The present disclosure relates to, but is not limited to, the field of display technologies, and particularly to a display substrate and a preparation method therefor, and a display apparatus.
An Organic Light Emitting Diode (OLED) and a Quantum dot Light Emitting Diode (QLED) are active light emitting display devices and have advantages of self-luminescence, a wide viewing angle, a high contrast ratio, low power consumption, an extremely high response speed, lightness and thinness, bendability, and a low cost, etc. An under screen camera technology is a brand-new technology proposed for increasing a screen-to-body ratio of a display apparatus.
The following is a summary of subject matters described herein in detail. The summary is not intended to limit the scope of protection of the claims.
Embodiments of the present disclosure provide a display substrate, a method for manufacturing the display substrate, and a display apparatus.
In one aspect, an embodiment of the present disclosure provides a display substrate including a base substrate, a circuit structure layer, a light transmitting structure layer, and a light emitting structure layer. The base substrate includes a first region and a second region located on at least one side of the first region. The circuit structure layer is located in the second region and at least includes a plurality of first pixel circuits. The light transmitting structure layer is located in the first region and includes a shielding layer and at least one connection layer. An orthographic projection of the shielding layer on the base substrate is at least partially overlapped with an orthographic projection of the at least one connection layer on the base substrate. The at least one connection layer includes a plurality of first connection lines, and at least one of the plurality of first connection lines extends from the first region to the second region. The light emitting structure layer is located at a side of the circuit structure layer and the light transmitting structure layer away from the base substrate, and at least includes a plurality of first light emitting elements located in the first region. At least one of the plurality of first light emitting elements in the first region is electrically connected to at least one of the plurality of first pixel circuits in the second region through at least one first connection line. The light emitting structure layer includes a patterned cathode located in the first region. The shielding layer is configured as a shielding structure in a cathode patterning process such that an orthographic projection of the patterned cathode on the base substrate is at least partially overlapped with an orthographic projection of the shielding layer on the base substrate.
In some exemplary embodiments, the shielding layer is located at a side of the at least one connection layer close to the base substrate.
In some exemplary embodiments, a material of the at least one connection layer is a metallic material or an oxide material.
In some exemplary embodiments, the shielding layer includes a shielding strip extending along a first direction, and a plurality of shielding blocks connected to the shielding strip. In the first region, an orthographic projection of an extended part of at least one first connection line of the at least one connection layer along the first direction on the base substrate is within a range of an orthographic projection of the shielding strip on the base substrate.
In some exemplary embodiments, the first region includes a first sub-region and a second sub-region, the second sub-region is located on at least one side of the first sub-region. The shielding layer of the second sub-region includes a shielding strip extending along the first direction and a plurality of shielding blocks connected with the shielding strip. The shielding layer of the first sub-region includes a plurality of shielding blocks independently arranged.
In some exemplary embodiments, a material of the first connection line electrically connected to at least one first light emitting element in the second sub-region is different from a material of a first connection line electrically connected to at least one first light emitting element in the first sub-region.
In some exemplary embodiments, the shielding strip and a plurality of shielding blocks connected to the shielding strip are of an integral structure.
In some exemplary embodiments, the light emitting structure layer further includes a patterned anode located in the first region, an orthographic projection of the anode in the first region on the base substrate is within a range of an orthographic projection of the shielding layer on the base substrate.
In some exemplary embodiments, the circuit structure layer includes a first conductive layer, a semiconductor layer, a second conductive layer, a third conductive layer, a fourth conductive layer, and a fifth conductive layer disposed on the base substrate. The shielding layer is disposed in the same layer as one of the first conductive layer, the second conductive layer, the third conductive layer, the fourth conductive layer and the fifth conductive layer, and the at least one connection layer and the shielding layer are located in different film layers.
In some exemplary embodiments, the circuit structure layer further includes a first transparent conductive layer, a second transparent conductive layer, and a third transparent conductive layer located at a side of the fourth conductive layer away from the base substrate. The at least one connection layer is disposed in the same layer as at least one of the first transparent conductive layer, the second transparent conductive layer and the third transparent conductive layer.
In some exemplary embodiments, the plurality of first light emitting elements of the first region include a first light emitting element that emits light of a first color, a first light emitting element that emits light of a second color, a first light emitting element that emits light of a third color, and a first light emitting element that emits a fourth color light. The shielding layer at least includes a first shielding block, a second shielding block, a third shielding block and a fourth shielding block. The first shielding block, the second shielding block, the third shielding block and the fourth shielding block are disposed along the first direction. An orthographic projection of an anode of the first light emitting element emitting light of the first color on the base substrate is within a range of an orthographic projection of the first shielding block on the base substrate, an orthographic projection of an anode of the first light emitting element emitting light of the second color on the base substrate is within a range of an orthographic projection of the second shielding block on the base substrate, an orthographic projection of an anode of the first light emitting element emitting light of the third color on the base substrate is within a range of an orthographic projection of the third shielding block on the base substrate, an orthographic projection of an anode of the first light emitting element emitting the fourth color light on the base substrate is within a range of an orthographic projection of the fourth shielding block on the base substrate.
In some exemplary embodiments, the shielding layer further includes a shielding strip connecting the first shielding block, the second shielding block, the third shielding block, and the fourth shielding block. The first shielding block, the second shielding block and the third shielding block are located at a side of the shielding strip in a second direction, and the fourth shielding block is located at another side of the shielding strip in the second direction. The second direction intersects with the first direction.
In some exemplary embodiments, the shielding layer further includes a shielding strip connecting the first shielding block, the second shielding block, the third shielding block, and the fourth shielding block. The first shielding block and the third shielding block are located at a side of the shielding strip in the second direction, and the second shielding block and the fourth shielding block are located at another side of the shielding strip in the second direction. The second direction intersects with the first direction.
In some exemplary embodiments, the shielding layer is located at a side of the at least one connection layer away from the base substrate; the shielding layer includes a hollow part, the at least one first connection line is electrically connected with an anode of the first light emitting element through an anode connection via, and an orthographic projection of the anode connection via on the base substrate is within a range of an orthographic projection of the hollow part on the base substrate.
In another aspect, an embodiment of the present disclosure provides a display apparatus, which includes the aforementioned display substrate and a sensor located at a non-display side of the display substrate, and an orthographic projection of the sensor on the display substrate is overlapped with the first region of the display substrate.
In another aspect, an embodiment of the present disclosure provides a preparation method for a display substrate, and the display substrate includes a first region and a second region located on at least one side of the first region. The preparation method includes the following acts: forming a light transmitting structure layer on the base substrate of the first region and forming a circuit structure layer on the base substrate of the second region; forming a light emitting structure layer at a side of the circuit structure layer and the light transmitting structure layer away from the base substrate, wherein the light emitting structure layer at least includes a plurality of first light emitting elements located in the first region; and forming a patterned cathode of the light emitting structure layer in the first region. The circuit structure layer at least includes a plurality of first pixel circuits. The light transmitting structure layer includes a shielding layer and at least one connection layer, wherein the at least one connection layer includes a plurality of first connection lines, and at least one first connection line of the plurality of first connection lines extends from the first region to the second region. An orthographic projection of the shielding layer on the base substrate is at least partially overlapped with an orthographic projection of the at least one connection layer on the base substrate. At least one of the plurality of first light emitting elements in the first region is electrically connected to at least one of the plurality of first pixel circuits in the second region through at least one first connection line. The shielding layer is configured as a shielding structure in a cathode patterning process such that an orthographic projection of the patterned cathode on the base substrate is at least partially overlapped with an orthographic projection of the shielding layer on the base substrate.
In some exemplary embodiments, forming the light transmitting structure layer on the base substrate of the first region and forming the circuit structure layer on the base substrate of the second region includes: forming a semiconductor layer on the base substrate of the second region, wherein the semiconductor layer at least includes an active layer of a transistor of a first pixel circuit; forming a shielding layer in the first region and forming a second conductive layer in the second region synchronously, wherein the second conductive layer includes a gate electrode of a transistor and a first plate of a storage capacitor of the first pixel circuit; forming a connection layer in the first region and forming a third conductive layer in the second region synchronously, wherein the third conductive layer includes a second plate of the storage capacitor of the first pixel circuit; and forming a fourth conductive layer in the second region, wherein the fourth conductive layer includes a first electrode and a second electrode of the transistor of the first pixel circuit.
Other aspects of the present disclosure may be comprehended after the drawings and the detailed descriptions are read and understood.
Accompanying drawings are used for providing further understanding of technical solutions of the present disclosure, constitute a part of the specification, and are used for explaining the technical solutions of the present disclosure together with embodiments of the present disclosure, but do not constitute limitations on the technical solutions of the present disclosure. Shapes and sizes of one or more components in the drawings do not reflect actual scales, but are only intended to schematically describe contents of the present disclosure.
The embodiments of the present disclosure will be described below with reference to the drawings in detail. Implementation modes may be implemented in multiple different forms. Those of ordinary skills in the art may easily understand such a fact that modes and contents may be transformed into other forms without departing from the purpose and scope of the present disclosure. Therefore, the present disclosure should not be explained as being limited to the contents recorded in the following implementations only. The embodiments and features in the embodiments of the present disclosure may be randomly combined with each other if there is no conflict.
In the drawings, a size of one or more constituent elements, a thickness of a layer, or a region is sometimes exaggerated for clarity. Therefore, one mode of the present disclosure is not necessarily limited to the size, and a shape and a size of one or more components in the drawings do not reflect an actual scale. In addition, the accompanying drawings schematically illustrate ideal examples, and a mode of the present disclosure is not limited to shapes, numerical values, or the like shown in the drawings.
Ordinal numerals “first”, “second”, “third”, etc., in the specification are set not to form limits on numbers but only to avoid confusion between composition elements. In the present disclosure, “a plurality of” represents two or more than two.
In the specification, for convenience, expressions “central”, “above”, “below”, “front”, “back”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, etc., indicating directional or positional relationships are used to illustrate positional relationships between the composition elements, not to indicate or imply that involved devices or elements are required to have specific orientations and be structured and operated with the specific orientations but only to easily and simply describe the present specification, and thus should not be understood as limitations on the present disclosure. The positional relationships between the constituent elements are changed as appropriate according to a direction where the constituent elements are described. Therefore, appropriate replacements based on situations are allowed, which is not limited to the expressions in the specification.
In the specification, unless otherwise specified and defined, terms “mounting”, “mutual connection”, and “connection” should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or a connection; it may be a direct connection, an indirect connection through a middleware, or internal communication inside two elements. Those of ordinary skills in the art may understand meanings of the aforementioned terms in the present disclosure according to situations.
In the specification, “electrical connection” includes connection of composition elements through an element with having some electrical function. The “element having some electrical function” is not particularly limited as long as electrical signals between the connected constituent elements may be transmitted. Examples of the “element having some electrical function” not only include an electrode and a wiring, but also include a switching element such as a transistor, a resistor, an inductor, a capacitor, another element with multiple functions, etc.
In the specification, a transistor refers to an element which at least includes three terminals, i.e., a gate, a drain, and a source. The transistor has a channel region between the drain (drain electrode terminal, drain region, or drain electrode) and the source (source electrode terminal, source region, or source electrode), and a current can flow through the drain, the channel region, and the source. In the specification, the channel region refers to a region through which a current mainly flows.
In the specification, to distinguish two electrodes of a transistor except a gate electrode, one of the electrodes is referred to as a first electrode and the other electrode is referred to as a second electrode. The first electrode may be a source electrode or a drain electrode, and the second electrode may be a drain electrode or a source electrode. In addition, the gate electrode of the transistor is referred to as a control electrode. In a case that transistors with opposite polarities are used, or in a case that a direction of a current is changed during operation of a circuit, or the like, functions of the “source” and the “drain” are sometimes interchangeable. Therefore, the “source” and the “drain” are interchangeable in the specification.
In the specification, “parallel” refers to a state in which an angle formed by two straight lines is above −10° and below 10°, and thus may include a state in which the angle is above −5° and below 5°. In addition, “perpendicular” refers to a state in which an angle formed by two straight lines is above 80° and below 100°, and thus may include a state in which the angle is above 85° and below 95° . . .
A triangle, rectangle, trapezoid, pentagon, or hexagon, etc. in the specification is not strictly defined, and it may be an approximate triangle, rectangle, trapezoid, pentagon, or hexagon, etc. There may be some small deformations caused by tolerance, and there may be a chamfer, an arc edge, and deformation, etc.
A “light transmittance” in the present disclosure refers to an ability of light to pass through a medium, and is a percentage of luminous flux passing through a transparent or translucent body to its incident luminous flux.
In the present disclosure, “about” and “substantially” refer to that a boundary is not defined strictly and a case within a range of process and measurement errors is allowed. In the present disclosure, “substantially the same” refers to a case where numerical values differ by less than 10%.
In the present disclosure, “A extends along a B direction” means that A may include a main body portion and a secondary portion connected with the main body portion, the main body portion is a line, a line segment, or a strip-shaped body, the main body portion extends along the B direction, and a length of the main body portion extending along the B direction is greater than a length of the secondary portion extending along another direction. In following description, “A extends in B direction” means “a main body portion of A extends in B direction”.
For products such as smart terminals, it is usually necessary to set up hardware such as front camera, fingerprint sensor or light sensor. In order to increase the screen-to-body ratio, products such as full screen or narrow bezel usually adopt under-screen fingerprint or under-screen camera technology.
An embodiment of the present disclosure provides a display substrate, which includes a base substrate, a circuit structure layer, a light transmitting structure layer and a light emitting structure layer. The base substrate includes a first region and a second region located on at least one side of the first region. The circuit structure layer is located in the second region and at least includes a plurality of first pixel circuits. The light transmitting structure layer is located in the first region and includes a shielding layer and at least one connection layer. An orthographic projection of the shielding layer on the base substrate is at least partially overlapped with an orthographic projection of at least one connection layer on the base substrate. At least one connection layer includes a plurality of first connection lines, and at least one of the plurality of first connection lines extends from the first region to the second region. The light emitting structure layer is located at a side of the circuit structure layer and the light transmitting structure layer away from the base substrate, and at least includes a plurality of first light emitting elements located in the first region. At least one of the plurality of first light emitting elements in the first region is electrically connected to at least one of the plurality of first pixel circuits in the second region through at least one first connection line. The light emitting structure layer includes a patterned cathode located in the first region. The shielding layer is configured as a shielding structure in a cathode patterning process such that an orthographic projection of the patterned cathode on the base substrate is at least partially overlapped with an orthographic projection of the shielding layer on the base substrate.
In the display substrate provided by the embodiment, the first light emitting element located in the first region and the first pixel circuit located in the second region are electrically connected by the first connection line provided by at least one connection layer, and an orthographic projection of the shielding layer on the base substrate is at least partially overlapped with an orthographic projection of at least one connection layer on the base substrate, so that the influence of the arrangement of the first connection lines on the light transmittance of the first region can be improved.
In some exemplary embodiments, the material of at least one connection layer may be a metallic material or an oxide material. For example, the oxide material may include indium tin oxide (ITO), indium gallium zinc oxide (IGZO).
In some examples, the display substrate may include one or more connection layers made of a metallic material. The electrical connections between the plurality of first pixel circuits and the plurality of first light emitting elements may all be realized by first connection lines made of a metallic material. In other examples, the display substrate may include a plurality of connection layers made of an oxide material. The electrical connections between the plurality of first pixel circuits and the plurality of first light emitting elements may all be realized by transparent first connection lines made of an oxide material. In other examples, the display substrate may include at least one connection layer made of a metallic material and at least one connection layer made of an oxide material. The electrical connections between a part of the first pixel circuits and a part of the first light emitting elements may be realized by first connection lines made of a metallic material, and the electrical connections between another part of the first pixel circuits and another part of the first light emitting elements may be realized by transparent first connection lines made of an oxide material. This embodiment is not limited thereto.
In some examples, the display substrate includes one or more connection layers made of a metallic material, which can reduce the use of transparent conductive layers, thereby reducing the process preparation process and facilitating increase in productivity. Moreover, by preparing one or more connection layers using a metallic material, it is advantageous to increase the number of connection lines between the first light emitting elements and the first pixel circuits, and to increase the size of the first region.
In some exemplary embodiments, the shielding layer may be located at a side of at least one connection layer close to the base substrate. For example, the circuit structure layer may at least include a first conductive layer, a semiconductor layer, a second conductive layer, a third conductive layer, a fourth conductive layer, and a fifth conductive layer disposed on the base substrate, and the shielding layer may be disposed in the same layer as one of the first conductive layer, the second conductive layer, the third conductive layer, the fourth conductive layer, and the fifth conductive layer and formed simultaneously by the same patterning process. The connection layer may be located at a different film layer from the shielding layer. For example, the shielding layer is disposed in the same layer as the first conductive layer, and the connection layer may be disposed in the same layer as any of the second conductive layer to the fifth conductive layer. As another example, the shielding layer is disposed in the same layer as the second conductive layer, and the connection layer may be disposed in the same layer as any of the third conductive layer to the fifth conductive layer. However, the embodiment is not limited thereto. In other examples, the shielding layer may be located at a side of the connection layer away from the base substrate. For example, the shielding layer may be disposed in the same layer as the fifth conductive layer and formed simultaneously by the same patterning process, and the connection layer may be disposed in the same layer as any of the first conductive layer to the fourth conductive layer and formed simultaneously by the same patterning process.
In some exemplary embodiments, the shielding layer may include a shielding strip extending along a first direction, and a plurality of shielding blocks connected to the shielding strip. In the first region, an orthographic projection of an extended part of at least one first connection line of at least one connection layer along the first direction on the base substrate may be located within a range of an orthographic projection of the shielding strip on the base substrate. In this example, the first connection line of the connection layer is at least partially shielded by the shielding strip of the shielding layer, so that the influence of the connection layer on the light transmittance of the first region can be avoided, and the space can be fully utilized to realize the trace arrangement.
In some exemplary embodiments, the first region may include a first sub-region and a second sub-region, and the second sub-region may be located on at least one side of the first sub-region. The shielding layer of the second sub-region may include a shielding strip extending in a first direction and a plurality of shielding blocks connected with the shielding strip. The shielding layer of the first sub-region may include a plurality of shielding blocks independently arranged. In the present example, removing the shielding strips of the shielding layer in a partial region within the first region can facilitate the improvement for diffraction caused by many shielding strips. In some exemplary embodiments, a material of the first connection line electrically connected to at least one first light emitting element in the second sub-region may be different from a material of a first connection line electrically connected to at least one first light emitting element in the first sub-region. For example, at least one first light emitting element in the second sub-region may be electrically connected to at least one first pixel circuit of the second region through a first connection line made of a metallic material, and at least one first light emitting element in the first sub-region may be electrically connected to at least one first pixel circuit of the second region through a first connection line made of an oxide material. In this way, the light transmittance of the first region can be improved and the diffraction can be improved. However, the embodiment is not limited thereto. In other examples, at least one first light emitting element within the first sub-region may also be electrically connected to at least one first pixel circuit of the second region through the first connection line made of a metallic material.
In some exemplary embodiments, the light emitting structure layer may further include a patterned anode located in the first region, an orthographic projection of the anode in the first region on the base substrate is within a range of an orthographic projection of the shielding layer on the base substrate. In this example, by covering the anode of the first region with the shielding layer, the anode of the first region can be protected and the light transmittance of the first region can be ensured, and the influence of the cathode patterning process on the anode can be avoided.
Solutions of the embodiments will be described below through some examples.
In some examples, as shown in
In some examples, as shown in
In some examples, as shown in
In some examples, as shown in
In some examples, the display region AA may be provided with a plurality of sub-pixels. At least one sub-pixel may include a pixel circuit and a light emitting element. The pixel circuit may be configured to drive a connected light emitting element. For example, the pixel circuit is configured to provide a drive current to drive the light emitting element to emit light. The pixel circuit may include a plurality of transistors and at least one capacitor. For example, the pixel circuit may be of a 3TIC, 4TIC, 5TIC, 5T2C, 6TIC, 7TIC, or 8TIC structure. Among them, in the above circuit structure, T refers to a thin film transistor, C refers to a capacitor, a number before T represents a quantity of thin film transistors in the circuit, and a number before C represents a quantity of capacitors in the circuit.
In some examples, the plurality of transistors in the pixel circuit may be P-type transistors or may be N-type transistors. Use of a same type of transistors in the pixel circuit may simplify a process flow, reduce a process difficulty of the display substrate, and improve a yield of products. In other examples, the plurality of transistors in the pixel circuit may include a P-type transistor and an N-type transistor.
In some examples, low temperature poly silicon thin film transistors, or oxide thin film transistors, or a low temperature poly silicon thin film transistor and an oxide thin film transistor may be adopted for the plurality of transistors in the pixel circuit. Low Temperature Poly Silicon (LTPS) is adopted for an active layer of a low temperature poly silicon thin film transistor and an oxide semiconductor (Oxide) is adopted for an active layer of an oxide thin film transistor. The low temperature poly silicon thin film transistor has advantages such as a high migration rate and fast charging, and the oxide thin film transistor has advantages such as a low leakage current. The low temperature poly silicon thin film transistor and the oxide thin film transistor are integrated on one display panel, that is, an LTPS+Oxide (LTPO for short) display panel, advantages of both the low temperature poly silicon thin film transistor and the oxide thin film transistor may be utilized, so that low-frequency drive may be achieved, power consumption may be reduced, and display quality may be improved.
In some examples, the light emitting element may be any one of a Light Emitting Diode (LED), an Organic Light emitting Diode (OLED), a Quantum dot Light emitting Diode (QLED), a Micro LED (including a mini-LED or a micro-LED) and the like. For example, the light emitting element may be an OLED, and the light emitting element may emit red light, green light, blue light, or white light, etc. under drive of a pixel circuit corresponding to the light emitting element. A color of light emitted by the light emitting element may be determined as required. In some examples, the light emitting element may include an anode, a cathode, and an organic emitting layer located between the anode and the cathode. The anode of the light emitting element may be electrically connected with a corresponding pixel circuit. However, the embodiment is not limited thereto.
In some examples, one pixel unit of the display region AA may include three sub-pixels, and the three sub-pixels may be a red sub-pixel, a green sub-pixel, and a blue sub-pixel, respectively. However, the embodiment is not limited thereto. In some examples, one pixel unit may include four sub-pixels, wherein the four sub-pixels may be a red sub-pixel, a green sub-pixel, a blue sub-pixel, and a white sub-pixel respectively.
In some examples, a shape of the light emitting element may be a rectangle, a rhombus, a pentagon, or a hexagon. When one pixel unit includes three sub-pixels, light emitting elements of the three sub-pixels may be arranged in a manner to stand side by side horizontally, in a manner to stand side by side vertically, or in a manner like a Chinese character “we”. When one pixel unit includes four sub-pixels, light emitting elements of the four sub-pixels may be arranged in a manner to stand side by side horizontally, in a manner to stand side by side vertically, or in a manner to form a square. However, the embodiment is not limited thereto.
In some examples, as shown in
In some examples, as shown in
In some examples, the first initial signal line INIT is configured to provide a first initial signal to the pixel circuit, and the second initial signal line INIT2 is configured to provide a second initial signal to the pixel circuit. For example, the first initial signal may be different from the second initial signal. The first initial signal and the second initial signal may be constant voltage signals, and their magnitudes may be between a first voltage signal VDD and a second voltage signal VSS, but not limited to this. In other examples, the first initial signal and the second initial signal may be the same and only the first initial signal line may be set to provide the first initial signal.
In some examples, as shown in
In this example, a first node N1 is a connection point of the storage capacitor Cst, the first reset transistor T1, the drive transistor T3, and the threshold compensation transistor T2, a second node N2 is a connection point of the first light emitting control transistor T5, the data writing transistor T4, and the drive transistor T3, a third node N3 is a connection point of the drive transistor T3, the threshold compensation transistor T2, and the second light emitting control transistor T6, and a fourth node N4 is a connection point of the second light emitting control transistor T6, the second reset transistor T7, and the light emitting element EL. The fourth node N4 is an anode connection node.
An operating process of the pixel drive circuit shown in
In some exemplary implementation modes, during one-frame display time period, the working process of the pixel circuit may include a first stage, a second stage, and a third stage.
The first stage is referred to as a reset stage. A first reset control signal RESET1 provided by the first reset control line RST1 is a low-level signal, so that the first reset transistor T1 is turned on, and a first initial signal provided by the first initial signal line INITI is provided to the first node N1 to initialize the first node N1 and clear an original data voltage in the storage capacitor Cst. A scan signal SCAN provided by the scan line GL is a high-level signal, and a light emitting control signal EM provided by the light emitting control line EML is a high-level signal, so that the data writing transistor T4, the threshold compensation transistor T2, the first light emitting control transistor T5, the second light emitting control transistor T6, and the second reset transistor T7 are turned off. In this stage, the light emitting element EL does not emit light.
The second stage is referred to as a data writing stage or a threshold compensation stage. A scan signal SCAN provided by the scan line GL is a low-level signal, a first reset control signal RESET1 provided by the first reset control line RST1 and an emitting control signal EM provided by the emitting control line EML are both high-level signals, and the data line DL outputs a data signal DATA. In this stage, the first capacitance plate of the storage capacitor Cst is at a low level, so that the driving transistor T3 is turned on. The scan signal SCAN is a low-level signal, so that the threshold compensation transistor T2, the data writing transistor T4, and the second reset transistor T7 are turned on. The threshold compensation transistor T2 and the data writing transistor T4 are turned on, so that a data voltage Vdata output by the data line DL is provided to the first node NI through the second node N2, the turned-on driving transistor T3, the third node N3, and the turned-on threshold compensation transistor T2, and the storage capacitor Cst is charged with a difference between the data voltage Vdata output by the data line DL and a threshold voltage of the driving transistor T3. A voltage of a first capacitance plate (that is, the first node N1) of the storage capacitor Cst is Vdata−|Vth|, Vdata is the data voltage output by the data line DL, and Vth is the threshold voltage of the driving transistor T3. The second reset transistor T7 is turned on, so that a second initial signal provided by the second initial signal line INIT2 is provided to the anode of the light emitting element EL to initialize (reset) the anode of the light emitting element EL and clear a pre-stored voltage therein, so as to complete initialization, thereby ensuring that the light emitting element EL does not emit light. The first reset control signal RESET1 provided by the first reset control line RST1 is the high-level signal, so that the first reset transistor T1 is turned off. The light emitting control signal EM provided by the light emitting control signal line EML is a high-level signal, so that the first light emitting control transistor T5 and the second light emitting control transistor T6 are turned off.
The third stage is referred to as a light emitting stage. A light emitting control signal EM provided by the light emitting control signal line EML is a low-level signal, and a scan signal SCAN provided by the scan line GL and a first reset control signal RESET1 provided by the first reset control line RST1 are high-level signals. The light emitting control signal EM provided by the light emitting control signal line EML is a low-level signal, so that the first light emitting control transistor T5 and the second light emitting control transistor T6 are turned on, and a first voltage signal VDD output by the first power supply line PLI provides a drive voltage to an anode of the light emitting element EL through the turned-on first light emitting control transistor T5, the drive transistor T3, and the second light emitting control transistor T6 to drive the light emitting element EL to emit light.
In a drive process of the pixel circuit, a drive current flowing through the drive transistor T3 is determined by a voltage difference between the gate and the first electrode of the drive transistor T3. Because the voltage of the first node NI is Vdata-|Vth|, the drive current of the drive transistor T3 is as follows.
Among them, I is the drive current flowing through the drive transistor T3, that is, the drive current for driving the light emitting element EL; K is a constant; Vgs is the voltage difference between the gate and the first electrode of the drive transistor T3; Vth is the threshold voltage of the drive transistor T3; Vdata is the data voltage output by the data line DL; and VDD is the first voltage signal output by the first power supply line PL1.
It may be seen from the above formula that a current flowing through the light emitting element EL has nothing to do with the threshold voltage of the drive transistor T3. Therefore, the pixel circuit of this embodiment can better compensate the threshold voltage of the drive transistor T3.
In some examples, as shown in
In some examples, as shown in
In some examples, since the second display region A2 is not only provided with a second pixel circuit 42 electrically connected with a second light emitting element, but also provided with a first pixel circuit 41 electrically connected with a first light emitting element 10, a quantity of pixel circuits may be greater than a quantity of second light emitting elements in the second display region A2. In some examples, as shown in
In other examples, original b rows of pixel circuits may be compressed along a second direction D2, so that arrangement space of one row of pixel circuits is added, and space occupied by b rows of pixel circuits before compression and space occupied by b+1 rows of pixel circuits after compression are the same. Herein, “b” may be an integer greater than 1. Or, a region in which a newly added pixel circuit is disposed may be obtained by reducing dimensions of a second pixel circuit in the first direction D1 and the second direction D2.
In an embodiment of the present disclosure, one row of pixel circuits may include a plurality of pixel circuits arranged in sequence along the first direction D1. A row of pixel circuits may all be adjacent to the same gate line (e.g. scan line). A row of light emitting elements may include a plurality of first light emitting elements and a plurality of second light emitting elements arranged along the first direction D1.
In some examples, in a direction perpendicular to the display substrate, as shown in
In some examples, as shown in
In some examples, as shown in
In some examples, as shown in
Exemplary description is made below for a structure and a manufacturing process of a display substrate. A “patterning process” mentioned in the embodiments of the present disclosure includes a treatment such as photoresist coating, mask exposure, development, etching, and photoresist stripping for a metallic material, an inorganic material, or a transparent conductive material, and includes a treatment such as organic material coating, mask exposure, and development for an organic material. Deposition may be any one or more of sputtering, evaporation, and chemical vapor deposition, coating may be any one or more of spray coating, spin coating, and inkjet printing, and etching may be any one or more of dry etching and wet etching, the present disclosure is not limited thereto. A “thin film” refers to a layer of thin film made of a material on a base substrate by using deposition, coating, or other processes. If the “thin film” does not need to be processed through a patterning process in the entire manufacturing process, the “thin film” may also be called a “layer”. If the “thin film” needs to be processed through the patterning process in the entire manufacturing process, the “thin film” is called a “thin film” before the patterning process is performed and is called a “layer” after the patterning process is performed. At least one “pattern” is contained in the “layer” which has been processed through the patterning process. “A and B are of a same layer structure” or “A and B are disposed in a same layer” mentioned in the embodiments of the present disclosure means that A and B are formed simultaneously through a same patterning process, or surfaces of A and B close to a base substrate have basically a same distance from the base substrate, or the surfaces of A and B close to the base substrate are in direct contact with a same film layer. A “thickness” of a film layer is a dimension of the film layer in a direction perpendicular to the display substrate. In an exemplary implementation of the present disclosure, “an orthographic projection of B being within a range of an orthographic projection of A” or “an orthographic projection of A containing an orthographic projection of B” means that a boundary of the orthographic projection of B falls within a range of a boundary of the orthographic projection of A, or the boundary of the orthographic projection of A is overlapped with the boundary of the orthographic projection of B.
In some exemplary implementations, a manufacturing process of the display substrate may include following operations.
(1) Providing a base substrate. In some examples, the base substrate 100 may be a flexible base substrate or may be a rigid base substrate. For example, the rigid base substrate may be made of a material such as glass or quartz. The flexible base substrate may be made of Polyimide (PI) or another material, and the flexible base substrate may be of a single-layer structure or a laminated structure composed of an inorganic material layer and a flexible material layer. However, the embodiment is not limited thereto.
(2) Forming a semiconductor layer. In some examples, a semiconductor thin film is deposited on the base substrate 100 in the second display region A2, and the semiconductor thin film is patterned through a patterning process to form a semiconductor layer in the second display region A2. For example, the semiconductor layer of the second display region may include an active layer of the transistor of the pixel circuit.
In some examples, a material of the semiconductor layer, for example, may include poly-silicon. An active layer may include at least one channel region and a first region and a second region located on two ends of the channel region. The channel region may not be doped with an impurity, and has characteristics of a semiconductor. The first region and the second region may be disposed on two sides of the channel region and doped with impurities, and thus are conductive. The impurities may be changed according to a type of a transistor. In some examples, a doped region of the active layer may be interpreted as a source or a drain of a transistor. A part of the active layer between the transistors may be interpreted as a wiring doped with an impurity, and may be used for electrically connecting the transistors.
(3) Forming a second conductive layer and a shielding layer. In some examples, a first insulation thin film and a second conductive thin film are sequentially deposited on the base substrate 100 where the aforementioned structure is formed, and the second conductive thin film is patterned by a patterning process to form a first insulation layer 101 covering a semiconductor layer, a second conductive layer disposed on the first insulation layer 101 of the second display region A2 and a shielding layer 51 disposed on the first insulation layer 101 of the first display region A1, as shown in
In some examples, as shown in
In some examples, as shown in
(4) Forming a third conductive layer and a connection layer. In some examples, a second insulation thin film and a third conductive thin film are sequentially deposited on the base substrate 100 where the aforementioned structures are formed, and the third conductive thin film is patterned by a patterning process to form a second insulation layer 102, a third conductive layer disposed on the second insulation layer 102 of the second display region A2 and a connection layer 52 disposed on the second insulation layer 102 of the first display region A1, as shown in
In some examples, the connection layer 52 may include a plurality of first connection lines. At least one first connection line may extend from the first display region A1 to the second display region A2 so as to electrically connect the anode of the first light emitting element of the first display region A1 and the first pixel circuit of the second display region A2.
(5) Forming a third insulation layer and a fourth conductive layer. In some examples, a third insulation thin film is deposited on the base substrate 100 where the aforementioned structures are formed, and the third insulation layer 103 is formed by a patterning process. A plurality of active vias are formed on the third insulation layer 103 of the second display region A2, and the plurality of active vias at least include two active vias located in the second display region A2, and the two active vias respectively expose two ends of the active layer of one transistor. Subsequently, a fourth conductive thin film is deposited and patterned by a patterning process to form a fourth conductive layer disposed in the second display region A2, as shown in
So far, preparation of a pixel circuit of the second display region A2 may be completed. For example, the transistor 300A may include an active layer, a gate electrode, a first electrode and a second electrode. The storage capacitor 300B may include a first plate and a second plate. At this time, the light transmitting structure layer 201 of the first display region A1 may include a first insulation layer 101, a shielding layer 51, a second insulation layer 102, a connection layer 52, and a third insulation layer 103 that are sequentially disposed on the base substrate 100
In some examples, the first insulation layer 101, the second insulation layer 102, and the third insulation layer 103 may be made of any one or more of Silicon Oxide (SiOx), Silicon Nitride (SiNx), and Silicon Oxynitride (SiON), and may be a single layer, a multi-layer, or a composite layer. The first insulation layer 101 and the second insulation layer 102 may be referred to as Gate Insulation (GI) layers, and the third insulation layer 103 may be referred to as an Interlayer Dielectric (ILD) layer. The second conductive layer, the third conductive, the fourth conductive layer, the shielding layer 51 and the connection layer 52 may be made of a metallic material, such as any one or more of Silver (Ag), Copper (Cu), Aluminum (Al), and Molybdenum (Mo), or an alloy material of the aforementioned metals, such as an Aluminum Neodymium alloy (AlNd) or a Molybdenum Niobium alloy (MoNb), and may be of a single-layer structure or a multi-layer composite structure, such as Mo/Cu/Mo, Ti/Al/Ti. The semiconductor layer may be made of various materials, such as amorphous Indium Gallium Zinc Oxide (a-IGZO), Zinc Oxynitride (ZnON), Indium Zinc Tin Oxide (IZTO), amorphous Silicon (a-Si), polycrystalline Silicon (p-Si). That is, the present disclosure is applicable to transistors manufactured based on an oxide technology, a silicon technology, and an organic matter technology.
(6) Forming a fifth conductive layer. In some examples, a fourth insulation thin film is deposited on the base substrate 100 where the aforementioned structures are formed, and the fourth insulation thin film is patterned by a patterning process to form a fourth insulation layer 104. The fourth insulation layer 104 is formed with a plurality of vias in the second display region A2, and the plurality of vias at least include a first connection hole located in the second display region A2. The fourth insulation layer 104 in the first connection hole of each sub-pixel may be removed to expose a first electrode of a transistor of a pixel circuit of the sub-pixel. In some examples, the fourth insulation layer 104 may be made of any one or more of Silicon Oxide (SiOx), Silicon Nitride (SiNx), and Silicon Oxynitride (SiON), and may be a single layer, a multi-layer, or a composite layer. The fourth insulation layer 104 may be referred to as a passivation (PVX) layer.
Subsequently, a fifth conductive thin film is deposited, and the fifth conductive thin film is patterned by a patterning process to form a fifth conductive layer. As shown in
In some examples, the fifth conductive layer may employ a multilayer composite structure, such as Ti/Al/Ti. However, the embodiment is not limited thereto.
(7) Forming a fifth insulation layer. In some examples, a fifth insulation thin film is coated on the base substrate 100 where the aforementioned structures are formed, and a fifth insulation layer 105 is formed through a patterning process, as show in
Thus, the preparation of the light transmitting structure layer 201 of the first display region A1 and the circuit structure layer 203 of the second display region A2 is completed. The light transmitting structure layer 201 of the first display region A1 may include a first insulation layer 101, a shielding layer 51, a second insulation layer 102, a connection layer 52, a third insulation layer 103, a fourth insulation layer 104, and a fifth insulation layer 105 that are sequentially disposed on the base substrate 100. The circuit structure layer 203 of the second display region A2 may include a semiconductor layer, a first insulation layer 101, a second conductive layer, a second insulation layer 102, a third conductive layer, a third insulation layer 103, a fourth conductive layer, a fourth insulation layer 104, a fifth conductive layer, and a fifth insulation layer 105 that are sequentially disposed on the base substrate 100.
(8) Forming an anode layer. In some examples, an anode conductive thin film is deposited on the base substrate 100 where the aforementioned structures are formed, and the anode conductive thin film is patterned through a patterning process to form an anode layer. As shown in
In some examples, as shown in
In some examples, as shown in
In some examples, the anode conductive thin film may be made of a metallic material or a transparent conductive material, and the metallic material may include any one or more of silver (Ag), copper (Cu), aluminum (Al), and molybdenum (Mo), or an alloy material of the above metals. The transparent conductive material may include Indium Tin Oxide (ITO) or Indium Zinc Oxide (IZO). In some examples, the anode conductive thin film may be of a single-layer structure or may be of a multi-layer composite structure, such as ITO/Al/ITO and the like.
(9) Forming a pixel define layer. In some examples, a pixel define thin film is coated on a base substrate 100 where the aforementioned patterns are formed, and the pixel define thin film is patterned by a patterning process to form a pixel define layer (PDL, Pixel Define Layer) 36, as shown in
In some examples, a patterning process of a half tone mask may be employed, and a pattern of a post spacer may be formed when forming the pixel define layer, the post spacer may be disposed outside the pixel opening, and the post spacer may be configured to support the fine metal mask in a subsequent evaporation process. However, the embodiment is not limited thereto.
In some examples, in a direction parallel to the display substrate, the shape of the pixel opening may be a rectangle, square, pentagon, hexagon, circle, or ellipse, or the like. In a direction perpendicular to the display substrate, the cross-sectional shape of the pixel opening may be a rectangle or a trapezoid, etc. The inner side walls of the pixel openings may be planar or cambered. However, the embodiment is not limited thereto.
(10) Forming an organic light emitting layer. In some examples, the organic light emitting layer 37 is formed by evaporation or ink jet printing on the base substrate 100 where the aforementioned structures are formed, as shown in
In an example, the organic emitting layer may include an Emitting Layer (EML), and any one or more of following: a Hole Injection Layer (HIL), a Hole Transport Layer (HTL), an Electron Block Layer (EBL), a Hole Block Layer (HBL), an Electron Transport Layer (ETL), and an Electron Injection Layer (EIL).
In some examples, the organic light emitting layer may be prepared in the following manner. Firstly, a hole injection layer, a hole transport layer, and an electron block layer are formed sequentially using an evaporation process of an open mask or an ink-jet printing process, and a common layer of the hole injection layer, the hole transport layer, and the electron block layer is formed on a display substrate. Then, a red emitting layer, a green emitting layer, and a blue emitting layer are respectively formed in corresponding sub-pixels using an evaporation process of a fine metal mask or an ink-jet printing process. Emitting layers of adjacent sub-pixels may be overlapped slightly (e.g. an overlapping portion accounts for less than 10% of an area of a pattern of an individual emitting layer) or may be isolated. Subsequently, a hole block layer, an electron transport layer, and an electron injection layer are formed in sequence using an evaporation process of an open mask or an ink-jet printing process. A common layer of the hole blocking layer, the electron transport layer, and the electron injection layer is formed on the display substrate.
In some examples, the organic emitting layer may include a microcavity adjustment layer, so that a thickness of the organic emitting layer between a cathode and an anode satisfies a design of a length of a microcavity. For example, a hole transport layer, an electron blocking layer, a hole blocking layer, or an electron transport layer may be employed as the microcavity adjustment layer. This embodiment is not limited thereto.
In some examples, the light emitting layer may include a host material and a dopant material doped in the host material. The doping ratio of the dopant material of the light emitting layer can be about 1% to 20%. Within a range of the doping ratio, on one hand, the host material of the emitting layer may effectively transfer exciton energy to the dopant material of the emitting layer to excite the dopant material to emit light; on the other hand, the host material “dilutes” the dopant material of the emitting layer, so as to effectively improve fluorescence quenching caused by collisions between molecules of the dopant material of the emitting layer and collisions between energies, and improve a light emitting efficiency and device lifetime. The doping ratio may refer to a ratio of the mass of the dopant material to the mass of the emitting layer, that is, the mass percentage. For example, the thickness of the light emitting layer may be about 10 nm to 50 nm.
(11) Forming a cathode layer. In some examples, a pattern of a cathode layer is formed by evaporation of an open mask on the base substrate where the aforementioned structures are formed. For example, the pattern of the cathode layer located in the first display region and the second display region may be a full-face structure.
In some examples, the cathode layer may be made of any one or more of magnesium (Mg), silver (Ag), aluminum (Al), copper (Cu), and lithium (Li), or an alloy made of any one or more of the above metals. For example, Mg and Ag with good conductivity can be used for the cathode layer.
In some examples, an optical coupling layer may be formed after the pattern of the cathode layer is formed, the optical coupling layer is disposed on the cathode, and a refractive index of the optical coupling layer may be greater than a refractive index of the cathode layer, thus facilitating light extraction and increasing light output efficiency. The material of the optical coupling layer may be an organic material, or an inorganic material, or an organic material and an inorganic material, and the optical coupling layer may be a single layer, a multilayer or a composite layer.
(12) Patterning the cathode. In some examples, on the base substrate where the aforementioned structures are formed, a patterned first cathode layer 381 is formed in the first display region A1 by irradiation from a side of the base substrate away from the light transmitting structure layer using an exposure machine, as shown in
In this example, since a plurality of anodes and cathodes of the first display region A1 are located at a side of the shielding layer 51 away from the base substrate 100, when the infrared laser device irradiates from the back surface of the display substrate (the side of the base substrate away from the light transmitting structure layer), the shielding layer 51 can be used as a protective layer to protect not only the plurality of anodes from being irradiated by the infrared laser, but also the cathode with an overlapped region with the shielding layer 51, so that the cathode with the overlapped region can be retained since it is not irradiated by the infrared laser, while the cathode without an overlapped region with the shielding layer 51 is removed by being irradiated by the infrared laser, thus forming a patterned cathode.
In the subsequent preparation process, a process such as forming an encapsulation structure layer may be included. For example, a first encapsulation layer, a second encapsulation layer and a third encapsulation layer are formed in sequence. The first encapsulation layer and the third encapsulation layer may be made of an inorganic material, and the second encapsulation layer may be made of an organic material. The encapsulation structure adopts a stacked structure of inorganic, organic and inorganic, which can ensure the integrity of encapsulation and effectively isolate external water and oxygen.
A structure and a manufacturing process of the display substrate of this embodiment are merely illustrative. In some exemplary implementation, a corresponding structure may be changed and a patterning process may be added or removed according to actual needs. The manufacturing process of the exemplary embodiment may be implemented using an existing mature manufacturing device, and may be compatible well with an existing manufacturing process, simple in process implementation, easy to implement, high in a production efficiency, low in a production cost, and high in yield.
The display substrate provided by the embodiment can reduce the number of transparent conductive layers by arranging the shielding layer of the first display region and the second conductive layer of the second display region in the same layer, and the connection layer of the first display region and the third conductive layer of the second display region in the same layer, thereby reducing the preparation steps and reducing the cost. Furthermore, a first connection line electrically connecting the first pixel circuit and the first light emitting element is provided by at least one connection layer, which is beneficial to increase the number of the first connection lines, thereby being beneficial to increase the size of the first display region. For example, if the line width of the first connection line and the spacing between adjacent lines are both designed in the size of 1.5/1.5, the display substrate with three transparent conductive layers can realize the arrangement of connection lines through two transparent conductive layers, which can reduce the preparation process of two transparent conductive layers and greatly reduce the cost. In addition, taking the first display region being a circular region as an example, the radius of the first display region can be approximately increased by 127 microns every time one connection layer is used for arranging connection lines, which is beneficial to the increase of the aperture of the first display region.
In this example, as shown in
In other examples, taking the shielding layer and the first conductive layer being disposed in the same layer as an example, the display substrate includes a plurality of connection layers, wherein one connection layer may be disposed in the same layer as one of the second conductive layer to the fifth conductive layer, and the rest connection layers may be disposed in the same layer as at least one of the first transparent conductive layer and the third transparent conductive layer.
In some examples, as shown in
In some examples, as shown in
In some examples, as shown in
Rest of the structure of the display substrate according to this embodiment may refer to descriptions of the aforementioned embodiments, and will not be repeated here.
In some examples, as shown in
In some examples, an orthographic projection of an extended part of at least one first connection line of the connection layer along the second direction D2 on the base substrate may be within a range of an orthographic projection of the first shielding strip or the second shielding strip of the shielding layer on the base substrate. The pattern of the shielding layer can be matched with the direction of the first connection line. The extending direction of the shielding strip of the shielding layer is parallel to the first direction D1, or the second direction D2, or may intersect with both the first direction D1 and the second direction D2. The shielding strip can be linear or curved arc. However, the embodiment is not limited thereto. Rest of the structure of the display substrate according to this embodiment may refer to descriptions of the aforementioned embodiments, and will not be repeated here.
In some examples, as shown in
In some examples, as shown in
In this example, the arrangement of the first light emitting elements to the fourth light emitting elements is different from that of the foregoing embodiments. Rest of the structure of the display substrate according to this embodiment may refer to descriptions of the aforementioned embodiments, and will not be repeated here.
The embodiment also provides a preparation method for a display substrate, wherein the display substrate includes a first region and a second region located on at least one side of the first region. The preparation method includes: forming a light transmitting structure layer on the base substrate of the first region and forming a circuit structure layer on the base substrate of the second region; forming a light emitting structure layer on a side of the circuit structure layer and the light transmitting structure layer away from the base substrate, wherein the light emitting structure layer at least includes a plurality of first light emitting elements located in the first region; forming a patterned cathode of the light emitting structure layer in the first region. The circuit structure layer at least includes a plurality of first pixel circuits. The light transmitting structure layer includes a shielding layer and at least one connection layer, wherein at least one connection layer includes a plurality of first connection lines, and at least one first connection line of the plurality of first connection lines extends from the first region to the second region. An orthographic projection of the shielding layer on the base substrate is at least partially overlapped with an orthographic projection of at least one connection layer on the base substrate. At least one of the plurality of first light emitting elements in the first region is electrically connected to at least one of the plurality of first pixel circuits in the second region through at least one first connection line. The shielding layer is configured as a shielding structure in a cathode patterning process such that an orthographic projection of the patterned cathode on the base substrate is at least partially overlapped with an orthographic projection of the shielding layer on the base substrate.
In some exemplary embodiments, forming the light transmitting structure layer on the base substrate of the first region and forming the circuit structure layer on the base substrate of the second region includes: forming a semiconductor layer on the base substrate of the second region, wherein the semiconductor layer at least includes an active layer of a transistor of a first pixel circuit; forming a shielding layer in the first region and forming a second conductive layer in the second region synchronously, wherein the second conductive layer includes a gate electrode of a transistor and a first plate of a storage capacitor of the first pixel circuit; forming a connection layer in the first region and forming a third conductive layer in the second region synchronously, wherein the third conductive layer includes a second plate of the storage capacitor of the first pixel circuit; and forming a fourth conductive layer in the second region, wherein the fourth conductive layer includes a first electrode and a second electrode of the transistor of the first pixel circuit.
The preparation process of the display substrate according to the embodiment may refer to descriptions of the aforementioned embodiments, and thus will not be repeated here.
An embodiment of the present disclosure also provides a display apparatus, which includes the aforementioned display substrate.
In some examples, the display substrate 91 may be a flexible OLED display substrate, a QLED display substrate, a Micro-LED display substrate, or a Mini-LED display substrate. The display apparatus may be any product or component with a display function such as an OLED display, a cell phone, a tablet, a television, a display, a laptop, a digital photo frame, and a navigator, which is not limited in the embodiments of the present disclosure.
The drawings of the present disclosure only involve structures involved in the present disclosure, and other structures may refer to conventional designs. The embodiments of the present disclosure and features in the embodiments may be combined to each other to obtain new embodiments if there is no conflict. Those of ordinary skills in the art should understand that modifications or equivalent replacements may be made to the technical solutions of the present disclosure without departing from the essence and scope of the technical solutions of the present disclosure, and shall all fall within the scope of the claims of the present disclosure.
Number | Date | Country | Kind |
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202211160598.1 | Sep 2022 | CN | national |
The present application is a U.S. National Phase Entry of International Application No. PCT/CN2023/113072 having an international filing date of Aug. 15, 2023, which claims priority to Chinese Patent Application No. 202211160598.1 filed to the CNIPA on Sep. 22, 2022 and entitled “Display Substrate and Preparation Method Therefor, and Display Apparatus”. The above-identified applications are incorporated into the present application by reference in their entireties.
Filing Document | Filing Date | Country | Kind |
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PCT/CN2023/113072 | 8/15/2023 | WO |