Electron microscope

Information

  • Patent Grant
  • D644258
  • Patent Number
    D644,258
  • Date Filed
    Thursday, July 29, 2010
    14 years ago
  • Date Issued
    Tuesday, August 30, 2011
    13 years ago
  • US Classifications
    Field of Search
    • US
    • D16 131
    • D16 130
    • D24 186
    • D24 232
    • D24 216
    • D10 81
    • 250 307000
    • 250 310000
    • 250 311000
    • 250 397000
    • 250 440110
    • 359 383000
    • 359 384000
    • 359 385000
    • 359 389000
    • 359 390000
    • 359 368000
    • 359 370000
    • 359 371000
    • 359 372000
    • 359 363000
    • 359 388000
  • International Classifications
    • 1606
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a top plan view thereof;



FIG. 5 is a bottom plan view thereof;



FIG. 6 is a left side elevational view thereof; and,



FIG. 7 is a right side elevational view thereof.


The broken lines shown are for illustrative purposes only and form no part of the claimed design.


Claims
  • We claim the ornamental design for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2010-004042 Feb 2010 JP national
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Foreign Referenced Citations (2)
Number Date Country
D973373-2 Feb 1997 JP
D1233767 Mar 2005 JP