The present invention relates to test and measurement instruments, and more particularly to the generation of test signals with impairments.
Many test systems need to add inter symbol interference (ISI) as a stress source when testing serial digital receivers. This is done to emulate real-life situations where long cables and/or printed circuit board (PCB) traces add ISI into a communications link. Once added, the receiver is challenged to operate in error-free conditions despite the added impairing stress. Grading mechanisms for receivers amount to seeing how much ISI a given receiver can operate error-free with. For this reason, creating a continuously variable amount of ISI in a test system is desirable.
Continuously variable ISI has been elusive as the current state of the art employs RF switches to switch-in different lengths of PCB traces which causes a practical limitation to the number of trace length paths that can be inserted. This decreases the resolution of the varying increments of ISI. Alternatively, a large collection of fixed PCB traces can be used and manually cabled; however, this presents a problem for automatically changing between one amount of ISI stress and another.
What is needed is a variable ISI generator.
Embodiments of the present invention provide a variable inter symbol interference generator that generates a data signal having a variable amount of inter symbol interference by passing a data signal through (1) a programmable filter having an adjustable frequency response, and through (2) a fixed filter having a fixed frequency response such as a PCB trace, a length of cable, a discrete filter, or the like. By adjusting the parameters and therefore the insertion gain or loss of the programmable filter, and combining this with one or more fixed filters, a large range of continuously variable and finely tunable inter symbol interference amounts can be easily generated.
The objects, advantages, and other novel features of the present invention are apparent from the following detailed description when read in conjunction with the appended claims and attached drawings.
Embodiments of the present invention provide a variable ISI generator that generates a data signal having variable amounts of ISI by passing a data signal through (1) an emphasis or de-emphasis filter having an adjustable frequency response, and through (2) a fixed filter having a fixed frequency response such as a PCB trace, a length of cable, a discrete filter, or the like.
By way of explanation, consider
Now, an emphasis filter is any device that conditions a data signal by adding controllable amounts of emphasis such as the BERTScope® Digital Pre-emphasis Processor DPP Series available from Tektronix, Inc. of Beaverton, Oreg.
Now, in accordance with an embodiment of the present invention, the insertion gain of the 9″ emphasis filter 605 is added to the insertion loss of the 40″ PCB trace 305 to “synthesize” the frequency response of a 31″ PCB trace 705 as shown in
By adjusting the parameters and therefore the insertion gain of the emphasis filter, a large range of continuously variable and finely tunable ISI amounts can be easily generated. For example, PCB traces having lengths of 32″, 33″, and 34″ can be synthesized by concatenating a 40″ PCB trace with an emphasis filter having parameters optimized to approximate the gain needed to counteract the loss of an 8″, 7″, and 6″ PCB trace, respectively. This is a significant improvement over state-of-the-art signal generators which require manual cabling changes and/or large and expensive RF switching arrays to accomplish the same task.
In the embodiment described above, the programmable filter 1010 is an emphasis filter that provides an adjustable amount of insertion gain to improve (i.e., boost) the frequency response of the data signal, so that the combined frequency response of the programmable filter 1010 and the fixed filter 1015 provides for less ISI than the fixed filter 1015 alone. In other embodiments, the programmable filter 1010 is a de-emphasis filter that provides an adjustable amount of insertion loss to degrade the frequency response of the data signal, so that the combined frequency response of the programmable filter 1010 and the fixed filter 1015 provides for more ISI than the fixed filter 1015 alone.
In an alternative embodiment (not shown), an output of a data signal generator is first input to a fixed filter having a fixed insertion loss, and then input to a programmable filter to provide an equivalent result.
Referring back to
In some embodiments, the fixed filter 1015 comprises a plurality of fixed filters and a selection circuit (not shown). Each of the fixed filters may be a PCB trace, a length of cable, a discrete filter, or the like. The selection circuit comprises one or more switches, selectors, or the like, and can be programmed to select one of the fixed filters, or a combination of the fixed filters, in order to provide a fixed insertion loss through the fixed filter 1015. In these embodiments, the processor 1020 programs the selection circuit so that the fixed filter 1015 provides a portion of the desired amount of ISI (either less than or more than the desired amount of ISI), and programs the programmable filter 1010 to provide a residual amount of ISI (either insertion loss or gain), so that the combination of the programmable filter 1010 and the fixed filter 1015 provides the desired amount of ISI. In some embodiments, frequency response data for each of the plurality of fixed filters is stored in a memory (not shown), and the processor 1020 programs the programmable filter 1010 based on the frequency response data associated with the selected fixed filters.
It will be appreciated from the foregoing discussion that the present invention represents a significant advance in the field of test and measurement instruments. Although specific embodiments of the invention have been illustrated and described for purposes of illustration, it will be understood that various modifications may be made without departing from the spirit and scope of the invention. Accordingly, the invention should not be limited except as by the appended claims.
This application is a Continuation in Part of U.S. patent application Ser. No. 13/219,152 titled “VARIABLE INTER SYMBOL INTERFERENCE GENERATOR” filed on Aug. 26, 2011, and claims the benefit of U.S. Provisional Patent Application No. 61/591,595 titled “DYNAMIC VARIABLE INTER-SYMBOL INTERFERENCE (ISI) STRESS IMPAIRMENT SYSTEM” filed on Jan. 27, 2012, both of which are herein incorporated by reference.
Number | Date | Country | |
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61591595 | Jan 2012 | US | |
61439764 | Feb 2011 | US |
Number | Date | Country | |
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Parent | 13219152 | Aug 2011 | US |
Child | 13594369 | US |