The present disclosure relates to the field of display technologies, and in particular, relates to a method for detecting a crack, a display substrate, and a display device.
With the advancement of display technologies, display panels have been widely used.
Embodiments of the present disclosure provide a method for detecting a crack, a display substrate, and a display device. The technical solutions are as follows.
According to some embodiments of the present disclosure, a display substrate is provided. The display substrate includes: a base substrate, a plurality of data lines, and a crack detection circuit that are disposed on the base substrate: wherein the base substrate includes a display region and a peripheral region surrounding the display region, at least part of the plurality of data lines are disposed on the display region,
In some embodiments, the crack detection circuit includes a first trace, a second trace, and a third trace, wherein two ends of the first trace and two ends of the second trace are connected to the controller, and the first trace is connected to the second trace via the third trace:
In some embodiments, the display substrate further includes: the controller disposed on the peripheral region of the base substrate: wherein the at least one of the plurality of data lines extends from the display region to the peripheral region and is connected to the controller; and the controller is configured to:
In some embodiments, the display substrate further includes: the controller disposed on the peripheral region of the base substrate: wherein the at least one of the plurality of data lines extends from the display region to the peripheral region and is connected to the controller; and the controller is configured to:
In some embodiments, the display substrate further includes: the controller disposed on the peripheral region of the base substrate: wherein the at least one of the plurality of data lines extends from the display region to the peripheral region and is connected to the controller; and the controller is configured to:
In some embodiments, the first trace passes through a first side and a second side of the display region, the second trace passes through the second side and a third side of the display region, and the third trace is disposed on a fourth side of the display region, wherein the first side is opposite to the third side, and the second side is opposite to the fourth side.
In some embodiments, an orthogonal projection of the first trace on a reference plane is overlapped with an orthogonal projection of the second trace on the reference plane, wherein the reference plane is intersected with a direction from the second side to the fourth side.
In some embodiments, the display substrate further includes a control line, a first switch assembly corresponding to the first data line, and a second switch assembly corresponding to the second data line: wherein
In some embodiments, the plurality of data lines further include at least one third data line other than the at least one of the plurality of data lines, wherein at least part of the at least one third data line is disposed on the display region; and
In some embodiments, each of the first switch assembly, the second switch assembly, and the third switch assembly is a thin-film transistor.
In some embodiments, the controller is a driver integrated circuit IC.
According to some embodiments of the present disclosure, a method for detecting a crack is provided. The method for detecting the crack is applicable to the display substrate according to the above embodiments, and the method includes:
In some embodiments, upon providing the base substrate, the method further includes: disposing the controller on the base substrate.
In some embodiments, the crack detection circuit includes a first trace, a second trace, and a third trace, wherein two ends of the first trace and two ends of the second trace are connected to the controller, and the first trace is connected to the second trace via the third trace:
In some embodiments, the plurality of data lines further includes at least one third data line other than the at least one of the plurality of data lines, and upon providing the base substrate, the method further includes:
According to some embodiments of the present disclosure, a method for detecting a crack is provided. The method is applicable to the controller connected to the crack detection circuit in the display substrate according to above embodiments, and the method includes:
In some embodiments, the crack detection circuit includes a first trace, a second trace, and a third trace:
In some embodiments, the display substrate includes a control line, at least one first switch assembly, and at least one second switch assembly:
the detection method in the first detection phase further includes: providing a first signal to the control line, wherein the first signal is configured to control a switch assembly connected to the control line to be in a closed state; and
According to some embodiments of the present disclosure, an apparatus for detecting a crack is provided. The apparatus is applicable to the controller connected to the crack detection circuit in the display substrate according to above embodiments, and the apparatus includes: at least one of a detecting module and a first signal providing module; wherein
In some embodiments, in the case that the apparatus for detecting the crack includes the detecting module, the apparatus for detecting the crack further includes: a first control module, configured to control one end of the first trace and one end of the second trace to be in a high resistance state in the first detection phase; and the detecting module is configured to detect a resistance in the first line from the other end of the first trace and the other end of the second trace; and
In some embodiments, in the case that the apparatus for detecting the crack includes the detecting module, the apparatus for detecting the crack further includes: a second signal providing module, configured to provide a first signal to the control line in the first detection phase, wherein the first signal is configured to control a switch assembly connected to the control line to be in a closed state; and
According to some embodiments of the present disclosure, a chip is provided. The chip is applicable to a controller and includes a programmable logic circuit and/or program instructions, wherein the chip, when running, is caused to perform the method for detecting the crack according to above embodiments.
According to some embodiments of the present disclosure, a computer-readable storage medium is provided in the embodiments of the present disclosure. The computer-readable storage medium stores instructions, wherein the computer-readable storage medium, when running on a processing assembly, causes the processing assembly to perform the processes performed by the controller or the chip in above embodiments.
According to some embodiments of the present disclosure, a computer program product including instructions is provided. The computer program product, when running on a computer, causes the computer to perform the method for detecting the crack according to above embodiments.
According to some embodiments of the present disclosure, a display device is provided. The display device includes the display substrate according to above embodiments.
For clearer descriptions of the technical solutions in the embodiments of the present disclosure, the following briefly introduces the accompanying drawings required for describing the embodiments. Apparently, the accompanying drawings in the following description show merely some embodiments of the present disclosure, and a person of ordinary skill in the art still derives other drawings from these accompanying drawings without creative efforts.
For clearer descriptions of the objectives, technical solutions, and advantages in the present disclosure, the embodiments of the present disclosure are described in detail hereinafter in combination with the accompanying drawings.
A display substrate in the display panel includes a pixel unit and a drive circuit, and the pixel unit is driven by the drive circuit to achieve displaying.
However, the display substrate is prone to cracks, such that the drive circuit in the display substrate is damaged, and a display effect of the display panel is affected.
In some embodiments, the crack detection circuit includes a first line x and a second line y. Two ends of the first line x are connected to a controller, one end of the second line y is connected to the controller, and the other end of the second line is connected to at least one of the plurality of data lines 02.
In some embodiments, as shown in
It is understood that,
It is noted that,
It is further noted that, the crack detection circuit includes at least one first line x and at least one second line y, and numbers of the first line x and the second line y are not limited in the embodiments of the present disclosure.
The above embodiments are described by taking the display substrate not including the controller as an example. In some embodiments, the display substrate further includes the controller. In some embodiments,
In some embodiments, the controller 03 is configured to have a function in at least one of a first detection phase and a second detection phase.
In some embodiments, the function of the controller in the first detection phase includes detecting a resistance in the first line x (for example, detecting a resistance between two ends of the first line x), and determining, based on the resistance, whether a crack is present in a position where the first line x passes through in the display substrate.
The first line x is conducted in the case that no crack is present in the position where the first line x passes through in the display substrate, and the resistance in the first line x is less than a resistance threshold. The crack in the position where the first line x passes through in the display substrate causes a break of the first line x, and the resistance in the first line x is greater than the resistance threshold. Therefore, where the resistance in the first line x detected by the controller 03 is greater than the resistance threshold, it is determined that the crack is present in the position where the first line x passes through in the display substrate. Where the resistance in the first line x detected by the controller 03 is less than or equal to the resistance threshold, it is determined that no crack is present in the position where the first line x passes through in the display substrate.
In some embodiments, the function of the controller in the second detection phase includes providing a data signal to the at least one of the plurality of data lines 02 connected to the second line y via the second line y.
In some embodiments, assuming that a pixel unit connected to the data line does not emit light in response to receiving a data signal at a high voltage, and emits light in response to not receiving the data signal at the high voltage, in the second detection phase, the controller 03 provides the data signal at the high voltage (such as the data signal at 7V) to an end, connected to the controller 03, of the second line y. Where no crack is present in the position where the second line y passes through in the display substrate, the signal at the high voltage is transmitted to the data line connected to the second line y through the second line y. Thus, the column of the pixel unit connected to the data line does not emit light, and the column of the pixel unit is a dark line. Where the crack is present in the position where the second line y passes through in the display substrate, the signal at the high voltage is not transmitted to the data line connected to the second line y through the second line y. Thus, the column of the pixel unit connected to the data line emits light, and the column of the pixel unit is a bright line. Thus, the user determines whether the crack is present in the position where the second line y passes through by viewing whether the column of the pixel unit connected to the data line connected to the second line y in the display region is the bright line.
It is noted that, whether the pixel unit connected to the data line emits light in response to receiving the data signal at the high voltage is related to the structure of the pixel unit. The pixel unit connected to the data line emits light in response to receiving the data signal at the high voltage, and does not emit light in response to not receiving the data signal at the high voltage, which is not limited in the embodiments of the present disclosure. Assuming that the pixel unit connected to the data line emits light in response to receiving the data signal at the high voltage, and does not emit light in response to not receiving the data signal at the high voltage, then the column of the pixel unit connected to the data line is the bright line in the case that no crack is present in the position where the second line y passes through in the display substrate, and the column of the pixel unit connected to the data line is the dark line in the case that the crack is present in the position where the second line y passes through in the display substrate. In this case, the user determines whether the crack is present in the position where the second line y passes through by viewing whether the column of the pixel unit connected to the data line connected to the second line y in the display region is the dark line.
Above crack detection circuits are implemented in various manners, and the crack detection circuits are described by taking one of the implementations as an example.
In some embodiments,
The at least one of the plurality of data lines 02 connected to the second line y includes at least one first data line 021 and at least one second data line 022, the first trace 04 is connected to the at least one first data line 021, and the second trace 05 is connected to the at least one second data line 022.
A first connection portion e between the first trace 04 and the third trace 06 is proximal to one end a of the first trace 04, and a second connection portion between the first trace 04 and the at least one first data line 021 is proximal to the other end b of the first trace 04. A third connection portion f between the second trace 05 and the third trace 06 is proximal to one end c of the second trace 05, and a fourth connection portion between the second trace 05 and the at least one second data line 022 is proximal to the other end d of the second trace 05.
In some embodiments,
In some embodiments, the crack detection circuit includes the first line x, and
In some embodiments, the crack detection circuit includes two second lines, and
The manner of disposing the trace in the crack detection circuit in
In addition, referring to
In some embodiments, assuming that the pixel unit connected to the data line does not emit light in response to receiving the data signal at the high voltage, and emits light in response to not receiving the data signal at the high voltage, then in the second detection phase, the controller 03 provides the data signal to the first data line 021 through the second line y1, and provides the data signal to the second data line 022 through the second line y2. In this case, where the column of the pixel unit connected to the first data line 021 emits light and the column of the pixel unit connected to the second data line 022 does not emit light, the crack is present in the position where the second line y1 connected to the first data line 021 in the display substrate passes through, and no crack is present in the position where the second line y2 connected to the second data line 022 in the display substrate passes through.
In the case that the crack detection circuit is shown in
In some embodiments, the controller 03 provides a square wave signal at a high resistance to the one end a of the first trace 04 and the one end c of the second trace 05 in the first detection phase, such that the one end a of the first trace 04 and the one end c of the second trace 05 are in the high resistance state. Furthermore, the controller 03 detects a resistance between the other end b of the first trace 04 and the other end d of the second trace 05, and the resistance is the resistance in the first line x. In the case that the one end a of the first trace 04 and the one end c of the second trace 05 are in the high resistance state, the one end a of the first trace 04 and the first connection portion e are break, and the one end c of the second trace 05 and the third connection portion f are broken. Referring to
In the crack detection circuit shown in
In some embodiments, the controller 03 provides a square wave signal to the other end b of the first trace 04 and the other end d of the second trace 05, such that the other end b of the first trace 04 and the other end d of the second trace 05 are in the high resistance state; and provides the data signal to the one end a of the first trace 04 and the one end c of the second trace 05, such that the data signal is transmitted to the first data line 021 and the second data line 022 through the second line. In the case that the other end b of the first trace 04 and the other end d of the second trace 05 are in the high resistance state, the other end b of the first trace 04 and the second connection portion are break, and the other end d of the second trace 05 and the fourth connection portion are break. Referring to
In some embodiments, the first line 04 passes through a first side and a second side of the display region F, the second trace 05 passes through the second side and a third side of the display region F, the third trace 06 is disposed on a fourth side of the display region F. The first side is opposite to the third side, and the second side is opposite to the fourth side.
In some embodiments, as show in
In some embodiments, an orthogonal projection of the first trace 04 on a reference plane is overlapped with an orthogonal projection of the second trace 05 on the reference plane, and the reference plane is intersected with (such as, perpendicular to) a direction from the second side to the fourth side.
In some embodiments, as show in
In some embodiments,
The control line 07, the first switch assembly 081, and the second switch assembly 082 are disposed on the base substrate 01, the first data line 021 is connected to the first trace 04 through the first switch assembly 081, and the second data line 022 is connected to the second trace 05 through the second switch assembly 082. The control line 07 is connected to both the first switch assembly 081 and the second switch assembly 082, and two ends of the control line 07 are connected to the controller 03.
In some embodiments, as shown in
The controller 03 is configured to: in the first detection phase, provide a first signal to the control line 07, and the first signal is configured to control a switch assembly (including the first switch assembly 081 and the second switch assembly 082) connected to the control line 07 to be in a closed state; and in the second detection phase, provide a second signal to the control line 07, and the second signal is configured to control the switch assembly connected to the control line 07 to be in an open state. The switch assembly is closed in the first detection phase, such that an effect of the data line on the resistance in the first line is avoided. The switch assembly is opened in the second detection phase, such that the second line is conducted, and crack detection is performed on the second line.
In some embodiments, the plurality of data lines 02 further include at least one third data line 023 other than the at least one of the plurality of data lines connected to the second line y. The display substrate further includes at least one third switch assembly 083 in one-to-one correspondence to the at least one third data line 023. The third switch assembly 083 is disposed on the base substrate 01, each third data line 023 is connected to the third trace 06 through the corresponding third switch assembly 083, and the control line 07 is further connected to each third switch assembly 083.
The third data line 023 is connected to the third trace 06, one end of the third trace 06 is connected to the first connection portion e proximal to the one end a of the first trace 04 and the other end of the third trace 06 is connected to the third connection portion f proximal to the one end c of the second trace 05. Thus, in the second detection phase, the data signal provided by the controller 03 to the one end a of the first trace 04 is transmitted to the third data line 023 along the third trace 06 at the first connection portion e, the data signal provided by the controller 03 to the one end c of the second trace 05 is transmitted to the third data line 023 along the third trace 06 at the third connection portion f. It is acquired that, no matter whether the creak is present in the first side and the second side of the display region surrounded by the first trace 04, and the second side and the third side of the display region surrounded by the second trace 05 to result to break, the data signal provided by the controller 03 is transmitted to the third data line 023.
It is assumed that the pixel unit connected to the data line does not emit light in response to receiving the data signal at the high voltage and emits light in response to not receiving the data signal at the high voltage, and the data signal provided by the controller 03 to the one end a of the first trace 04 in the second detection phase is a high voltage signal (such as the data signal at 7V). In the case that the crack is present in the first side, the second side, or the third side of the display region, the pixel unit connected to the third data line 023 does not emit light in response to receiving the data signal at the high voltage provided by the controller 03, and the column of the pixel unit connected to the third data line 023 is a dark line. In addition, the pixel unit connected to the first data line 021 or the second data line 022 does not receive the data signal at the high voltage provided by the controller 03 and thus emits light, and the column of the pixel unit connected to the first data line 021 or the second data line 022 is a bright line. Thus, in the case that the crack is present in the first side, the second side, or the third side of the display region, a display difference of the bright line and the dark line is formed in the display region, and the display region shows bright and dark fringes. In the case that the crack is not present in the display region, each column of the pixel unit in the display region shows the dark line, and the entire display region is in a dark state. Thus, the user determines whether the crack is present in the display substrate by viewing whether the bright and dark fringes are present in the display region.
In some embodiments, as shown in
In some embodiments, each of the first switch assembly 081, the second switch assembly 082, and the third switch assembly 083 is a thin-film transistor. The thin-film transistor is taken as the switch assembly, such that the switch assembly is simultaneously manufactured with the thin-film transistor in the pixel unit, and the manufacturing process is simplified.
In some embodiments, taking each of the first switch assembly 081, the second switch assembly 082, and the third switch assembly 083 being a p-type thin-film transistor as an example, the p-type thin-film transistor is closed at the high voltage signal, and is conducted at the low voltage signal. A voltage of the high voltage signal is higher than a voltage of the low voltage signal. Thus, in the first detection phase, the first signal provided by the controller 03 to two ends of the control line 07 is the high voltage signal, such that all switch assemblies are broken. In the second detection phase, the second signal provided by the controller 03 to two ends of the control line 07 is the low voltage signal, such that all switch assemblies are conducted. It is noted that the switch assemblies are n-type thin-film transistors. The n-type thin-film transistors are conducted at the high voltage signal, and are closed at the low voltage signal. The implementing processes are not repeated herein.
In some embodiments, the controller 03 is a driver IC. Because the driver IC includes a plurality of free ports, the process is simplified by taking the driver IC as the controller 03. The controller is not the driver IC, which is not limited in the embodiments of the present disclosure.
It is noted that the driver IC is connected to at least part of the data lines on the base substrate. In some embodiments, the driver IC is connected to each data line (not shown in the drawing). In some embodiments, the driver IC is connected to the first data line 081, the second data line 082, and the third data line 083, and is not connected to other data line (such as, dummy data line) than the first data line 081, the second data line 082, and the third data line 083. In some embodiments, the driver IC is connected to the data lines directly. In some embodiments, the driver IC is connected to the data lines through other circuit (such as a multiplexer (MUX)), which is not limited in the embodiments of the present disclosure.
In summary, a display substrate is provided in the embodiments of the present disclosure. The display substrate includes the crack detection circuit, and achieves a crack detection function. In addition, the crack detection circuit of the display substrate includes two different circuit, and thus supports two crack detection solutions.
In addition, two different traces share a part of the trace in the crack detection circuit, such that one trace includes two different line, and the one trace supports two crack detection solutions.
Furthermore, the crack detection circuit includes two second lines at different positions, such that the position of the crack is determined based on different data lines connected to different second lines.
A method for manufacturing the display substrate, applicable to manufacturing the display substrate in above embodiments, is provided in the embodiments of the present disclosure.
In S101, a base substrate is provided.
The base substrate includes a display region and a peripheral region surrounding the display region.
In S102, a plurality of data lines and a crack detection circuit are formed on the base substrate.
At least part of the plurality of data lines are disposed on the display region, and the crack detection circuit includes a first line and a second line. Two ends of the first line are connected to a controller, one end of the second line is connected to the controller, and the other end of the second line is connected to at least one of the plurality of data lines.
In summary, a method for manufacturing the display substrate is provided in the embodiments of the present disclosure. The display substrate manufactured by the method includes the crack detection circuit, such that the crack detection is performed on the display substrate. In addition, the crack detection circuit includes different circuit, and thus supports different crack detection solutions.
Another method for manufacturing the display substrate, applicable to manufacturing the display substrate in above embodiments, is provided in the embodiments of the present disclosure.
In S201, a base substrate is provided.
The base substrate includes a display region and a peripheral region surrounding the display region.
In S202, a controller is disposed on the base substrate.
In S203, a plurality of data lines and a crack detection circuit are formed on the base substrate.
At least part of the plurality of data lines are disposed on the display region, and the crack detection circuit includes a first trace, a second trace, and a third trace. Two ends of the first trace and two ends of the second trace are connected to the controller, and the first trace is connected to the second trace via the third trace.
The at least one of the plurality of data lines includes at least one first data line and at least one second data line. The first trace is connected to the at least one first data line, and the second trace is connected to the at least one second data line.
A first connection portion between the first trace and the third trace is proximal to one end of the first trace, and a second connection portion between the first trace and the at least one first data line is proximal to the other end of the first trace. A third connection portion between the second trace and the third trace is proximal to one end of the second trace, and a fourth connection portion between the second trace and the at least one second data line is proximal to the other end of the second trace.
It is noted that, the first trace, the second trace, and the third trace are disposed on the same layer, or are disposed on different layers. The first trace, the second trace, and the third trace are disposed on the same layer as the data line, or are disposed on different layers from the data line. The first trace, the second trace, and the third trace are disposed on the same layer as a gate line, or are disposed on different layers from the gate line, which is not limited in the present disclosure.
In some embodiments, the plurality of data lines further include at least one third data line other than the at least one of the plurality of data lines.
In S204, a control line, a first switch assembly corresponding to the first data line, and a second switch assembly corresponding to the second data line are formed on the base substrate.
The first data line is connected to the first trace through the corresponding first switch assembly, and the second data line is connected to the second trace through the corresponding second switch assembly. The control line is connected to both the first switch assembly and the second switch assembly, and two ends of the control line are connected to the controller.
It is noted that, the control line is disposed on the same layer as the first trace, the second trace, and the third trace, or is disposed on different layers from the first trace, the second trace, and the third trace. The control line is disposed on the same layer as the data line, or is disposed on different layers from the data line. The control line is disposed on the same layer as the gate line, or is disposed on different layers from the gate line, which is not limited in the present disclosure.
In S205, a third switch assembly corresponding to the third data line is formed on the base substrate.
The third data line is connected to the third trace through the corresponding third switch assembly, and the control line is further connected to the third switch assembly.
It is noted that, the third switch assembly is simultaneously formed with the second switch assembly and the first switch assembly.
It is noted that, the switch assembly (such as the first switch assembly, the second switch assembly and/or the third switch assembly) is formed at the same layer as the thin-film transistor in the pixel unit in the case that the switch assembly is the thin-film transistor.
In summary, a method for manufacturing the display substrate is provided in the embodiments of the present disclosure. The display substrate manufactured by the method includes the crack detection circuit, such that the crack detection is performed on the display substrate. In addition, the crack detection circuit includes different circuit, and thus supports different crack detection solutions.
A method for detecting a crack, applicable to the controller in the display substrate in above embodiments, is provided in the embodiments of the present disclosure.
In S301, in a first detection phase, a resistance in the first line is detected, and whether a crack is present in a position where the first line passes through in the display substrate is determined based on the resistance.
In S302, in a second detection phase, a data signal is provided to the at least one of the plurality of data lines via the second line.
Description of S301 is referred to the description of the function of the controller 03 achieved in the first detection phase in above embodiments, and description of S302 is referred to the description of the function of the controller 03 achieved in the second detection phase in above embodiments.
Above embodiments are described by taking S301 and S302 as an example. It is noted that, the method for detecting the crack in the embodiments only includes one of S301 and S302.
In summary, a method for detecting a crack is provided, and the method is applicable to the controller in the display substrate. In some embodiments, by detecting the resistance in the first line, whether the crack is present in the position where the first line passes through in the display substrate is determined based on the resistance. In some embodiments, the data signal is provided to the at least one of the plurality of data lines. In this case, the user determines whether the crack is present in the position where the second line passes through by viewing whether the pixel unit connected to the at least one of the plurality of data lines is displayed normally. Thus, the crack detection of the display substrate is achieved by the method.
In addition, different methods for detecting the crack are performed in different detection phases, such that the display substrate supports two crack detection solutions simultaneously.
A method for detecting a crack, applicable to the controller in the display substrate in above embodiments, is provided in the embodiments of the present disclosure.
In S401, in a first detection phase, one end of the first trace and one end of the second trace are controlled to be in a high resistance state.
In S402, in the first detection phase, a first signal is provided to the control line, wherein the first signal is configured to control a switch assembly connected to the control line to be in a closed state.
In S403, in the first detection phase, a resistance in the first line is detected from the other end of the first trace and the other end of the second trace, and whether the crack is present in the position where the first line passes through is determined based on the resistance.
In S404, in a second detection phase, the other end of the first trace and the other end of the second trace are controlled to be in the high resistance state.
In S405, in the second detection phase, a second signal is provided to the control line, wherein the second signal is configured to control a switch assembly connected to the control line to be in an open state.
In S406, in the second detection phase, the data signal is provided to the one end of the first trace and the one end of the second trace.
Descriptions of S401 to S403 are referred to the description of the function of the controller 03 achieved in the first detection phase in above embodiments, and descriptions of S404 to S406 are referred to the description of the function of the controller 03 achieved in the second detection phase in above embodiments.
Above embodiments are described by taking S401 and S406 as an example. It is noted that, the method for detecting the crack in the embodiments only includes the detection method in the first detection phase (including S401 and S403), or only includes the detection method in the second detection phase (including S404 and S406).
In summary, a method for detecting a crack is provided, and the method is applicable to the controller in the display substrate. In some embodiments, by detecting the resistance in the first line, whether the crack is present in the position where the first line passes through in the display substrate is determined based on the resistance. In some embodiments, the data signal is provided to the at least one of the plurality of data lines. In this case, whether the crack is present in the position where the second line passes through is determined by viewing whether the pixel unit connected to the at least one of the plurality of data lines is displayed normally. Thus, the crack detection of the display substrate is achieved by the method.
In addition, different methods for detecting the cracks are performed in different detection phases, such that the display substrate supports two crack detection solutions simultaneously.
It is noted that, in some embodiments, the sequence of the steps in the method for detecting the crack in the embodiments of the present disclosure is adjusted appropriately. In some embodiments, the sequence of S401 and S402 is adjusted. The steps are added or deleted as required. In some embodiments, S402 is deleted. That is, the switch assembly is opened in the first detection phase, which does not affect detecting the resistance in the first line. Any method change made within the technical scope disclosed in the present disclosure by the person skilled in the art is included within the scope of protection of the present disclosure, and thus is not described in detail herein.
An apparatus for detecting a crack is provided in the present disclosure, and the apparatus is applicable to the controller in any display substrate in above embodiments.
The detecting module 501 is configured to, in a first detection phase, detecting a resistance in the first line, and determine, based on the resistance, whether a crack is present in a position where the first line passes through in the display substrate.
The first signal providing module 502 is configured to, in a second detection phase, providing a data signal to the at least one of the plurality of data lines via the second line.
In some embodiments, in the case that the apparatus for detecting the crack includes the detecting module, the apparatus for detecting the crack further includes: a first control module (not shown in
In the case that the apparatus for detecting the crack include the first signal providing module, the apparatus for detecting the crack further includes: a second control module (not shown in
In some embodiments, in the case that the apparatus for detecting the crack includes the detecting module, the apparatus for detecting the crack further includes: a second signal providing module (not shown in
In the case that the apparatus for detecting the crack includes the first signal providing module, the apparatus for detecting the crack further includes: a third signal providing module (not shown in
It is clear for those skilled in the art that to understand that, above specific operation processes of the apparatus and the module are referred to corresponding process in above method embodiments for convenient and simply description, which is not repeated herein.
A chip is provided in the embodiments of the present disclosure. The chip is applicable to a controller and includes a programmable logic circuit and/or program instructions. The chip, when running, is caused to perform any method for detecting the crack according to the above embodiments.
A computer-readable storage medium is provided in the embodiments of the present disclosure. The computer-readable storage medium stores instructions. The computer-readable storage medium, when running on a processing assembly, causes the processing assembly perform the processes performed by the controller or the chip in above embodiments.
A computer program product including instructions is provided. The computer program product, when running on a computer, causes the computer to perform the method for detecting the crack according to the above method embodiments.
The embodiments of the present disclosure provide a display device, and the display device includes any display substrate according to above embodiments.
In some embodiments, the display device is any products or parts with a display function, such as a display panel, a liquid crystal display (LCD), an organic light-emitting diode (OLED) display device, a micro light emitting diode (Micro LED) display device, a quantum dot light emitting diode (QLED) display device, electronic paper, a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, a navigator, and the like.
In the present disclosure, the terms “first” and “second” are used to descriptive purposes, and are not construed to indicate or imply relative importance. Unless expressly limited otherwise, the term “at least one” refers to one or more, and the term “a plurality of” refers to two or more.
It is noted that the term “and/or” in the context indicates three relationships. In some embodiments, A and/or B indicates: A alone, A and B, and B clone. The symbol “/” generally indicates that the associated objects are in an “or” relationship.
Described above are example embodiments of the present disclosure, and are not intended to limit the present disclosure. Any modifications, equivalent replacements, improvements and the like made within the spirit and principles of the present disclosure are included within the scope of protection of the present disclosure.
Number | Date | Country | Kind |
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202110055900.6 | Jan 2021 | CN | national |
This application is a U.S. national stage of international application No. PCT/CN2021/126126, filed on Oct. 25, 2021, which claims priority to Chinese Patent Application No. 202110055900.6 filed on Jan. 15, 2021 and entitled “CRACK DETECTION METHOD, DISPLAY SUBSTRATE, AND DISPLAY DEVICE.” and the disclosures of which are herein incorporated by reference in their entireties.
Filing Document | Filing Date | Country | Kind |
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PCT/CN2021/126126 | 10/25/2021 | WO |