Patent Application
20230204654
The disclosure relates to an electronic apparatus and a control method thereof More particularly, the disclosure relates to an electronic apparatus for identifying a defect of a touch panel and a method for controlling thereof.
There are various types of touch panels, but capacitive touch panels are most actively used. The capacitive touch panel recognizes a touch based on a change in an electric field existing between two electrodes, and the two electrodes may be implemented in a form of a sheet.
The above information is presented as background information only to assist with an understanding of the disclosure. No determination has been made, and no assertion is made, as to whether any of the above might be applicable as prior art with regard to the disclosure.
There have been various attempts to identify a defect of an electrode sheet, but the existing defect identification method identifies the defect after assembling by bonding a transmission (TX) electrode sheet and a reception (RX) electrode sheet is finished, and thus there was a limitation that it is impossible to reuse the electrode sheet identified to be defective, and additional work by a user was required because a location where the defect exists was unknown.
Therefore, there is a need for a technology capable of identifying a defect and acquiring a location where the defect exists even before assembling by bonding the electrode sheets constituting a touch panel.
Aspects of the disclosure are to address at least the above-mentioned problems and/or disadvantages and to provide at least the advantages described below. Accordingly, an aspect of the disclosure is to identify whether a defect exists in a transparent electrode sheet constituting a touch panel based on a signal received from an external device.
Additional aspects will be set forth in part in the description which follows and, in part, will be apparent from the description, or may be learned by practice of the presented embodiments.
In accordance with an aspect of the disclosure, an electronic apparatus is provided. The electronic apparatus includes a communication interface configured to communicate with an external device, a memory, and a processor, wherein the processor is configured to transmit a control signal requesting the external device to apply a first signal to a transparent electrode sheet connected to the external device, to the external device, receive, from the external device, a first point at which the first signal is applied to the transparent electrode sheet, a second point at which a second signal that is a response signal to the first signal is acquired by the external device, and a waveform of the second signal, and identify whether a defect exists in the transparent electrode sheet based on a difference between the first point and the second point, and the waveform of the second signal.
The processor may, based on the difference between the first point and the second point being outside a predetermined time range, identify that a defect exists in the transparent electrode sheet.
The processor may, based on a voltage magnitude of the second signal being outside a predetermined voltage range, identify that a defect exists in the transparent electrode sheet.
The processor may, based on the difference between the first point and the second point being less than a predetermined time and the voltage magnitude of the second signal being less than a predetermined value, identify that at least some of a plurality of lines included in the transparent electrode sheet are shorted to each other or at least some of the plurality of lines are shorted to a ground.
The processor may, based on a rise time of the second signal being greater than the predetermined time, identify that a foreign material is present in the transparent electrode sheet or a degree of compression between the transparent electrode sheet and another transparent electrode sheet is outside a predetermined range.
The processor may acquire a location of the defect existing in the transparent electrode sheet based on the difference between the first point and the second point.
The processor may acquire a similarity between the waveform of the second signal and a predetermined waveform, based on the similarity being less than the predetermined value, identify that a defect exists in the transparent electrode sheet, and based on the similarity being greater than or equal to the predetermined value, identify that there is no defect in the transparent electrode sheet.
The apparatus may further include a display, wherein the processor is configured to, based on a defect existing in the transparent electrode sheet, control the display to display information on the defect.
In accordance with another aspect of the disclosure, a method of controlling an electronic apparatus is provided. The method includes performing a communication connection with an external device, transmitting a control signal requesting the external device to apply a first signal to a transparent electrode sheet connected to the external device, to the external device, receiving, from the external device, a first point at which the first signal is applied to the transparent electrode sheet, a second point at which a second signal that is a response signal to the first signal is acquired by the external device, and a waveform of the second signal, and identifying whether a defect exists in the transparent electrode sheet based on a difference between the first point and the second point, and the waveform of the second signal.
The identifying of whether the defect exists may include, based on the difference between the first point and the second point being outside a predetermined time range, identifying that a defect exists in the transparent electrode sheet.
The identifying of whether the defect exists may include, based on a voltage magnitude of the second signal being outside a predetermined voltage range, identifying that a defect exists in the transparent electrode sheet.
The identifying of whether the defect exists may include, based on the difference between the first point and the second point being less than a predetermined time and a voltage magnitude of the second signal being less than a predetermined value, identifying that at least some of a plurality of lines included in the transparent electrode sheet are shorted to each other or at least some of the plurality of lines are shorted to a ground.
The identifying of whether the defect exists may include, based on a rise time of the second signal being greater than the predetermined time, identifying that a foreign material is present in the transparent electrode sheet or a degree of compression between the transparent electrode sheet and another transparent electrode sheet is outside a predetermined range.
The identifying of whether the defect exists may include acquiring a location of the defect existing in the transparent electrode sheet based on the difference between the first point and the second point.
The identifying of whether the defect exists may include acquiring a similarity between the waveform of the second signal and a predetermined waveform, based on the similarity being less than the predetermined value, identifying that a defect exists in the transparent electrode sheet, and based on the similarity being greater than or equal to the predetermined value, identifying that there is no defect in the transparent electrode sheet.
The method may further include, based on a defect being identified to be existed in the transparent electrode sheet, displaying information on the defect.
The technical problems of the disclosure are not limited to the technical problem described above, and the other technical problems not described will be clearly understood by those skilled in the art from the following description.
According to various embodiments of the disclosure as described above, the electronic apparatus may identify whether a defect exists in an electrode sheet even before assembling by bonding electrode sheets constituting a touch panel. Also, the electronic apparatus may acquire a location where the defect exists in the electrode sheet.
In addition, effects acquirable or predicted by embodiments of the disclosure are to be disclosed directly or implicitly in the detailed description of the embodiments of the disclosure. For example, various effects predicted according to embodiments of the disclosure will be disclosed in the detailed description to be described below.
Other aspects, advantages, and salient features of the disclosure will become apparent to those skilled in the art from the following detailed description, which, taken in conjunction with the annexed drawings, discloses various embodiments of the disclosure.
The above and other aspects, features, and advantages of certain embodiments of the disclosure will be more apparent from the following description taken in conjunction with the accompanying drawings, which:
The same reference numerals are used to represent the same elements throughout the drawings.
The following description with reference to the accompanying drawings is provided to assist in a comprehensive understanding of various embodiments of the disclosure as defined by the claims and their equivalents. It includes various specific details to assist in that understanding, but these are to be regarded as merely exemplary. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the various embodiments described herein can be made without departing from the scope and spirit of the disclosure. In addition, descriptions of well-known functions and constructions may be omitted for clarity and conciseness.
The terms and words used in the following description and claims are not limited to the bibliographical meanings, but are merely used by the inventor to enable a clear and consistent understanding of the disclosure. Accordingly, it should be apparent to those skilled in the art that the following description of various embodiments of the disclosure is provided for illustration purposes only and not for the purpose of limiting the disclosure as defined by the appended claims and their equivalents.
It is to be understood that the singular forms “a,” “an,” and “the” include plural referents unless the context clearly dictates otherwise. Thus, for example, reference to “a component surface” includes reference to one or more of such surfaces.
The terms used in example embodiments will be briefly explained, and example embodiments will be described in greater detail with reference to the accompanying drawings.
Terms used in the disclosure are selected as general terminologies currently widely used in consideration of the configuration and functions of the disclosure, but may be different depending on intention of those skilled in the art, a precedent, appearance of new technologies, or the like. Further, in specific cases, terms may be arbitrarily selected. In this case, the meaning of the terms will be described in the description of the corresponding embodiments. Accordingly, the terms used in the description should not necessarily be construed as simple names of the terms, but be defined based on meanings of the terms and overall contents of the disclosure.
The example embodiments may vary, and may be provided in different example embodiments. Various example embodiments will be described with reference to accompanying drawings. However, this does not necessarily limit the scope of the various embodiments to a specific embodiment form. Instead, modifications, equivalents and replacements included in the disclosed concept and technical scope of this specification may be employed. While describing various embodiments, if it is identified that the specific description regarding a known technology obscures the gist of the disclosure, the specific description is omitted.
The terms such as “first,” “second,” and so on may be used to describe a variety of elements, but the elements should not be limited by these terms. The terms used herein are solely intended to explain specific example embodiments, and not to limit the scope of the disclosure.
Singular forms are intended to include plural forms unless the context clearly indicates otherwise. The terms “include”, “comprise”, “is configured to,” etc., of the description are used to indicate that there are features, numbers, steps, operations, elements, parts or combination thereof, and they should not exclude the possibilities of combination or addition of one or more features, numbers, steps, operations, elements, parts or a combination thereof.
The example embodiments of the disclosure will be described in greater detail below in a manner that will be understood by one of ordinary skill in the art. However, various embodiments may be realized in a variety of different configurations, and not limited to descriptions provided herein. Also, well-known functions or constructions are not described in detail since they would obscure the disclosure with unnecessary detail.
Referring to
The external device 200 is an impedance measuring device. For example, the external device 200 may include a time domain reflectometer (TDR) device. The external device 200 may apply a first signal to the electrode sheets 340 and 360, and acquire a second signal (i.e., a response signal to the first signal) that the first signal is reflected back from the electrode sheets 340 and 360. The external device 200 may acquire information on the first signal and information on the second signal. Information on each signal may include a voltage magnitude of a signal over time, that is, a waveform of a signal. In the disclosure, the second signal may also be referred to as a response signal.
The electronic apparatus 100 may acquire information on the first signal and information on the second signal by communicating with the external device 200. The electronic apparatus 100 may identify whether a defect exists in the touch panel 300 based on the information on the first signal and the information on the second signal. Although the electronic apparatus 100 is illustrated as a personal computer (PC) in
Although not shown, the electrode sheets 340 and 360 may be disposed on a printed circuit board (PCB) and may be electrically connected to the external device 200. In addition, a MUX circuit connecting a plurality of lines included in the electrode sheets 340 and 360, and the electronic apparatus 100 may be disposed on the printed circuit board. The electronic apparatus 100 may control the MUX circuit to sequentially apply the first signal to each of the plurality of lines included in the electrode sheet.
Referring to
The communication interface 110 may include at least one communication terminal. For example, the communication interface 110 may include at least one of a universal serial bus (USB) port, a local area network (LAN) port, and a wide area network (WAN) port. The communication interface 110 may include a wired communication module and a wireless communication module. The wired communication module may include an Ethernet module. Wireless communication modules may include at least one of Bluetooth Low Energy (BLE) module, Wi-Fi communication module, cellular communication module, 3rd generation (3G) mobile communication module, 4th generation (4G) mobile communication module, 4th generation Long Term Evolution (LTE) communication module, 5th generation (5G) mobile communication module.
The display 120 may display various information under a control of the processor 140. For example, the display 120 may display information on defects present in the touch panel or the electrode sheet. The information about the defect may include a type and location of the defect. The display 120 may be implemented as a liquid crystal display panel (LCD), organic light emitting diodes (OLED), etc., and the display 120 may be implemented as a flexible display, a transparent display, or the like. However, the display 120 according to the disclosure is not limited to a specific type.
The memory 130 may store an operating system (OS) for controlling the overall operation of components of the electronic apparatus 100 and commands or data related to components of the electronic apparatus 100. The memory 130 may be implemented as a non-volatile memory (e.g., a hard disk, a solid state drive (SSD), a flash memory), a volatile memory, or the like.
The memory 130 may store a reference value for identifying the defect of the electrode sheet. For example, the memory 130 may store a predetermined time range. When a difference between a first point at which the first signal is applied to the electrode sheet and a second point at which the second signal is acquired by an external device is outside a predetermined time range (e.g., 10 ns to 12 ns), the processor 140 may identify that there is a defect in the electrode sheet. In the disclosure, the second point at which the second signal is acquired means a point at which a reflection signal corresponding to the first signal is acquired.
The memory 130 may store a predetermined voltage range. When a voltage magnitude of the second signal is outside a predetermined voltage range (e.g., 0.95V to 1.05V), the processor 140 may identify that a defect exists in the electrode sheet. The predetermined time range and the predetermined voltage range may be set by a user.
The processor 140 may be electrically connected to the memory 130 to control overall functions and operations of the electronic apparatus 100. For example, when a user command for inspecting a defect of the electrode sheet is acquired, the processor 140 may control the communication interface 110 to transmit a control signal to an external device. The control signal may be a signal requesting the external device to apply the first signal to a transparent electrode sheet connected to the external device.
The processor 140 may receive information about a first signal from an external device and information about a second signal that is a signal from which the first signal is reflected from the transparent electrode sheet. The information on the first signal may include a first point at which the first signal is applied to the transparent electrode sheet. The information on the second point may receive a second point at which the second signal is acquired by an external device, and a waveform of the second signal.
The processor 140 may identify whether a defect exists in the transparent electrode sheet based on a difference between the first point and the second point and the waveform of the second signal. For example, when the difference between the first point and the second point is outside a predetermined time range, the processor 140 may identify that a defect exists in the transparent electrode sheet. Alternatively, when a voltage magnitude of the second signal is outside a predetermined voltage range, the processor 140 may identify that a defect exists in the transparent electrode sheet.
When the difference between the first point and the second point is less than the predetermined time, and the voltage magnitude of the second signal is less than the predetermined value, the processor 140 may identify that at least some of a plurality of lines included in the transparent electrode sheet are shorted to each other or that at least some of the plurality of lines are shorted to a ground.
When a rise time of the second signal is greater than a predetermined time (e.g., 1 ns to 1.5 ns), the processor 140 may identify that a foreign material is present in the transparent electrode sheet. When a defect test is performed after the transparent electrode sheet is bonded to the other transparent electrode sheet (e.g., the upper electrode sheet 340 and the lower electrode sheet 360 of
The processor 140 may acquire a location of a defect present in the transparent electrode sheet based on the difference between the first point and the second point. The processor 140 may calculate an impedance of a line based on the difference between the first point and the second point. For example, a line of 60 ohms may correspond to 250 ps. The processor 140 may acquire a length of the line based on the calculated impedance, and may acquire the location of the defect based on the length of the line. Physical properties (e.g., resistivity, conductivity) of the line may be previously stored in the memory 130.
The processor 140 may acquire a similarity between the waveform of the second signal and a predetermined waveform. For example, the processor 140 may acquire the similarity between the waveform of the second signal and predetermined waveform by using a similarity identification algorithm or a neural network model for identifying similarity. In this case, the similarity identification algorithm or the neural network model for identifying the similarity may be previously stored in the memory 130. If the similarity is less than a predetermined value, the processor 140 may identify that a defect exists in the transparent electrode sheet. If the similarity is greater than or equal to the predetermined value, the processor 140 may identify that a defect does not exist in the transparent electrode sheet.
While it is described in the disclosure that the external device 200 is a TDR device, this is only an example, and the external device 200 may be implemented as a jig board using a field programmable gate array (FPGA) or an application-specific integrated circuit (ASIS). The jig board may include a pulse generator that generates a pulse signal to be applied to an electrode sheet, a time-to-digital converter (TDC), and a comparator. The jig board may store information on the pulse signal and the response signal. For example, the jig board may store a first point at which the pulse signal is applied to the jig board, a second point at which the response signal is acquired, a difference between the first point and the second point, and a size of the response signal. The jig board may transmit stored information to the electronic apparatus 100.
Referring to
Referring to
The electronic apparatus 100 may identify whether a defect exists in the line based on the waveform of the response signal, and may identify a type of the defect. For example, when a waveform of the received response signal has the same shape as the first response signal 31, the electronic apparatus 100 may identify that a defect exists in the line. In this case, the electronic apparatus 100 may identify that an air gap is formed in the line. When a waveform of the received response signal has the same shape as the second response signal 41, the electronic apparatus 100 may identify that a defect exists in the line. In this case, the electronic apparatus 100 may identify that a foreign material is present in the line or that a dent has occurred.
The electronic apparatus 100 may store a waveform of a reference response signal when the electrode sheet is normal. When a difference between a size of the reference response signal and a size of the received response signal is greater than a predetermined value, the electronic apparatus 100 may identify that a defect exists in the line. Alternatively, the electronic apparatus 100 may acquire the inductance or capacitance of the line by analyzing the waveform of the received response signal. When the difference between the acquired inductance or capacitance, and the reference value is greater than a predetermined value, the electronic apparatus 100 may identify that a defect exists in the line.
Referring to
Referring to
Referring to
The electronic apparatus 100 may identify a first point t0 by analyzing a waveform of the reference response signal 90. For example, the electronic apparatus 100 may identify the first point t0 by identifying a point at which a value acquired by differentiating the reference response signal 90 is greater than a predetermined value. The electronic apparatus 100 may define a reference time range (TR) and a reference voltage range (VR) based on the first point t0. The electronic apparatus 100 may identify whether a defect exists in the electrode sheet by analyzing the response signal based on the reference time range TR and the reference voltage range VR. For example, when a point at which the reflected signal corresponding to the pulse signal is acquired by the TDR device is outside the reference time range TR, or a size of the response signal in the reference time range TR is outside the reference voltage range VR, the electronic apparatus 100 may identify that a defect exists in the electrode sheet.
Referring to
Referring to
The electronic apparatus 100 may identify whether a defect exists in the electrode sheet 60 by analyzing a waveform of the first response signal 91. For example, the electronic apparatus 100 may identify a point at which a value acquired by differentiating the first response signal 91 becomes greater than a predetermined value for the first time, as a first point t1. In addition, the electronic apparatus 100 may identify a change in the size of the first response signal 91 at the first point t1. Since the first point t1 is smaller than the reference point t0 and the third voltage V3 is smaller than the first voltage V1, the electronic apparatus 100 may identify that there is a defect in which the impedance of the first line 61 decreases at a point where the electrical length from the TDR device is smaller than the reference length d0. For example, the electronic apparatus 100 may identify that the first line 61 is shorted with the other line at a point where the electrical length from the TDR device is less than the reference length d0.
The electronic apparatus 100 may acquire a location where a defect exists based on the first point t1. The electronic apparatus 100 may calculate an electrical length of the first line 61 based on the first point t1. For example, the electronic apparatus 100 may calculate the electrical length of the first line 61 by comparing the first point t1 and the reference point t0. The electronic apparatus 100 may identify a location where the reflected signal corresponding to the pulse signal is reflected based on the electrical length of the first line 61.
Referring to
Referring to
The electronic apparatus 100 may identify whether a defect exists in the electrode sheet 70 by analyzing a waveform of the second response signal 92. For example, the electronic apparatus 100 may identify a point at which a value acquired by differentiating the second response signal 92 becomes greater than a predetermined value, as the second point t2. Since the second point t2 is greater than the reference point t0, the electronic apparatus 100 may identify that a defect that increases the electrical length of the first line 71 exists in the electrode sheet 70. For example, the electronic apparatus 100 may identify that the first line 71 and the other line are connected in series.
Referring to
Referring to
The electronic apparatus 100 may identify whether a defect exists in the electrode sheet 80 by analyzing a waveform of the third response signal 93. For example, the electronic apparatus 100 may identify a point at which a value acquired by differentiating the third response signal 93 becomes greater than a predetermined value, as the third point t3. Since the third point t3 is smaller than the reference point t0, the electronic apparatus 100 may identify that a defect in which the electrical length of the first line 81 decreases exists in the electrode sheet 80. In addition, since the size of the third response signal 93 has become smaller than the first voltage V1 after the third point t3, the electronic apparatus 100 may identify that a defect in which the impedance of the first response signal 91 decreases exists. For example, the electronic apparatus 100 may identify that the first line 81 is shorted to the ground at a point corresponding to a third distance d3.
The electronic apparatus 100 may identify whether a defect exists in the upper electrode sheet 340 or the lower electrode sheet 360 even after the upper electrode sheet 340 and the lower electrode sheet 360 are bonded.
Referring to
Referring to
The electronic apparatus 100 may identify whether a defect exists in the bonded electrode sheet by analyzing the response signal based on the reference time range TR′ and the reference voltage range VR′. For example, when a point at which the reflected signal corresponding to the pulse signal is acquired by the TDR device is outside the reference time range TR′, or a size of the response signal in the reference time range TR′ is outside the reference voltage range VR′, the electronic apparatus 100 may identify that a defect exists in the bonded electrode sheet.
The second response signal 122 is a response signal when capacitances C1, C2, and C3 are greater than a predetermined value. As the capacitance increases, a rise time of the response signal may increase. Accordingly, it may be identified that a time for the second response signal 122 to reach the reference voltage V0′ is greater than a time for the first response signal 121 to reach the reference voltage V0′.
The electronic apparatus 100 may identify whether a defect exists in the bonded electrode sheet by analyzing a waveform of the response signal. For example, if the response signal is the same as the second response signal 122, the electronic apparatus 100 may identify that there is a defect in which the capacitance increases than a predetermined value, in the bonded electrode sheet,
As shown in the circuit diagram of
The electronic apparatus 100 may identify whether a defect exists in the bonded electrode sheet by analyzing a waveform of the response signal. For example, if the response signal is the same as the third response signal 123, the electronic apparatus 100 may identify that there is a defect in which the electrical length and impedance of the first line 101 are reduced.
A method of identifying whether a defect exists in the bonded electrode sheet based on a signal acquired from the upper electrode sheet 340 has been described in
Referring to
Referring to
The electronic apparatus 100 may receive a response signal from the oscilloscope 131 and identify whether a defect exists in the bonded electrode sheet by analyzing the response signal. The electronic apparatus 100 may identify whether a defect exists in the bonded electrode sheet by identifying whether the response signal satisfies a predetermined condition. For example, the predetermined condition may include a first condition that a time difference between points at which two adjacent response signals are acquired must be within a predetermined range. When the first condition is satisfied, it means that the capacitors formed between the upper electrode sheet 340 and the lower electrode sheet 360 are formed at regular intervals, that is, uniformly. Accordingly, when the first condition is not satisfied, the electronic apparatus 100 may identify that a defect that a capacitor formed on the bonded electrode sheet is non-uniform exists. The preset condition may include a second condition that a size of the response signal sensed at a location having a greater electrical length from the TDR device should be smaller. When a short occurs between lines included in the bonded electrode sheet, an electrical length may be changed, and accordingly, a point at which a response signal is acquired may change. Accordingly, if the second condition is not satisfied, the electronic apparatus 100 may identify that a defect exists in the bonded electrode sheet. When the first condition and the second condition are satisfied, the electronic apparatus 100 may identify that there is no defect in the bonded electrode sheet.
Referring to
The electronic apparatus 100 may identify whether the first condition is satisfied based on the first time difference (Δt1), the second time difference (Δt2), and the third time difference (Δt3). If the first time difference (Δt1), the second time difference (Δt2), and the third time difference (Δt3) are all within a predetermined range (e.g., 0.4 ns to 0.6 ns), the electronic apparatus 100 identifies that the first condition is satisfied. Meanwhile, if at least one of the first time difference (Δt1), the second time difference (Δt2), and the third time difference (Δt3) is out of the predetermined range, the electronic apparatus 100 may identify that the first condition is not satisfied.
The electronic apparatus 100 may identify whether the second condition is satisfied by identifying a maximum value of a size of each response signal and comparing the identified maximum value. For example, the electronic apparatus 100 may identify a first maximum value V1′ of the first response signal 141, a second maximum value V2′ of the second response signal 142, and a third maximum value V3′ of the third response signal 143, and a fourth maximum value V4′ of the fourth response signal 144. Since the first maximum value V1′ is greater than the second maximum value V2′, the second maximum value V2′ is greater than the third maximum value V3′, and the third maximum value V3′ is greater than the maximum value V4′, the electronic apparatus 100 may identify that the second condition is satisfied. Accordingly, when a response signal as shown in
Referring to
The electronic apparatus 100 may receive a first point at which a first signal is applied to the transparent electrode sheet from the external device, a second point at which a second signal that is a response signal to the first signal is acquired by the external device, and a waveform of the second point at operation S1530.
The electronic apparatus 100 may identify whether a defect exists in the transparent electrode sheet based on a difference between the first point and the second point, and the waveform of the second signal at operation S1540. For example, when the difference between the first point and the second point is outside a predetermined time range, the electronic apparatus 100 may identify that a defect exists in the transparent electrode sheet. Alternatively, when a voltage magnitude of the second signal is outside a predetermined voltage range, the electronic apparatus 100 may identify that a defect exists in the transparent electrode sheet.
When the difference between the first point and the second point is less than the predetermined time, and the voltage magnitude of the second signal is less than the predetermined value, the electronic apparatus 100 may identify that at least some of a plurality of wires included in the transparent electrode sheet are shorted to each other or that at least some of the plurality of wires are shorted to a ground.
When a rise time of the second signal is greater than a predetermined time, the electronic apparatus 100 may identify a foreign material is present in the transparent electrode sheet or that a degree of compression between the transparent electrode sheet and the other transparent electrode sheet is outside a predetermined range.
The electronic apparatus 100 may identify a location of the defect present in the transparent electrode sheet based on the difference between the first point and the second point. The electronic apparatus 100 may display information about the defect including the location of the defect through the display 120.
The electronic apparatus 100 may acquire a similarity between the waveform of the second signal and a predetermined waveform. If the similarity is less than a predetermined value, the electronic apparatus 100 may identify that a defect exists in the transparent electrode sheet. If the similarity is greater than or equal to the predetermined value, the electronic apparatus 100 may identify that a defect does not exist in the transparent electrode sheet.
In addition, various embodiments described above may be implemented in a recording media that may be read by a computer or a similar device to the computer by suing software, hardware, or a combination thereof In some cases, the embodiments described herein may be implemented by the processor itself In a software configuration, various embodiments described in the specification such as a procedure and a function may be implemented as separate software modules. The software modules may respectively perform one or more functions and operations described in the disclosure
According to various embodiments described above, computer instructions for performing processing operations of a device according to the various embodiments described above may be stored in a non-transitory computer-readable medium. The computer instructions stored in the non-transitory computer-readable medium may cause a particular device to perform processing operations on the device according to the various embodiments described above when executed by the processor of the particularly device.
The non-transitory computer-readable medium does not refer to a medium that stores data for a short period of time, such as a register, cache, memory, etc., but semi-permanently stores data and is available of reading by the device. For example, the non-transitory computer-readable medium may be compact disc (CD), digital versatile disc (DVD), a hard disc, Blu-ray disc, USB, a memory card, read only memory (ROM), or the like.
While the disclosure has been shown and described with reference to various embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the disclosure as defined by the appended claims and their equivalents.
| Number | Date | Country | Kind |
|---|---|---|---|
| 10-2021-0127886 | Sep 2021 | KR | national |
This application is a continuation application, claiming priority under § 365(c), of an International application No. PCT/KR2022/014337, filed on Sep. 26, 2022, which is based on and claims the benefit of a Korean patent application number 10-2021-0127886, filed on Sep. 28, 2021, in the Korean Intellectual Property Office, the disclosure of which is incorporated by reference herein in its entirety.
| Number | Date | Country | |
|---|---|---|---|
| Parent | PCT/KR2022/014337 | Sep 2022 | US |
| Child | 18175732 | US |
