Number | Name | Date | Kind |
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5854139 | Aratani et al. | Dec 1998 | A |
5994717 | Igarashi et al. | Nov 1999 | A |
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Author; John G. Webster, Title; Encyclopedia of Electrical & Engineering, Publisher; John Wiley&Sons Inc., Publication Date: Mar. 19, 1999. vol. 11, pp. 441-459.* |
Hirano Y et al: “Analysies of the Radiation Caused Characteristics Change in SOI Mosfets Using Field Shield Isolation” International Conference on Solid State Devices and Materials, JA, Japan Society of Applied Physics. Tokyo, Sep. 1998, pp. 314-315. |