The invention generally relates to antenna pattern measurement methods.
Thus,
It is to be understood that the foregoing and the following detailed description are exemplary and explanatory only and are not to be viewed as being restrictive of the invention, as claimed. Advantages of this invention will be apparent after a review of the following detailed description of the disclosed embodiments, which are illustrated schematically in the accompanying drawings and in the appended claims.
Embodiments of the invention generally relate to a dynamic antenna pattern measurement method. Embodiments of the invention provide for nanosecond or better time resolution and milliradian angular resolution of the dynamic radiation pattern of an antenna under test 202 (
An embodiment of a dynamic antenna pattern measurement method performed in accordance with the principles of the invention includes recovering the full vector angular and temporal information of one output commutation sequence's radiation from the recorded full time-domain waveforms (of the probe antenna and reference antenna), resulting in a full vector solid-angle measurement of the dynamic antenna under test's commutation sequence providing for nanosecond or better time resolution and miliradian angular resolution over the predetermined solid angle scan of the dynamic radiation pattern of said AUT by performing the steps in
Beginning with step 102 in
A “probe antenna” 204 is any antenna whose received radiation pattern characteristics are known and are suitable to antenna measurement testing. The bandwidth of the probe antenna's 204 receiver should be greater than or equal to the bandwidth of the modulation of the AUT's 202 output radiation 206.
With reference to
With reference to
With reference to
With the positioner in an initial position, the desired commutation sequence is transmitted from the AUT 202. This step is depicted as block 110 in
With reference to
With reference to
With reference to the loop in
Each of the full time-domain waveforms recorded by the probe antenna is referred to herein using Pn(t), where N is the number of angular positions of the spatial sampling grid through which the positioner steps during the solid angle scan, n is an index from 1 to N that associates the probe antenna time domain waveform to the position of the probe antenna relative to the AUT at which the probe antenna time domain waveform was recorded, and t represents the time variable and is correlated to the time of the input signal. For example P1(t) is the full time-domain waveform recorded by the probe antenna at the first angular position of the AUT relative to the probe antenna in the solid angle scan.
Each of the full time-domain waveforms recorded by the reference antenna is referred to herein using the notation Rn(t), where N is the number of angular positions of the spatial sampling grid through which the positioner steps during the solid angle scan, n is an index from 1 to N that associates the reference antenna time domain waveform to the position of the probe antenna relative to the AUT at which the reference antenna time domain waveform was recorded, where again t represents time. For example R1(t) is the full time-domain waveform recorded by the reference antenna at the first angular position of the AUT relative to the probe antenna in the solid angle scan.
With reference to
A time delay τ for each angular position n from 1 to N is generated using the cross-correlation function for the angular position as mathematically described in Equation 1. Cross-correlations are useful for determining the time delay between two like/similar signals. The maximum (or minimum if the signals are negatively correlated) of the cross-correlation function indicates the point in time where the signals are best aligned, i.e. the time delay τ between two cross-correlated signals is determined by the argument of the maximum, or arg max of the cross-correlation,
Note that τn is equal to 0 for the angular position n=a because the time-domain probe measurement at angular position a is used as the center/reference frequency for cross-correlation purposes.
Time-aligned probe measurements
Note that
The time-aligned probe measurements
ℑ{I(t)}=I(ω) Equation 3
ℑ{
In some embodiments, when the measurements were taken/recorded (performed) in near field mode, a time-domain near-to-far-field transform to the full vector angular and temporal information of the output commutation sequence's near-field radiation pattern is applied using any time domain near-to-far-field transform (or any other known means).
In another embodiment, when the measurements (waveforms) were taken/recorded in near-field mode, holographic imagery of the radiating field at the surface of the AUT is created using the full angular and temporal information of the output commutation sequence's near-field radiation pattern using any known microwave holographic metrology means. Microwave holographic metrology involves transformation of the full angular and temporal information of the output commutation sequence's near-field radiation pattern to a representation/approximation of measurements at closer approaches to the AUT (“back-transformation”). The use of the back transformation has its greatest application in the phase alignment of phased-array antennas. The amplitude and phase of each element of a phased array can be determined accurately and is used to adjust the phase of the element, and to detect defective elements or phase shifters. Element phase accuracy of one degree RMS (root mean squared) is being achieved on large microwave radar antennas. Other uses include the detection of anomalies in radomes and in detection of surface distortion in parabolic reflector antennas.
When the measurements are not taken/recorded in near field mode, the method is complete.
While the invention has been described, disclosed, illustrated and shown in various terms of certain embodiments or modifications which it has presumed in practice, the scope of the invention is not intended to be, nor should it be deemed to be, limited thereby and such other modifications or embodiments as may be suggested by the teachings herein are particularly reserved especially as they fall within the breadth and scope of the claims here appended.
This application is being filed as a continuation in part application off of previously filed application having Ser. No. 12/770,311 filed on Apr. 29, 2010 the entire disclosure of which is incorporated herein.
The invention described herein may be manufactured and used by or for the government of the United States of America for governmental purposes without the payment of any royalties thereon or therefor.
Number | Name | Date | Kind |
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8325098 | Henrie | Dec 2012 | B1 |
8531343 | Henrie | Sep 2013 | B1 |
20040155824 | Nagashima | Aug 2004 | A1 |
Entry |
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Henrie, Justin, et al., Measurement of Time-Evolving Electronically Steerable Radiation Patterns at Fast . . . , Microwave Symposium Digest (MTT), Jun. 2011, p. 1-4, Baltimore, MD, 2011. |
Henrie, Justin, et al., Measurement of Time-Evolving Electronically Steerable Radiation Patterns at Fast . . . , Slide Set presented at Microwave Symposium Digest, Jun. 2011, US, 2011. |
Number | Date | Country | |
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Parent | 12770311 | Apr 2010 | US |
Child | 13691299 | US |