Electron gun in cathode-ray tube

Information

  • Patent Application
  • 20020047672
  • Publication Number
    20020047672
  • Date Filed
    August 17, 2001
    23 years ago
  • Date Published
    April 25, 2002
    22 years ago
Abstract
An electron gun according to the present invention is provided with a grid having a beam aperture with a small diameter. In addition, the electron gun of the present invention is such that a second grid thereof is comprised of a plurality of grid plates each having the beam aperture. The electron gun of the present invention is such that a required grid comprising the electron gun is comprised of the grid plates each having the beam apertures. At least one grid plate among the plurality of grid plates has a beam aperture with an aperture diameter of less than 80% or less of an overall pseudo plate thickness. When compared with the case of comprising the grid with one sheet of metal, it becomes possible to provide a beam aperture with a small diameter.
Description


BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention


[0002] The present invention relates to an electron gun used in a cathode-ray tube.


[0003] 2. Description of the Related Art


[0004]
FIG. 1 shows one example of grid arrangement of an electron gun. This electron gun 1 is comprised of three cathodes K (KR, KG, KB) arranged in an inline fashion, and a plurality of grid electrodes arranged to be in common with each of the cathodes KR, KG, KB. The three cathodes K (KR, KG, KB) are used for displaying red, green and blue, respectively. These grid electrodes include a first grid G1, a second grid G2, a third A grid G3A, a third B grid G3B, a fourth grid G4, a fifth A grid G5A, a fifth B grid G5B, an intermediate grid GM, and a sixth grid G6. A shield cup G7 is integrally provided on the end of the sixth grid G6.


[0005] A lead wire 3 is connected to the first grid G1. A lead wire 4 is connected to the second grid G2 and the fourth grid G4. Namely, the second grid G2 and the fourth grid G4 are electrically connected to each other. A lead wire 6 is connected to the third A grid G3A and the fifth B grid G5B. Namely, the third A grid G3A and the fifth B grid G5B are electrically connected to each other. In addition, a lead wire 5 is connected to the third B grid G3B and the fifth A grid G5A. Namely the third B grid G3B and the fifth A grid G5A are electrically connected to each other.


[0006] A predetermined voltage is respectively applied to the grids G1, G2, G3, G4 and G5. through each lead wire. In other words, a predetermined low voltage is applied to the first grid G1. In addition, a predetermined low voltage is applied to the second grid G2 and the fourth grid G4. A predetermined focus voltage Fc is applied to the third B grid G3B and the fifth A grid G5A. A dynamic focus voltage Fv is applied to the third A grid G3A and the fifth B grid G5B. An anode voltage VH is applied to the sixth grid G6 and the shield cup G7. The anode voltage VH is applied to the sixth grid G6 and the shield cup G7. Further, the voltage VM is applied to the intermediate grid GM. The voltage VM has an intermediate voltage between the anode voltage VH and the focus voltage Fv. In FIG. 1 the voltage VH is obtained by dividing the anode voltage VH through an internal resistance board 7.


[0007] The shield cup G7 is formed in a cylindrical shape. Three beam apertures which correspond to each of the three cathodes K (KR, KG, KB) are formed in the first grid G1, the second grid G2, the third A grid G3A, the third B grid G3B, the fourth grid G4, the fifth A grid G5A, the fifth B grid G5B and the sixth grid G6.


[0008] The triple-pole portion 8 of the electron gun 1 is formed of the cathode K (KR, KG, KB), a second grid G2 that draws the electron beam from the cathode K, and a first grid G1 that enters between the cathode K and the second grid G2 to thereby restrict the electron beam by an electric field therebetween.


[0009] Normally, the material used for the grid assembly that comprises the electron gun is a metal. The grid assembly is manufactured by means of a press process technique. For example, because a beam aperture is formed in a metal plate by a punch process, it can be formed with good accuracy.


[0010] Recently, however, requests to reduce the electron beam spot diameter on fluorescent surfaces even further have been increasing following the higher precision of color cathode-ray tubes used for, for example, displays. Consequently, in the three-pole portion of the electron gun even more reductions have been requested in the beam aperture diameters of the grids. concretely, there is a growing demand that the beam apertures of the first grid G1 and the second grid G2 be reduced. This made it necessary to form beam apertures with smaller diameters without using thick plates for the metal plates.


[0011] For the diameters of conventional beam apertures, however, aperture diameters that occupied approximately 80% of the metal plate were limits. That was because there was a need to maintain the durability of the punch die.


[0012] In other words, as shown in FIG. 2, a beam aperture 14 is formed in the metal plate 11 using round or elliptical punch die (12, 13). Hereupon, the plate thickness T1 of the beam aperture portion and the aperture diameter ΦD of the beam aperture 14 are decisive factors in determining the basic characteristics of an electron gun as well as extremely important dimensions. In current punch process technology, however, aperture diameters that occupy 80% or less of the metal plate thickness T1 have not been realized from the perspective of durability of the punch die (12, 13).


[0013] Because of this, conventional beam apertures formed in grids of electron guns did not have much degree of freedom in the design because the beam diameter ΦD had the relationship ΦD≧0.8T1 for the thickness T1.


[0014] If the plate thickness T1 is made thinner, the aperture diameter can proportionately-be reduced in size. But electric fields permeate particularly the second grid G2 from the first grid G1 and the third grid G3. For this reason the thickness T1 of the beam aperture of the second grid G2 is in need of a required thickness according to the demand of the characteristics. Therefore, there were also limits on the plate thickness being made thinner.


[0015] Furthermore, as shown in FIG. 3, there is a case in which coining 15 is applied to the beam apertures corresponding to the red, green and blue of the second grid G2. A thickness T0 in FIG. 3 is a plate thickness of the coining portion. The coining 15 is applied to the second grid G2 in order to form an astigmatic electric field lens or the like. For the degree of freedom in the design of the grid to improve, it is desirable that separate voltages be applied to the beam aperture 14 portion and the coining 15 portion. However, in the structure shown in FIG. 3, it is impossible to apply separate voltages to the beam aperture 14 portion and the coining 15 portion.



SUMMARY OF THE INVENTION

[0016] The present invention is an electron gun for a cathode-ray tube comprised of a plurality of grids and of the grids a required grid is comprised of a plurality grid plates each having an beam aperture. At least one grid plate among the plurality of grid plates has a beam aperture with an aperture diameter of 80% or less of a pseudo plate thickness formed of the plurality of grid plates.


[0017] The electron gun according to the present invention is such that a required grid constituting the electron gun is comprised of the plurality of grid plates. Therefore, since it is possible to make the thickness of each grid plate thinner, it becomes possible to form the beam aperture with a small diameter as well as make a pseudo plate thickness of the grid necessary for the characteristics thereof. Since it becomes possible to form the beam aperture with a small diameter, formation of a plurality of beam apertures corresponding to each cathode becomes possible, thereby increasing the degree of freedom in the design of the electron gun. In addition, since the required grid is comprised of the plurality of grid plates, it becomes possible that an electric potential difference is held within the grid and a dynamic electric potential is applied to the grid plates making it possible to change the shape of the beam apertures in the grid plates. Namely, since it becomes possible to form an astigmatic electric field lens, to control the path of the electron beam and so on, the degree of freedom in the design of the electron gun is increased. Consequently, by means of providing the electron gun of the present invention it becomes possible to offer a cathode-ray tube of high performance.


[0018] Moreover, the electron gun according to the present invention is such that the second grid thereof is comprised of a plurality of grid plates.


[0019] The electron gun of the present invention is such that the second grid thereof is comprised of the plurality of grid plates. Therefore, since the thickness of each grid can be made smaller, it becomes possible to form the beam aperture with a small diameter.


[0020] From the standpoint of the characteristics of the electron gun, the second grid needs to have a predetermined thickness. According to the present invention, the thickness of the second grid becomes an overall pseudo plate thickness formed of a plurality of grid plates. Consequently, it becomes possible to secure a required plate thickness necessary for the characteristics of the electron gun. In the second grid it becomes possible to form a beam aperture with an aperture diameter which is smaller than the press process limit with respect to the overall pseudo plate thickness, that is, 80% or less of the required thickness. Consequently, for the electron gun it becomes possible to realize a three-pole portion having a beam aperture with a small diameter, which has been unable to realize.


[0021] According to the present invention, since it becomes possible to form a beam aperture with a small diameter in the second grid, formation of a plurality of beam apertures corresponding to each cathode becomes easier, thereby increasing the degree of freedom in the design of the electron gun.


[0022] In addition, since the required grid is comprised of a plurality of grid plates, it becomes possible that an electric potential difference is held within the grid and a dynamic electric potential is applied to the grid plates making it possible to change the shape of the beam apertures in the grid plates. Namely, since it becomes possible to form an astigmatic electric field lens, and to control the path of the electron beam and so on, the degree of freedom in the design of the electron gun is increased.


[0023] Consequently, by means of providing the electron gun of the present invention it becomes possible to offer a cathode-ray tube of high performance.


[0024] The present invention is suitable for being applied to, for example, the second grid and can realize a three-pole portion having a very small beam aperture which has conventionally been unable to be realized due to the limit on the plate thickness.







BRIEF DESCRIPTION OF THE DRAWINGS

[0025]
FIG. 1 is a diagram showing one example of the configuration of a conventional electron gun as well as explaining a layout and electrical connections of each grid;


[0026]
FIG. 2 is a diagram showing the method of how to make an aperture in a metal plate using a punch die as the method of forming a beam aperture;


[0027]
FIG. 3 is a diagram explaining an example of the structure in the vicinity of a beam aperture of a second grid comprised of one sheet of metal as well as explaining the structure in which a coining process is applied in the vicinity thereof;


[0028]
FIG. 4 is a diagram showing one embodiment of an electron gun according to the present invention as well as explaining the layout and electrical connections of a grid when a second grid is comprised of a plurality of grid plates;


[0029]
FIG. 5 is a diagram showing a cross-sectional view of an essential portion in the vicinity of a beam aperture as one example of a second grid according to the present invention as well as the state in which the second grid is comprised of two grid plates and beam apertures are provided in the grids, respectively;


[0030]
FIG. 6 is a diagram showing a cross-sectional view of an essential portion in the vicinity of a beam aperture as an another example of a second grid according to the present invention as well as the state in which the second grid is comprised of two sheets of grids and beam apertures with different diameters are provided in the grids, respectively;


[0031]
FIG. 7A is a diagram showing a further another example of the shape of a beam aperture used in the second grid according to the present invention, wherein a grid aperture of a grid plate G2A is made laterally long in shape in the horizontal, that is, left and right direction of FIG. 4 and an aperture of a grid plate G2B is made circular in shape;


[0032]
FIG. 7B is a diagram showing a still further another example of the shape of a beam aperture used in the second grid according to the present invention, wherein a grid aperture of the grid plate G2A is longitudinally long in shape in the vertical, that is, vertical direction with respect to the paper surface of FIG. 4 and the aperture of the grid plate G2B is made circular in shape;


[0033]
FIG. 7D is a diagram showing a still further another example of the shape of a beam aperture used in the second grid according to the present invention, wherein the beam aperture of the grid plate G2A is made the shape of a large circle and the beam aperture of the grid plate G2B is made the shape of a small circle;


[0034]
FIG. 8 is a diagram showing a cross-sectional view of an essential portion in the vicinity of a beam aperture as a further another example of the second grid according to the present invention, wherein the second grid is comprised of three sheets of grid plates and beam apertures are provided in the grid plates, respectively;


[0035]
FIG. 9 is a diagram showing a cross-sectional view of an essential portion in the vicinity of a beam aperture of a conventional second grid in order to compare with the present invention;


[0036]
FIG. 10 is a diagram showing a cross-sectional view of an essential portion in the vicinity of a second grid to be explained in an embodiment 1; and


[0037]
FIG. 11 is a diagram showing a cross-sectional view of an essential portion in the vicinity of a second grid to be explained in an embodiment 2.







DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0038] In the following embodiments of the present invention will be described while referring to the drawings.


[0039]
FIG. 4 shows an embodiment of the electron gun of the present invention. The electron gun shows an electron gun as applied to an inline electron gun as previously described. The electron gun 21 is comprised of three cathodes K (KR, KG, KB) arranged in an inline fashion, and a plurality of grid electrodes arranged to be in common with each of the cathodes KR, KG, KB. The three cathodes K (KR, KG, KB) are used for displaying red, green and blue, respectively. These plurality of grids are, for example, a first grid G1, a second grid G2 (described later), a third A grid G3A, a third B grid G3B, a fourth grid G4, a fifth A grid G5A, a fifth B grid G5B, an intermediate grid GM, and a sixth grid G6. A cylindrical shield cup G7 is integrally provided on the end of the sixth grid G6.


[0040] Three beam apertures which correspond to the three cathodes K (KR, KG, KB) are formed in each of the first grid G1, the second grid G2, the third A grid G3A, the third B grid G3B, the fourth grid G4, the fifth A grid G5A, the fifth B grid G5B. the intermediate grid GM and the sixth grid G6. Each of these grids G1˜G6 and the shield cup G7 are maintained at required distance and secured by a pair of bead glass.


[0041] A lead wire 23 is connected to the first grid G1. Connections of the second grid G2 and the fourth grid G4 will be described later. A lead wire 27 is connected to the third B grid G3B and the fifth A grid G5A. That is, the third B grid G3B and the fifth A grid G5A are connected to each other. A lead wire 28 is connected to the third A grid G3A and the fifth B grid G5B. That is, the third A grid G3A and the fifth B grid G5B are connected to each other.


[0042] A predetermined voltage is applied to each grid G1, G2, G3, G3A, G3B, G4, G5A and G5B through each lead wire. That is, a predetermined low voltage is applied to the first grid G1. A predetermined low voltage is applied to the second grid G2, which will be described later. In addition, a predetermined low voltage is applied to the fourth grid G4, which is to be described later on. A predetermined focus voltage FC is applied to the third B grid G3B and the fifth A grid G5A. A dynamic focus voltage Fv is applied to the third A grid G3A and the fifth B grid G5B. An anode voltage VH is applied to the sixth grid G6 and the shield cup G7. A voltage VM is applied to the intermediate grid GM. The voltage VM has an intermediate voltage between the anode voltage VH and the focus voltage Fv. The voltage VM is applied to the sixth grid G6 and the shield cup G7 through an internal resistance board 29.


[0043] In this embodiment in particular, the second grid G2 is comprised of a plurality of grid plates. In this example the second grid G2 is comprised of two grid plates G2A and G2B. The two grid plates G2A and G2B are arranged in series in the direction the electron beam progresses.


[0044] The lead wire connection and the supply of the electric potential for the two grid plates G2A and G2B that comprise the second grid G2 can be obtained in various ways depending on the design of the electron gun. In the example of FIG. 4, the lead wire 24 and the lead wire 25 are independently connected to the grid plates G2A and G2B, respectively. With these two grid plates G2A and G2B, a predetermined low voltage is applied to at least the grid plate G2A. Various kinds of voltage to be applied to the grid plate G2B can be set as described later on. For example, for cases such as when a static voltage is applied to the grid plate G2B in a like manner to the grid plate G2A, or when a static voltage is applied to the grid plate G2B in a manner different from the grid plate G2A, or when a voltage that changes dynamically (dynamic voltage) is applied to the grid plate G2B, various settings can be made as described later. Moreover, various kinds of voltages applied to the fourth grid G4 can be set. For example, for cases such as when a voltage to be applied to the fourth grid G4 is a predetermined voltage through an independent lead wire or, as shown by the dashed lines in FIG. 1, when the fourth grid G4 and the grid plate G2A are connected in common and a voltage is applied in a like manner to the grid plate G2A, various settings can be made.


[0045] As shown in, for example, FIG. 5, the two grid plates G2A and G2B that comprise the second grid G2 are made such that a coining process is used to form both of two metal plates 17, 18 (which has a required thickness) into a suitable shape. In an example shown in FIG. 5, the plate thickness Ta, Tb of the coining portions 17a, 18a of both metal plates 17, 18 are processed thinner than a desired beam aperture diameter ΦD, for example, 80% or less of the beam aperture diameter, and next, a beam aperture 19 is simultaneously or separately formed by means of a punch process. With the second grid G2, an overall pseudo plate thickness T2 (namely, the thickness between the end of the beam aperture on the first grid G1 side and the end of the beam aperture on the third A grid G3A side) that combines the two grid plates G2A and G2B forms an effective plate thickness for the second grid G2. As the result, the second grid G2 is formed having an aperture diameter Φd smaller than the press process limit with respect to the overall pseudo plate thickness. For example, 80% or less of the pseudo plate thickness T2.


[0046] The two grid plates G2A and G2B can also be integrally fused together before the electron gun is assembled. Further, the two grid plates G2A and G2B can also be independently secured by bead glass or electrically insulated and secured to another structure. A static electric potential can also be applied to these two grid plates G2A and G2B in a like manner to the conventional second grid G2. The first grid G1 is a grid for a cut-off. The third A grid G3A is a grid for forming an electrical field such as an astigmatic electric field lens and the like. Different static electric potentials can also be applied to the grid plate G2A on the first grid G1 side and to the grid plate G2B on the third A grid G3A side. In other words, different static electric potentials can be applied in order to generate an electric potential difference between the grid plates G2A and G2B. Further, not only can a static electric potential be applied to at least the grid plate G2A on the first grid G1 side but an electric potential and a dynamic electric potential as well can also be applied to the grid plate G2B on the third A grid G3A side. Even further, a dynamic electric potential can also be applied to both the grid plates G2A and G2B in order to generate an electric potential difference between both of the grid plates G2A and G2B.


[0047]
FIG. 6 shows another example of the second grid G2 comprised of the two grid plates G2A and G2B. The grid plates G2A and G2B are formed with different beam aperture diameters for respective beam apertures which correspond to red, green and blue. In other words, the beam aperture 20A with an aperture diameter Φda is formed in the grid plate G2A on the first grid G1 side and the beam aperture 20B with an aperture diameter Φdb (larger than aperture diameter Φda) is formed in the grid plate G2B on the third A grid G3A side. Other compositions are identical to FIG. 5. The aperture 20B of the grid plate G2A does not need to be round.


[0048] FIGS. 7A-7D show examples of shapes for 20A and 20B. FIG. 7A shows the beam aperture of the grid plate G2A formed in a circular shape and the beam aperture of the grid plate G2B formed in a horizontally long rectangular shape. FIG. 7B shows the beam aperture of the grid plate G2A formed in a circular shape and the beam aperture of the grid plate G2B formed in a vertically long rectangular shape. FIG. 7C shows the beam aperture of the grid plate G2A formed in a circular shape and the beam aperture of the grid plate G2B formed in a circular shape. FIG. 7D shows the beam aperture of the grid plate G2A formed in a circular shape and the beam aperture of the grid plate G2B formed in a square shape.


[0049] In this embodiment, of the two grid plates G2A and G2B the beam aperture diameter or shape of the beam aperture 20A of the grid plate G2A and the beam aperture 20B of the grid plate G2B on the third A grid G3A side is made different, for example, as shown in FIGS. 77D, thereby making it possible to form an astigmatic electrical field lens. As the result, the shape of electron beams can be altered. Provision of the beam aperture 20B of the grid plate G2A by shifting the center thereof with respect to that of the beam aperture 20B of the grid plate G2A can control the beam path. Further, of the two grid plates G2A and G2B, by applying a dynamic voltage to the grid plate G2B on the third A grid G3A side to thereby change the beam shape by forming a separate electric field such as an astigmatic electric field, the beam path can be controlled. In addition, the beam aperture of the grid plate G2A is not limited to only a circular shape but can also be, for example, a square shape. A plurality of apertures can also be provided in the grid plate G2A for a cathode. For this case, the orientation of the plurality of apertures is not limited to a particular direction. For example, the plurality of apertures can be arranged lined up in the horizontal, that is, the orientation direction of the three cathodes with respect to one cathode. A plurality of beam apertures can also be arranged in the vertical direction or in the horizontal as well as vertical direction with respect to one cathode. Even further, they can be radially arranged with respect to one cathode.


[0050]
FIG. 8 shows another example of the second grid G2 related to this embodiment. This second grid G2 is comprised of three grid plates G2A, G2B and G2C. The aperture diameters and shapes of beam apertures 31, 32 and 33 formed in each of these grid plates G2A, G2B and G2C can be formed identically or differently. In the example in this figure, the beam apertures 31, 32 with identical aperture diameters Φdc are formed in the two grid plates G2A and G2B on the first grid G1 side. The beam aperture 33 with an aperture diameter Φdd larger than the beam apertures 31, 32 is formed in the grid plate G2C on the third A grid G3A side. The shapes of the beam apertures 31, 32 and the shape of the beam aperture 33 can have the relationship shown in, for example, FIGS. 77D. In the example in this figure, the diameter of the beam apertures 31, 32 can be formed at 80% or less of the pseudo plate thickness Tc formed of the two grid plates G2A and G2B. Thickness T3 is an overall pseudo thickness of the three grid plates G2A, G2B and G2C.


[0051] As for the electric potential to be applied, identical static electric potentials can be applied to the three grid plates G2A, G2B and G2C. For an electric potential difference to be generated between arbitrary two among the three grid plates G2A, G2B and G2C, different static electric potentials or a dynamic electric potential can also be applied to the grid plates. A static electric potential can be applied to the grid plate G2A on the first grid G1 side and then a dynamic electric potential may be applied to any of the remaining grid plates. For example, a static electric potential can be applied to the grid plates G2A and G2B and a dynamic electric potential can be applied to the grid plate G2C. In addition, a static electric potential can be applied to the grid plate G2A and a dynamic electric potential can be applied to the grid plates G2B and G2C.


[0052] An astigmatic electric field or the beam path can be controlled in a like manner to the example above by means of selecting the beam aperture shape or shapes of the three grid plates G2A, G2B and G2C and the grid plate or plates where a dynamic electric potential or potentials will be applied.


[0053] By means of providing the electron gun described above in this embodiment, color cathode-ray tubes used in display devices such as, for example, color displays can be constituted.


[0054] According to the embodiment described above, by means of constituting the second grid G2 with a plurality of grid plates, it is possible to obtain a second grid G2 with a smaller beam aperture compared to when a second grid G2 is formed of a single metal plate. An aperture diameter smaller than the press process limit with respect to the effective thickness for the second grid G2, or what is called the pseudo thickness, for example, a diameter of 80% or less of the pseudo thickness can be formed. Consequently, a triple-pole structural portion could be achieved that has very small beam apertures which had conventionally been unable to be achieved due to restrictions on the plate thickness. In addition, Because of these characteristics, a second grid G2 having very small beam apertures can be constituted through the use of a required and sufficient, namely, optimum plate thickness. Further, a plurality of beam apertures can be provided for each cathode.


[0055] Since the second grid G2 can be comprised of a plurality of grid plates, for example, two, three or more grid plates, not only a single electric potential can be applied to these grid plates but a separate electric potential or a dynamic voltage can also be applied to each grid plate. Consequently, a cathode-ray tube with even higher performance can be provided through the use of the electron gun of this embodiment. Furthermore, the beam apertures of the grid plates G2A and G2B are not limited to only a circular shape but can also be, for example, a square shape. Even further, although a description about the beam apertures of the grid plates G2A, G2B and G2C arranged on the same axis was provided, the arrangement is not limited to the same axis. For example, these beam apertures can be arranged eccentrically. By means of arranging the beam apertures eccentrically, the electric field will be asymmetric. Therefore, the path of the electron beam can be bent in response to the amount of the eccentricity. In addition, a plurality of apertures can also be provided for the grid plates G2A and G2B. For this case, the orientation of the plurality of apertures is not limited to a particular direction. For example, the plurality of apertures can be arranged in the horizontal direction, namely, in the direction the three cathodes are arranged. Further, they can also be arranged in the vertical direction or the horizontal direction. Even further, they can be arranged radially as well.


[0056] Using a plurality of grid plates as described above is not limited to the second grid G2 but can also be applied to other grids comprising an electron gun. A single electric potential, separate electric potentials or a dynamic voltage can be applied to these grids. In addition, the present invention is not limited to the electron gun shown in FIG. 4 but can also be applied to electron guns which utilize other formats.


[0057] According to the present invention, a plurality of beam apertures can be provided for each cathode. Therefore, the present invention is suitably applied to a cathode-ray tube which displays a monochromatic image by using a plurality of electron beams, that is, multi-beam cathode-ray tube. Further, by means of making eccentric respective beam apertures for the plurality of grid plates comprising the second grid G2, the curvature of the path of the electron beam can be adjusted. Consequently, the present invention is also suited for use in electron guns used for multi-beam format cathode-ray tubes which require a plurality of electron beams for each color to be converged on a fluorescent surface.


[0058] [Embodiments]


[0059] <Embodiment 1>


[0060]
FIG. 9 shows a structure of the conventional second grid G2 in order to compare with the present invention. For this second grid G2, a metal plate 41 with a plate thickness To of 0.4 mm undergoes a coining process to obtain a plate thickness T1 of 0.2 mm at the coining portion. Thereafter, an beam aperture 42 with an aperture diameter ΦD of 0.16 mm is formed at the coining portion 41a. This aperture diameter is the punch process limit, that is, 80% of the plate thickness.


[0061]
FIG. 10 shows an embodiment of a second grid G2 related to the present invention. For the second grid G2 of this example, a metal plate 44 with a plate thickness To of 0.4 mm undergoes a coining process to obtain a plate thickness t2 of 0.05 mm at the coining portion. Thereafter, a beam aperture 45 with an aperture diameter Φd of 0.04 mm is formed at a coining portion 44a of the grid plate. This aperture diameter is the punch process limit, that is, 80% of the plate thickness. The second grid G2 of this embodiment is comprised of above processed two grid plates G2A and G2B being arranged at an interval d1 of 0.1 mm. The beam aperture diameter Φd (0.04 mm) is 20% of the coining portion pseudo plate thickness T2 (0.2 mm). According to this embodiment, it is possible to obtain a second grid G2 that has an effective plate thickness T2 identical to the conventional plate thickness T1 (t2+t2+d1=T1) and a very small beam aperture 45 with an aperture diameter of 80% or less with respect to the plate thickness.


[0062] <Embodiment 2>


[0063]
FIG. 11 shows another embodiment of the second grid G2 according to the present invention. The grid plate G2 according to this embodiment is such that a metal plate 44 with a plate thickness T0 of 0.4 mm undergoes a coining process to obtain a plate thickness t2 of 0.05 mm at the coining portion. Thereafter, a beam aperture 45 with an aperture diameter Φd of 0.04 mm is formed in the coining portion. This aperture diameter is the punch process limit, that is, 80% of the plate thickness. The grid plate G2 is comprised of above processed two grid plates G2A and G2B being arranged at an interval of 0.05 mm. The beam aperture diameter (0.04 mm) is 8% of the coining portion pseudo plate thickness T3 (0.5 mm). According to the second grid G2 of this embodiment example, a pseudo plate thickness T3 having a very small beam aperture can be made thicker as well.


[0064] Having described preferred embodiments of the present invention with reference to the accompanying drawings, it is to be understood that the present invention is not limited to the above-mentioned embodiments and that various changes and modifications can be effected therein by one skilled in the art without departing from the spirit or scope of the present invention as defined in the appended claims.


Claims
  • 1. An electron gun being comprised of a plurality of grids, wherein a required grid among said grids is formed of a plurality of grid plates each having a beam aperture and at least one grid plate among said plurality of grid plates has an aperture diameter of less than 80% with respect to an overall pseudo plate thickness formed of said plurality of grid plates.
  • 2. An electron gun as set forth in claim 1, wherein an identical static electric potential is applied to said plurality of grid plates.
  • 3. An electron gun as set forth in claim 1, wherein a different static electric potential is applied to said plurality of grid plates in order to generate an electric potential difference between arbitrary grid plates.
  • 4. An electron gun as set forth in claim 1, wherein a static electric potential and a dynamic electric potential are selectively applied to said plurality of grid plates of said grid.
  • 5. An electron gun as set forth in claim 1, wherein a dynamic electric potential is applied to said plurality of grid plates.
  • 6. An electron gun as set forth in claim 1, wherein beam apertures formed in the plurality of grid plates have identical shapes or different shapes.
  • 7. An electron gun for a cathode-ray tube, being comprised of a plurality of grids, wherein a second grid is formed of a plurality of grid plates each having a beam aperture.
  • 8. An electron gun as set forth in claim 7, wherein at least one grid plate among said plurality of grid plates has an aperture diameter of 80% or less of the press process limit with respect to an overall pseudo plate thickness formed of said plurality of grid plates.
  • 9. An electron gun as set forth in claim 7, wherein an identical static electric potential is applied to the plurality of grid plates of said second grid.
  • 10. An electron gun as set forth in claim 7, wherein different static electric potentials are applied to the plurality of grid plates of said second grid in order to generate an electric potential difference among arbitrary grid plates.
  • 11. An electron gun as set forth in claim 7, wherein a static electric potential is applied to an grid plate on a first grid side among the plurality of grid plates of said second grid and a dynamic electric potential is applied to any of the remaining grid plates.
  • 12. An electron gun as set forth in claim 7, wherein a dynamic electric potential is applied to the plurality of grid plates of said second grid.
  • 13. An electron gun as set forth in claim 7, wherein beam apertures formed in the plurality of grid plates of said second grid have identical shapes or different shapes.
Priority Claims (1)
Number Date Country Kind
P2000-251237 Aug 2000 JP