1. Technical Field
The present disclosure relates to a drive circuit for improving display quality and a liquid crystal display (LCD) using the same.
2. Description of Related Art
LCDs include a plurality of gate lines and data lines, and an array of pixel units arranged between adjacent gate lines and data lines. Referring to
A scan signal is applied to the gate line 101, and the TFT 110 is turned on when the scan signal is in a logic high state. Then, data signals applied to the data line 102 charge the liquid crystal capacitor 120 and the storage capacitor 130. When the voltage of the scan signal changes, such as from a logic high to a logic low, the voltage of the liquid crystal capacitor 120 suddenly becomes lower due to the parasitic capacitor 140. When this happens repeatedly, the brightness of the pixel unit 100 fluctuates causing flickering in the images displayed on the LCD.
Therefore, it is desired to provide a drive circuit and an LCD which can overcome the above-described deficiencies.
Many aspects of the present drive circuit and LCD using the same can be better understood with reference to the following drawings. The components in the various drawings are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present drive circuit and LCD using the same.
Reference is now made to the drawings to describe various embodiments of the present disclosure in detail.
Referring to
The liquid crystal panel 210 includes a plurality of parallel gate lines 212 extending along a first direction, a plurality of parallel data lines 214 extending along a second direction orthogonal to the first direction, and a plurality of pixel units 216 defined by the intersecting gate lines 212 and data lines 214.
The drive circuit 220 includes a gate driver 250 configured for driving the gate lines 212, a source driver 260 configured for driving the data lines 214, a timing control circuit 270, and a wave signal generation circuit 280. The timing control circuit 270 is configured for driving the gate driver 250 and the source driver 260. The timing control circuit 270 includes a connection terminal 271, and the timing control circuit 270 is electronically connected to the gate driver 250, the source driver 260, and the wave signal generation circuit 280 through the connection terminal 271. The wave signal generation circuit 280 is electronically connected between the power circuit 230 and the gate driver 250.
Referring to
The signal processing unit 282 is configured to receive the indication signal, get the signal pulse width associated with the frequency value from the storage unit 283, and generate a control signal OE corresponding to the signal pulse width. The signal conversion unit 284 is configured to receive the control signal OE from the signal processing unit 282, and generate a wave signal according to the control signal OE.
The signal conversion unit 284 includes a first transistor 285, a second transistor 286, a resistor 287, and an inverter 288. In an exemplary embodiment, the first transistor 285 and the second transistor 286 are N-channel metal oxide semiconductors (NMOS). A gate electrode of the first transistor 285 is electronically connected to the signal processing unit 282 through the inverter 288. A source electrode of the first transistor 285 is electronically connected to ground through the resistor 287. A drain electrode of the first transistor 285 is electronically connected to a source electrode of the second transistor 286. A drain electrode of the second transistor 286 is electronically connected to the power circuit 230 to receive the power supply voltage VDD. A gate electrode of the second transistor 286 is electronically connected to the signal processing unit 282. A node between the drain electrode of the first transistor 285 and the source electrode of the second transistor 286 is an output terminal 289. The output terminal 289 is configured to output wave signals to the gate driver 250.
Referring to
Referring to
The frequency detection unit 281 samples the first timing control signal, obtains the frequency value of the first timing control signal, and sends an indication signal corresponding to the frequency value to the signal processing unit 282. The signal processing unit 282 receives the indication signal, gets signal pulse width associated with the frequency value from the storage unit 283, and generates a control signal OE corresponding to the signal pulse width. The enable pulse width of the control signal OE is T1. As the refresh rate increases, the pulse width of the enable pulse increases. One enable pulse corresponds to one control pulse, and the enable pulse is offset in time relative to the corresponding control pulse. The signal conversion unit 284 receives the control signal OE, generates a wave signal under the control of the control signal OE, and sends the wave signal to the gate driver 250.
According to the first timing control signal and the wave signal generated under the control of the control signal OE, the gate driver 250 sends scan signals to the gate lines 212. Each of the scan signals is a voltage pulse signal. During the interval between two successive control pulses of the first timing control signal, when the first timing control signal is at a high logic level, the gate driver 250 outputs the scan signal at a minimum voltage Vgl; when the first timing control signal is at a low logic level, the gate driver 250 outputs the scan signal at a maximum voltage Vgh. In detail, when the (i-1)th control pulse of the first timing control signal ends, the voltage of the scan signal Gi changes from the minimum voltage Vgl to the maximum voltage Vgh. According to the i-th enable pulse and the wave signal, the maximum voltage Vgh decreases to a middle voltage (Vgh-Ve) before the i-th control pulse of the first timing control signal starts. The time offset between the i-th enable pulse and the i-th control pulse is a fall time Te of the scan signal Gi. The decreased value Ve is determined by the wave signal and the fall time Te. Then, the scan signals are applied to the gate lines 212, and the source driver 260 sends data signals to the data lines 214 to drive the pixel units 216 to display images.
Referring to
According to the second timing control signal and the wave signal generated under the control of the control signal OE′, the gate driver 250 sends scan signals to the gate lines 212. As the frequency of the timing control signal increases, the enable pulse width of control signal increases, the time offset between the enable pulse and the corresponding control pulse is a fixed value Te. The discharge rate of the voltage of the output terminal 289 is invariable, and then the decreased value of the scan signals at the refresh rate of 75 HZ is Ve.
The wave signal generation circuit 280 sends wave signals to the gate driver 250, the maximum voltage Vgh of the scan signals decreases to a middle voltage of (Vgh-Ve) before reaching the minimum voltage Vgl. The magnitude of the scan signal voltage variation decreases and the impact of the scan signal voltage variation on the pixel unit 216 is reduced. The frequency of the timing control signal changes according to the variation of the refresh rate, and the wave signal generation circuit 280 outputs wave signals corresponding to the timing control signal. Therefore, the decreased value and the fall time of the scan signals are invariable at different refresh rates.
Referring to
Referring to
In an alternative embodiment, the first transistor 285 and the second transistor 286 may be P-channel metal oxide semiconductors (PMOS), and the gate electrode of the first transistor 285 is electronically connected to the signal processing unit 282, and the gate electrode of the second transistor 286 is electronically connected to the signal processing unit 282 through the inverter 288.
In another alternative embodiment, the first transistor 285 may be a PMOS, and the second transistor 286 may be an NMOS. The gate electrode of the first transistor 285 and the gate electrode of the second transistor 286 are directly connected to the signal processing unit 282.
In another alternative embodiment, the storage unit 283 includes a look-up table, and signal frequencies and signal pulse widths are stored in the look-up table.
It is to be understood, the gate electrode of the transistor may be referred to as control terminal, the source electrode and the drain electrode of the transistor may be referred to as conductive terminal.
It is to be further understood that even though numerous characteristics and advantages of the present embodiments have been set forth in the foregoing description, together with details of structures and functions of various embodiments, the disclosure is illustrative only, and changes may be made in detail, especially in matters of shape, size, and arrangement of parts within the principles of the present disclosure to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Number | Date | Country | Kind |
---|---|---|---|
201010300264.0 | Jan 2010 | CN | national |