Electron microscope

Information

  • Patent Grant
  • D625749
  • Patent Number
    D625,749
  • Date Filed
    Tuesday, June 30, 2009
    15 years ago
  • Date Issued
    Tuesday, October 19, 2010
    14 years ago
  • US Classifications
    Field of Search
    • US
    • D16 130
    • D16 131
    • D16 221
    • D16 234
    • D24 186
    • D24 232
    • D24 216
    • D10 81
    • D13 184
    • 250 311000
    • 359 383000
    • 359 384000
    • 359 385000
    • 359 389000
    • 359 390000
    • 359 368000
    • 359 370000
    • 359 371000
    • 359 372000
    • 359 363000
  • International Classifications
    • 1606
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front, top and right side perspective view of electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a left side elevational view thereof;



FIG. 5 is a right side elevational view thereof;



FIG. 6 is a top plan view thereof; and,



FIG. 7 is a bottom plan view thereof.


The broken lines form no part of the claimed design.


Claims
  • We claim the ornamental design for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2009-006242 Mar 2009 JP national
US Referenced Citations (13)
Number Name Date Kind
D141832 Holley Jul 1945 S
D172780 Briskin et al. Aug 1954 S
D182698 Wells Apr 1958 S
3551019 Michel Dec 1970 A
D225580 Reinecke Dec 1972 S
D299861 Hunsdale et al. Feb 1989 S
4812029 Onanhian Mar 1989 A
D332616 Hashimoto et al. Jan 1993 S
D491272 Alden et al. Jun 2004 S
D527464 Ina et al. Aug 2006 S
D574280 Wakamatsu et al. Aug 2008 S
D591864 Schmidt May 2009 S
D607569 Yukikado et al. Jan 2010 S
Foreign Referenced Citations (1)
Number Date Country
D11233735 Mar 2005 JP