The above and other advantages of the present disclosure of invention will become clearer by reference to the following detailed description when considered in conjunction with the accompanying drawings wherein:
It is to be understood that when an element or layer is referred to herein as being “on,” “connected to” or “coupled to” another element or layer, it can be either directly on, connected to or coupled to the other element or layer, or one or more intervening elements or layers may be present for providing indirect coupling. In contrast, when an element is referred to herein as being “directly on,” “directly connected to” or “directly coupled to” the other element or layer, there are no intervening elements or layers present. Like numbers refer to like elements throughout. As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items.
It will be understood that, although the terms first, second, third etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited in number by these terms. These terms are only used to distinguish one element, component, region, layer or section from another region, layer or section. Thus, a first element, component, region, layer or section discussed below could be instead termed a second element, component, region, layer or section.
Spatially relative terms, such as “beneath,” “below,” “lower,” “above,” “upper” and the like, may be used herein for ease of description to describe one element or feature's relationship to another element(s) or feature(s) as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as “below” or “beneath” other elements or features would then be oriented “above” the other elements or features. Thus, the exemplary term “below” can encompass both an orientation of above and below. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the present disclosure of invention.
Embodiments described herein with reference to cross-section illustrations are to be considered as schematic illustrations of idealized embodiments (and intermediate structures). As such, variations from the shapes of the illustrations as a result, for example, of specific manufacturing techniques and/or tolerances, are to be expected. Thus, the disclosure should not be construed as being limited to the particular shapes of regions illustrated herein but is to be construed as including routine design choices and deviations in shapes that result, for example, from specific manufacturing techniques. For example, an implanted region that is schematically illustrated as a rectangle will, typically, have rounded or curved features and/or a gradient of implant concentration at its edges rather than a binary change from implanted to non-implanted region. Likewise, a buried region formed by implantation may result in some implantation in the region between the buried region and the surface through which the implantation takes place. Thus, the regions illustrated in the figures are schematic in nature and their shapes are not intended to illustrate the actual shape of a region of a device and are not intended to limit the scope of the disclosure.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same ordinary meaning as commonly understood by one of ordinary skill in the art to which this disclosure most closely pertains. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
Referring to
A main driving circuit 110 is mounted on the PCB 100. The main driving circuit 110 receives original control signals and an original driving signals from an external device (not shown), and outputs corresponding control signals and driving signals for driving the display panel 400 via the flexible second PCB 500.
The display panel 400 includes a display substrate 200 and an opposite substrate 300 that is combined with the display substrate 200 to receive an interposed liquid crystal layer (not shown). Each of the two opposed substrates 200 and 300 includes a relatively transparent section for allowing light to pass therethrough. The display panel 400 includes a display area DA (see
A plurality of source lines (also referred to as data lines) DL and a plurality of gate lines GL are formed across the display area DA. The source lines (DL) and gate lines GL cross orthogonally with respect to each other. A plurality of pixel parts P are defined at respective crossings of the source lines DL and the gate lines GL. Each of the pixel parts P includes a switching element, such as a thin-film field effect transistor (TFT), a liquid crystal capacitor CLC (defined by a corresponding pixel-electrode, and opposed common electrode and interposed liquid crystal material) and a charge storage capacitor CST.
A plurality of source driver chips is bonded to the substrate of the display panel 400 in the first peripheral area PA1 thereof. The source driver chips apply data voltages to the source lines DL, respectively for propagation across the display area. More particularly, in the illustrated embodiment, a first plurality of left-side source driver chips LD1, LD2, LD3 and LD4 are mounted in a left portion of the first peripheral area PA1, and a second plurality of right-side source driver chips RD1, RD2, RD3 and RD4 are mounted in a right portion of the first peripheral area PA1.
A plurality of first power wiring sections (or first power buses) 210, a plurality of second power wiring sections (or second power buses) 220, a plurality of connection wiring sections (or signal buses) 230 and a plurality of conductive patterns 240 are formed in the first peripheral area PA1 and are electrically coupled to respectively adjacent ones of the source driver chips LD1, . . . , RD4. For example, the first power wiring section 210 transfers first driving voltages, such as a first power voltage VDD1 and a first ground voltage VSS1, to the source driver chip LD3 (i.e., to internal PMOS and NMOS buffering transistors within LD3). The second power wiring section 220 transfers second driving voltages, such as a second power voltage VDD2 and a second ground voltage VSS2, to the same source driving chip LD3 (i.e., to internal PMOS and NMOS transistors that define DAC's within LD3). The connection wiring section 230 transfers a data signal and one or more gamma-corrected level signals to the same source driver chip LD3. The data signal and gamma signal(s) are transferred between corresponding pairs of source driver chips such as LD2 and LD3 that are cascade connected with each other through the connection wiring section 230.
The conductive pattern 240 is insulatively overlapped with at least one of the conductors in the first power wiring section 210 and the conductive pattern 240 is further overlapped with at least a second of the conductors in the first power wiring section 210 so as to thereby define a transient bypass capacitor at least for voltages developed locally on the first and second conductors in the first power wiring section 210. Because the conductive pattern 240 forms a predetermined capacitance between a power line transferring the first power voltage VDD1 and a ground line transferring the first ground voltage VSS1 of wiring section 210, the bypass capacitor helps to maintain steady levels (i.e., ripple-free levels) for the first power voltage VDD1 and for the first ground voltage VSS1 in the vicinity of the adjacent source driver chips (i.e., LD2 and LD3). Therefore, a switching noise component of the data signal, which may be output from the corresponding source driver chip (i.e., LD3) and propagated along the first power wiring section 210, may be removed or decreased. (
A plurality of power and signal wiring sections 510, 520, 530, 540, 550 and 560 are arranged in the FPC 500. The power and signal wiring sections 510, 520, 530, 540, 550 and 560 electrically interconnect the PCB 100 and the display panel 400. The wiring sections 510, 520, 530, 540, 550 and 560 transfer control signals and power signals that are provided from the main driving circuit 110 to the display panel 400.
For example, the first signal wiring section 510 transfers first driving voltages VDD1 and VSS1 to the first power wiring section 210. The second signal wiring section 520 transfers second power voltages VDD2 and VSS2 to the second power wiring section 220. Each of the first and second signal wiring sections 510 and 520 is electrically connected (distributed) to the corresponding ones of the first and second power wiring sections 210 and 220 that are arranged on the left and right sides of the panel. For example, lines 510 and 520 are shown to connect between the first source driver chip LD1 on the left side and a first source driver chip RD1 on the right side.
A third signal wiring section 530 includes a plurality of signal wirings that transfer the data signals and gamma signals that are provided to the source driver chips LD1, LD2, LD3 and LD4 that are mounted in a left portion of the first peripheral area PA1. The third signal wiring section 530 is electrically connected to the first source driver chip LD1 of the left portion. The data signals and the gamma signals that enter the middlemost, left source driver chip LD1 may be serially transferred to the other source driver chips LD2, LD3 and LD4 of a left portion by a signal cascading method.
A fourth signal wiring section 540 includes a plurality of signal wirings that transfer data signals and gamma signals that are provided to the source driver chips RD1, RD2, RD3 and RD4 that are mounted in a right portion of the first peripheral area PA1. The fourth signal wiring section 540 is electrically connected to the first source driver chip RD1 of the right portion. The data signals and the gamma signals that enter the middlemost, right source driver chip RD1 may be transferred to the other source driver chips RD2, RD3 and RD4 of the right portion by a signal cascading method.
A fifth signal wiring section 550 includes a plurality of signal wirings that transfer gate driving signals to the first gate driving section 610 formed in the second peripheral area PA2. A sixth signal wiring section 560 includes a plurality of signal wirings that transfer gate driving signals to the second gate driving section 620 formed in the third peripheral area PA3.
Referring to
The first power wiring section 210 and the second power wiring section 220 are commonly formed to extend through the first chip area CA1, the intermediate area IA and the second chip area CA2. A signal connection wiring section 230 is formed in the intermediate area IA. The first power wiring section 210 includes a first voltage-supplying conductor 211 (VDD1) and a first ground-supplying conductor 212 (VSS1). For example, the first voltage-supplying conductor 211 may be structured to receive a first power voltage from an external source and to propagate the first power voltage to the at least one of the ICs. For example, the first ground-supplying conductor 212 may be structured to extend wiring that is substantially parallel to the first voltage-supplying conductor 211 and to receive a first ground voltage from an external source and to propagate the first power voltage to said at least one of the IC. The second power wiring section 220 includes a second voltage-supplying conductor 221 (VDD2) and a second ground-supplying conductor 222 (VSS2). The signal connection wiring section 230 includes a plurality of wirings for transferring corresponding data signals and gamma signals.
A first input pads section IP1 and a first output pads section OP1 are formed in the first chip area CA1. The first input pads section IP1 includes means (not shown) for contacting the first and second power wiring sections 210 and 220 for obtaining corresponding power and ground voltages (VDD1 and VSS1) and for coupling these to appropriate power input terminals of the first source driver chip LD1. The first output pads section OP1 contacts output terminals of the first source driver chip LD1. A first fan-out section FO1 is formed in the first chip area CA1. The first fan-out section FO1 is electrically connected to the first output pads section OP1, and is insulatively overlapped with the first power wiring section 210.
A second input pads section IP2 and a second output pads section OP2 are formed in the second chip area CA2. The second input pads section IP2 contacts the first and second power wiring sections 210 and 220 and couples them to appropriate input terminals of the second source driver chip LD2. The second output pads section OP2 contacts corresponding output terminals of the second source driver chip LD2. A second fan-out section FO2 is formed in the second chip area CA2. The second fan-out section FO2 is electrically connected to the second output pads section OP2, and is insulatively overlapped with the first power wiring section 210.
The first and second power wiring sections 210 and 220, the connection wiring section 230 and the conductive pattern 240 are formed in the intermediate area IA. The connection wiring section 230 is formed in the intermediate area IA to insulatively overlap with a portion of the second power wiring section 220. The conductive pattern 240 is formed in the intermediate area IA so as to insulatively overlap with a portion of the first power wiring section 210. In one embodiment, the conductive pattern 240 has the shape of an irregular pentagon such as that formed by attaching the base of a triangle to the bottom side of a rectangle whose bottom dimension is the same as the base of the downwardly protruding triangle.
A first portion of the first power wiring section 210 is overlapped with the first and second fan-out sections FO1 and FO2, and a second portion of that section 210 is overlapped with the conductive pattern 240. That is, the conductive pattern 240 is formed in the intermediate area IA so as not to substantially overlap with the first and second fan-out sections FO1 and FO2 and thereby create parasitic capacitance coupling between the first and second fan-out sections FO1 and FO2.
The first power wiring section 210 includes a first voltage-supplying conductor 211 and a ground voltage wiring 212. In one embodiment, a capacitively-effective overlap area between the conductive pattern 240 and the first voltage-supplying conductor (VDD1) 211 is greater than a capacitively-effective overlap area between the conductive pattern 240 and the first ground voltage wiring (VSS1) 212.
A first capacitor C1 (see also
Referring to
A pixel part having a switching element such as a thin film transistor (TFT) and a liquid crystal capacitor CLC is formed in the display area DA. More particularly, a gate electrode G is formed from a first conductive layer deposited (bonded to) a transparent first base substrate 101 of the panel. A gate insulating layer 202 is formed on (i.e., deposited over) the first conductive layer that forms the gate electrode G. A semi-conductive channel layer (CH, i.e. doped polysilicon) is formed on the gate insulating layer 202 corresponding to the gate electrode G. A source electrode S and a drain electrode D are patterned out of a second conductive layer that is deposited on the semi-conductive channel layer CH to thereby define a thing film transistor whose conduction is controlled by the gate electrode G.
A source/drain passivation layer 203 is formed by deposition of dielectric material on the source and drain electrodes S and D. A pixel electrode PE is formed on the passivation layer 203 and extends through a via to contact the drain electrode D. The pixel electrode PE is typically composed of an optically transparent and electrically conductive material. The pixel electrode PE may define a first electrode of the liquid crystal capacitor CLC. A common electrode CE as a second electrode of the liquid crystal capacitor CLC is formed on a second base portion 301 of the opposing substrate 300. A liquid crystal layer LC is interposed between the pixel electrode PE and the common electrode CE.
The first conductive layer that forms the gate electrode (G) may be further patterned in the peripheral area (PA1) to define the first voltage-supplying conductor (Vdd1) 211, the first ground voltage wiring (Vss1) 212, the second voltage-supplying conductor (Vdd2) 221 and the second ground voltage wiring (Vss2) 222 as extending along a longitudinal direction parallel to the longitudinal direction of gate wirings GL formed in the first peripheral area PA1. For example, the first voltage-supplying conductor 211 and the first ground-supplying conductor 212 are formed spaced-apart but adjacent to each other. The first voltage-supplying conductor 211 extends substantially parallel to the first ground voltage wiring 212. The second voltage-supplying conductor 221 and the second ground voltage wiring 222 are also formed in spaced apart regions but adjacent to each other. The second voltage-supplying conductor 221 is substantially parallel to the second ground voltage wiring 222. The gate insulating layer 202 is formed on the first voltage-supplying conductor 211, on the first ground voltage wiring 212, on the second voltage-supplying conductor 221 and on the second ground voltage wiring 222.
The signal connection wiring section 230 is patterned out of a second conductive layer that is formed on the gate insulating layer 202 to partially overlap with the second ground voltage wiring section 222. The first fan-out section FO1 is also formed from the second conductive layer. The first fan-out section FO1 is formed in the first chip area CA1 to overlap with the first voltage-supplying conductor 211 and the first ground voltage wiring 212 as best seen in
The passivation layer 203 of
As a result of the insulative overlap defined between the conductive pattern 240 and the power conduction strips 211-212, a first capacitor C1 is defined by the overlap of the first voltage-supplying conductor 211 with the conductive pattern 240, and a second capacitor C2 is defined by the overlap of the first ground voltage wiring 212 with the conductive pattern 240. Thus, the first capacitor C1 is serially connected to the second capacitor C2 between the first power wiring 211 and the first ground-supplying conductor 212, so that a transient-bypassing capacitance, Ccap is defined by the first and second capacitors C1 and C2 so as to be satisfied for example by the following Expression 1.
Referring to
The digital-analog converting section 710 includes a plurality of digital-to-analog converters DAC1, DAC2, . . . , DACm-1 and DACm corresponding to respective output terminals of the source driver chip. Each of the digital-analog converters DAC1, DAC2, . . . , DACm-1 and DACm receives a second power voltage VDD2 and a second ground voltage VSS2 as second power-providing voltages, and for example, in the case of the digital-analog converter DAC1, each receives a corresponding multi-bit digital data signal D1 and a plurality of gamma-corrected voltage levels VR1, VR2, . . . , VRi-1 and VRi through the connection wiring section 230. The digital-analog converter DAC1 outputs a selected one of the gamma-corrected voltages VR1, VR2, . . . , VRi-1 and VRi as its analog output signal (to the corresponding buffer B1) based on the digital value represented by the supplied data signal D1.
The output buffer section 730 includes a plurality of output buffers B1, B2, Bm-1 and Bm that are electrically connected to respective output terminals of the corresponding digital-to-analog converters DAC1, DAC2, . . . , DACm-1 and DACm. Each of the output buffers B1, B2, . . . , Bm-1 and Bm receives a first power voltage VDD1 and a first ground voltage VSS1 as first power-providing voltages, and, for example, in the case of the output buffer B1, each buffers and outputs a corresponding analog data voltage corresponding to the gamma-corrected voltage output by the corresponding digital-analog converter DAC1. Here, a first capacitor C1 and a second capacitor C2 are formed by the conductive pattern 240 so as to be serially connected to each other to form a transient-bypass capacitance Ccap between the first power voltage VDD1 and the first ground voltage VSS1. For example, the bypass capacitor charges in between switchings of the digital data signal D1 so as to store an energy component for use by the output buffer B1 at the time that the DAC1 output switches, so that the operation of the output buffer B1 may be stabilized and a ripple component or ringing component of the output signal may be reduced and removed and so that a corresponding transient does not reflect back through the power lines to cause noticeable perturbations in other pixel areas that are not undergoing intentional switching of intensity.
Consequently, a data signal output along each source wiring DL may be stabilized so as to be free of undesired voltage ripples (or so as to have the magnitudes of such ripples substantially reduced), so that display quality may be enhanced.
Hereinafter, substantially the same reference numerals will be used to refer to same or like parts as those described above, and any further repetitive explanation concerning the above elements will be omitted.
Referring now to the details of
A plurality of source driver chips LD1, . . . , LD4, RD1, RD2, . . . , RD4 is mounted in a first peripheral area PA1 of the display panel 400. The source driver chips output analog type data signals to the source wirings DL.
A first voltage wiring section 210, a second voltage wiring section 220, a connection wiring section 230, a first conductive pattern 240 and a second conductive pattern 250 are formed between the source driver chips. For example, the first voltage wiring section 210 commonly transfers a first power voltage VDD1 and a first ground voltage VSS1 to the source driver chips, and the second voltage wiring section 220 commonly transfers a second power voltage VDD2 and a second ground voltage VSS2 to the source driver-chips. The connection wiring section 230 transfers a digital type data signal and a gamma signal to the source driver chips adjacent to each other.
The first conductive pattern 240 is formed in the first voltage wiring section 210 to define a first bypass capacitor. The first power voltage VDD1 and the first ground voltage VSS1 may be stabilized by transient suppression provided by the first bypass capacitance (C1-C2).
The second conductive pattern 250 is formed in the second voltage wiring section 220 to define a second bypass capacitance. The second power voltage VDD2 and the second ground voltage VSS2 may be stabilized by transient suppression provided by the second bypass capacitance (C3-C4).
Therefore, the first driving voltages VDD1 and VSS1 and the second driving voltages VDD2 and VSS2, which drive each of the source driver chips, may be stabilized, so that a plurality of data signals as output from the source driver chips may be stabilized.
Referring to
A first portion of the first voltage wiring section 210 is overlapped with the first and second fan-out sections FO1 and FO2, and a second portion of the first voltage wiring section 210 is overlapped with the first conductive pattern 240. That is, the first conductive pattern 240 is formed in the intermediate area IA so as not to substantially overlap with the first and second fan-out sections FO1 and FO2.
The first voltage wiring section 210 includes a first power wiring 211 and a first ground-supplying conductor 212. An overlap area between the first conductive pattern 240 and the first power wiring 211 is greater than an overlap area between the first conductive pattern 240 and the first ground-supplying conductor 212.
A first portion of the second voltage wiring section 220 is overlapped with the connection wiring section 230, and a second portion of the second voltage wiring section 220 is overlapped with the second conductive pattern 250. That is, the second conductive pattern 250 is formed in the intermediate area IA so as not to overlap with the connection wiring section 230.
The second voltage wiring section 220 includes a second power wiring 221 and a second ground-supplying conductor 222. An overlap area between the second conductive pattern 250 and the second power wiring 221 is greater than an overlap area between the second conductive pattern 250 and the second ground-supplying supplying conductor 222.
Consequently, a first capacitor C1 and a second capacitor C2 are formed between the first power wiring 211 and the first ground-supplying conductor 212, so that the first power voltage VDD1 and the first ground voltage VSS1 that are transferred to the first power wiring section 210 may be stabilized. Furthermore, a third capacitor C3 and a fourth capacitor C4 are formed between the second power wiring 221 and the second ground-supplying conductor 222 by the second conductive pattern 250, so that the second power voltage VDD2 and the second ground voltage VSS2 that are transferred to the second voltage wiring section 220 may be stabilized.
Referring to
The connection wiring section 230, the first fan-out section FO1 and the second fan-out section FO2 as a second conductive layer are formed on the gate insulation layer 202. The passivation layer 203 is formed on the second conductive layer. The first conductive pattern 240 and the second conductive pattern 250 as a third conductive layer are formed on the passivation layer 203. The first conductive pattern 240 is overlapped with the first power wiring 240 and the first ground pattern 212, and the second conductive pattern 250 is overlapped with the second power wiring 221 and the second ground-supplying conductor 222.
Accordingly, the first and second capacitors C1 and C2 are defined between the first power wiring 211 and the first ground-supplying conductor 212. Furthermore, the third and fourth capacitors C3 and C4 are defined between the second power wiring 221 and the second ground-supplying conductor 222. The third and fourth capacitors C3 and C4 are serially connected to each other, so that a capacitance Ccap that is defined the above Expression 1 is formed.
Referring to
Here, the third and fourth capacitors C3 and C4 are serially connected to each other between the second power voltage VDD2 and the second ground voltage VSS2 as a driving voltage of the digital-analog converter DAC1, so that the second power voltage VDD2 and the second ground voltage VSS2 are locally maintained as substantially constant voltages by the third and fourth capacitors C3 and C4. Therefore, a ripple component of a switched output signal outputted from the digital-analog converter DAC1 may be reduced and removed.
The output signal of the digital-analog converter DAC1, from which the ripple component is removed, is inputted to the output buffer B1. First driving voltages, that is, the first power voltage VDD1 and the first ground voltage VSS1 that are applied to the output buffer B1, may be stabilized by the first and second capacitors C1 and C2. Consequently, a noise component of the data signal D1′, . . . , Dm′, that is an output signal of the source driver chip may be removed, so that display quality may be enhanced.
According to the present disclosure therefore, in a chip-on-glass (COG) structure or another such structure where integrated circuits are bonded or fused to a display substrate, and in which a source driver chip that mounts directly on the substrate outputs a data signal to a source wiring of the display panel, one or more bypass capacitances are integrally formed with the use of insulatively overlapping conductive patterns for thereby stabilizing the output signals of the source driver chips. The integral bypass capacitances may be monolithically formed on the display panel so as to provide reliable mass production of the same, and so that a noise component of the data signal may be removed. Therefore, a driving signal of the display device may be stabilized, so that display quality may be enhanced.
Although exemplary embodiments have been described, it is understood that the present disclosure of invention should not be limited to the exemplary embodiments and that various changes and modifications can be made by one ordinary skilled in the art while remaining within the spirit and scope of the present disclosure.
Number | Date | Country | Kind |
---|---|---|---|
2006-54699 | Jun 2006 | KR | national |