Electrical test probe

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Information

Patent Grant
D334147

References
Source

Patent Number
D334,147
Date Filed
Wednesday, June 13, 1990
35 years ago
Date Issued
Tuesday, March 23, 1993
33 years ago

Inventors
- Glen Aukstikalnis
- Mark W. Nightingale
Original Assignees
- Tektronix, Inc.
Examiners
- Douglas; Alan P.
- Davis; Antoine
Agents
- Bucher; William K.

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 80
- D10 103
- D10 46
- 029 844
- 029 847
- 029 862
- 174 89
- 174 750
- 324 725
- 324 156
- 324 149
- 324 158 P
- 439 482
- 439 585
- 439 374
- 439 824
- 439 819
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for an electrical test probe, as shown.

US Referenced Citations (4)

Number	Name	Date	Kind
D162813	Goldberger et al.	Apr 1951
D300909	Thornburg et al.	May 1989
D311346	Gross	Oct 1990
4673300	Wilhelmson et al.	Jun 1987

Non-Patent Literature Citations (2)

Entry
Tektronix, Inc., Tek Accessories; Minature Modular Passive Probes; Subminiature Passive Probes; etc.: .COPYRGT.1989; pp. 4, 6, 8, 10, 12, 14, 18-20, 24.
Tegam Inc., Thermocouple Probes, Aug. 1987; cover page.