Claims
- 1. An production line adapted for dynamic testing of electronic assemblies, comprising:
a) at least one assembly machine; b) at least one inspection machine, programmed with at least a first program and a second program for identifying defects on electronic assemblies produced by the assembly machine; c) a communication network passing information between the assembly machine and the inspection machine; d) wherein the communication network passes information concerning an event that could cause defects in the manufacture of the electronic assemblies; and e) wherein, in response to receiving the indication of the event, the at least one inspection machine switches from using the first program to using the second program to inspect electronic assemblies.
- 2. The production line of claim 1 wherein the first program is a sampling program.
- 3. The production line of claim 1 wherein the first program inspects different regions on successive electronic assemblies.
- 4. The production line of claim 1 wherein the at least one assembly machine comprises a pick and place machine.
- 5. The production line of claim 1 wherein the at least one inspection machine comprises an AOI machine.
- 6. The production line of claim 1 wherein the at least one inspection machine comprises an AOI machine and a pick and flying prober machine.
- 7. The production line of claim 1 wherein the at least one inspection machine comprises a flying prober machine.
- 8. The production line of claim 1 wherein:
a) the at least one inspection machine comprises at least two inspection machines and b) the production line additionally comprises a switch routing electronic assemblies to the second assembly machine in response to the event; and c) the second program runs on the second inspection machine.
- 9. A method of manufacturing printed circuit boards using the production line of claim 1 comprising:
a) assembling a board with the assembly machine; b) selecting one of the first program and the second program in response to an indication of an event; and c) inspecting the board with the inspection machine using the selected program.
- 10. An inspection machine adapted for use in a production line capable of performing dynamic testing of electronic assemblies, comprising:
a) inspection apparatus selected from the class consisting of AOI and flying prober; b) a controller, connected to the inspection apparatus, the controller having:
i) at least a first software program and a second software program; ii) a connection to a communications network; iii) software adapted to receive event messages over the communications network and to select either the first program or the second program in response to an event message.
- 11. The inspection machine of claim 10 wherein the first software program is adapted to inspect different regions of successive electronic assemblies and the second software program is adapted to inspect specific components on the electronic assemblies.
- 12. The inspection machine of claim 11 wherein the specific component inspected by the second program are selected in response to the event message.
- 13. The inspection machine of claim 10 wherein the communications network comprises a GEM network.
RELATED APPLICATIONS
[0001] This application contains priority to provisional application 60/202,395 filed May 8, 2000.
Provisional Applications (1)
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Number |
Date |
Country |
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60202395 |
May 2000 |
US |