Electronic test probe

Follow

Information

Patent Grant
D311346

References
Source

Patent Number
D311,346
Date Filed
Friday, September 25, 1987
37 years ago
Date Issued
Tuesday, October 16, 1990
34 years ago

Inventors
- Robert F. Gross
Original Assignees
- QA Technologies, Inc.
Examiners
- Dunkins; Bruce W.
- Davis; Antoine D.
Agents
- Davis, Bujold & Streck

US Classifications
- D10 - Measuring, testing, or signalling instruments
Field of Search
- US
- D10 75-80
- 324 158 P
- Term of Grant
  14Years

Information

Abstract

Description

Claims

The ornamental design for electronic test probe, as shown and described.

US Referenced Citations (4)

Number	Name	Date	Kind
4397519	Cooney	Aug 1983
4461993	Glau	Jul 1984
4597622	Coe	Jul 1986
4659987	Coe et al.	Apr 1987

Foreign Referenced Citations (1)

Number	Date	Country
3103077	Aug 1982	DEX