Electrical test probe

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Information

Patent Grant
D346338

References
Source

Patent Number
D346,338
Date Filed
Friday, February 26, 1993
32 years ago
Date Issued
Tuesday, April 26, 1994
30 years ago

Inventors
- Jonathan E. Myers
- Mark W. Nightingale
Original Assignees
- Tektronix, Inc.
Examiners
- Douglas; Alan P.
- Davis; Antoine D.
Agents
- Bucher; William K.

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- 324 725
- 324 158 P
- D10 78
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for an electrical test probe, as shown and described.

US Referenced Citations (3)

Number	Name	Date	Kind
4978921	Indig et al.	Dec 1990
5032787	Johnston et al.	Jul 1991
5041781	Kawada et al.	Aug 1991

Non-Patent Literature Citations (1)

Entry
Tektronix, Passive Voltage Probes, .COPYRGT.1990, p. 411, provided by applicant.