This invention relates to making connections between integrated circuit array packages (IC) and circuit boards.
Ball grid array (BGA) and land grid array (LGA) packages are becoming increasingly popular because of their low profiles and high densities. With a BGA package, for example, the rounded solder balls of the BGA are generally soldered directly to corresponding surface mount pads of a printed circuit board rather than to plated thru-holes which receive pins from, for example, a pin grid array IC package.
Sockets are used to allow particular IC packages to be interchanged without permanent connection to a circuit board. More recently, sockets for use with BGA and LGA packages have been developed to allow these packages to be non-permanently connected (e.g., for testing) to a circuit board. Problems associated with attaching a BGA package to conventional sockets are discussed in U.S. Pat. No. 5,877,554, which is incorporated herein by reference. However, some of the same problems exist in attaching the socket to the circuit board. These problems occur because a BGA package presents a non-traditional mating condition. The rounded solder balls of the BGA are relatively poor points of contact for temporary connection to the circuit board and are suited oily for their intended purpose of being reflowed. Further, individual points of contact for each rounded solder ball may lack co-planarity on account of ball irregularities and warping of the circuit board.
This invention features a socket terminal assembly which provides a reliable, non-permanent and low-loss electrical interconnection between electrical contacting areas of an array package and connection regions of a substrate (e.g., printed circuit board). The term “integrated circuit array package” is intended to mean those packages, including PGA (pin grid array), BGA and LGA packages. The term “substrate” is intended to mean any base member having electrical contact areas including printed circuit boards, IC chip substrates or the packages supporting such chip substrates.
In general, the invention relates to a socket terminal assembly of the type configured to electrically connect an electrical contacting area of an integrated circuit package to a corresponding connection region of a substrate.
In one aspect of the invention, the socket terminal assembly includes a socket body, having a first end with a first opening to receive a contact element and an opposite end with a second opening to receive a pin. The contact element is located in the first opening of the socket body. A contact spring in the second opening of the socket body receives the pin and applies a frictional force sufficient to retain it within the opening of the socket body. A resilient member is disposed within the socket body between the contact spring and the contact element.
In another aspect of the invention, an intercoupling component (e.g., a socket assembly) includes a number of socket terminal assemblies, of the type described above, received within openings in an insulative socket support member. The openings extend from the upper surface to the lower surface of the support member and are located in a pattern corresponding to the pattern of connection contacts in a substrate. The socket terminal assemblies are configured to electrically connect the electrical contacting areas of an integrated circuit array package with the array of connection regions of the substrate.
An intercoupling component having this arrangement eliminates the need for soldering the package directly to a circuit board (e.g., motherboard) and allows removing the integrated circuit array package in situations where the package needs to be repaired or replaced. Likewise, the contact elements of the socket terminal assemblies eliminate the need for soldering the intercoupling component itself to the circuit board, providing similar advantages.
Embodiments of these aspects of the invention may include one or more of the following features. The contact element is configured to contact a corresponding connection region of a printed circuit board or other substrate. This contact element provides the electrical connection between the substrate and the socket terminal assembly. The contact element has a flange which retains it within the first opening of the socket body. The contact element is configured to contact the sides of the socket. For example, the contact element has a groove defining two halves which expand apart, keeping them in contact with the socket. For another example, the contact is hollow and formed from thin material which is spring-fit and which contacts the sides of the socket. The contact spring is configured to provide a “wiping,” reliable electrical contact in which the frictional force is substantially transverse to the upward force applied by the resilient member. For example, the contact spring includes at least one resilient spring finger which frictionally engages the lower end of the pin.
The resilient member applies, in response to a downward force applied to the pin, an upward force to the pin sufficient to overcome the frictional force of the contact spring, and in response to an upward force on the contact element, a downward force sufficient to maintain the position of that element. The resilient member is in the form of a coiled conductive spring, or alternatively, in the form of an elastomeric material (e.g., rubber). The contact element may have a blunt tip that makes direct contact with the conductive portion of the circuit board. Alternatively, the contact element may have a sharpened point to pierce an oxidation layer or other coating that would otherwise prevent electrical connection to the circuit board. Additional contact element tip configurations are also possible.
The pin is adapted to contact the electrical contacting area of the integrated circuit array package. For integrated circuit array packages having ball-shaped contacts, the upper end of the pin may include a concave ball-contacting surface to receive a ball-shaped contact. A sharp protuberance extending from the ball-contacting surface may be provided to pierce the surface of the ball-shaped contact. The sharp protuberance is conically-shaped and disposed along the longitudinal axis of the pin. In other embodiments, the sharp protuberance may be ring-shaped and disposed concentric with the longitudinal axis. Alternatively, the upper end of the pin may include particle interconnections.
Embodiments of the intercoupling component aspect of the invention may include one or more of the following features. The intercoupling component includes an electrically insulative sheet coupled to the pins of the socket terminal assemblies and having holes arranged in the pattern of the connection contacts of the substrate. The sheet is formed, for example, of a polyimide film and adapted to retain the pins in a ganged arrangement. The intercoupling component includes a guide member to align the integrated circuit array package with the array of socket terminal assemblies, and a member which applies a downward force on the contact area of the integrated circuit package and to each pin to cause the resilient member to compress. The member applying downward force includes a heat sink threadingly received within a cover positioned over the integrated circuit package. The socket support member includes a member which attaches the socket to the printed circuit board or other substrate, and applies, via the pins and the resilient member, a downward force to the contact elements, causing them to maintain contact with the connection contacts on the substrate.
Other features of the invention will be apparent from the following description of the preferred embodiments and from the claims.
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BGA socket converter assembly 10 also includes a hold-down cover 30 for securing the BGA package 12 into the socket converter assembly. Hold-down cover 30 includes an edge 31 connected to guide box 26 via a hinge structure 215 and an opposite edge 33 having a tab member 216 which engages the recessed portion 217 of guide box 26. Hold-down cover 30 includes a threaded thru-hole 34 which threadingly receives a heat sink 32 to provide a thermal path for dissipating heat from the IC device generated within BGA package 12. Heat sink 32 is inserted from the top of cover 30 and includes a lip 49 which limits the extent to which heat sink 32 can be threaded into cover 30. A slot 36 (
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Each male terminal 52 has a pin 56 and a head 54 adapted to receive a corresponding ball 22 (
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Each of pins 56 are received within corresponding contact springs 46 with spring leaves 48 configured to provide a lateral force, generally transverse to the longitudinal axis of pins 56, thereby frictionally engaging outer surfaces of the pins.
In one embodiment, the lower end of pin 56 includes a flattened head 58 having a diameter slightly larger than the diameter of pin 56 so that after head 58 passes through spring leaves 48 of contact spring 46, male terminal 52 is captured within female socket 40.
Metallic coiled springs 60 are loosely positioned within the interiors of each of female sockets 40 and provide an upward force to the lower ends of pins 56 and a downward force to the upper ends of contact elements 200. As mentioned earlier, spring leaves 48 of contact springs 46 provide a sufficient amount of lateral frictional force generally transverse to the longitudinal axis of the pins, in order to ensure a reliable electrical contact to pins 56 of male terminals 52. However, when the socket is removed from the circuit board, metallic coiled springs 60 expand causing each of contact elements 200 to extend to their lowest position within female sockets 40. Also, when hold-down cover 30 (
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Other embodiments are within the following claims. For example, the socket assembly may be attached to the circuit board by clips or catches, rather than by a bolt or nut. The contact element may be adapted to make contact with the contact pads in different ways depending on the nature of the circuit board.
It is also appreciated that in the above described embodiments, other forms of spring members may be substituted for coiled springs 60 (
Still further embodiments are supported by the following claims.
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Number | Date | Country | |
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20060052011 A1 | Mar 2006 | US |