Dual Function Measurement System

Abstract

A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source configured to provide light along a first axis that illuminates a sample media. The measurement system has a first sensor configured to measure scattered light in a sample media. The measurement system has a second sensor configured to measure light passing through the sample media.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1—is a sectional view of the optical layout of a particulate measurement system in an example embodiment of the invention.

FIG. 2—is a first side view of particulate measurement system in an example embodiment of the invention.

FIG. 3—is a second side view, with the meniscus lens removed, of a particulate measurement system in an example embodiment of the invention.

FIG. 4—is a sectional view of the flow path of a particulate measurement system in an example embodiment of the invention.

FIG. 5—is a block diagram of the optical layout of the detection path in an example embodiment of the invention.

FIG. 6—is a block diagram of the optical layout when utilizing more than one detection path in an example embodiment of the invention.

FIG. 7—is a block diagram of the optical layout of the light source path in an example embodiment of the invention.

FIG. 7 a to 7g—are block diagrams of various arrangements and constructions of an aperture masks used to discriminate angle of scatter from particles in suspension in an example embodiment of the invention.

FIG. 8—is a block diagram of the optical layout of the view area of the suspension media in an example embodiment of the invention.

FIG. 9—is a block diagram of a particulate measurement system utilizing a plurality of light source paths in an example embodiment of the invention.

FIG. 10—is a block diagram of the optical layout of a particulate measurement system with an annulus virtual source and second light source in an example embodiment of the invention.

FIG. 11—is a block diagram of the optical layout of a particulate measurement system with an uncoated area of the convex lens surface and a second light source in an example embodiment of the invention.

FIG. 12—is a block diagram of the optical detail of an insitu calibration and verification means utilizing light from the primary light source and optical switching means to divert a portion of the primary source to the calibration and verification means in an example embodiment of the invention.

Claims

1. A measurement system comprising: a light source directed along a first axis and configured to illuminate a sample volume;a first sensor aligned along a second axis and configured to detect scattered light in the sample volume;a second sensor configured to detect a light amount, from the light source, passing through the sample volume.

2. The measurement system of claim 1, further comprising: a processor coupled to the first and second sensors and configured to compare the total amount of light detected by the first sensor with the total amount of light detected by the second sensor.

3. The measurement system of claim 1, further comprising: a processor coupled to the first and second sensors and configured to compute both a turbidity of a suspension media in the sample volume and a number of particles detected in the sample volume.

4. The measurement system of claim 1, further comprising: an integration sphere having a entrance port and an exit port where the entrance port is aligned with the first axis and the second sensor is aligned with the exit port.

5. The measurement system of claim 4, where the entrance port is aligned substantially 90 degrees with respect to the exit port.

6. The measurement system of claim 1, where the first axis is aligned substantially 90 degrees with respect to the second axis.