The present disclosure relates to an electronic device including an electronic component mounted on a substrate.
Surface acoustic wave devices are widely used in the field of mobile communications, such as mobile phones. Surface acoustic wave devices convert electrical signals into surface acoustic waves (SAWs) to receive and transmit signals. Such a surface acoustic wave device includes a surface acoustic wave element mounted face-down on a substrate and has a frame made of a photosensitive resin or other materials and disposed on the substrate to surround the surface acoustic wave element. In the surface acoustic wave device, the surface acoustic wave element is integrally fixed by applying a sealing material, such as a sealing resin, from a surface of the surface acoustic wave element opposite to an element formation surface (Japanese Unexamined Patent Application Publication No. 2003-168942).
An electronic device, such as the surface acoustic wave device disclosed in Japanese Unexamined Patent Application Publication No. 2003-168942, has a frame that surrounds a face-down mounted surface acoustic wave element (an electronic component having a functional element on one main surface) so as to block intrusion of a sealing material into a gap between the surface acoustic wave element and a substrate. However, when the gap between the surface acoustic wave element and the substrate is cleaned with a cleaning solution to remove dirt (such as flux) remaining at the joint between the surface acoustic wave element and the substrate before the surface acoustic wave element is sealed with the sealing material, the frame hinders the cleaning solution from flowing into the gap between the surface acoustic wave element and the substrate and also hinders the cleaning solution that has flowed into the gap from flowing out.
Preferred embodiments of the present invention provide electronic devices in each of which a cleaning solution easily flows into a gap between an electronic component and a substrate and the cleaning solution that has flowed into the gap easily flows out.
An electronic device according to an aspect of a preferred embodiment of the present disclosure includes an electronic component including a functional element and a bump on one main surface, a substrate on which the electronic component is mounted using the bump as a joint, a frame positioned on the substrate to surround the electronic component in a plan view of the electronic component mounted on the substrate, and a sealing material that seals the electronic component and seals a gap between the frame and the electronic component, wherein the frame includes at least one recess adjacent to the electronic component.
Since the frame includes at least one recess adjacent to the electronic component according to an aspect of a preferred embodiment of the present disclosure, a cleaning solution easily flows into a gap between the electronic component and the substrate, and the cleaning solution that has flowed into the gap easily flows out.
The above and other elements, features, steps, characteristics and advantages of the present invention will become more apparent from the following detailed description of the preferred embodiments with reference to the attached drawings.
Electronic devices according to preferred embodiments of the present invention will be described below with reference to the drawings. In the following description, the same components are assigned with the same reference signs. The same components have the same names and the same functions. Therefore, detailed description of the same components is not repeated.
A surface acoustic wave device 10 in
The substrate 1 includes an electrode (not shown) to electrically connect the substrate 1 to the surface acoustic wave element 2, and the electrode is connected to bumps 21 on one main surface of the surface acoustic wave device 10. The substrate 1 is not necessarily made of a glass epoxy resin, and may be, for example, a package substrate made of alumina or other materials, a silicon substrate, a piezoelectric substrate (lithium niobate (LN), lithium tantalate (LT)), a component-embedded substrate (a multilayer product including, for example, polyimide, an epoxy resin, and metal wiring).
The surface acoustic wave element 2 includes multiple comb electrodes (IDT electrodes) (not shown), which are functional elements, and multiple bumps 21 on one main surface of a piezoelectric substrate 20.
The piezoelectric substrate 20 is, for example, an LTCC substrate. The LTCC substrate is made of a piezoelectric single crystal material, such as lithium tantalate (LT), lithium niobate (LN), alumina (Al2O3), or sapphire, or a piezoelectric layered composite containing silicon (Si).
The IDT electrode is made of an electrode material, such as at least one single metal selected from aluminum, copper, silver, gold, titanium, tungsten, platinum, chromium, nickel, and molybdenum, or alloys including these metals as main components. In the surface acoustic wave element 2, the piezoelectric substrate 20 and the IDT electrodes define a surface acoustic wave resonator.
The bumps 21 are connection terminals to provide electrical connection between the surface acoustic wave element 2 and the substrate 1. The bumps 21 may be made of a material, such as gold, silver, or copper, although solder is described as an example.
The frame 3 is made of a photosensitive material, such as polyimide, and disposed on the substrate 1 in order to block intrusion of the sealing material 4 into a gap between the surface acoustic wave element 2 and the substrate 1. In other words, in the surface acoustic wave device 10, the frame 3 on the substrate 1 can keep a hollow portion between the surface acoustic wave element 2 and the substrate 1 even after the surface acoustic wave element 2 is sealed with the sealing material 4.
The gap between the surface acoustic wave element 2 and the substrate 1 is cleaned with a cleaning solution to remove dirt (e.g., flux for the bumps 21 made of solder (solder bumps)) remaining at the joint between the surface acoustic wave element 2 and the substrate 1 before the surface acoustic wave element 2 is sealed with the sealing material 4. However, blocking intrusion of the sealing material 4 into the gap between the surface acoustic wave element 2 and the substrate 1, the frame 3 hinders the cleaning solution from flowing into the gap between the surface acoustic wave element 2 and the substrate 1 and also hinders the cleaning solution that has flowed into the gap from flowing out.
In the surface acoustic wave device 10 according to the present preferred embodiment, the frame 3 has at least one recess 5 adjacent to the surface acoustic wave element 2. When the frame 3 prevents intrusion of the sealing material 4 into the gap between the surface acoustic wave element 2 and the substrate 1, and the cleaning solution flows in and out through the recess 5 of the frame 3, the cleaning solution easily flows into the gap between the surface acoustic wave element 2 and the substrate 1, and the cleaning solution that has flowed into the gap easily flows out.
In
When the frame 3 includes multiple recesses 5, the cleaning solution easily flows into the gap between the surface acoustic wave element 2 and the substrate 1, and the cleaning solution that has flowed into the gap easily flows out. In particular, referring to
Referring to
The sealing material 4 is an epoxy resin used to mold common electronic components and includes a filler, such as silica or alumina. The sealing material 4 thus has higher viscosity than the cleaning solution. Preferably, the sealing material 4 includes about 30 wt % to about 85 wt % of a filler having an average size of about 0.4 μm to about 50 μm in the epoxy resin, for example. The epoxy resin and the curing agent are not limited however.
Since the recesses 5 are small relative to the frame 3, and the sealing material 4 has higher viscosity than the cleaning solution, as described above, the sealing material 4 is less likely to intrude into the gap between the surface acoustic wave element 2 and the substrate 1 even when the frame 3 has the recesses 5. However, further limitation of the sizes of the recesses 5 makes it more difficult for the sealing material 4 to intrude into the gap between the surface acoustic wave element 2 and the substrate 1. The size of a recess 5 will be described.
Referring to
When the size of the recess 5 is defined as described above, at least one of the length, the width, or the depth of the recess 5 in the frame 3 is preferably less than about 30 μm, for example. When at least one of the length, the width, or the depth of the recess 5 is less than about 30 μm, the sealing material 4 having higher viscosity than the cleaning solution is less likely to pass through the recess 5 and less likely to flow into the gap between the surface acoustic wave element 2 and the substrate 1.
The width of the recess 5 is not the length of the recess 5 in the frame 3, but the length to an edge of the surface acoustic wave element 2. When the width of the recess 5 is about 30 μm, and the gap between the frame 3 and the surface acoustic wave element 2 is about 10 μm, the length of the recess 5 in the frame 3 is only about 20 μm, for example.
The depth of the recess 5 is a length from the deepest portion of the recess 5 to one main surface of the surface acoustic wave element 2, not a length from the deepest portion of the recess 5 to the top surface of the frame 3. In other words, the frame 3 is not necessarily higher than the height to one main surface of the surface acoustic wave element 2, and may be lower than one main surface of the surface acoustic wave element 2.
The width of the recess 5 is not determined only by the size of the recess 5 in the frame 3 and varies depending on the gap between the frame 3 and the surface acoustic wave element 2. The gap between the frame 3 and the surface acoustic wave element 2 depends on the accuracy of how the surface acoustic wave element 2 is mounted on the substrate 1. Even if the surface acoustic wave element 2 can be mounted on the substrate 1 by self-alignment using the bumps 21 made of solder (solder bumps), variations in mounting generate an error in the width of the recess 5.
The depth of the recess 5 is not determined only by the size of the recess 5 in the frame 3 and varies depending on the height to one main surface of the surface acoustic wave element 2. The height to one main surface of the surface acoustic wave element 2 depends on the accuracy of how the surface acoustic wave element 2 is mounted on the substrate 1. Even if the bumps 21 have the same diameter, variations in mounting the surface acoustic wave element 2 on the substrate 1 generate an error in the depth of the recess 5.
The length of the recess 5 is determined only by the size of the recess 5 in the frame 3. Therefore, the length of the recess 5 is less subject to variations in mounting, and an error in the length of the recess 5 is unlikely to occur. The length of the recess 5 in the frame 3 is preferably less than about 30 μm, for example. When the length of the recess 5 is less than about 30 μm, a dimension of the recess 5 of less than about 30 μm among dimensions of the recess 5 is less subject to variations in mounting the surface acoustic wave element 2 on the substrate 1.
Next, preferable location areas of the recesses 5 in the frame 3 in forming the recesses 5 in the frame 3 will be described.
Since the recesses 5 are provided in the location areas in the frame 3, the effect of the bumps 21 can be avoided when the cleaning solution flows into or out of the gap between the surface acoustic wave element 2 and the substrate 1.
The recesses 5 can be provided in the frame 3 as long as they are in the location areas. Hereinafter, arrangement examples of the recesses 5 in the frame 3 will be described.
In a surface acoustic wave device 10a in
The frame 3 described above is illustrated as an integrally formed frame around the surface acoustic wave element 2, but is not limited to an integrally formed frame.
The frame 3 described above is illustrated as a frame including one layer made of a photosensitive material, but is not limited to a frame having one layer.
As described above, the electronic device (surface acoustic wave device 10) according to the present preferred embodiment includes the electronic component (surface acoustic wave element 2) that includes functional elements and bumps 21 on one main surface, the substrate 1 on which the electronic component including the bumps 21 is mounted by using the bumps 21 as joints, the frame 3 that is disposed on the substrate 1 to surround the electronic component in a plan view of the electronic component mounted on the substrate 1, and the sealing material 4 that seals the electronic component and seals a gap between the frame and the electronic component. The frame 3 includes at least one recess 5 adjacent to the electronic component.
In the electronic device according to the present preferred embodiment, the cleaning solution thus easily flows into a gap between the electronic component and the substrate 1 through the recess 5, and the cleaning solution that has flowed into the gap easily flows out through the recess 5. The frame 3 can prevent misalignment of the electronic component with respect to the substrate 1 when the electronic component is mounted on the substrate 1. The recess 5 in the frame 3 reduces continuity of the frame and can thus reduce or prevent deformation (e.g., warpage) of the frame.
Preferably, at least a portion of the recess 5 reaches the surface of the substrate 1, and the sealing material 4 is positioned along the recess 5 and in contact with the surface of the substrate 1. This configuration increases the bonding strength between the sealing material 4 and the substrate 1.
The frame 3 preferably includes multiple recesses 5. In particular, the multiple recesses 5 are each preferably provided on each of sides of the frame 3 that face each other with the electronic component interposed therebetween. With this configuration, the cleaning solution can more easily flow into a gap between the electronic component and the substrate 1, and the cleaning solution that has flowed into the gap can more easily flow out.
Areas in the frame 3 other than portions facing the portions where the bumps 21 are located are defined as location areas where the recesses 5 are located. With this configuration, the recesses 5 can be positioned so as not to be affected by the bumps 21.
When the length of one recess 5 is a length in a direction along the corresponding side of the frame 3, the width of the recess 5 is a length perpendicular or substantially perpendicular to the direction along the corresponding side of the frame 3 and extending to an edge of the electronic component, and the depth of the recess 5 is a length from the deepest portion to one main surface of the electronic component in a direction perpendicular or substantially perpendicular to the surface of the substrate 1, at least one of the length, the width, or the depth of the recess 5 is preferably less than about 30 μm, for example. This configuration can further prevent intrusion of the sealing material 4 into a gap between the electronic component and the substrate 1.
When the length of one recess 5 is a length in a direction along the corresponding side of the frame 3, the width of the recess 5 is a length perpendicular or substantially perpendicular to the direction along the corresponding side of the frame 3 and extending to an edge of the electronic component, and the depth of the recess 5 is a length from the deepest portion of the recess 5 to one main surface of the electronic component in a direction perpendicular or substantially perpendicular to the surface of the substrate 1, the length of the recess 5 is preferably less than about 30 μm, for example. Thus, a dimension of the recess 5 of less than about 30 μm among dimensions of the recess 5 is less subject to variations in mounting the electronic component on the substrate 1.
The frame 3 preferably includes multiple parts in a plan view of the frame 3. When the frame 3 includes multiple parts, the frame has low continuity and is less likely to deform (e.g., warp).
The frame 3 preferably includes multiple layers. This configuration increases the degree of freedom in producing the frame 3.
The bumps 21 are preferably solder bumps. The use of solder bumps facilitates face-down mounting of the electronic component on the substrate 1.
While preferred embodiments of the present invention have been described above, it is to be understood that variations and modifications will be apparent to those skilled in the art without departing from the scope and spirit of the present invention. The scope of the present invention, therefore, is to be determined solely by the following claims.
Number | Date | Country | Kind |
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2020-157432 | Sep 2020 | JP | national |
This application claims the benefit of priority to Japanese Patent Application No. 2020-157432 filed on Sep. 18, 2020 and is a Continuation Application of PCT Application No. PCT/JP2021/032820 filed on Sep. 7, 2021. The entire contents of each application are hereby incorporated herein by reference.
Number | Date | Country | |
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Parent | PCT/JP2021/032820 | Sep 2021 | US |
Child | 18108075 | US |