Electron microscope

Information

  • Patent Grant
  • D626579
  • Patent Number
    D626,579
  • Date Filed
    Tuesday, March 2, 2010
    14 years ago
  • Date Issued
    Tuesday, November 2, 2010
    14 years ago
  • US Classifications
    Field of Search
    • US
    • D16 130
    • D16 131
    • D16 221
    • D16 234
    • D24 186
    • D24 232
    • D24 216
    • D07 390
    • D10 81
    • D13 184
    • 250 311000
    • 359 383000
    • 359 384000
    • 359 385000
    • 359 389000
    • 359 390000
    • 359 368000
    • 359 370000
    • 359 371000
    • 359 372000
  • International Classifications
    • 1606
    • Term of Grant
      14Years
Abstract
Description


FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a left side elevational view thereof;



FIG. 5 is a right side elevational view thereof;



FIG. 6 is a top plan view thereof; and,



FIG. 7 is a bottom plan view thereof.


The broken lines form no part of the claimed design.


Claims
  • We claim the ornamental design for an electron microscope, as shown and described.
Priority Claims (1)
Number Date Country Kind
2009-022637 Sep 2009 JP national
US Referenced Citations (22)
Number Name Date Kind
D141832 Holley Apr 1945 S
2424791 Bachman et al Jul 1947 A
D172780 Briskin et al. Aug 1954 S
D173282 Pike Oct 1954 S
D182583 Goldberg Apr 1958 S
D182698 Wells Apr 1958 S
3202047 Lawler Aug 1965 A
3551019 Kurt Dec 1970 A
D223669 Nishino May 1972 S
D225580 Reinecke Dec 1972 S
4210384 Meyer et al. Jul 1980 A
D299861 Hunsdale et al. Feb 1989 S
4812029 Onanhian Mar 1989 A
D303267 Takahashi et al. Sep 1989 S
D332616 Hashimoto et al. Jan 1993 S
D491272 Alden et al. Jun 2004 S
D516121 Suzuki et al. Feb 2006 S
D527464 Ina et al. Aug 2006 S
7321462 Yamamoto Jan 2008 B2
D574280 Wakamatsu et al. Aug 2008 S
D591864 Schmidt May 2009 S
D607569 Yukikado et al. Jan 2010 S