one of the cap layers CP1, CP2 and CP3. The sealing layer SEs is formed by the same manufacturing process and of the same material as those of any one of the sealing layers SE1, SE2, and SE3. For example, the organic layer ORs, the upper electrode UEs, the cap layer CPs, and the sealing layer SEs are formed by the same manufacturing process and of the same material as those of the organic layer OR3, the upper electrode UE3, the cap layer CP3, and the sealing layer SE3, respectively.
The resin layer 13 (first resin layer) is formed, for example, by an ink-jet method. The unevenness of the sealing layer SEs, created by the convex portions R1, R2, R3, and R4 suppresses the spreading of the resin layer 13 before curing. In
Note that, in
In the display device DSP of the above-described embodiment, the partition 6 disposed in the display area DA is connected to the conductive layer CL disposed in the peripheral area SA. Further, the partition 6 is connected to the upper electrodes UE1, UE2, and UE3 of the subpixels SP1, SP2, and SP3, and the conductive layer CL is connected to the power feed line PW. In such a configuration, the common voltage of the feed line PW can be supplied to the upper electrodes UE1, UE2, and UE3 via the conductive layer CL and the partition 6.
In the following descriptions, advantageous effects of the display device DSP of this embodiment will be explained using comparative examples. Note that the comparative examples are intended to illustrate some of the effects that the display device DSP can exhibit, and do not exclude the configurations and effects common to the present embodiment and the comparative examples from the scope of the present invention.
The display device DSP1 of the comparative example is different from the display device DSP of the embodiment mainly in the following two points: (1) the organic layers ORs, the upper electrode UEs and the cap layer CPs are arranged to cover the dam structure DS and are exposed to the outside, and (2) the end portion CLa of the conductive layer CL is located between the first convex part R1 of the dam structure DS and the end portions E1, E2, E3, and E4 of the substrate 10.
When, as in the case of the display device DSP1 of the comparative example, the organic layer ORs, the upper electrode UEs and the cap layer CPs are arranged in the peripheral area SA so as to cover the dam structure DS and exposed to the outside, there is a possibility that moisture may enter the display device DSP1 through these layers. If such moisture reaches the gate drive circuits GD1 and GD2, the selector circuit ST, the power feed line PW, the pixel circuit 1 and the display element 20, etc., operation error of the display device DSP1 may occur.
Here, in the display device DSP1 of the comparative example, as shown in
However, in the display device DSP1 of the comparative example, if a defect (such as a crack) occurs in the sealing layer SEs in the area surrounded by the chain line frame VIII in
By contrast, in the display device DSP of this embodiment, the end portion CLa of the conductive layer CL, and the end portions of the organic layer ORs, the upper electrode UEs, the cap layer CPs and the sealing layer SEs are located between the end portion 12a of the organic insulating layer 12 and the first convex portion R1 in plan view. In other words, the end portion CLa of the conductive layer CL, and the end portions of the organic layer ORs, the upper electrode UEs, the cap layer CPs, and the sealing layer SEs are located between the display area DA and the first convex portion R1 in plan view. Further, the conductive layer CL is covered by the organic layer ORs, the upper electrode UEs, the cap layer CPs, and the sealing layer SEs, and the organic layer ORs, the upper electrode UEs, the cap layer CPs, and the sealing layer SEs are covered by the resin layer 13.
With this configuration, the organic layer ORs, the upper electrode UEs, and the cap layer CPs, which may serve as a moisture penetration path, are not exposed to the outside, and therefore it is possible to suppress moisture penetration to the inside of the display device DSP through these layers. In addition, since the organic layer ORs, the upper electrode UEs, and the cap layer CPs are separated from each other by the end portion CLa of the conductive layer CL, moisture penetration to the inside of the display device DSP through these layers can be further suppressed. As a result, the resistance of the display device DSP to moisture is improved. Further, in the display device DSP of this embodiment, even if a defect occurs in a part of the sealing layer SEs, there is no path for moisture to possibly enter the inside of the display device DSP from the outside, and thus moisture will not enter the inside of the display device DSP due to defects in the sealing layer SEs.
Note that in this embodiment, as can be seen from
Further, the structure in which the end portion CLa of the conductive layer CL and the end portions of the organic layers ORs, the upper electrode UEs, the cap layer CPs and the sealing layer SEs are placed between the end portion 12a of the organic insulating layer 12 and the first convex part R1 is applicable to such a case where the display device DSP has the so-called touch panel function as well.
As shown in
As shown in
The power feed line PWT (second power feed line) is disposed on the insulating layer 33 and covered by the third convex portion R3. The power feed line PWT is formed by the same manufacturing process and of the same material as those of the metal layer 43 and the second portion P2 constituting the power feed line PW. The power feed line PWT is connected to the wiring line TL in the third contact portion CN3. The third contact portion CN3 includes a contact hole CHb provided in the sealing layer 14 and the third convex portion R3. The wiring line TL is in contact with the upper surface of the power feed line PWT via the contact hole CHb.
When the configuration in which the end portion CLa of the conductive layer CL and the end portions of the organic layer ORs, the upper electrode UEs, the cap layer CPs and the sealing layer SEs are placed between the end portion 12a of the organic insulating layer 12 and the first convex portion R1 is applied to the display device DSP having the touch panel function, the organic layer ORs, the upper electrode UEs, the cap layer CPs, and the sealing layer SEs are not placed on the dam structure DS. Therefore, it is possible to provide the third contact portion CN3 at a location which overlaps the dam structure DS. With this configuration, the wiring line TL can be covered by the resin layer 15 in the third contact portion CN3 to protect it. Even in this case, since the organic layer ORs, the upper electrode UEs, and the cap layer CPs, which can be a pathway for moisture to enter, are not exposed to the outside, advantageous effects similar to those described above can be obtained with respect to moisture resistance.
According to one embodiment described above, it is possible to provide a display device DSP with enhanced resistance to moisture.
While certain embodiments have been described, these embodiments have been presented by way of example only, and are not intended to limit the scope of the inventions. Indeed, the novel embodiments described herein may be embodied in a variety of other forms; furthermore, various omissions, substitutions and changes in the form of the embodiments described herein may be made without departing from the spirit of the inventions. The accompanying claims and their equivalents are intended to cover such forms or modifications as would fall within the scope and spirit of the inventions.
Number | Date | Country | Kind |
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2023-032017 | Mar 2023 | JP | national |