Claims
- 1. Electrochemical measuring probe for determining the oxygen content of gases comprising: a solid-electrolyte body having at least one cermet electrode on the side of the solid-electrolyte body exposed to the gas to be measured with said at least one electrode having a supporting matrix composed of a finely divided ion-conducting ceramic material, a porous ceramic protective layer on the cermet electrode exposed to the gas to be measured, and a finely porous ion-conducting covering layer disposed between and directly adherent to the cermet electrode and the porous ceramic protective layer; and wherein the finely porous ion-conducting covering layer is comprised predominately of the same ion-conducting supporting matrix material as that of the cermet electrode exposed to the gas to be measured, with the porosity of said covering layer being substantially the same as that of said cermet electrode, with said covering layer being at least 1/2, and not greater than 3 times, as thick as said at least one cermet electrode, and with the pore diameters in said covering layer being not larger than the layer thickness of said covering layer.
- 2. Measuring probe according to claim 1, wherein the finely porous covering layer comprises at least 80% by volume of the same ion-conducting supporting matrix material as said at least one cermet electrode.
- 3. A measuring probe according to claim 2, wherein said finely porous ion-conducting supporting material of said covering layer has no sintering activity.
- 4. Measuring probe according to claim 1 wherein the supporting matrix material of said covering is comprised of stabilized zirconium dioxide.
- 5. A measuring probe according to claim 4, wherein said finely porous ion-conducting supporting material of said covering layer has no sintering activity.
- 6. Measuring probe according to claim 1, wherein the supporting matrix material of said covering is comprised of completely stabilized zirconium dioxide.
- 7. A measuring probe according to claim 6, wherein said finely porous ion-conducting supporting material of said covering layer has no sintering activity.
- 8. A measuring probe according to claim 1, wherein said finely porous ion-conducting supporting material of said covering layer has no sintering activity.
Priority Claims (1)
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Date |
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Kind |
39 34 586.6 |
Oct 1989 |
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Parent Case Info
This application is a Continuation, of application Ser. No. 07/842,378, filed as PCT/DE90/00746, Sep. 29, 1990.
US Referenced Citations (8)
Continuations (1)
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842378 |
Mar 1992 |
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