Claims
- 1. A system for determining electrical properties of a subject material, said system comprising:
a microstrip antenna comprising:
a ground plane, an insulating material disposed on the ground plane in a plane thereof; and a microstrip antenna structure disposed on the insulating material; and an impedance measuring device coupled to the microstrip antenna structure to thereby enable detection of a change of impedance of the microstrip antenna structure.
- 2. The system as defined in claim 1 wherein the impedance measuring device is selected from the group of impedance measuring devices comprising a network analyzer, and impedance bridge, a time domain reflectometer, and a frequency domain reflectometer.
- 3. A method for determining electrical properties of a subject material utilizing a microstrip antenna, said method comprising the steps of:
(1) providing a microstrip antenna and an impedance measuring device, wherein the microstrip antenna is coupled to the impedance measuring device; (2) disposing the microstrip antenna adjacent to the subject material; (3) measuring a change in impedance of the microstrip antenna utilizing the impedance measuring device; and (4) correlating the change in impedance to a physical characteristic of the subject material.
- 4. The method as defined in claim 3 wherein the method further comprises the steps of:
(1) measuring a change in resonant frequencies of the sensor; and (2) correlating the change in resonant frequencies with physical properties of the subject material.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This document claims priority to, and incorporates by reference all of the subject matter included in the provisional patent application filed on Jul. 7, 2001, having serial No. 60/303,558, and in the provisional patent application filed on Apr. 1, 2002, having serial No. 60/369,006.
Provisional Applications (2)
|
Number |
Date |
Country |
|
60303558 |
Jul 2001 |
US |
|
60369006 |
Apr 2002 |
US |