1. Field of the Invention
This invention relates to a display driving device which performs scan driving of a plasma display panel (hereafter “PDP”) or other display panel, and in particular relates to a display driving device incorporated into an integrated circuit.
2. Description of the Background
A PDP uses light emission at the intersections of a matrix of electrodes accompanying a rare gas plasma discharge, causing light emission at the intersections of row electrodes and column electrodes selected by a scan driver and a data driver respectively.
A scan driver IC comprises numerous unit circuits (output circuits); the unit circuits, or their output, are called bits. Scan data (DATA) input from the data terminal of a scan driver IC is transferred, in the direction of the arrow in the figure, to shift registers SR1 to SRN (where N is an integer) in synchronization with a clock signal (CLK). The ith bit (i=1 to N) comprises a selection circuit SEi, level shifter LSi, H (high) side pull-up switching element Nui, and L (low) side pull-down switching element Ndi, and bit outputs Do1 to DoN are obtained. The selection circuits SEi perform selection and switching of display mode operation and write mode operation, and execute control of delay time (dead time) such that the pull-up switching element Nui and pull-down switching element Ndi are not turned on simultaneously.
In the shift registers SR1 to SRN, when data transferred to Si is at a high or H level, the pull-down switching element Ndi is turned on and the output Doi goes to a low or L level, and when the data transferred to SRi is at the L level, the pull-up switching element Nui is turned on and the output Doi is at the H level. Further, when in scanning mode as shown in
However, in recent years there have been urgent demands to reduce the costs of the above scan driver ICs, accompanying falling prices for PDP televisions. Reduction of the chip size is an effective means of lowering the cost of scan driver ICs. Hence it has been proposed that the H-side pull-up switching elements Nu1 to NuN be replaced with resistance elements R1 to RN.
By replacing the pull-up switching elements Nui with resistance elements Ri, the H-side pull-up switching elements Nui are eliminated, and the level shifters LSi driving them also become unnecessary and can be omitted. In the case of a scan driver IC, the total area occupied by the level shifters LS1 to LSN, which convert logic signals at approximately 5 V to high-voltage signals at approximately 120 V, is approximately 15% of the total, and so elimination of these level shifters LS1 to LSN is effective for reducing costs.
In addition, in order to reduce the chip size of driving voltage supply circuitry for line-sequential driving with large currents in the above-described display driving device, without requiring special circuit elements or processes, it has been proposed that the resistance elements Ri of
However, in a display driving device of the prior art which displays a PDP as described above, if the H-side pull-up switching elements Nui are replaced with resistance elements Ri, the load capacitances Ci are charged through these resistance elements Ri at the time that the output rises (see the broken-line arrow in
In the case of a scan driver IC, rapid scanning operation is necessary due to the PDP specifications, and so the output rise time must be held to within approximately 300 ns. In the circuit of the prior art shown in
Further, the device presented in Japanese Patent Laid-open No. 2005-129121, as described in paragraph [0052] thereof, is such that in one display operation period, both the transistors equivalent to the Nui and Ndi in
Further, in paragraph [0071] thereof it is stated that “viewing simultaneous action . . . there is the problem of susceptibility to the effects of coupling”, and so reduction of control systems is indicated; but even if the number of systems were increased, there is inherently no means of reducing the effect of coupling. In particular, with the trend toward larger PDP screen sizes, currents flowing in adjacent elements tend to become large, and so the influence of coupling can in no way be ignored.
This invention was devised in light of such problems, and has as an object the provision of a display driving device which is capable of high-speed scanning operation, the chip size of which can be made small, and costs for which can be lowered, and which in addition has no problems with coupling.
In order to resolve the above problems, a display driving device according to a preferred embodiment of this invention, which performs scan driving of a display panel, comprises a pull-up switching element, connected to a first driving voltage supply line, and common to all bits each of which is a unit circuit of the display driving device; diodes for each bit, connected between the pull-up switching element and driving voltage output terminals for each bit; pull-down switching elements for each bit, connected between a second driving voltage supply line and the driving voltage output terminals for each bit; and resistance elements for each bit, connected between the first driving voltage supply line and the pull-down switching elements.
A display driving device according to a preferred embodiment of this invention uses a pull-up switching element common to each bit, turns on for a short time the pull-up switching element when raising the output for each bit, and when the output has risen, maintains the H (high) level output using resistance elements, so that high-speed scan operation is possible, the chip size can be reduced, and lower costs can be achieved, and there is also the advantage that the problem of coupling is eliminated.
Below, embodiments of the invention are explained referring to the drawings.
The above scan driver IC comprises numerous unit circuits (output circuits); these unit circuits, or their outputs, are called bits. Data input from a data terminal of the scan driver IC is transferred, in the direction of the arrow in the figure, to the shift registers SR1 to SRN in synchronization with a clock signal. The ith bit (i=1 to N) comprises a selection circuit SEi, resistance element Ri, diode Di, and L-side pull-down switching element Ndi; outputs Do1 to DoN are obtained for each bit. Further, an H-side pull-up switching element Nu, level shifter LS, and selection circuit SE, common to each bit, are also included therein. The selection circuits SE and SEi perform selection and switching of display mode operation and write mode operation, and execute control to turn on the pull-down switching elements Ni after the pull-up switching element Nu has been turned off, in order that the pull-up switching element Nu and pull-down switching elements Ndi are not on at the same time.
IGBTs are preferably used for the above pull-up switching element Nu and pull-down switching elements Nd1 to NdN, but devices other than IGBTs may also be used without departing from the scope of the invention. C1 through CN indicate the load capacitances for each bit.
In the shift registers SR1 to SRN, when scan data transferred to SRi (i=1 to N) is at the H level, the pull-down switching element Ndi is turned on and the output Doi goes to the L level, and when the scan data transferred to SRi is at the L level, the pull-up switching element Nu is turned on and the output Do1 to DoN goes to the H level. Further, when in scan mode, at the outputs Doi of the N bits (i=1 to N), the L level is output sequentially (the on-off relationship may be the opposite between the scan data level and the pull-down switching elements Ndi and pull-up switching element Nu; conversely, in the shift registers SR1 to SRN, L level may be transferred sequentially as the scan data).
The pull-up switching element Nu operates in synchronization with the clock signals of shift registers SR1 to SRN which control the outputs Do1 to DoN of the driving voltage output terminals; the turn-on time is fixed at approximately 200 ns and is independent of the clock frequency. The pull-up switching element Nu and pull-down switching elements Ndi operate when there is scan data in SRi among the shift registers SR1 to SRN.
In the scan driver IC of the first embodiment, by turning on the common pull-up switching element Nu at the rising edge of the output of each bit, the output rise time can be shortened. Further, because the common pull-up switching element Nu is used for charging the load capacitances C1 to CN when outputs rise, the values of the resistance elements R1 to RN can be increased and current consumption can be suppressed. Moreover, because shift registers are not needed for each bit, the chip size can be reduced.
That is, in the first embodiment, a pull-up switching element Nu, level shifter LS, and selection circuit SE, common to all bits, are added to the prior art circuit shown in FIG. 10 and
The common pull-up switching element Nu is turned on for only a fixed interval of approximately 200 ns from the rising edge of the clock signal. During this interval, control is executed so that the pull-down switching elements Nd1 to NdN are turned off; this is because if there is an interval during which both are on, leakage current flows. In actuality, the pull-down switching elements Ndi are turned on simultaneously with the turning-off of the pull-up switching element Nu.
The pull-down switching elements Nd1 to NdN have the driving capacity to lower the outputs Do1 to DoN in approximately 50 ns, so that even when there is a delay of approximately 200 ns from the rising edge of the clock signal, the output can be lowered in a total of approximately 250 ns. This time is within 300 ns, and poses no problem. The common pull-up switching element Nu has a driving capacity to raise the output in 150 ns, and so a turn-on interval of 200 ns is sufficient.
Thus the scan driver IC of the first embodiment uses the pull-up switching element Nu in common for all bits, turns on for a short time (200 ns) the pull-up switching element when the output of the bits is raised, and maintains the H (high) level output by means of the resistance elements R1 to RN when the output rises, so that rapid scan operation is possible, the chip size can be reduced, costs can be reduced, and in addition there is the advantage that coupling problems are eliminated.
Specifically, the chip area can be reduced by 13 to 15%, and significant cost reductions are possible. Further, by setting the values of the resistance elements R1 to RN to approximately 10 kΩ, current consumption can be reduced to 1/10 or less than that of the circuit shown in
In an actual display panel, because of the large number of scan lines, scan driver ICs such as shown in
In the scan driver IC of the first embodiment, the common pull-up switching element Nu and level shifter LS always operate in synchronization with the rising edge of the clock signal. Further, in the scan operation of an actual display panel, among the plurality of scan driver ICs, only one scan driver IC is operating (is receiving scan data input), and so it is desirable that the common pull-up switching elements Nu and level shifters LS of the other scan driver ICs not be operating, in order to reduce current consumption of the entire system.
In the scan driver IC of the second embodiment, by inputting the outputs of the shift registers SR1 to SR(N+1) for each bit to a NOR circuit 10, the absence of scan data in the shift registers SR1 to SR(N+1) is detected. SR(N+1) is added in order to increase the number of shift register stages from N to (N+1), for the purpose of stabilizing operation at the instant when scan data is discharged from SRN. The output of SRN is connected to the input of SR1 of the next-stage scan driver IC. When there is no scan data, the selection circuit SE ensures that the common pull-up switching element Nu and level shifter LS do not operate. In this way, current consumption can be greatly reduced. If SR(N+1) is not present, because the common pull-up switching element Nu and level shifter LS are turned off at the instant when scan data is discharged from SRN, there is the problem of a delay in the rising-edge waveform output of the final bit (DoN) of each scan driver IC.
It will be appreciated by those skilled in the art that the invention may be practiced otherwise than as specifically described herein, without departing from the scope thereof.
Number | Date | Country | Kind |
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2006-312409 | Nov 2006 | JP | national |