The present application relates to display devices, and particularly, to display devices using feedback enhanced light emitting diodes.
Display devices in use today typically employ liquid crystal displays (LCDs) and more recently, organic light emitting devices (OLEDs).
Matrix displays typically contain a grid of small picture elements (pixels), which can be switched to form characters and display graphics and video images. The electrodes are patterned as a series of stripes, with the stripes 11,12 on one glass piece running perpendicular to the stripes on the other glass piece. The electrodes are made from a transparent, conductive material, usually indium-tin oxide (ITO). Switching cells or pixels 10 are formed where the stripes overlap as shown in
Passive matrix displays use a simple grid to supply the charge to a particular pixel. That is, the rows or columns are connected to integrated circuits that control when a particular column or row is biased with the proper display drive voltage. To turn on a pixel, the integrated circuit biases the correct column and the correct row with the drive voltage signals. The row and column intersect at the designated pixel, and the row and column bias voltage result in the correct voltage at that pixel.
In active matrix displays a drive scheme is used that employs a storage capacitor 14 and a transistor switch 13 at each pixel site as shown in
The display devices including the above described matrix display devices, however, have problems associated with them such as poor viewing characteristics, for example, in high ambient illumination environments, poor visibility over wide viewing angles, and/or high power consumption. Accordingly, there is a need for more efficient display devices.
Display devices using feedback-enhanced light emitting diodes are provided. A display device in one aspect comprises a luminescent device comprising at least one layer of light emissive material disposed between a first feedback layer and a second feedback layer. At least one of the first feedback layer and the second feedback layer may comprise material having at least in part periodically varying refractive index profile. An imaging element is provided proximate to the second feedback layer to allow projection of displayed images at a distance. An imaging element may comprise a projection lens, a light diverging screen, a diffusing screen or some other type of rear projection screen, or any other image forming apparatus.
A display device in another aspect comprises a luminescent device comprising at least one layer of light emissive material disposed between a first feedback layer and a second feedback layer. At least one of the first feedback layer and the second feedback layer may comprise material having at least in part periodically and continuously varying refractive index profile.
Further features as well as the structure and operation of various embodiments are described in detail below with reference to the accompanying drawings. In the drawings, like reference numbers indicate identical or functionally similar elements.
a and 1b illustrate examples of prior art matrix display devices.
Display devices using feedback-enhanced light emitting diodes are disclosed. Display devices include, but are not limited, to active and passive matrix displays, and projection systems. Feedback-enhanced light emitting diode is fully disclosed in co-pending U.S. patent application Ser. No. 10/434,941 entitled “FEEDBACK ENHANCED LIGHT EMITTING DEVICE,” filed on May 8, 2003. For Example,
A second feedback element 6 may also be included such that the emissive layer is between the two feedback elements 4, 6. The second feedback element 6 may allow some light to be transmitted through the second feedback element 6 or substantially reflect the light incident upon it. In one embodiment, a structure with a periodic index of refraction variation, a plane mirror, a distributed Bragg reflector (DBR), or another reflector may be used as the second feedback element 6.
The device in one aspect may also include other elements such a transparent buffer layer lying between the feedback layers and the emissive layer, a diffuser, an anode, a cathode or other elements.
The cathode 102 may include a transparent conductive structure with a low work function surface adjacent to the emissive layer 2 such that it is able to inject electrons into the emissive layer 2. In one aspect, for the cathode 102 to have the desired transparency, a two-layer cathode may be provided. The two-layer cathode may include a very thin, for example, 5 nanometer (nm.) metal cathode such that the metal is essentially transparent. The metal may then be backed, for example, on the feedback layer side, with a transparent conductor like indium-tin oxide (ITO) to yield high enough conductivity to have a low impedance device. The anode 104 may include a transparent conductive material chosen to have a high work function such that it is able to inject holes into the emissive layer 2.
The emissive layer 2 may include an electroluminescent material whose spectral emission band overlaps the reflection bands of the feedback layers 4 and 6. In one aspect, the emissive layer 2 may also be a fluorescent or phosphorescent emissive material, an emissive inorganic semiconductor material (such as GaAs, AlGaAs, or InGaN), an organometallic material, a composite organic/inorganic material, or a liquid crystalline material.
The feedback layers 4 and 6 may include light non-absorbing material with a periodically varying index of refraction. The feedback layers 4 and 6 may act as a photonic crystal that reflects light of a given wavelength band propagating along the axis labeled “light out” 110. A photonic crystal is a material that because of a periodically varying refractive index along one or more axes cannot support light propagation of particular frequencies along those axes. In sufficient thickness it thus becomes a perfect reflector over some reflection band along those axes and is said to have a photonic band gap in light energies it is incapable of supporting. Feedback layers 4 and 6 show a one-dimensional photonic band gap.
Another way of looking at this is a that the light entering the feedback layer material along the layer normal axis suffers a small reflection each time it passes through one cycle of the refractive index oscillation. When the feedback element is thick enough, the feedback element may act as a nearly perfect reflector at the resonant wavelength, 2d, where d is the pitch of the refractive index spatial oscillation.
The feedback layers in one aspect are fabricated from plane wave holograms with peak reflectivity at the desired emission wavelength.
In one aspect, the device 300 shown in
The device 300 also may include a substrate 106 placed adjacent to a feedback layer, for example the feedback layer 6. The substrate 106 is used as a layer on which the device 300 may be built. In one aspect the substrate 106 may be comprised of a transparent material. In one aspect, a material may be applied over the device 300 to function as a cover 108. The cover 108, for example, functions to hermetically seal out ambient water and oxygen, or otherwise to protect the device 300 from chemical or other degradation.
Other components of the device 300 may include a hole transport layer between the anode 104 and the emissive layer 2. The hole transport layer may be used to allow more electron/hole recombination to occur at the emissive layer 2. For example, in emissive layers having imbalance between electron and hole mobilities, usually with low hole mobilities, the electron/hole recombination tends to occur at the anode. Similarly, a device with a direct anode/emitter interface tends to be inefficient because many traps, that is, sites at which non-radiative de-excitation of the emitter occurs, exist at the emitter/anode interface. Using hole transport layers, for example, with high hole mobilities minimizes the problem of the electron/hole recombination occurring at the anode. The hole transport layer may also be chosen to have a hole conduction band intermediate between those of the anode 104 and the emissive layer 2, thus providing more efficient hole injection from the anode into the emitter.
A hole injection layer may also be provided between the anode 104 and the hole transport layer. For example, if anode materials like indium-tin oxide (ITO) having less than well defined band structures that may lead to inefficient hole injection into the device are used, hole injection layers like copper phthalocyanine may be provided to better define band structure with energy level intermediate between ITO and hole transport materials. Providing the additional hole injection layers thus may assist hole injection and produce a more efficient device.
In another embodiment, additional hole transport layers may be inserted between the hole injection layer and the emitter to further smooth out band energy differences. If the hole transport layer adjacent to the emitter has its electron conduction band at an energy level nearly the same as the emitter, electrons can “overshoot” the emitter with recombination occurring in the transport layer rather than the emitter. This overshoot may be eliminated by interposing an electron blocking layer that has a high energy electron conduction band, but good hole conduction, between the emitter and the transport layer.
In another embodiment, an electron transport layer may be provided between the cathode 102 and the emissive layer 2. The electron transport layer performs the similar function for electrons that the hole transport layer performs for holes. As with hole transport layers, additional electron transport layers may be added to assist band energy matching.
In another embodiment, an electron injection layer may be provided between the cathode 102 and the electron transport layer. Ideally, it is desirable to have as low a work function material for the cathode as possible so that energy is not expended injecting electrons into the device. Very low work function metals such as calcium may be used. Calcium, however, may be very chemically reactive and very sensitive to moisture and oxygen. Aluminum also may be used. Although aluminum has higher work function, it has been found that overcoating the aluminum with a very thin film of materials like lithium or magnesium fluoride provides a “band bending” effect that helps relieve the band energy mismatch.
In another embodiment, a hole blocking layer may be provided between the emitter and hole transport layer to eliminate hole “overshoot” from the emitter. The above described carrier transport, injection, and blocking layers are also typically used in the conventional OLED devices. Accordingly, further details of these elements will not be described herein.
In one embodiment, the device 300 may also include a buffer layer, for example, a clear dielectric interposed between an electrode and a feedback layer. When the buffer layer is placed between the cathode 102 and the feedback layer 4, it may act as a hermetic barrier between the cathode and the outside environment especially during subsequent processing. The buffer layer also may provide the right size spacing between the two feedback layers such that destructive interference of light in the gap between the two feedback layers does not occur. To achieve this function, the buffer layer may be inserted between the feedback layer and the electrode to adjust the optical thickness of the device. The buffer layer may also be used to maintain the proper phase relationship between the refractive index profiles in the two feedback layers. In addition the buffer layer may be used to adjust the thickness of the gap between the feedback layers thereby tuning the wavelengths of the modes of the light that is resonating in the gap.
The devices shown in
In one aspect, referring back to
Typically, without the induced stimulated emission, spontaneous emission, which is a relatively slow and purely statistical process, dominates the light generation process in an emissive material. The rapid conversion of excitation energy to light by stimulated emission leaves the spontaneous emission process with little or no excited state energy to convert to light. An even slower process, non-radiative de-excitation, converts excited state energy to heat. Thus, stimulated emission preempts conversion of excited state energy to heat since the mechanism of heat formation is orders of magnitude slower than that of stimulated emission. Consequently, the excited state energy of the device 1 is converted predominantly into light, not heat. The consequent reduction in heat generation also results in reduced temperature in the device, which allows for a longer life and more efficiency in the device.
In one embodiment of a feedback enhanced light emitting display the one or more device cathodes and the one or more anodes overlay each other in a pattern such that the areas of overlap, and when properly energized, display visual information.
In matrix displays using light-emitting diodes, for example, organic light-emitting diodes, the organic light-emitting layer is generally divided into individual pixels. The pixels are generally arranged in orthogonal rows and columns and may be switched between emitting and non-emitting states by altering the current flow through them. The pixels are generally controlled via a passive or active matrix arrangement. In a passive matrix device one of the electrodes is patterned in rows and the other in columns. Each pixel may be caused to emit light by applying an appropriate voltage between the row and column electrodes at whose intersection it lies. An active matrix device employs at least one capacitor and at least one transistor at each pixel site.
In this example, the OLED materials are then patterned on top of the anode structure. The OLED may be composed of from one to five or more layers, for example, 109-115 of organic semiconductor. The OLED materials may be low molecular weight, polymeric, another suitable material or a combination of these materials. The low molecular weight materials may be vacuum deposited and patterned by the use of a shadow mask or by a mushroom process using patterned photoresist as an in situ shadow mask. The mushroom process is described in Society for Information Display International Symposium, May 2000, Seminar Lecture Notes, Volume 1, p. M-3/40. Polymers and some low molecular weight materials may be deposited by solvent casting. In this case, the materials may be patterned using ink jet printing.
In this example, photoresist is first applied and then patterned to form a crossover insulator 108. Next, a very thin, hole injection layer 109 of copper phthalocyanine, for example, approximately 50 Å is uniformly deposited through a shadow mask onto the red, green, and blue anodes. Without moving the shadow mask, a 350 Å layer of N, N′-Dinaphthalen-1-yl-N, N′-diphenylbenzidene (NPB) hole transport layer 110 is deposited onto the anodes. Next, a 200 Å layer 111 of parahexaphenyl (PHP) emissive layer is deposited through a shadow mask onto the blue anodes only. The green emissive layer 112 is formed by depositing a 200 Å layer of tris-(8-hydroxyquinoline) aluminum (Alq3) through a shadow mask onto the green anodes only. The red emissive layer 113 is formed by depositing a 200 Å layer of 5,10,14,20-tetraphenylporphine (TPP) through a shadow mask onto the red anodes only.
Next, the electron transport layer 114 of 450 Å of 2-(biphenyl-5-(4-tert butylphenyl)-1,3,4-oxadiazole) (PBD) is vacuum deposited through a shadow mask onto the red, green, and blue sub-pixels. Without moving the shadow mask used to deposit the electron transport layer an electron injection layer 115 of 50 Å of lithium fluoride is deposited. Next, approximately 50 Å layer 123 of aluminum is deposited through the shadow mask to form the cathode. Alternatively, a metal-free cathode structure may be formed to avoid the light absorption of even very thin layers of cathode metals that are detrimental to the lasing action of the device. The metal free cathode layer may be composed of 50 Å of bathocuproine or some other transparent conductive organic material. A more detailed discussion of a metal-free electrode can be found in G. Gu et al., Journal of Applied Physics 86, p. 4067 (1999), the entire disclosure of which is incorporated herein by reference.
On top of the aluminum, 500 Å of ITO 116 is sputter deposited through a shadow mask to form the cathode electrodes. Aluminum is evaporated onto the entire device and then patterned into cathode bus lines 117 using photolithography with a boron trichloride plasma etch. To protect OLED structures during further processing a 1000 Å thick silicon nitride layer 118 is vacuum deposited onto the entire substrate.
In this example, the device is removed from vacuum and the holographic recording material used to create the ten-micron thick feedback layer on the cathode side of the device is applied by solvent casting. In a similar manner to the film on the opposite side of the device, the feedback layer is successively patterned with an area 119 optimized for 660 nm wavelength light (red), with an area 120 optimized for 515 nm wavelength light (green), and with an area 121 optimized for 440 nm wavelength light (blue). The display is then encapsulated by application of a coverglass 122 with an epoxy peripheral seal.
In one embodiment of the present disclosure, emitter material is patterned photolithographically. In one embodiment, emitters used for patterning photolithographically include but are not limited to emitters that are photo-cross-linkable.
In one embodiment, the light emitting device layers 155-165 are patterned as striped layers covering a whole column of pixel elements just as they were in the passive display of
The interconnect 153 of the active matrix, feedback-enhanced OLED display of
The ribs 180 may be photolithographically patterned on the glass substrate from a high temperature resistant polymer or from sol-gel glass. It is also possible to pattern the ribs 180 from a thick metallization layer overcoated with an insulating material, for example, to avoid shorting. In this structure, the metal rib cores may be used for heat dissipation in displays with intense thermal loads, for instance, in projection displays.
In another embodiment, display resolutions may be improved by building the TFT matrix on top of an already deposited and exposed holographic feedback layer using a very low temperature polycrystalline silicon TFT process such as used with flexible polymer substrates. Examples of very low temperature process can be found in C. S. McCormick, C. E. Weber, J. R. Abelson, and S. M. Gates, “An amorphous silicon thin film transistor fabricated at 125 degrees Celsius by dc reactive magnetron sputtering,” Appl. Phys. Lett., Vol. 70, no. 2, pp. 226-7 and P. M. Smith, P. G. Carey, and T. W. Sigmon, “Excimer laser crystallization and doping of silicon films on plastic substrates,” Appl. Phys. Lett., Vol. 70, no. 3, pp. 342-344, 1997.
In this method of producing a feedback enhanced OLED, the stimulated emission produced feedback enhancement does not strongly depend on the thickness uniformity of the OLED display device semiconductive or conductive layers, their parallelism, or their surface finish because the lasing action is defined by the phase relationship of the feedback layers. In the case of holographic feedback layers, maintenance of the correct phase relationship between the two feedback layers may be ensured by the phase-locking methods described in a copending application entitled “FEEDBACK-ENHANCED LIGHT EMITTING DEVICE.” This ensures that the set of interference fringes created in space by the exposure apparatus is aligned with one feedback layer while the other feedback layer is recorded.
The active matrix thin film transistors 170 in
Here the addition autozero (AZ) 824 and autozero bar (AZB) 820 lines and transistors TFT 3814 and TFT 4826 allow measurement of variations in the threshold of TFT 2806 before the gate of TFT 1804 is enabled to allow the data voltage to bias the gate of TFT 2806. Storage of the threshold voltage in capacitor C1816 then allows the gate bias of TFT 2806 to be offset to allow for threshold voltage variation. The above described active matrix addressing configurations using TFTs are typically used in conventional active matrix OLED devices. (See for instance, Fish, et al., “A Comparison of Pixel Circuits for Active Matrix Polymer/Organic LED Displays”, SID International Symposium Proceedings, 2002, p.968; and S. Tam, et al., “Poly-Si Driving Circuits for Organic EL Displays”, Paper 4925-20, Conference 4925A, Electronic Imaging 2001) Accordingly, further details of these elements will not be described herein.
In one embodiment, the matrix addressing scheme in the OLED display devices of the present disclosure allows for maintaining constant current on a selected pixel element. Various constant current levels may be maintained on pixels to support gray scale operations. Such gray scale operation may be performed by active matrices fabricated from polycrystalline silicon or single crystal silicon materials. The gray scale modulation is accomplished by a combination of analog current adjustment and/or time modulation of drive current at individual pixels during each addressing timeframe of the graphic information.
In another embodiment, display devices in the present disclosure may projection systems that use feedback enhanced light emitting device. Such projection systems may include but are not limited to display monitors and televisions.
In the example of a direct-view active matrix FE-OLED display 1000 shown in
The screen comprises an array of tapered micro-light guides 1024 comprised of an optically transparent material. The interstitial areas between the light guides are filled with a black-filled resin 1026, for instance, filled with carbon black, that has a lower refractive index than the micro-light guide material. As a result light 1018 is multiply reflected out through the light guides and out through the light guide tips 1028. The geometry of the reflections, and for example, optionally roughening of the light guide tips, leads to a wide angular dispersal of the light 1030 exiting the screen. The screen 1022 may be bonded to the FE-OLED array by an adhesive 1040 or separated from it by an air gap.
This direct-view active matrix FE-OLED display may be used under high ambient illumination because ambient light 1032 striking the front surface of the display assembly may be highly likely to be absorbed in the black resin 1026 that constitutes on the order of 90% of the front surface 1034 of the screen. The small amount of ambient light that does pass through the light guide tips 1028 for the most part enters the FE-OLED structure through surface 1012. Feedback layers 1008 and 1010 may be designed to have spectrally narrow reflection bands. Therefore, less than half the light striking surface 1012 is directly reflected back towards screen 1022 and the display viewer. The remainder of the light transits the FE-OLED and impacts potting material 1036 that fills the space between the FE-OLED and the back substrate 1038. Potting material 1036 may be filled with a black filler so that the remaining ambient light that impinges it is almost completely absorbed. The light absorbing function of potting material 1036 may also be achieved by a thin layer of light absorbing material deposited between potting material 1036 and the FE-OLED structure. A black matrix material may also be deposited over the top of the active matrix pixel drive circuit 1002 to further enhance ambient light absorption.
A result of the highly efficient absorption of ambient light by the display structure in
The direct-view passive matrix FE-OLED display 1100 shown in
The embodiments described above are illustrative examples and it should not be construed that the present disclosure is limited to these particular embodiments. Various changes and modifications may be effected by one skilled in the art without departing from the spirit or scope of the invention as defined in the appended claims.
This application claims the benefit of U.S. Provisional Application No. 60/379,141 filed May 8, 2002, incorporated herein in its entirety by reference thereto. This application is related to U.S. patent application Ser. No. 10/434,941, filed on May 8, 2003, and entitled “FEEDBACK ENHANCED LIGHT EMITTING DEVICE,” and U.S. patent application Ser. No. 10/431,885, filed on May 8, 2003, and entitled “LIGHTING DEVICES USING FEEDBACK ENHANCED LIGHT EMITTING DIODE,” which applications are incorporated herein in their entirety by reference.
Number | Name | Date | Kind |
---|---|---|---|
5142192 | Takahashi et al. | Aug 1992 | A |
5365541 | Bullock | Nov 1994 | A |
5406573 | Ozbay et al. | Apr 1995 | A |
5537000 | Alivisatos et al. | Jul 1996 | A |
5559400 | Nakayama et al. | Sep 1996 | A |
5847506 | Nakayama et al. | Dec 1998 | A |
6072275 | Kobashi | Jun 2000 | A |
6075317 | Keyser et al. | Jun 2000 | A |
6091195 | Forrest et al. | Jul 2000 | A |
6091197 | Sun et al. | Jul 2000 | A |
6097147 | Baldo et al. | Aug 2000 | A |
6142643 | Araki et al. | Nov 2000 | A |
6160828 | Kozlov et al. | Dec 2000 | A |
6259423 | Tokito et al. | Jul 2001 | B1 |
6280559 | Terada et al. | Aug 2001 | B1 |
6304366 | Scalora et al. | Oct 2001 | B1 |
6330265 | Kinoshita | Dec 2001 | B1 |
6396859 | Kopp et al. | May 2002 | B1 |
6404789 | Kopp et al. | Jun 2002 | B1 |
6411635 | Kopp et al. | Jun 2002 | B1 |
6433355 | Riess et al. | Aug 2002 | B1 |
6541911 | Tanabe et al. | Apr 2003 | B1 |
6639250 | Shimoda et al. | Oct 2003 | B1 |
6710541 | He et al. | Mar 2004 | B2 |
6791261 | Shimoda et al. | Sep 2004 | B1 |
6873099 | Maeda | Mar 2005 | B2 |
20010033136 | Kawase | Oct 2001 | A1 |
20010036212 | Kopp et al. | Nov 2001 | A1 |
20010038102 | Kawase | Nov 2001 | A1 |
20010043627 | Koyama et al. | Nov 2001 | A1 |
20020003827 | Genack et al. | Jan 2002 | A1 |
20020018620 | Koyama et al. | Feb 2002 | A1 |
20020118710 | Kopp et al. | Aug 2002 | A1 |
20020131707 | Kopp et al. | Sep 2002 | A1 |
20040155238 | Thompson et al. | Aug 2004 | A1 |
Entry |
---|
Kopp et al., “Low-threshold lasing at the edge of a photonic stop band in cholesteric liquid crystals”, Optics Letters, Nov. 1, 1998, vol. 23, No. 21. |
Number | Date | Country | |
---|---|---|---|
20030214691 A1 | Nov 2003 | US |
Number | Date | Country | |
---|---|---|---|
60379141 | May 2002 | US |