Embodiments described herein relate to the field of patterned media, and, in particularly, to electro-deposited passivation of pattern media.
Patterned media poses unique challenges to the tribological properties of hard disks because typical fabrication processes can involve producing topography (e.g., grooves) in the magnetic media layers. The non-planar media surface can adversely affect a disk drive's performance in terms of both head flyability and corrosion. In conventional hard disk media, the head flies over a very smooth surface and the magnetic layers, which are composite metal films, are capped with a thin diamond-like carbon (DLC) film to protect against corrosion. In patterned media, a DLC film is also typically required to cap the magnetic layers, but the presence of topography in the magnetic layers can result in poor conformal coverage (e.g., groove sidewalls and corners) resulting in inadequate corrosion performance.
In conventional fabrication process for patterned media, the DLC film is applied to the pattern features of the discrete track recording (DTR) disk, also referred to as discrete track media (DTM). One type of DTM structure utilizes a pattern of concentric discrete zones for the recording medium. When data are written to the recoding medium, the discrete magnetic areas correspond to the data tracks. The substrate surface areas not containing the magnetic material isolate the data tracks from one another. The discrete magnetic zones (also known as hills, lands, elevations, etc.) are used for storing data and the non-magnetic zones (also known as troughs, valleys, grooves, etc.) provide inter-track isolation to reduce noise. The lands have a width less than the width of the recording head such that portions of the head extend over the troughs during operation. The lands are sufficiently close to the head to enable the writing of data in the magnetic layer. Therefore, with DTM, data tracks are defined both physically and magnetically
In conventional fabrication of DTM, the recessed (e.g., grooves) and non-recessed regions (e.g., lands) of the patterned area are coated at the same time using the same diamond-like carbon (DLC) deposition process. As a result, the coating of the recessed regions will be thinner and less uniform than the non-recessed regions because of shadowing effects and a larger surface area in the recessed regions. Consequently, the potential for corrosion in the recessed regions of the patterned media is greater than the non-recessed regions and likewise greater than standard non-patterned media.
One conventional DTM fabrication approach uses a physical vapor deposition (PVD) technique to coated the entire surface of patterned magnetic layer. Such an approach may involve multi-steps of depositing and etching back films to completely fill recessed regions of the patterned media and achieve a flyable surface.
Another conventional DTM fabrication method described in US 2008/0187779 utilizes atomic layer deposition (ALD) to deposit a DLC film over the entire surface of the patterned magnetic recording layer, after installing a resin mold mask on the surface of magnetic recording layer. The ALD fills not only the grooves but also covers the resin mold mask on the lands of the magnetic recording layer. Then, the resin mold mask is removed together with the ALD protective layer above the lands of the magnetic recording layer.
Embodiments are illustrated by way of example, and not limitation, in the figures of the accompanying drawings in which:
Embodiments of the apparatus and methods are described herein with reference to figures. However, particular embodiments may be practiced without one or more of these specific details, or in combination with other known methods, materials, and apparatuses. In the following description, numerous specific details are set forth, such as specific materials, dimensions and processes parameters etc. to provide a thorough understanding. In other instances, well-known manufacturing processes and equipment have not been described in particular detail to avoid unnecessarily obscuring the claimed subject matter. Reference throughout this specification to “an embodiment” means that a particular feature, structure, material, or characteristic described in connection with the embodiment is included in at least one embodiment of the invention. Thus, the appearances of the phrase “in an embodiment” in various places throughout this specification are not necessarily referring to the same embodiment. Furthermore, the particular features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments.
Embodiments of a method of electro-depositing a coating to reside in the recessed areas (grooves) of a patterned magnetic film are described. Electro-deposition of the coating in these topographical grooves may be performed in order to passivate the surfaces of these patterned grooves and prevent corrosion. In one particular embodiment, such a coating layer is only electro-deposited in the patterned grooves so that no additional spacing loss is added to the top magnetic surface. In one embodiment, depending on the coating layer thickness, the effect on head flyability can also be mitigated by either partially or completely filling the grooves to planarize the media. Improved corrosion performance as well as flyability of the patterned media may result from embodiments of the invention discussed herein.
In one embodiment, the electro-deposition process is performed after the features have been etched by some means into the media layers but before a mask layer is stripped so that only the exposed conductive surfaces are the recessed features. Consequently, material is only deposited in the recessed areas (i.e., grooves) of the patterned magnetic layers(s) during the electro-deposition process. After depositing the first coating in the etched features, the masking layer is then stripped and second protection layer (e.g., DLC film) can be deposited over the entire surface of the patterned magnetic layer(s). As a result, the recessed regions of the pattern will have two layers of protection (i.e., electro-deposited film and vacuum deposited DLC) while the non-recessed regions (i.e., lands) of the pattern will have only the second protection layer (e.g., the DLC film).
As one of ordinary skill in the art will appreciate, different deposition methods may provide distinct material properties of the deposited layer. For example, one of ordinary skill in the art would understand CVD carbon to have material properties that are distinct from PVD carbon. Thus, a CVD carbon layer would not be considered structurally equivalent to a PVD carbon layer. As another example, a DLC film formed by a CVD method is denser and harder than a DLC film formed by a sputtering method. ALD is similar in chemistry to CVD, except that the ALD reaction breaks the CVD reaction into two half-reactions, keeping precursor materials separate during the reaction. A layer produced by electro deposition has different material properties than a layer of produced by ALD. As such, embodiments of the deposition method may be discussed herein at times in reference to the physical properties of a layer produced by the particular deposition method as well as a description of the deposition process. In one embodiment, the electrodeposited layer may have a crystalline structure. Alternatively, the electrodeposited layer may have an amorphous structure.
After the patterned magnetic layer(s) 112 and mask layer 111 have been provided, operation 110, the method 100 then proceeds with electro-depositing a protection layer 123 within the grooves 113 of the patterned magnetic layer(s) 112, operation 120. Next, mask layer 111 is removed, operation 130, followed by the depositing of a second protection layer 145 over both the grooves 113 and lands 114 of the pattered magnetic layer(s) 112, step 140. Further details of each of the operations of
In the electro-deposition process, the disk 205 as a work piece is made into either an anode or a cathode depending on the material to be deposited. A wide variety of materials can be electrodeposited into the recessed areas of the magnetic recording pattern including both metals and insulators. The materials which can be electro-deposited in this fashion include, for example, metals such as Au or silicates such as sodium silicate (Na2SiO3), potassium silicate (K2SiO3). In one embodiment, the deposited film may be a cross-linked silicate (silica) film free of sodium or potassium. In the case of sodium silicate, the electro-deposited film can then be converted to silica by baking the coating after deposition, as illustrated by operation 120 in
In alternative embodiments, other metallic materials such as aluminum (Al), gold (Au), chromium (Cr), ruthenium (Ru), platinum (Pt), rhodium (Rh) and Copper (Cu) may be used. In general, metals are not magnetically sensitive and provide good adhesion, corrosion resistance and mechanical strength can also be employed. In yet other embodiments, aluminates can also be used similarly as silicate to be electro chemically deposited to the recessed areas 113. It should be noted that alloys can also be employed for formation of the first protection layer 123. In addition, multiple materials can also be electro-deposited in sequence to obtain desired adhesion, corrosion resistance, and mechanical properties.
When metallic materials are to be deposited into the grooves 113, the disk 205 is made a cathode and the tank electrode 240 is made an anode. When silicates or aluminates are to be used, the disk 205 is made an anode and the tank electrode 240 is made a cathode. In one embodiment, the electro deposition is carried out in a DC mode. In alternative embodiments, other plating modes may be used, for example, a positively pulsed mode, or a reversely pulsed mode (positive and negative). It should be noted that other types and configurations of electroplaters may be used in alternative embodiments of the present invention. Electroplating equipment is known in the art; accordingly, a further discussion is not provided herein. In one embodiment, the electrodeposition operation may be performed using electroless plating techniques.
The thickness of the first protection layer 123 can be controlled so that the groove 113 depth can be controlled to render the disk good flyability as well as good corrosion resistance. In the case of the metal coatings, relatively thick coatings can be achieved to even planarize the patterned features. In the case of silicates or aluminates, the coating thickness is self-limiting because the coating becomes non-conductive after a few nm and the deposition process stops.
Parameters such as electroplating bath composition, temperature, pH, voltage, pulse time and frequency (if pulsed), deposition time, etc all should be controlled to obtain optimum film properties. In order to limit the deposited film into grooves, the resist on the land area is non-conductive according to one embodiment. This can be done through controlling the resist thickness or selecting resist of high electrical resistance.
Referring to both
Embodiments of the methods described above may be used to fabricate a DTR perpendicular magnetic recording (PMR) disk having a soft magnetic film disposed above a substrate. The soft magnetic film may be composed of a single soft magnetic underlayer (SUL) or multiple soft magnetic underlayers having interlayer materials, such as ruthenium (Ru), disposed there between. In particular embodiments, both sides of the substrate may be processed, in either simultaneous or consecutive fashion, to form disks with double sided DTR patterns.
The terms “over,” “under,” “between,” and “on” as used herein refer to a relative position of one layer with respect to other layers. As such, for example, one layer deposited or disposed over or under another layer may be directly in contact with the other layer or may have one or more intervening layers. Moreover, one layer deposited or disposed between layers may be directly in contact with the layers or may have one or more intervening layers. In contrast, a first layer “on” a second layer is in contact with that second layer. Additionally, the relative position of one layer with respect to other layers is provided assuming the initial workpiece is a starting substrate and the subsequent processing deposits, modifies and removes films from the substrate without consideration of the absolute orientation of the substrate. Thus, a film that is deposited on both sides of a substrate is “over” both sides of the substrate.
Although these embodiments have been described in language specific to structural features and methodological acts, it is to be understood that the invention defined in the appended claims is not necessarily limited to the specific features or acts described in particular embodiments. The specific features and acts disclosed are to be understood as particularly graceful implementations of the claimed invention in an effort to illustrate rather than limit the present invention.
This application is a divisional of U.S. patent application Ser. No. 12/472,288, filed May 26, 2009, which is hereby incorporated by reference in its entirety.
Number | Name | Date | Kind |
---|---|---|---|
3969195 | Dotzer et al. | Jul 1976 | A |
4238385 | Okado et al. | Dec 1980 | A |
4420365 | Lehrer | Dec 1983 | A |
4482418 | Rigby | Nov 1984 | A |
4935278 | Krounbi et al. | Jun 1990 | A |
5700523 | Petrole et al. | Dec 1997 | A |
5723033 | Weiss | Mar 1998 | A |
6013161 | Chen et al. | Jan 2000 | A |
6063248 | Bourez et al. | May 2000 | A |
6068891 | O'Dell et al. | May 2000 | A |
6086730 | Liu et al. | Jul 2000 | A |
6099981 | Nishimori | Aug 2000 | A |
6103404 | Ross et al. | Aug 2000 | A |
6117499 | Wong et al. | Sep 2000 | A |
6136403 | Prabhakara et al. | Oct 2000 | A |
6143375 | Ross et al. | Nov 2000 | A |
6145849 | Bae et al. | Nov 2000 | A |
6146737 | Malhotra et al. | Nov 2000 | A |
6149696 | Jia | Nov 2000 | A |
6150015 | Bertero et al. | Nov 2000 | A |
6156404 | Ross et al. | Dec 2000 | A |
6159076 | Sun et al. | Dec 2000 | A |
6164118 | Suzuki et al. | Dec 2000 | A |
6200441 | Gornicki et al. | Mar 2001 | B1 |
6204995 | Hokkyo et al. | Mar 2001 | B1 |
6206765 | Sanders et al. | Mar 2001 | B1 |
6210819 | Lal et al. | Apr 2001 | B1 |
6216709 | Fung et al. | Apr 2001 | B1 |
6221119 | Homola | Apr 2001 | B1 |
6248395 | Homola et al. | Jun 2001 | B1 |
6261681 | Suekane et al. | Jul 2001 | B1 |
6270885 | Hokkyo et al. | Aug 2001 | B1 |
6274063 | Li et al. | Aug 2001 | B1 |
6283838 | Blake et al. | Sep 2001 | B1 |
6287429 | Moroishi et al. | Sep 2001 | B1 |
6290573 | Suzuki | Sep 2001 | B1 |
6299947 | Suzuki et al. | Oct 2001 | B1 |
6303217 | Malhotra et al. | Oct 2001 | B1 |
6309765 | Suekane et al. | Oct 2001 | B1 |
6358636 | Yang et al. | Mar 2002 | B1 |
6362452 | Suzuki et al. | Mar 2002 | B1 |
6363599 | Bajorek | Apr 2002 | B1 |
6365012 | Sato et al. | Apr 2002 | B1 |
6381090 | Suzuki et al. | Apr 2002 | B1 |
6381092 | Suzuki | Apr 2002 | B1 |
6387483 | Hokkyo et al. | May 2002 | B1 |
6391213 | Homola | May 2002 | B1 |
6395349 | Salamon | May 2002 | B1 |
6403919 | Salamon | Jun 2002 | B1 |
6408677 | Suzuki | Jun 2002 | B1 |
6426157 | Hokkyo et al. | Jul 2002 | B1 |
6429984 | Alex | Aug 2002 | B1 |
6482330 | Bajorek | Nov 2002 | B1 |
6482505 | Bertero et al. | Nov 2002 | B1 |
6500567 | Bertero et al. | Dec 2002 | B1 |
6528124 | Nguyen | Mar 2003 | B1 |
6548821 | Treves et al. | Apr 2003 | B1 |
6552871 | Suzuki et al. | Apr 2003 | B2 |
6565719 | Lairson et al. | May 2003 | B1 |
6566674 | Treves et al. | May 2003 | B1 |
6571806 | Rosano et al. | Jun 2003 | B2 |
6628466 | Alex | Sep 2003 | B2 |
6664503 | Hsieh et al. | Dec 2003 | B1 |
6670055 | Tomiyasu et al. | Dec 2003 | B2 |
6680079 | Stirniman et al. | Jan 2004 | B1 |
6682807 | Lairson et al. | Jan 2004 | B2 |
6683754 | Suzuki et al. | Jan 2004 | B2 |
6730420 | Bertero et al. | May 2004 | B1 |
6743528 | Suekane et al. | Jun 2004 | B2 |
6759138 | Tomiyasu et al. | Jul 2004 | B2 |
6778353 | Harper | Aug 2004 | B1 |
6795274 | Hsieh et al. | Sep 2004 | B1 |
6821627 | Stirniman et al. | Nov 2004 | B2 |
6855232 | Jairson et al. | Feb 2005 | B2 |
6857937 | Bajorek | Feb 2005 | B2 |
6893748 | Bertero et al. | May 2005 | B2 |
6899959 | Bertero et al. | May 2005 | B2 |
6916558 | Umezawa et al. | Jul 2005 | B2 |
6939120 | Harper | Sep 2005 | B1 |
6946191 | Morikawa et al. | Sep 2005 | B2 |
6967798 | Homola et al. | Nov 2005 | B2 |
6972135 | Homola | Dec 2005 | B2 |
7004827 | Suzuki et al. | Feb 2006 | B1 |
7006323 | Suzuki | Feb 2006 | B1 |
7016154 | Nishihira | Mar 2006 | B2 |
7019924 | McNeil et al. | Mar 2006 | B2 |
7045215 | Shimokawa | May 2006 | B2 |
7070870 | Bertero et al. | Jul 2006 | B2 |
7090934 | Hokkyo et al. | Aug 2006 | B2 |
7099112 | Harper | Aug 2006 | B1 |
7105241 | Shimokawa et al. | Sep 2006 | B2 |
7112377 | Itoh et al. | Sep 2006 | B2 |
7119990 | Bajorek et al. | Oct 2006 | B2 |
7147790 | Wachenschwanz et al. | Dec 2006 | B2 |
7150844 | Deeman et al. | Dec 2006 | B2 |
7161753 | Wachenschwanz et al. | Jan 2007 | B2 |
7166319 | Ishiyama | Jan 2007 | B2 |
7166374 | Suekane et al. | Jan 2007 | B2 |
7169487 | Kawai et al. | Jan 2007 | B2 |
7174775 | Ishiyama | Feb 2007 | B2 |
7179549 | Malhotra et al. | Feb 2007 | B2 |
7184139 | Treves et al. | Feb 2007 | B2 |
7196860 | Alex | Mar 2007 | B2 |
7199977 | Suzuki et al. | Apr 2007 | B2 |
7208236 | Morikawa et al. | Apr 2007 | B2 |
7220500 | Tomiyasu et al. | May 2007 | B1 |
7229266 | Harper | Jun 2007 | B2 |
7239970 | Treves et al. | Jul 2007 | B2 |
7252897 | Shimokawa et al. | Aug 2007 | B2 |
7277254 | Shimokawa et al. | Oct 2007 | B2 |
7281920 | Homola et al. | Oct 2007 | B2 |
7292329 | Treves et al. | Nov 2007 | B2 |
7300595 | Suwa et al. | Nov 2007 | B2 |
7301726 | Suzuki | Nov 2007 | B1 |
7302148 | Treves et al. | Nov 2007 | B2 |
7305119 | Treves et al. | Dec 2007 | B2 |
7314404 | Singh et al. | Jan 2008 | B2 |
7314833 | Kamata et al. | Jan 2008 | B2 |
7320584 | Harper et al. | Jan 2008 | B1 |
7323258 | Kamata et al. | Jan 2008 | B2 |
7329114 | Harper et al. | Feb 2008 | B2 |
7341825 | Bandic et al. | Mar 2008 | B2 |
7351484 | Wang et al. | Apr 2008 | B2 |
7375362 | Treves et al. | May 2008 | B2 |
7378029 | Hattori et al. | May 2008 | B2 |
7385785 | Hattori et al. | Jun 2008 | B2 |
7420886 | Tomiyasu et al. | Sep 2008 | B2 |
7425719 | Treves et al. | Sep 2008 | B2 |
7471484 | Wachenschwanz et al. | Dec 2008 | B2 |
7498062 | Calcaterra et al. | Mar 2009 | B2 |
7531485 | Hara et al. | May 2009 | B2 |
7537846 | Ishiyama et al. | May 2009 | B2 |
7549209 | Wachenschwanz et al. | Jun 2009 | B2 |
7569490 | Staud | Aug 2009 | B2 |
7572528 | Yamamoto et al. | Aug 2009 | B2 |
7597792 | Homola et al. | Oct 2009 | B2 |
7597973 | Ishiyama | Oct 2009 | B2 |
7608193 | Wachenschwanz et al. | Oct 2009 | B2 |
7632087 | Homola | Dec 2009 | B2 |
7656615 | Wachenschwanz et al. | Feb 2010 | B2 |
7682546 | Harper | Mar 2010 | B2 |
7684152 | Suzuki et al. | Mar 2010 | B2 |
7686606 | Harper et al. | Mar 2010 | B2 |
7686991 | Harper | Mar 2010 | B2 |
7695833 | Ishiyama | Apr 2010 | B2 |
7722968 | Ishiyama | May 2010 | B2 |
7733605 | Suzuki et al. | Jun 2010 | B2 |
7736768 | Ishiyama | Jun 2010 | B2 |
7755861 | Li et al. | Jul 2010 | B1 |
7758732 | Calcaterra et al. | Jul 2010 | B1 |
7833639 | Sonobe et al. | Nov 2010 | B2 |
7833641 | Tomiyasu et al. | Nov 2010 | B2 |
7910159 | Jung | Mar 2011 | B2 |
7911736 | Bajorek | Mar 2011 | B2 |
7924519 | Lambert | Apr 2011 | B2 |
7944165 | O'Dell | May 2011 | B1 |
7944643 | Jiang et al. | May 2011 | B1 |
7955723 | Umezawa et al. | Jun 2011 | B2 |
7983003 | Sonobe et al. | Jul 2011 | B2 |
7993497 | Moroishi et al. | Aug 2011 | B2 |
7993765 | Kim et al. | Aug 2011 | B2 |
7998912 | Chen et al. | Aug 2011 | B2 |
8002901 | Chen et al. | Aug 2011 | B1 |
8003237 | Sonobe et al. | Aug 2011 | B2 |
8012920 | Shimokawa | Sep 2011 | B2 |
8038863 | Homola | Oct 2011 | B2 |
8057926 | Ayama et al. | Nov 2011 | B2 |
8062778 | Suzuki et al. | Nov 2011 | B2 |
8064156 | Suzuki et al. | Nov 2011 | B1 |
8076013 | Sonobe et al. | Dec 2011 | B2 |
8092931 | Ishiyama et al. | Jan 2012 | B2 |
8100685 | Harper et al. | Jan 2012 | B1 |
8101054 | Chen et al. | Jan 2012 | B2 |
8125723 | Nichols et al. | Feb 2012 | B1 |
8125724 | Nichols et al. | Feb 2012 | B1 |
8137517 | Bourez | Mar 2012 | B1 |
8142916 | Umezawa et al. | Mar 2012 | B2 |
8163093 | Chen et al. | Apr 2012 | B1 |
8171949 | Lund et al. | May 2012 | B1 |
8173282 | Sun et al. | May 2012 | B1 |
8178480 | Hamakubo et al. | May 2012 | B2 |
8206789 | Suzuki | Jun 2012 | B2 |
8218260 | Iamratanakul et al. | Jul 2012 | B2 |
8247095 | Champion et al. | Aug 2012 | B2 |
8257783 | Suzuki et al. | Sep 2012 | B2 |
8298609 | Liew et al. | Oct 2012 | B1 |
8298689 | Sonobe et al. | Oct 2012 | B2 |
8309239 | Umezawa et al. | Nov 2012 | B2 |
8316668 | Chan et al. | Nov 2012 | B1 |
8331056 | O'Dell | Dec 2012 | B2 |
8354618 | Chen et al. | Jan 2013 | B1 |
8367228 | Sonobe et al. | Feb 2013 | B2 |
8383209 | Ayama | Feb 2013 | B2 |
8394243 | Jung et al. | Mar 2013 | B1 |
8397751 | Chan et al. | Mar 2013 | B1 |
8399809 | Bourez | Mar 2013 | B1 |
8402638 | Treves et al. | Mar 2013 | B1 |
8404056 | Chen et al. | Mar 2013 | B1 |
8404369 | Ruffini et al. | Mar 2013 | B2 |
8404370 | Sato et al. | Mar 2013 | B2 |
8406918 | Tan et al. | Mar 2013 | B2 |
8414966 | Yasumori et al. | Apr 2013 | B2 |
8425975 | Ishiyama | Apr 2013 | B2 |
8431257 | Kim et al. | Apr 2013 | B2 |
8431258 | Onoue et al. | Apr 2013 | B2 |
8453315 | Kajiwara et al. | Jun 2013 | B2 |
8488276 | Jung et al. | Jul 2013 | B1 |
8491800 | Dorsey | Jul 2013 | B1 |
8492009 | Homola et al. | Jul 2013 | B1 |
8492011 | Itoh et al. | Jul 2013 | B2 |
8496466 | Treves et al. | Jul 2013 | B1 |
8517364 | Crumley et al. | Aug 2013 | B1 |
8517657 | Chen et al. | Aug 2013 | B2 |
8524052 | Tan et al. | Sep 2013 | B1 |
8530065 | Chernyshov et al. | Sep 2013 | B1 |
8546000 | Umezawa | Oct 2013 | B2 |
8551253 | Na'im et al. | Oct 2013 | B2 |
8551627 | Shimada et al. | Oct 2013 | B2 |
8556566 | Suzuki et al. | Oct 2013 | B1 |
8559131 | Masuda et al. | Oct 2013 | B2 |
8562748 | Chen et al. | Oct 2013 | B1 |
8565050 | Bertero et al. | Oct 2013 | B1 |
8570844 | Yuan et al. | Oct 2013 | B1 |
8580410 | Onoue | Nov 2013 | B2 |
8584687 | Chen et al. | Nov 2013 | B1 |
8591709 | Lim et al. | Nov 2013 | B1 |
8592061 | Onoue et al. | Nov 2013 | B2 |
8596287 | Chen et al. | Dec 2013 | B1 |
8597723 | Jung et al. | Dec 2013 | B1 |
8603649 | Onoue | Dec 2013 | B2 |
8603650 | Sonobe et al. | Dec 2013 | B2 |
8605388 | Yasumori et al. | Dec 2013 | B2 |
8605555 | Chernyshov et al. | Dec 2013 | B1 |
8608147 | Yap et al. | Dec 2013 | B1 |
8609263 | Chernyshov et al. | Dec 2013 | B1 |
8619381 | Moser et al. | Dec 2013 | B2 |
8623528 | Umezawa et al. | Jan 2014 | B2 |
8623529 | Suzuki | Jan 2014 | B2 |
8634155 | Yasumori et al. | Jan 2014 | B2 |
8658003 | Bourez | Feb 2014 | B1 |
8658292 | Mallary et al. | Feb 2014 | B1 |
8665541 | Saito | Mar 2014 | B2 |
8668953 | Buechel-Rimmel | Mar 2014 | B1 |
8674327 | Poon et al. | Mar 2014 | B1 |
8685214 | Moh et al. | Apr 2014 | B1 |
20010055700 | Dykes et al. | Dec 2001 | A1 |
20020030949 | Itoh et al. | Mar 2002 | A1 |
20020060883 | Suzuki | May 2002 | A1 |
20030022024 | Wachenschwanz | Jan 2003 | A1 |
20040022387 | Weikle | Feb 2004 | A1 |
20040132301 | Harper et al. | Jul 2004 | A1 |
20040202793 | Harper et al. | Oct 2004 | A1 |
20040202865 | Homola et al. | Oct 2004 | A1 |
20040209123 | Bajorek et al. | Oct 2004 | A1 |
20040209470 | Bajorek | Oct 2004 | A1 |
20050036223 | Wachenschwanz et al. | Feb 2005 | A1 |
20050086795 | Suwa et al. | Apr 2005 | A1 |
20050120545 | Wachenschwanz et al. | Jun 2005 | A1 |
20050142990 | Homola | Jun 2005 | A1 |
20050150862 | Harper et al. | Jul 2005 | A1 |
20050151282 | Harper et al. | Jul 2005 | A1 |
20050151283 | Bajorek et al. | Jul 2005 | A1 |
20050151300 | Harper et al. | Jul 2005 | A1 |
20050155554 | Saito | Jul 2005 | A1 |
20050167867 | Bajorek et al. | Aug 2005 | A1 |
20050211566 | Tomita et al. | Sep 2005 | A1 |
20050263401 | Olsen et al. | Dec 2005 | A1 |
20050271819 | Wago et al. | Dec 2005 | A1 |
20060063336 | Triyoso et al. | Mar 2006 | A1 |
20060093863 | Tsuchiya et al. | May 2006 | A1 |
20060147758 | Jung et al. | Jul 2006 | A1 |
20060181697 | Treves et al. | Aug 2006 | A1 |
20060207890 | Staud | Sep 2006 | A1 |
20060222897 | Kamata | Oct 2006 | A1 |
20060231409 | Sakamoto et al. | Oct 2006 | A1 |
20070026265 | Sakurai et al. | Feb 2007 | A1 |
20070054153 | Dai et al. | Mar 2007 | A1 |
20070070549 | Suzuki et al. | Mar 2007 | A1 |
20070245909 | Homola | Oct 2007 | A1 |
20080026252 | Sonoda et al. | Jan 2008 | A1 |
20080075845 | Sonobe et al. | Mar 2008 | A1 |
20080085362 | Yen et al. | Apr 2008 | A1 |
20080093760 | Harper et al. | Apr 2008 | A1 |
20080187779 | Horiguchi | Aug 2008 | A1 |
20090117408 | Umezawa et al. | May 2009 | A1 |
20090136784 | Suzuki et al. | May 2009 | A1 |
20090162704 | Kimura et al. | Jun 2009 | A1 |
20090169922 | Ishiyama | Jul 2009 | A1 |
20090191331 | Umezawa et al. | Jul 2009 | A1 |
20090202866 | Kim et al. | Aug 2009 | A1 |
20090311557 | Onoue et al. | Dec 2009 | A1 |
20100059476 | Yamamoto et al. | Mar 2010 | A1 |
20100067144 | Tagami | Mar 2010 | A1 |
20100103559 | Sato | Apr 2010 | A1 |
20100143752 | Ishibashi et al. | Jun 2010 | A1 |
20100190035 | Sonobe et al. | Jul 2010 | A1 |
20100196619 | Ishiyama | Aug 2010 | A1 |
20100196740 | Ayama et al. | Aug 2010 | A1 |
20100209601 | Shimokawa et al. | Aug 2010 | A1 |
20100215992 | Horikawa et al. | Aug 2010 | A1 |
20100232065 | Suzuki et al. | Sep 2010 | A1 |
20100247965 | Onoue | Sep 2010 | A1 |
20100261039 | Itoh et al. | Oct 2010 | A1 |
20100279151 | Sakamoto et al. | Nov 2010 | A1 |
20100300884 | Homola et al. | Dec 2010 | A1 |
20100304186 | Shimokawa | Dec 2010 | A1 |
20110001423 | Natori et al. | Jan 2011 | A1 |
20110097603 | Onoue | Apr 2011 | A1 |
20110097604 | Onoue | Apr 2011 | A1 |
20110171495 | Tachibana et al. | Jul 2011 | A1 |
20110206947 | Tachibana et al. | Aug 2011 | A1 |
20110212346 | Onoue et al. | Sep 2011 | A1 |
20110223446 | Onoue et al. | Sep 2011 | A1 |
20110244119 | Umezawa et al. | Oct 2011 | A1 |
20110299194 | Aniya et al. | Dec 2011 | A1 |
20110311841 | Saito et al. | Dec 2011 | A1 |
20120069466 | Okamoto et al. | Mar 2012 | A1 |
20120070692 | Sato et al. | Mar 2012 | A1 |
20120077060 | Ozawa | Mar 2012 | A1 |
20120127599 | Shimokawa et al. | May 2012 | A1 |
20120127601 | Suzuki et al. | May 2012 | A1 |
20120129009 | Sato et al. | May 2012 | A1 |
20120140359 | Tachibana | Jun 2012 | A1 |
20120141833 | Umezawa et al. | Jun 2012 | A1 |
20120141835 | Sakamoto | Jun 2012 | A1 |
20120148875 | Hamakubo et al. | Jun 2012 | A1 |
20120156523 | Seki et al. | Jun 2012 | A1 |
20120164488 | Shin et al. | Jun 2012 | A1 |
20120170152 | Sonobe et al. | Jul 2012 | A1 |
20120171369 | Koike et al. | Jul 2012 | A1 |
20120175243 | Fukuura et al. | Jul 2012 | A1 |
20120189872 | Umezawa et al. | Jul 2012 | A1 |
20120196049 | Azuma et al. | Aug 2012 | A1 |
20120207919 | Sakamoto et al. | Aug 2012 | A1 |
20120225217 | Itoh et al. | Sep 2012 | A1 |
20120251842 | Yuan et al. | Oct 2012 | A1 |
20120251846 | Desai et al. | Oct 2012 | A1 |
20120276417 | Shimokawa et al. | Nov 2012 | A1 |
20120308722 | Suzuki et al. | Dec 2012 | A1 |
20130040167 | Alagarsamy et al. | Feb 2013 | A1 |
20130071694 | Srinivasan et al. | Mar 2013 | A1 |
20130165029 | Sun et al. | Jun 2013 | A1 |
20130175252 | Bourez | Jul 2013 | A1 |
20130216865 | Yasumori et al. | Aug 2013 | A1 |
20130230647 | Onoue et al. | Sep 2013 | A1 |
20130314815 | Yuan et al. | Nov 2013 | A1 |
20140011054 | Suzuki | Jan 2014 | A1 |
20140044992 | Onoue | Feb 2014 | A1 |
20140050843 | Yi et al. | Feb 2014 | A1 |
Number | Date | Country |
---|---|---|
2008062772 | May 2008 | WO |
2009101983 | Aug 2009 | WO |
Entry |
---|
Myasoedov, V.E., et al. “Manufacture of silicate enamel coatings by pulsed electrodeposition” Glass and Ceramics, vol. 51, Nos. 3-4, 1994. |
Wang, et al. (Oct. 2001). “Atomic Layer Deposition”, Abstract, Solid-State and Intergrated-Circuit Technology, vol. 1, pp. 364. |
Kikitsu, et al. (Sep. 2007). “Recent Progress of Patterned Media”, IEEE Transactions on Magnetics, 43(9) 3685-3688. |
Andrew M. Homola et al., U.S. Appl. No. 12/882,888, filed Sep. 15, 2010, 17 pages. |
Andrew M. Homola, et al., U.S. Appl. No. 12/472,288, filed May 26, 2009, 14 pages. |
Office Action dated Feb. 28, 2012 from U.S. Appl. No. 12/472,288, 18 pages. |
Final Office Action dated Jul. 13, 2012 from U.S. Appl. No. 12/472,288, 13 pages. |
Number | Date | Country | |
---|---|---|---|
Parent | 12472288 | May 2009 | US |
Child | 13740010 | US |