Electrical connector with wafers having split ground planes

Information

  • Patent Grant
  • 6808399
  • Patent Number
    6,808,399
  • Date Filed
    Monday, December 2, 2002
    22 years ago
  • Date Issued
    Tuesday, October 26, 2004
    20 years ago
Abstract
An electrical wafer configured to be housed within an electrical connector comprising a main body, and a plurality of signal routes, gap routes and ground planes. The plurality of signal routes, gap routes and ground planes may be positioned on each of the first and second sides of the main body. Alternatively, all of the signal routes may be on one side, while all of the ground planes may be on the other side. Each ground plane on one side of the wafer is positioned between two gap routes, or a gap route and a signal route.
Description




BACKGROUND OF THE INVENTION




The present invention generally relates to an electrical wafer or circuit board configured for use within an electrical connector, and more particularly to an electrical wafer having at least one split ground plane.




In the past, controlled impedance connectors have been proposed that are used as board-to-board connectors. Many connectors house a plurality of circuit boards, or electrical wafers, having edges that mate with edges of corresponding contacts in an adjoining connector. The connectors may electrically connect components, such as motherboards and daughterboards.





FIG. 7

is a cross-sectional view of a portion of a conventional electrical wafer


100


. The electrical wafer


100


includes a main body


112


formed of a dielectric material, such as molded plastic. Signal tracks


114


are positioned on one side


102


of the electrical wafer


114


and may be separated from one another by a gap. The second side of the electrical wafer


104


includes at least one ground plane


116


. As shown in

FIG. 7

, the ground plane


116


is shared by both signal tracks


114


. Thus, electrical energy may travel from a first signal track to the ground plane


116


and into the second signal tracks (as shown by the arrows).




Examples of electrical connectors that utilize wafers are disclosed in United States Patent Application Publication US 2002/0009926 A1, filed Feb. 3, 2000 and published Jan. 24, 2002 (“the '926 application”). The '926 application is incorporated by reference herein in its entirety. The '926 application discloses an electrical connector that includes a housing that carries a plurality of wafers or circuit boards.

FIG. 9

illustrates an electrical connector


1111


according to the '926 application. As shown in

FIG. 9

(FIG. 1 of the '926 application), the electrical connector


1111


includes a housing


1112


having a front housing


1120


and an organizer


1130


. Wafers


1113


having mating edges


1116


are received and retained within the housing


1112


. The wafers


1113


extend parallel to each other in a spaced-apart relationship. The wafers


1113


include signal tracks that provide electrical paths through the connector. Each electrical path extends from a mating interface at one end of the connector to a mounting interface at another end of the connector.




The signal tracks of the wafers are separated by common ground planes. Ground planes may be provided on both sides of the wafer. At least a portion of the ground plane on one side of the wafer is located directly opposite a signal track on the opposite side of the wafer. Therefore, two signal tracks on a first side of the electrical wafer have a common return path to a ground plane, while a signal track on the second side of the wafer is directly across from the same ground plane through the main body of the wafer. The body of the wafer is typically a thin layer of dielectric material. Additionally, the signal track on the second side of the electrical wafer is typically separated from other signal tracks on the second side of the wafer by separate ground planes.




Electrical noise, jitter and the like generated by one signal track, or signal route, may pass into the ground plane. While the ground plane absorbs and alleviates noise and jitter, the ground plane may not entirely remove the noise and jitter. Hence, the ground plane may permit a small portion of the electrical noise, jitter and the like to pass from one signal track to another signal track. That is, the ground plane may couple with one signal track and act as an electrical conduit to another signal track, thereby allowing electrical noise and jitter to pass from one signal track to another signal track. Consequently, the signal tracks that share the same ground planes may still experience noise, jitter and the like thereby degrading performance within the electrical connector.





FIG. 8

is a cross-sectional view of a portion of another conventional electrical wafer


118


. The electrical wafer


118


includes differential signal pairs


120


that each share a common ground plane


122


. Thus, electrical energy may travel from one differential signal pair


120


to another differential signal pair through the common ground plane


122


.




Many connector systems are arranged to convey signals arranged in differential pairs. Each differential pair includes complimentary signals such that if one signal in a differential pair switches from a zero logic state to a one logic state, the other signal in the differential pair switches from a one logic state to a zero logic state. If the differential pair signals are skewed in time with respect to one another, or if the transmission line characteristics of the signal tracks in a differential pair differ, cancellation between signals of the differential pair does not occur and a new current (resulting from the fact that the signals did not cancel) may be generated and passed to the ground plane. This new current is passed from one differential pair to another differential pair through the common ground plane, thereby causing interference and degrading performance within the connector.




Thus, a need exists for an electrical wafer that minimizes the effects of adjacent signal paths communicating with one another. Further, a need exists for an electrical wafer that exhibits less interference, cross-talk, jitter and the like.




BRIEF SUMMARY OF THE INVENTION




Certain embodiments of the present invention provide an electrical wafer configured to be housed within an electrical connector, comprising a main body and a plurality of signal routes and ground planes. The main body is formed of a dielectric material having first and second sides. The plurality of signal routes are positioned on a first side of the main body. Each of the signal routes comprises a signal contact pad at a mating edge of the electrical wafer, a signal terminal at a mounting edge of the electrical wafer, and a trace connecting the signal contact pad with the signal terminal. The plurality of ground planes positioned on the second side of the main body are positioned such that each of the ground planes is directly across from one of the plurality of signal routes located on the first side of the main body. Neighboring ground planes on the second side are separated by a ground-to-ground gap.




Certain embodiments of the present invention also provide an electrical wafer configured to be housed within an electrical connector comprising a main body, and a plurality of signal routes, gap routes and ground planes. The plurality of signal routes, gap routes and ground planes are positioned on each of the first and second sides of the main body. Each of the plurality of signal routes on one of the sides is located between two of the plurality of ground planes on the same side of the main body. Each of the ground planes on one side of the main body is positioned between one of the plurality of signal routes and one of the plurality of the gap routes on the same side of the main body.











BRIEF DESCRIPTION OF SEVERAL VIEWS OF THE DRAWINGS





FIG. 1

illustrates an elevation view of a first side of an electrical wafer according to an embodiment of the present invention.





FIG. 2

illustrates an elevation view of a second side of an electrical wafer according to an embodiment of the present invention.





FIG. 3

is a cross-sectional view of an electrical wafer taken along line


3





3


in

FIG. 2

according to an embodiment of the present invention.





FIG. 4

is a cross-sectional view of a portion of an electrical wafer according to an alternative embodiment of the present invention.





FIG. 5

is a cross-sectional view of a portion of an electrical wafer according to a second alternative embodiment of the present invention.





FIG. 6

is a cross-sectional view of a portion of an electrical wafer according to a third alternative embodiment of the present invention.





FIG. 7

is a cross-sectional view of a portion of a conventional electrical wafer.





FIG. 8

is a cross-sectional view of a portion of another conventional electrical wafer that utilizes differential signal pairs.





FIG. 9

illustrates an electrical connector according to the '926 application.











The foregoing summary, as well as the following detailed description of certain embodiments of the present invention, will be better understood when read in conjunction with the appended drawings. For the purpose of illustrating the invention, there is shown in the drawings, certain embodiments. It should be understood, however, that the present invention is not limited to the arrangements and instrumentalities shown in the attached drawings.




DETAILED DESCRIPTION OF THE INVENTION





FIG. 1

illustrates an elevation view of a first side


10


of an electrical wafer


11


. The wafer


11


includes a main body


12


defined by a mounting edge


13


configured to be received and retained within an organizer of an electrical connector housing, a mating edge


14


configured to mate with a mating edge of another wafer, a top edge


16


and a rear edge


18


. The wafer


11


is configured to be received and retained within a connector housing, such as the housing


1112


shown in

FIG. 9. A

plurality of ground terminals


20


and signal terminals


22


are positioned proximate and along the mounting edge


13


in an alternating fashion. That is, each signal terminal


22


is positioned between two ground terminals


20


. A via


24


is formed within each ground and signal terminal


20


and


22


and allows an electrical signal to travel from the first side


10


of the electrical wafer


11


to the second side


42


(shown in

FIG. 2

) of the electrical wafer


11


.




A plurality of ground contact pads


26


and signal contact pads


28


are positioned proximate and along the mating edge


14


in an alternating fashion. Similar to the arrangement of the ground and signal terminals


20


and


22


, each signal contact pad


28


is positioned between two ground contact pads


26


. Some of the signal contact pads


28


include a via


30


, which allows an electrical signal to travel from a signal contact pad


28


to the other side of the electrical wafer


10


.




Each ground contact pad


26


is mechanically and electrically connected to a corresponding ground terminal


20


through a common ground plane


32


. Each ground plane


32


includes a ground contact pad


26


and a corresponding ground terminal


20


and is preferably integrally formed as a single piece of material, such as copper. Each ground plane


32


has a via


34


positioned within the main body


12


, distally located from the ground contact pads


26


. As shown in

FIG. 1

, the electrical wafer


11


includes ground planes A, C, E, G and I on the first side


10


.




A signal contact pad


28


may be mechanically and electrically connected to a corresponding signal terminal


22


through a signal trace


40


, which may be formed integrally with the signal contact pad


28


and the signal terminal


22


. The signal contact pads


28


, signal terminals


22


and traces


40


are preferably integrally formed as a single piece of material, such as copper. As shown in

FIG. 1

, the electrical wafer


11


includes a plurality of signal routes, such as signal routes B, D, F and H. Each signal route may include a signal contact pad


28


and a corresponding signal terminal


22


. Thus, each signal route extends from a signal contact pad


28


to a corresponding signal terminal


22


. An active signal route, such as signal route F, includes a trace


40


that connects the signal contact pad


28


to the signal terminal


22


. While the signal routes shown in

FIGS. 1 and 2

, for example, are single signal routes, the signal routes may also be differential pair signal routes. A gap route, such as signal route D, does not include a signal trace


40


. Rather, a gap route includes a contact gap


38


, which surrounds a signal contact pad


28


, that connects to an intermediate gap


36


, which in turn connects to a terminal gap


41


, which surrounds a signal terminal


22


.




Signal routes B and F are connected through a trace


40


. Conversely, gaps


36


,


38


and


41


of non-conductive material are formed between the signal contact pads


28


and the signal terminals


22


of gap routes D and H. Further, as shown in

FIG. 2

, the signal contact pads


28


of signal routes D′ and H′ (the prime designation denotes the route on the other side of the electrical wafer


10


) are electrically connected to their corresponding signal terminals


22


on the second side of the electrical wafer


11


(as shown in

FIG. 2

) through traces


40


. Referring to

FIGS. 1 and 2

, while the signal terminals


22


of signal routes B and F are connected to corresponding signal contacts pads


28


on the first side of the wafer


10


through traces


40


, the signal contact pads


28


and signal terminals


22


of gap routes B′ and F′ are surrounded by contact gaps


38


and


41


, respectively, which, in turn, are connected through gap


36


. That is, gaps


36


,


38


and


41


of non-conductive material are formed between the signal contact pads


28


and signal terminals


22


of gap routes B′ and F′ on the second side of the electrical wafer


10


. As more particularly shown in

FIG. 3

, while a trace


40


exists on one side of the electrical wafer


10


, the area directly underneath, or on the other side of, that trace


40


is a gap route comprising gaps


36


,


38


and


41


that are devoid of a conductive trace.




Spacers


36


′,


38


′ and


41


′ or gaps


36


,


38


and


41


are formed between ground planes


32


and signal routes. For example, as shown in

FIG. 1

, ground plane A is separated from signal route B by contact spacers


38


′, which are connected to intermediate spacers


36


′, which are in turn connected to terminal spacers


41


′. On the first side


10


of the wafer


10


, ground planes A and C are separated from one another by a spacers


36


′,


38


′ and


41


′ and a signal trace


40


connected to a signal contact pad


28


and a signal terminal


22


positioned between the spacers


36


′,


38


′ and


41


′. That is, ground planes A and C are separated by signal route B, which is an active signal route. Additionally, on the first side


10


of the electrical wafer


11


, ground planes C and E are separated from one another by gaps


36


,


38


and


41


, which do not include a signal trace


40


. That is, ground planes C and E are separated from one another by gap route D, which has no intervening signal trace


40


situated between ground planes C and E. The gaps


36


,


38


and


41


do not include any conductive material. The spacers


36


′,


38


′ and


41


′ do not include conductive material and are defined by a top surface of the main body


12


and an outer lateral edge of an adjacent ground plane


32


and an outer lateral edge of an adjacent trace


40


, signal contact pad


28


, and signal terminal


22


, respectively. The gaps


38


are formed so that electrical communication between adjacent ground planes


32


is minimized or reduced to tolerable levels.




The gaps


36


,


38


and


41


and spacer


36


′,


38


′ and


41


′ follow the contours of the signal and ground planes. For example, signal route B includes a trace


40


that electrically connects the signal contact pad


28


of signal route B to the signal terminal


22


of signal route B. The signal trace


40


(and the rest of signal route B) is positioned between two intermediate spacers


38


′, which conform to the shape of the signal trace


40


and the adjacent ground plane A (on one side of the signal trace


40


) and the adjacent ground plane C (on the other side of the signal trace


40


). Alternatively, the gaps


36


,


38


and


41


and the spacers


36


′,


38


′ and


41


′ may not follow the contours of the signal and ground planes, but may instead be non-uniform.





FIG. 2

illustrates an elevation view of a second side


42


of an electrical wafer


11


. As shown in

FIG. 2

, gap route B′, which is associated with signal route B on the first side


10


of the electrical wafer


11


, includes a non-conductive path defined by contact gap


38


, intermediate gap


36


and terminal gap


41


. Similar to

FIG. 1

, the signal contact pads


28


and the signal terminals


22


of the gap routes include vias


30


and


24


, respectively, that allow electrical signals to pass to the opposite side of the electrical wafer


11


.





FIG. 3

is a cross-sectional view of an electrical wafer


11


taken along line


3





3


in FIG.


2


. Gap route B′ is a mirror image of signal route B, which is located directly across from gap route B′. Thus, because signal route B includes a signal trace


40


, the gap route B′ includes a non-conductive path defined by gaps


36


,


38


and


41


. The same holds true for routes D-D′, F-F′ and H-H′ in that if a signal route


28


includes a signal trace


40


on one side of the electrical wafer


11


, the associated gap route on the other side of the electrical wafer


11


does not include a signal trace


40


. That is, a gap route mirrors an active signal route, which is located directly across from the gap route. Hence, where signal traces


40


exist on a first side


10


of the electrical wafer, the region on the second side


42


corresponding to the signal traces


40


on the first side


10


is a gap


38


. The ground planes


32


are separated on each side of the electrical wafer


11


so that a signal trace


40


on the opposite side is not positioned directly opposite that of a ground plane


32


. Because the ground planes


32


are separated from one another by gaps


36


,


38


and


41


, the progress of electrical signals from one ground plane


32


to an adjacent ground plane


32


is hindered, diminished or eliminated.




As shown in

FIG. 3

, a signal trace


40


on one side of the electrical wafer


11


is associated with an intermediate gap


36


on the other side located directly opposite that of the signal trace


40


. The ground planes on one side of the electrical wafer


10


are separated by a distance equaling at least the width of signal trace


40


on the opposite side of the electrical wafer


11


. For example, the signal trace


40


of signal route H′ on the second side of the electrical wafer


11


is mirrored on the first side


10


by (that is, located directly across from) the intermediate gap


36


of gap route H. Further, the trace


40


of signal route H′ is separated from ground planes I′ and G′ by intermediate spacers


36


′ formed between the trace


40


and the ground planes G′ and I′. Thus, no part of the signal route H′ abuts an adjacent ground plane (such as ground planes H′ and I′), nor does the gap route H (which is on the first side


10


) include any ground plane material. Rather, the gap route H includes the contact gap


38


, intermediate gap


36


and terminal gap


41


, but no trace


40


. The area across from a signal trace


40


in the lateral direction denoted by line X is an intermediate gap


36


. Similarly, the signal contact pads


28


connected to a signal trace


40


may be across from a contact gap


38


in the X-direction. In other words, an active signal route, such as signal route B, may be mirrored by a gap route defined by a contact gap


38


, an intermediate gap


36


and a terminal gap


41


of dielectric material, but without any conductive materials contained thereon.




Because the ground planes


32


are separated from one another, there is no common path for energy, in the form of cross-talk, noise and jitter, to travel from a lower signal route, such as signal route A, to an upper signal route, such as signal route H′. Thus, any energy that does travel from a lower signal route to an upper signal route is attenuated, as compared to conventional wafers. There is no ground plane material across from the signal route H′ (i.e., gap route H) to act as a conductive path or coupling structure over which energy may travel. Because there is no conductive path across from signal route H′, any energy that does travel from signal route H′ to signal route F is attenuated. Similarly, energy that may travel among other signal routes, such as signal routes B, D′, F and H′, is attenuated, diminished, reduced or minimized.





FIG. 4

is a cross-sectional view of a portion of the electrical wafer


11


according to an alternative embodiment of the present invention. In this embodiment, each trace


40


and/or signal route


36


and


136


is associated with one ground plane


32


. Also, as shown in

FIG. 4

, all signal routes


36


and


136


are on one side, for example the second side


42


, of the electrical wafer


11


, while the associated ground planes


32


are on the opposite side, such as the first side


10


, of the electrical wafer


11


. Thus, the majority of any electrical energy in the form of cross-talk, jitter, etc., from a trace


40


and/or signal route


36


and


136


travels from the dielectric material in the main body


12


, such as plastic, into an associated ground plane


32


. Any energy that travels from one signal route


36


to another signal route


136


is attenuated, or otherwise reduced. However, most, if not all, of any such electrical energy does not travel from one ground plane


32


to an adjacent ground plane


32


.





FIG. 5

is a cross-sectional view of a portion of the electrical wafer


111


according to a second alternative embodiment of the present invention. The embodiment shown in

FIG. 5

is similar to that of

FIGS. 1-3

, except that all the signal routes


136


are on one side, for example the second side


42


, of the electrical wafer


11


, while the associated ground planes


32


are on the first side


10


. Similar to the embodiments shown in

FIGS. 1-3

, the signal routes


136


are directly across, in the direction denoted by line X, from gap routes having intermediate gaps


38


. Thus, while energy may travel from the lower signal route


136


to the middle signal route


136


through the ground plane


32


on side


10


between the two signal routes


136


, energy does not travel from the lower signal route


136


to the upper signal route


136


. Most, if not all, of any such electrical energy does not travel to and from adjacent ground planes


32


because there is no conductive material over which the energy may travel.





FIG. 6

is a cross-sectional view of a portion of the electrical wafer


11


according to a third alternative embodiment of the present invention. Differential signal pairs


46


are used in this embodiment. Each differential signal pair


46


is associated with a single, distinct ground plane


32


. Thus, electrical energy in the form of noise, jitter, cross-talk and the like from one differential signal pair


46


may travel to the associated ground plane


32


, but not to another ground plane


32


. Alternatively, each differential signal pair


46


may be positioned across from, in the direction denoted by line X, a gap route having a gap


38


, with ground planes


32


being positioned between gaps


38


(similar to the embodiments shown with respect to

FIGS. 1-3

and


5


).




Thus, embodiments of the present invention provide an electrical wafer that minimize the effects of adjacent signal paths communicating with one another due to the ground planes being separated from one another. That is, each ground plane is associated with only one signal path or plane. Because the ground planes are separated from one another, most or all of any electrical energy does not travel from one ground plane to another ground plane positioned on the same side of the electrical wafer. Overall, embodiments of the present invention provide an electrical wafer that produces less interference, cross-talk, jitter and the like.




The electrical wafer may include more or less ground planes and signal routes than those shown. For example, each side of the electrical wafer may include more or less than the four signal routes shown. The electrical wafer may have a main body having first and second sides that are integrally formed with one another; or each side may be a separate component that may be snapably or otherwise fixedly secured to its counterpart or a connecting intermediate member. Embodiments of the present invention may be used with any electrical connector that utilizes electrical wafers. Further, embodiments of the present invention may be used with systems that may benefit from the reduction of cross-talk, interference, jitter and the like among signal routes, paths, traces and the like.




While the invention has been described with reference to certain embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from its scope. Therefore, it is intended that the invention not be limited to the particular embodiment disclosed, but that the invention will include all embodiments falling within the scope of the appended claims.



Claims
  • 1. An electrical wafer configured to be housed within an electrical connector, comprising:a main body formed of a dielectric material having first and second sides; a plurality of signal routes positioned on said first side of said main body, each of said signal routes comprising a conductive trace; and a plurality of ground planes positioned on said second side of said main body such that each of said ground planes is located directly across from one of said plurality of signal routes located on said first side of said main body, wherein neighboring ground planes on said second side are electrically isolated and separated from one another by a ground-to-ground gap.
  • 2. The electrical wafer of claim 1, wherein said signal routes comprise at least one of single signal routes and differential signal pairs.
  • 3. The electrical wafer of claim 1, wherein each of said signal routes on said first side is directly across from a respective one of said ground planes on said second side.
  • 4. The electrical wafer of claim 1, wherein said ground-to-ground gap is a non-uniform gap route.
  • 5. The electrical wafer of claim 1, further comprising vias that allow an electrical signal to pass from said first side of said main body to said second side of said main body.
  • 6. An electrical wafer configured to be housed within en electrical connector comprising:a main body formed of a dielectric material having first and second sides; and a plurality of signal routes, gap routes and ground planes positioned on each of said first and second sides of said main body, each of said plurality of signal routes on one of said sides is located between two of said plurality of ground planes on said one side, and each of said ground planes on said one side is positioned between one of said plurality of signal routes and one of said plurality of said gap routes on said one side.
  • 7. The electrical wafer of claim 6, wherein said signal routes comprise a trace electrically connected to a signal terminal at a mounting edge of said electrical wafer and a signal contact at a mating edge of said electrical wafer.
  • 8. The electrical wafer of claim 6, wherein each of said plurality of signal routes comprises a signal trace and a spacer positioned on each side of said signal trace, and wherein each of said plurality of gap routes is devoid of a signal trace.
  • 9. The electrical wafer of claim 6, wherein said signal routes comprise at least one of single signal routes and differential signal pairs.
  • 10. The electrical wafer of claim 6, wherein each of said signal routes on one of said sides is directly across from one of said gap routes on the other of said sides.
  • 11. The electrical wafer of claim 6, further comprising vias that allow an electrical signal to pass from said first side of said main body to said second side of said main body.
  • 12. An electrical wafer comprising:a dielectric main body having respective opposite sides; a plurality of signal routes on one of said sides and a plurality of ground planes on the other of said sides, wherein said ground planes are separated from each other by ground-to-ground gaps, and each of said signal routes on said one side is directly across from one of said ground-to-ground gaps on said other side.
  • 13. An electrical wafer comprising:a dielectric main body having respective opposite sides; a plurality of signal routes and a plurality of ground planes on one of said sides, wherein said signal routes are spaced-apart and all of said signal routes are separated from each other by respective pairs of said ground planes; wherein each of said pairs includes two ground planes that are separated from each other by a gap.
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