Number | Name | Date | Kind |
---|---|---|---|
4864166 | Gloaguen | Sep 1989 | |
4967106 | Tamegaya | Oct 1990 | |
5162677 | Takahashi | Nov 1992 |
Entry |
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Burnett and Hu, "Hot-Carrier Degradation in Bipolar Transistors at 300 and 110k-Effect on BiCMOS Inverter Performance", IEEE Trans. on Elec. Dev., vol. 37, No. 4, Apr. '1990, pp. 1171-1173. |
Blood, "MECL System Design Handbook", 4th Ed., 1988, FIG. 1-1a, p. 1. |