The present application claims priority from Japanese Patent Application No. 2011-152589 filed on Jul. 11, 2011, the entire contents of which are hereby incorporated by reference into this application.
The technical field relates to an electronic component and a method of producing the same, and in particular, to an electronic component that includes a laminate and a method of producing the same.
An example of a conventional electronic component is a stacked inductor described in Japanese Unexamined Patent Application Publication No. 2010-165975.
As illustrated in
The external electrode 508 includes external electrode patterns 508a to 508c. Each of the external electrode patterns 508a to 508c has a substantially L shape. The external electrode patterns 508a to 508c are disposed in corners of the insulating layers 504b to 504d, respectively. The external electrode 510 includes external electrode patterns 510a to 510c. Each of the external electrode patterns 510a to 510c has a substantially L shape. The external electrode patterns 510a to 510c are disposed in corners of the insulating layers 504b to 504d, respectively. The top and bottom of the external electrodes 508 and 510 in the stacking direction thereof are overlaid with the insulating layers 504a and 504d, respectively.
The present disclosure provides an electronic component capable of suppressing the occurrence of breakage of a laminate and a method of producing the electronic component.
According to an aspect of the present disclosure, an electronic component includes a laminate in which plural insulator layers are stacked and an external electrode exposed to an exterior of the laminate includes plural conductive layers stacked in a staking direction. Each of the conductive layers pass through a first part of the plural insulator layers in a stacking direction. At least one side of the external electrode in the stacking direction is overlaid with a second part of the plural insulator layers. At least one side surface of the external electrode facing in the stacking direction includes a portion that is uneven with another portion of the side surface.
According to another aspect of the present invention, a method of producing an electronic component includes a first step of forming an outer insulator layer, a second step of forming, on the outer insulator layer, an inner insulator layer in which an opening is formed, a third step of forming a conductive layer on the inner insulator layer, the conductive layer having an area larger than the opening and overlapping the opening, and a fourth step of cutting a mother laminate including the outer insulator layer and the inner insulator layer into a plurality of laminates. In the fourth step an external electrode including the conductive layer is exposed from the laminate in a first cut surface formed by the cutting.
Other features, elements, characteristics, and advantages of the present disclosure will become more apparent from the following detailed description with reference to the attached drawings.
The inventor realized that in the stacked inductor 500 described in Japanese Unexamined Patent Application Publication No. 2010-165975, the laminate 502 may be damaged. More specifically, the process of producing the stacked inductor 500 contains a dividing step of dividing a mother laminate into individual laminates 502 and a firing step of firing the laminates 502. In the dividing step and the firing step, a stress is applied to each of the laminates 502. Because the material of the laminate 502 differs from the material of the external electrodes 508 and 510, when a stress is applied to the laminate 502, an internal stress remains between the laminate 502 and the external electrodes 508 and 510. If the laminate 502 is subjected to barrel polishing or plating in the state where the internal stress remains, the impact of the barrel polishing or plating may cause breakage such as a crack or the like in a portion in each of the insulating layers 504a and 504d, the portion being in contact with the external electrodes 508 and 510.
An electronic component according to exemplary embodiments and a method of producing the same that can address the above-described breakage issues will now be described.
A configuration of an electronic component according to an exemplary embodiment is described below with reference to the drawings.
As illustrated in
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As illustrated in
The coil L includes coil conductive layers 18 (18a to 18g) and via hole conductors V1 to V6. The coil L has a substantially helical shape turning clockwise in plan view from the positive y-axis direction and winding from negative to positive in the y-axis direction. The coil conductive layers 18a to 18g are disposed on the insulator layers 16a to 16g, respectively. Each of the coil conductive layers 18a to 18g has a substantially rectangular ring shape which is formed by cutting off (i.e., excluding) a part of a rectangular ring shape. The number of turns of each of the coil conductive layers 18a to 18g is about ¾. Each of the coil conductive layers 18 can be made of a conductive material whose main component is silver, for example. In the following description, the upstream end in the clockwise direction of each coil conductive layer 18 is referred to as an upstream end, and the downstream end in the clockwise direction of each coil conductive layer 18 is referred to as a downstream end.
The via hole conductors V1 to V6 pass through the insulator layers 16b to 16g in the y-axis direction, respectively. The via hole conductors V1 to V6 can be made of a conductive material whose main component is silver, for example. The via hole conductor V1 connects the downstream end of the coil conductive layer 18a and the upstream end of the coil conductive layer 18b. The via hole conductor V2 connects the downstream end of the coil conductive layer 18b and the upstream end of the coil conductive layer 18c. The via hole conductor V3 connects the downstream end of the coil conductive layer 18c and the upstream end of the coil conductive layer 18d. The via hole conductor V4 connects the downstream end of the coil conductive layer 18d and the upstream end of the coil conductive layer 18e. The via hole conductor V5 connects the downstream end of the coil conductive layer 18e and the upstream end of the coil conductive layer 18f. The via hole conductor V6 connects the downstream end of the coil conductive layer 18f and the upstream end of the coil conductive layer 18g.
As illustrated in
The external electrode conductive layers 25b, 25d, 25f, and 25h pass through the insulator layers 16c, 16d, 16e, and 16f, respectively, in the y-axis direction and are substantially L-shaped. In plan view from the y-axis direction, the external electrode conductive layers 25b, 25d, 25f, and 25h are in contact with the short side of each of the insulator layers 16a and 16h in the negative x-axis direction and the long side thereof in the negative z-axis direction.
The external electrode conductive layers 25a to 25i coincide with each other in plan view from the y-axis direction. The external electrode conductive layer 25b is in contact with the external electrode conductive layers 25a and 25c. The external electrode conductive layer 25d is in contact with the external electrode conductive layers 25c and 25e. The external electrode conductive layer 25f is in contact with the external electrode conductive layers 25e and 25g. The external electrode conductive layer 25h is in contact with the external electrode conductive layers 25g and 25i.
The external electrode conductive layers 20a, 21a, and 22a are disposed on the front surface of the insulator layer 16a and are substantially rectangular. The external electrode conductive layers 20a, 21a, and 22a have a shape different from the shape of each of the external electrode conductive layers 25a to 25i in plan view from the y-axis direction and overlap the external electrode conductive layers 25a to 25i in plan view from the y-axis direction. More specifically, the external electrode conductive layer 21a is disposed in the corner of the insulator layer 16a in the negative x-axis direction and in the negative z-axis direction. The external electrode conductive layer 20a is disposed on the positive z-axis direction side with respect to the external electrode conductive layer 21a and is in contact with the short side of the insulator layer 16a in the negative x-axis direction. The external electrode conductive layer 20a is connected to the upstream end of the coil conductive layer 18a. The external electrode conductive layer 22a is disposed on the positive x-axis direction side with respect to the external electrode conductive layer 21a and is in contact with the long side of the insulator layer 16a in the negative z-axis direction.
The external electrode conductive layers 20b, 21b, and 22b pass through the insulator layer 16b in the y-axis direction and coincide with the external electrode conductive layers 20a, 21a, and 22a, respectively, in plan view from the y-axis direction. The external electrode conductive layers 20b, 21b, and 22b are in contact with the external electrode conductive layers 20a, 21a, and 22a, respectively.
The external electrode conductive layers 20c, 21c, and 22c pass through the insulator layer 16g in the y-axis direction and coincide with the external electrode conductive layers 20a, 21a, and 22a, respectively, in plan view from the y-axis direction.
The external electrode conductive layers 20d, 21d, and 22d coincide with the external electrode conductive layers 20c, 21c, and 22c, respectively, in plan view from the y-axis direction. The external electrode conductive layers 20d, 21d, and 22d are in contact with the external electrode conductive layers 20c, 21c, and 22c, respectively.
In the external electrode 14a, in which the external electrode conductive layers 20, 21, 22, and 25 are stacked in the above-described way, a side surface S10 of the external electrode 14a located at the end in the negative y-axis direction and a side surface S11 of the external electrode 14a located at the end in the positive y-axis direction are uneven, as illustrated in
More specifically, the side surface S10 is defined by the external electrode conductive layers 20a, 20b, 21a, 21b, 22a, 22b, and 25a. The external electrode conductive layers 20a, 20b, 21a, 21b, 22a, and 22b protrude in the negative y-axis direction farther than the external electrode conductive layer 25a. Thus, the side surface S10 has a shape in which in plan view from the negative z-axis direction both ends thereof in the x-axis direction protrude in the negative y-axis direction and a substantially central portion thereof in the x-axis direction is depressed in the positive y-axis direction. The side surface S10 also has a shape in which in plan view from the negative x-axis direction both ends thereof in the z-axis direction protrude in the negative y-axis direction and a substantially central portion thereof in the z-axis direction is depressed in the positive y-axis direction.
The side surface S11 is defined by the external electrode conductive layers 20c, 20d, 21c, 21d, 22c, 22d, and 25i. The external electrode conductive layers 20c, 20d, 21c, 21d, 22c, and 22d protrude in the positive y-axis direction farther than the external electrode conductive layer 25i. The side surface S11 has a shape in which in plan view from the negative z-axis direction both ends thereof in the x-axis direction protrude in the positive y-axis direction and a substantially central portion thereof in the x-axis direction is depressed in the negative y-axis direction. The side surface S11 also has a shape in which in plan view from the negative x-axis direction both ends thereof in the z-axis direction protrude in the positive y-axis direction and a substantially central portion thereof in the z-axis direction is depressed in the negative y-axis direction.
As illustrated in
The external electrode conductive layers 35b, 35d, 35f, and 35h pass through the insulator layers 16c, 16d, 16e, and 16f, respectively, in the y-axis direction and are substantially L-shaped. In plan view from the y-axis direction, the external electrode conductive layers 35b, 35d, 35f, and 35h are in contact with the short side of each of the insulator layers 16a and 16h (rest of the insulator layers 16) in the positive x-axis direction and the long side thereof in the negative z-axis direction.
The external electrode conductive layers 35a to 35i coincide with each other in plan view from the y-axis direction. The external electrode conductive layer 35b is in contact with the external electrode conductive layers 35a and 35c. The external electrode conductive layer 35d is in contact with the external electrode conductive layers 35c and 35e. The external electrode conductive layer 35f is in contact with the external electrode conductive layers 35e and 35g. The external electrode conductive layer 35h is in contact with the external electrode conductive layers 35g and 35i.
The external electrode conductive layers 30a, 31a, and 32a are disposed on the front surface of the insulator layer 16a and are substantially rectangular. The external electrode conductive layers 30a, 31a, and 32a have a shape different from the shape of each of the external electrode conductive layers 35a to 35i in plan view from the y-axis direction and overlap the external electrode conductive layers 35a to 35i in plan view from the y-axis direction. More specifically, the external electrode conductive layer 31a is disposed in the corner of the insulator layer 16a in the positive x-axis direction and in the negative z-axis direction. The external electrode conductive layer 30a is disposed on the positive z-axis direction side with respect to the external electrode conductive layer 31a and is in contact with the short side of the insulator layer 16a in the positive x-axis direction. The external electrode conductive layer 32a is disposed on the negative x-axis direction side with respect to the external electrode conductive layer 31a and is in contact with the long side of the insulator layer 16a in the negative z-axis direction.
The external electrode conductive layers 30b, 31b, and 32b pass through the insulator layer 16b in the y-axis direction and coincide with the external electrode conductive layers 30a, 31a, and 32a, respectively, in plan view from the y-axis direction. The external electrode conductive layers 30b, 31b, and 32b are in contact with the external electrode conductive layers 30a, 31a, and 32a, respectively.
The external electrode conductive layers 30c, 31c, and 32c pass through the insulator layer 16g in the y-axis direction and coincide with the external electrode conductive layers 30a, 31a, and 32a, respectively, in plan view from the y-axis direction.
The external electrode conductive layers 30d, 31d, and 32d coincide with the external electrode conductive layers 30c, 31c, and 32c, respectively, in plan view from the y-axis direction. The external electrode conductive layers 30d, 31d, and 32d are in contact with the external electrode conductive layers 30c, 31c, and 32c, respectively. The external electrode conductive layer 30d is connected to the downstream end of the coil conductive layer 18g.
The external electrode conductive layers 30, 31, 32, and 35 are stacked in the above-described way, whereby a side surface S12 of the external electrode 14b located at the end in the negative y-axis direction and a side surface S13 of the external electrode 14b located at the end in the positive y-axis direction are uneven, as illustrated in
More specifically, the side surface S12 is defined by the external electrode conductive layers 30a, 30b, 31a, 31b, 32a, 32b, and 35a. The external electrode conductive layers 30a, 30b, 31a, 31b, 32a, and 32b protrude in the negative y-axis direction farther than the external electrode conductive layer 35a. The side surface S12 has a shape in which in plan view from the negative z-axis direction both ends thereof in the x-axis direction protrude in the negative y-axis direction and a substantially central portion thereof in the x-axis direction is depressed in the positive y-axis direction. The side surface S12 also has a shape in which in plan view from the positive x-axis direction both ends thereof in the z-axis direction protrude in the negative y-axis direction and a substantially central portion thereof in the z-axis direction is depressed in the positive y-axis direction.
The side surface S13 is defined by the external electrode conductive layers 30c, 30d, 31c, 31d, 32c, 32d, and 35i. The external electrode conductive layers 30c, 30d, 31c, 31d, 32c, and 32d protrude in the positive y-axis direction farther than the external electrode conductive layer 35i. The side surface S13 has a shape in which in plan view from the negative z-axis direction both ends thereof in the x-axis direction protrude in the positive y-axis direction and a substantially central portion thereof in the x-axis direction is depressed in the negative y-axis direction. The side surface S13 also has a shape in which in plan view from the positive x-axis direction both ends thereof in the z-axis direction protrude in the positive y-axis direction and a substantially central portion thereof in the z-axis direction is depressed in the negative y-axis direction.
The portion of each of the external electrodes 14a and 14b exposed from the laminate 12 to the outside is subjected to nickel plating and tin plating and to prevent corrosion.
Each of both sides of the each of the external electrodes 14a and 14b in the y-axis direction is overlaid with the insulator layer 16a or 16h. Thus, the external electrodes 14a and 14b are not exposed in the side surfaces S5 and S6.
A method of producing the electronic component 10 according to the first exemplary embodiment will now be described with reference to the drawings.
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Then, the mother laminate 112 is cut into a plurality of unfired laminates 12 by, for example, dicing. In the step of cutting the mother laminate 112, each of the external electrodes 14a and 14b is made to be exposed from each of the laminates 12 in two neighboring cut surfaces formed by the cutting. The two neighboring cut surfaces for the external electrode 14a are the lower surface S2 and the end surface S3, whereas those for the external electrode 14b are the lower surface S2 and the end surface S4.
Then, the unfired laminate 12 is fired under a predetermined condition, and the fired laminate 12 is obtained. In addition, the laminate 12 is subjected to barreling.
Lastly, the portions in the external electrodes 14a and 14b exposed from the laminate 12 are subjected to nickel plating with a thickness of approximately 2 μm to 7 μm and tin plating with a thickness of approximately 2 μm to 7 μm. Through the above-described steps, the electronic component 10 is completed.
In the electronic component 10 configured in the above-described way, the occurrence of breakage of the laminate 12 can be suppressed. More specifically, the process of producing the stacked inductor 500 described in Japanese Unexamined Patent Application Publication No. 2010-165975 contains a dividing step of dividing a mother laminate into individual laminates 502 and a firing step of firing the laminates 502. In the dividing step and the firing step, a stress is applied to each of the laminates 502. Because the material of the laminate 502 differs from the material of the external electrodes 508 and 510, when a stress is applied to the laminate 502, an internal stress remains between the laminate 502 and the external electrodes 508 and 510. If the laminate 502 is subjected to barrel polishing or plating in the state where the internal stress remains, the impact of the barrel polishing or plating may cause in a portion in each of the insulating layers 504a and 504d, the portion being in contact with the external electrodes 508 and 510. As the result, breakage such as a crack or the like is caused in the portion therein.
In contrast, in the electronic component 10, the side surfaces S10 to S13 located on both sides of the external electrodes 14a and 14b in the y-axis direction are uneven. Therefore, the area in which the insulator layers 16a and 16h on both sides of the external electrodes 14a and 14b in the y-axis direction are in contact with the external electrodes 14a and 14b is increased, whereby the adhesion therebetween is high. As a result, even if an impact occurs in the laminate 12, the occurrence of breakage such as a crack in the portions of the insulator layers 16a and 16h in contact with the external electrodes 14a and 14b is suppressed. That is, breakage of the electronic component 10 is suppressed.
In the electronic component 10 of the preferred embodiments, both sides of the external electrodes 14a and 14b in the y-axis direction is overlaid with the insulator layers 16a and 16h. However, it is not restrictive and it is possible to change to only one of the external electrodes being overlaid with insulator layer.
Next, an electronic component 10a according to a variation is described with reference to the drawings.
The electronic component 10a differs from the electronic component 10 in the shape of each of the external electrodes 14a and 14b. The electronic component 10a does not include the external electrode conductive layers 21 and 31. Thus, the side surface S10 has a shape in which in plan view from the negative z-axis direction the end in the positive x-axis direction protrudes in the negative y-axis direction farther than the other portions. The side surface S10 also has a shape in which in plan view from the negative x-axis direction the end in the positive z-axis direction protrudes in the negative y-axis direction farther than the other portions.
Similarly, the side surface S11 has a shape in which in plan view from the negative z-axis direction the end in the positive x-axis direction protrudes in the positive y-axis direction farther than the other portions. The side surface S11 also has a shape in which in plan view from the negative x-axis direction the end in the positive z-axis direction protrudes in the positive y-axis direction farther than the other portions.
The side surface S12 has a shape in which in plan view from the negative z-axis direction, the end in the negative x-axis direction protrudes in the negative y-axis direction farther than the other portions. The side surface S12 also has a shape in which in plan view from the positive x-axis direction, the end in the positive z-axis direction protrudes in the negative y-axis direction farther than the other portions.
Similarly, the side surface S13 has a shape in which in plan view from the negative z-axis direction the end in the negative x-axis direction protrudes in the positive y-axis direction farther than the other portions. The side surface S13 also has a shape in which in plan view from the positive x-axis direction the end in the positive z-axis direction protrudes in the positive y-axis direction farther than the other portions.
In the above-described electronic component 10a, breakage of the laminate can be suppressed. More specifically, a corner of the laminate is easily broken by an impact from the outside. In the electronic component 10a, the width of the external electrode 14a in the y-axis direction is not a maximum in the corner between the lower surface S2 and the end surface S3, and the width of the external electrode 14b in the y-axis direction is not a maximum in the corner between the lower surface S2 and the end surface S4. Therefore, the distance d2 from each of the external electrodes 14a and 14b to each of the side surfaces S5 and S6 in the corner of the electronic component 10a is larger than the distance d1 from each of the external electrodes 14a and 14b to each of the side surfaces S5 and S6 in the corner of the electronic component 10. Accordingly, in the electronic component 10a, the occurrence of breakage in a corner of the laminate 12 can be suppressed.
To form the above-described external electrodes 14a and 14b, in the steps illustrated in
In the electronic components 10 and 10a, all of the side surfaces S10 and S11 of the external electrode 14a and the side surfaces S12 and S13 of the external electrode 14b are uneven. However, suppression of lamination breakage can be achieved with at least one of the side surfaces S10 and S11 uneven and/or at least one of the side surfaces S12 and S13 uneven.
In the electronic components 10 and 10a, both sides of the external electrodes 14a and 14b in the y-axis direction is overlaid with the insulator layers 16a and 16h. However, these examples are not restrictive and it is possible to change them to only one of the external electrodes being overlaid with insulator layer.
As described above, preferred embodiments of the present invention are useful in an electronic component and a method of producing the same and, in particular, advantageous in that breakage of a laminate can be suppressed.
While exemplary embodiments have been described above, it is to be understood that variations and modifications will be apparent to those skilled in the art without departing from the scope and spirit of the disclosure.
Number | Date | Country | Kind |
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2011-152589 | Jul 2011 | JP | national |
Number | Date | Country | |
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Parent | 13545378 | Jul 2012 | US |
Child | 14448956 | US |