Claims
- 1. A material testing system comprising:
a base; a first specimen holder; a second specimen holder; a first displacement sensor measuring displacement of the first specimen holder relative to the base; and a second displacement sensor measuring displacement of the second specimen holder relative to the base.
- 2. The material testing system of claim 1 and further comprising an actuator assembly fixedly coupled to the second specimen holder and operated as a function of the second displacement sensor to dispose the second specimen holder in a known position.
- 3. The material testing system of claim 2 wherein the actuator assembly comprises an electromagnetic coil coupled to a current source.
- 4. The material testing system of claim 3 and further comprising a controller receiving a signal from the second displacement sensor and adjusting the current applied to the coil to maintain the second specimen holder in a stationary, known position.
- 5. The material testing system of claim 3 and further comprising a controller to vary the current applied to the coil to displace the second specimen holder in an oscillating manner.
- 6. The material testing system of claim 1 wherein the second displacement sensor is a capacitive sensor.
- 7. A material testing system comprising:
a first specimen holder; a second specimen holder aligned with the first specimen holder along a common axis; a first actuator coupled to the first specimen holder; a second actuator coupled to the second specimen holder; a controller coupled to the first actuator and the second actuator, the controller operating the first actuator to cause displacement of the first specimen holder away from the second specimen holder, the controller further operating the second actuator to dispose the second specimen holder in a known position.
- 8. The material testing system of claim 7 wherein the second actuator includes a displacement sensor having a pair of fixed plates and a movable plate coupled to the second specimen holder.
- 9. The material testing system of claim 8 wherein the second actuator comprises an electromagnetic coil.
- 10. The material testing system of claim 9 wherein the second specimen holder is maintained in a fixed, known position.
- 11. The material testing system of claim 9 wherein an oscillatory force is applied to the second specimen holder.
- 12. The material testing system of claim 7 and further comprising a crosshead coupled to the first specimen holder, the crosshead further coupled to the first actuator.
- 13. The material testing system of claim 12 wherein the crosshead is coupled to a support frame with a guide mechanism to provide a predetermined path of displacement of the crosshead.
- 14. The material testing system of claim 13 wherein the guide mechanism comprises a linear bearing.
- 15. A method for determining elastic and plastic properties of materials, comprising:
attaching a specimen to a first holder and a second holder; displacing the first holder away from the second holder; applying a force to the second holder in a direction opposite displacement of the first holder; and simultaneously measuring extension of the specimen with a first sensor and measuring force on the specimen with a second sensor.
- 16. The method of claim 15 wherein the step of applying comprises maintaining the second holder in a first, fixed position.
- 17. The method of claim 15 wherein the step of applying comprises applying an oscillatory force to the second holder.
- 18. The method of claim 15 wherein an electromagnetic actuator is coupled to the second holder and the step of applying comprises applying a current to the electromagnetic actuator.
- 19. The method of claim 18 wherein measuring force on the specimen comprises measuring the current applied during the step of applying.
- 20. A material testing system comprising:
a first specimen holder; a second specimen holder aligned with the first specimen holder along a common axis; a first actuator coupled to the first specimen holder; a load assembly coupled to the second specimen holder and configured to control the second specimen holder to be statically rigid and dynamically compliant.
- 21. The material testing system of claim 20 wherein the load assembly comprises an electromagnetic coil coupled to a current source.
- 22. The material testing system of claim 20 wherein the load assembly includes a displacement sensor having a pair of fixed plates and a movable plate coupled to the second specimen holder.
Parent Case Info
[0001] The present application is based on and claims the benefit of U.S. provisional patent application Ser. No. 60/209,553, filed Jun. 6, 2000, the content of which is hereby incorporated by reference in its entirety.
Provisional Applications (1)
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Number |
Date |
Country |
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60209553 |
Jun 2000 |
US |