Electrical test probe

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Information

Patent Grant
D409929

References
Source

Patent Number
D409,929
Date Filed
Thursday, November 6, 1997
27 years ago
Date Issued
Tuesday, May 18, 1999
25 years ago

Inventors
Original Assignees
- Fluke Corporation
Examiners
- Davis; Antoine Duval

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 78
- 324 725
- 324 149
- 324 156
- 324 508
- 324 509
- 324 538
- 340 81574
International Classifications
- 1004
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for an electrical test probe, as shown.

US Referenced Citations (1)

Number	Name	Date	Kind
D391503	Van Dyk	Mar 1998

Non-Patent Literature Citations (1)

Entry
1994 Fluke Test & Measurement Catalog, Fluke Corporation, 1993 Everett, Washington.