This disclosure relates generally to energy production, more particularly, to energy harvesting for wearable technology through a thin, flexible thermoelectric device.
A thermoelectric device is able to directly convert heat (i.e. a temperature gradient) into electricity. If their efficiency may be increased and the operational temperatures reduced to near room temperature (300K), thermoelectric devices may begin to supplement or even supplant traditional power sources used in wearable or internet of things (IoT) devices. High thermal conductivity with lower electrical conductivity may prevent higher efficiency. Unfortunately, there are no single materials that possess simultaneously higher electrical conductivity and lower thermal conductivity. Low efficiency and high operating temperatures, combined with higher cost, prohibit current thermoelectric devices from wider market adoption.
Low efficiency may relegate thermoelectric devices to a few applications where their simplicity and ruggedness may outweigh the inefficiency, such as sensors and waste-heat-energy converters. The current market products are often used in conjunction with either heat sink or active cooling at high temperatures for industrial use cases. Additionally, the current state of the art thermoelectric devices are rigid and bulky, and are produced using complex processes which scale poorly, resulting in higher cost. As a result, current thermoelectric devices, being expensive, inefficient near room temperature, rigid, and bulky, are less than ideal for use in wearable or internet of things (IoT) devices.
Disclosed are a method and apparatus of energy harvesting for wearable technology through a thin flexible thermoelectric device. It will be appreciated that the various embodiments discussed herein need not necessarily belong to the same group of exemplary embodiments, and may be grouped into various other embodiments not explicitly disclosed herein. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the various embodiments. Accordingly, the specification and drawings are to be regarded in an illustrative rather than a restrictive sense.
In one aspect, a flexible thermoelectric device includes a lower dielectric layer and a lower conduction layer, where the lower conduction layer includes an electrically conductive pad. The device further includes an active layer, comprising a thin film thermoelectric conduit, wherein the thin film thermoelectric conduit is vacuum deposited on top of each electrically conductive pad using a mask. The device also includes an upper conduction layer, comprising an electrically conductive contact coupled to the top of each of the thin film thermoelectric conduits. Each of the thin film thermoelectric conduits includes a thermoelectric material, and the active layer further includes a thermal insulator filling a space around each of the thin film thermoelectric conduits.
The lower conduction layer and the upper conduction layer may further include an electrically conductive lead to bridge pairs of electrically conductive pads and to bridge pairs of electrically conductive contacts. The electrically conductive pads may be bridged and the electrically conductive contacts may be bridged such that all of the thin film thermoelectric conduits are connected in series. The electrically conductive pads may include an N-designated conductive pad and a P-designated conductive pads. The thin film thermoelectric conduit deposited on each N-designated conductive pad may be vacuum deposited through an N-designated mask and may include an N-type thermoelectric material. Furthermore, the thin film thermoelectric conduit deposited on each P-designated conductive pad may be vacuum deposited through a P-designated mask and may include a P-type thermoelectric material.
The flexible thermoelectric device may further include an internal dielectric layer on top of the active layer and an upper dielectric layer on top of the upper conduction layer. Each of the electrically conductive contacts may run through a contact hole drilled above each of the thin film thermoelectric conduits. Also, each contact hole may pass through the thermal insulator and/or the internal dielectric layer. A portion of the upper conduction layer may be between the internal dielectric layer and the upper dielectric layer. Additionally, the internal dielectric layer may be an electrical insulator and/or a poor thermal conductor. Finally, the upper dielectric layer and the lower dielectric layer may both be electrical insulators and/or good thermal conductors. The thin film thermoelectric conduit may include a thermoelectric material vacuum deposited no thicker than 50 microns.
The flexible thermoelectric device may include a barrier layer between different thermoelectric materials within a thin film thermoelectric conduit, an electrically conductive pad and a thin film thermoelectric conduit, and/or an electrically conductive contact and a thin film thermoelectric conduit. The barrier layer may be electrically conductive and may have a higher melting temperature than either of the substances being separated by the barrier layer.
The electrically conductive pads may include a metal cladding, a vacuum deposited metal, a conductive paste, an electroplated layer, and/or a surface plating layer. Furthermore, the electrically conductive contacts may include a conductive paste, an electroplated layer, and/or a surface plating layer. Finally, the thin film thermoelectric conduit and/or the lower conduction layer may be annealed before the upper conduction layer is applied.
In another aspect, a method of producing a flexible thermoelectric device includes creating a lower conduction layer including a plurality of electrically conductive pads and a electrically conductive lead on a lower dielectric layer. The plurality of electrically conductive pads include N-designated conductive pads and P-designated conductive pads. The method also includes aligning an N-designated mask with the lower conduction layer such that the N-designated conductive pads are exposed through the N-designated mask, and vacuum depositing an N-type conduit on top of each of the N-designated conductive pads exposed through the N-designated mask. The method further includes aligning a P-designated mask with the lower conduction layer such that the P-designated conductive pads are exposed through the P-designated mask, and vacuum depositing a P-type conduit on top of each of the P-designated conductive pads exposed through the P-designated mask.
The method of producing a flexible thermoelectric device includes laminating a thermal insulator and an internal dielectric layer on top of the N-type conduits and P-type conduits, such that the thermal insulator fills a space around each N-type conduit and P-type conduit. The method also includes drilling a contact hole through the internal dielectric layer and thermal insulator above each N-type conduit and each P-type conduit. The method further includes creating an upper conduction layer, including an electrically conductive contact coupled to the top of each N-type conduit and P-type conduit, and an electrically conductive lead. The electrically conductive contacts run through the contact holes. Finally, the method includes affixing an upper dielectric layer on top of the upper conduction layer.
A portion of the upper conduction layer is between the internal dielectric layer and the upper dielectric layer. The N-type conduits are thin film thermoelectric conduits including at least one N-type thermoelectric material. Furthermore, the P-type conduits are thin film thermoelectric conduits including at least one P-type thermoelectric material. Finally, pairs of electrically conductive pads are bridged with electrically conductive leads and pairs of electrically conductive contacts are bridged with electrically conductive leads such that all of the thin film thermoelectric conduits are connected in series.
The internal dielectric layer may be an electrical insulator and/or a poor thermal conductor. The upper dielectric layer and the lower dielectric layer may both be electrical insulators and/or good thermal conductors. Also, the thin film thermoelectric conduits may include a thermoelectric material vacuum deposited no thicker than 50 microns.
The method of producing a flexible thermoelectric device may further include vacuum depositing a barrier layer through the N-designated mask and/or the P-designated mask such that the barrier layer is between different thermoelectric materials within a thin film thermoelectric conduit, an electrically conductive pad and a thin film thermoelectric conduit, and/or an electrically conductive contact and a thin film thermoelectric conduit. The barrier layer may be electrically conductive and/or has a higher melting temperature than either of the substances being separated by the barrier layer.
The method may include applying a resist to the lower dielectric layer using a lower conduction mask. The lower dielectric layer may be metal-clad, and the lower conduction layer may be created by etching the lower dielectric layer to remove exposed metal-cladding and/or removing the resist. The lower conduction layer, the N-type conduits and the P-type conduit may be annealed before the upper conduction layer is applied. Finally, the aligning of the N-designated mask, the vacuum depositing of the N-type conduit, the aligning of the P-designated mask, and/or the vacuum depositing of the P-type conduit, may all be accomplished within the same vacuum system while continuing to maintain a vacuum.
In yet another aspect, a flexible thermoelectric device includes a lower dielectric layer and a lower conduction layer, which includes an electrically conductive pad on the lower dielectric layer. The device also includes an active layer, including a thin film thermoelectric conduit. The thin film thermoelectric conduit is affixed on top of each electrically conductive pad. The device further includes an internal dielectric layer on top of the active layer, and an upper conduction layer, including an electrically conductive contact coupled to the top of each of the thin film thermoelectric conduits.
Finally, the device includes an upper dielectric layer on top of the upper conduction layer. Each of the thin film thermoelectric conduits includes a thermoelectric material. The active layer further includes a thermal insulator filling at least the space around each of the thin film thermoelectric conduits. Also, the lower conduction layer and the upper conduction layer further include at least one electrically conductive lead to bridge pairs of electrically conductive pads and to bridge pairs of electrically conductive contacts. The electrically conductive pads are bridged and the electrically conductive contacts are bridged such that all of the thin film thermoelectric conduits are connected in series.
The electrically conductive pads include an N-designated conductive pad and a P-designated conductive pad. Additionally, the thin film thermoelectric conduit affixed to each N-designated conductive pad includes an N-type thermoelectric material, and the thin film thermoelectric conduit affixed to each P-designated conductive pad includes a P-type thermoelectric material. Also, each of the electrically conductive contacts runs through a contact hole drilled above each of the thin film thermoelectric conduits. Each contact hole passes through the thermal insulator and the internal dielectric layer. Finally, a portion of the upper conduction layer is between the internal dielectric layer and the upper dielectric layer. The internal dielectric layer is an electrical insulator and a poor thermal conductor, while the upper dielectric layer and the lower dielectric layer are both electrical insulators and good thermal conductors.
The flexible thermoelectric device may also include a thermal adhesive layer affixed to the upper dielectric layer and/or the lower dielectric layer, to adhere the flexible thermoelectric device to a target platform. The thermal adhesive layer may have a coefficient of thermal expansion compatible with the target platform, such that adhesion may not be compromised due to thermal expansion while the target platform is within an intended temperature range. The target platform may be a wearable device, a clothing, a jewelry, a sensor, a handheld device, and/or a building material.
The methods and apparatus disclosed herein may be implemented in any means for achieving various aspects. Other features will be apparent from the accompanying drawings and from the detailed description that follows.
The embodiments of this invention are illustrated by way of example and not limitation in the Figures of the accompanying drawings, in which like references indicate similar elements and in which:
Other features of the present embodiments will be apparent from the accompanying drawings and from the detailed description that follows.
Example embodiments, as described below, may be used to provide a method and/or an apparatus of voltage generation across temperature differentials through a thin film thermoelectric device. Although the present embodiments have been described with reference to specific example embodiments, it will be evident that various modifications and changes may be made to these embodiments without departing from the broader spirit and scope of the various embodiments.
In one embodiment, a flexible thermoelectric device 100 includes a lower dielectric layer 108 and a lower conduction layer 104, where the lower conduction layer 104 includes an electrically conductive pad 110. The device further includes an active layer 101, comprising a thin film thermoelectric conduit 102, wherein the thin film thermoelectric conduit 102 is vacuum deposited on top of each electrically conductive pad 110 using a mask. The device also includes an upper conduction layer 106, comprising an electrically conductive contact 114 coupled to the top of each of the thin film thermoelectric conduits 102. Each of the thin film thermoelectric conduits 102 includes a thermoelectric material 118, and the active layer 101 further includes a thermal insulator 112 filling a space around each of the thin film thermoelectric conduits 102.
The lower conduction layer 104 and the upper conduction layer 106 may further include an electrically conductive lead 116 to bridge pairs of electrically conductive pads 110 and to bridge pairs of electrically conductive contacts 114. The electrically conductive pads 110 may be bridged and the electrically conductive contacts 114 may be bridged such that all of the thin film thermoelectric conduits 102 are connected in series. The electrically conductive pads 110 may include an N-designated conductive pad 206 and a P-designated conductive pad 208. The thin film thermoelectric conduit 102 deposited on each N-designated conductive pad 206 may be vacuum deposited through an N-designated mask 302 and may include an N-type thermoelectric material 210. Furthermore, the thin film thermoelectric conduit 102 deposited on each P-designated conductive pad 208 may be vacuum deposited through a P-designated mask 304 and may include a P-type thermoelectric material 212.
The flexible thermoelectric device 100 may further include an internal dielectric layer 203 on top of the active layer 101 and an upper dielectric layer 204 on top of the upper conduction layer 106. Each of the electrically conductive contacts 114 may run through a contact hole 220 drilled above each of the thin film thermoelectric conduits 102. Also, each contact hole 220 may pass through the thermal insulator 112 and/or the internal dielectric layer 203. A portion of the upper conduction layer 106 may be between the internal dielectric layer 203 and the upper dielectric layer 204. Additionally, the internal dielectric layer 203 may be an electrical insulator and/or a poor thermal conductor. Finally, the upper dielectric layer 204 and the lower dielectric layer 108 may both be electrical insulators and/or good thermal conductors. The thin film thermoelectric conduit 102 may include a thermoelectric material 118 vacuum deposited no thicker than 50 microns.
The flexible thermoelectric device 100 may include a barrier layer 218 between different thermoelectric materials within a thin film thermoelectric conduit 102, an electrically conductive pad 110 and a thin film thermoelectric conduit 102, and/or an electrically conductive contact 114 and a thin film thermoelectric conduit 102. The barrier layer 218 may be electrically conductive and may have a higher melting temperature than either of the substances being separated by the barrier layer 218.
The electrically conductive pads 110 may include a metal cladding (e.g. the metal cladding 214 of
In another embodiment, a method of producing a flexible thermoelectric device 100 includes creating a lower conduction layer 104 including a plurality of electrically conductive pads 110 and an electrically conductive lead 116 on a lower dielectric layer 108. The plurality of electrically conductive pads 110 include N-designated conductive pads 206 and P-designated conductive pads 208. The method also includes aligning an N-designated mask 302 with the lower conduction layer 104 such that the N-designated conductive pads 206 are exposed through the N-designated mask 302, and vacuum depositing an N-type conduit 200 on top of each of the N-designated conductive pads 206 exposed through the N-designated mask 302. The method further includes aligning a P-designated mask 304 with the lower conduction layer 104 such that the P-designated conductive pads 208 are exposed through the P-designated mask 304, and vacuum depositing a P-type conduit 202 on top of each of the P-designated conductive pads 208 exposed through the P-designated mask 304.
The method of producing a flexible thermoelectric device 100 includes laminating a thermal insulator 112 and an internal dielectric layer 203 on top of the N-type conduits 200 and P-type conduits 202, such that the thermal insulator 112 fills a space around each N-type conduit 200 and P-type conduit 202. The method also includes drilling a contact hole 220 through the internal dielectric layer 203 and thermal insulator 112 above each N-type conduit 200 and each P-type conduit 202. The method further includes creating an upper conduction layer 106, including an electrically conductive contact 114 coupled to the top of each N-type conduit 200 and P-type conduit 202, and an electrically conductive lead 116. The electrically conductive contacts 114 run through the contact holes 220. Finally, the method includes affixing an upper dielectric layer 204 on top of the upper conduction layer 106.
A portion of the upper conduction layer 106 is between the internal dielectric layer 203 and the upper dielectric layer 204. The N-type conduits 200 are thin film thermoelectric conduits 102 including at least one N-type thermoelectric material 210. Furthermore, the P-type conduits 202 are thin film thermoelectric conduits 102 including at least one P-type thermoelectric material 212. Finally, pairs of electrically conductive pads 110 are bridged with electrically conductive leads 116 and pairs of electrically conductive contacts 114 are bridged with electrically conductive leads 116 such that all of the thin film thermoelectric conduits 102 are connected in series.
The internal dielectric layer 203 may be an electrical insulator and/or a poor thermal conductor. The upper dielectric layer 204 and the lower dielectric layer 108 may both be electrical insulators and/or good thermal conductors. Also, the thin film thermoelectric conduits 102 may include a thermoelectric material 118 vacuum deposited no thicker than 50 microns.
The method of producing a flexible thermoelectric device 100 may further include vacuum depositing a barrier layer 218 through the N-designated mask 302 and/or the P-designated mask 304 such that the barrier layer 218 is between different thermoelectric materials within a thin film thermoelectric conduit 102, an electrically conductive pad 110 and a thin film thermoelectric conduit 102, and/or an electrically conductive contact 114 and a thin film thermoelectric conduit 102. The barrier layer 218 may be electrically conductive and/or has a higher melting temperature than either of the substances being separated by the barrier layer 218.
The method may include applying a resist 604 to the lower dielectric layer 108 using a lower conduction mask 300. The lower dielectric layer 108 may be metal-clad, and the lower conduction layer 104 may be created by etching the lower dielectric layer 108 to remove exposed metal-cladding and/or removing the resist 604. The lower conduction layer 104, the N-type conduits 200 and the P-type conduit 202 may be annealed before the upper conduction layer 106 is applied. Finally, the aligning of the N-designated mask 302, the vacuum depositing of the N-type conduit 200, the aligning of the P-designated mask 304, and/or the vacuum depositing of the P-type conduit 202, may all be accomplished within the same vacuum system 612 while continuing to maintain a vacuum 614.
In yet another embodiment, a flexible thermoelectric device 100 includes a lower dielectric layer 108 and a lower conduction layer 104, which includes an electrically conductive pad 110 on the lower dielectric layer 108. The device also includes an active layer 101, including a thin film thermoelectric conduit 102. The thin film thermoelectric conduit 102 is affixed on top of each electrically conductive pad 110. The device further includes an internal dielectric layer 203 on top of the active layer 101, and an upper conduction layer 106, including an electrically conductive contact 114 coupled to the top of each of the thin film thermoelectric conduits 102.
Finally, the device includes an upper dielectric layer 204 on top of the upper conduction layer 106. Each of the thin film thermoelectric conduits 102 includes a thermoelectric material 118. The active layer 101 further includes a thermal insulator 112 filling at least the space around each of the thin film thermoelectric conduits 102. Also, the lower conduction layer 104 and the upper conduction layer 106 further include at least one electrically conductive lead 116 to bridge pairs of electrically conductive pads 110 and to bridge pairs of electrically conductive contacts 114. The electrically conductive pads 110 are bridged and the electrically conductive contacts 114 are bridged such that all of the thin film thermoelectric conduits 102 are connected in series.
The electrically conductive pads 110 include an N-designated conductive pad 206 and a P-designated conductive pad 208. Additionally, the thin film thermoelectric conduit 102 affixed to each N-designated conductive pad 206 includes an N-type thermoelectric material 210, and the thin film thermoelectric conduit 102 affixed to each P-designated conductive pad 208 includes a P-type thermoelectric material 212. Also, each of the electrically conductive contacts 114 runs through a contact hole 220 drilled above each of the thin film thermoelectric conduits 102. Each contact hole 220 passes through the thermal insulator 112 and the internal dielectric layer 203. Finally, a portion of the upper conduction layer 106 is between the internal dielectric layer 203 and the upper dielectric layer 204. The internal dielectric layer 203 is an electrical insulator and a poor thermal conductor, while the upper dielectric layer 204 and the lower dielectric layer 108 are both electrical insulators and good thermal conductors.
The flexible thermoelectric device 100 may also include a thermal adhesive layer affixed to the upper dielectric layer 204 and/or the lower dielectric layer 108, to adhere the flexible thermoelectric device 100 to a target platform 700. The thermal adhesive layer may have a coefficient of thermal expansion compatible with the target platform 700, such that adhesion may not be compromised due to thermal expansion while the target platform 700 is within an intended temperature range. The target platform 700 may be a wearable device, a clothing, a jewelry, a sensor, a handheld device, and/or a building material.
The flexible thermoelectric device 100 may be a flexible device which converts heat (i.e. a temperature differential) directly into electrical energy. Furthermore, applying a current to a thermoelectric device may create a temperature differential, which may be used to heat or cool a surface.
The active layer 101 may be a portion of the flexible thermoelectric device 100 which comprises thermoelectric materials. In some embodiments, the active layer 101 may further comprise materials and/or components which are not thermoelectric or electrically conductive.
The thin film thermoelectric conduit 102 may be a layer of thermoelectric material 118 or a stack of layered materials which comprises thermoelectric materials 118. In one embodiment, some or all of these layers may be applied or deposited as a thin film, whose thickness may range from sub-nanometer to micrometers. The lower conduction layer 104 and the upper conduction layer 106 may be layers within the flexible thermoelectric device 100 which are comprised of electrically conductive material electrically coupled to thin film thermoelectric conduits 102. In various embodiments, the thin film thermoelectric conduit 102 may be incorporated into the flexible thermoelectric device 100 in such a way that it serves as a conduit for heat from one side of the device to the other.
The lower dielectric layer 108 may be a flexible dielectric material which provides structure to the flexible thermoelectric device 100. In various embodiments, the lower dielectric layer 108 may be a flexible polymer material which has a high thermal conductivity, and is also electrically insulating. Examples include, but are not limited to, polyimide which has been doped to increase thermal conductivity. In some embodiments, the lower dielectric layer 108 may be between 1 millimeter and 10 millimeters thick. The lower dielectric layer 108 may also be metal-clad, such as copper-clad Kapton tape. The lower dielectric layer 108 should be chosen such that it will not melt at the temperatures associated with the production of the flexible thermoelectric device 100 (e.g. the high temperatures associated with sputter deposition, etc.).
An electrically conductive pad 110 may be a flat area which may be affixed to a material or component, or to which a material or component may be affixed to make an electrical connection. A thermal insulator 112 may be a material which reduces the conduction of thermal energy. In the context of the present description, the thermal insulator 112 may also be electrically insulating. The thermal insulator 112 may be a cross-linked polymer adhesive, such as prepeg or other resins with similar properties.
An electrically conductive contact 114 may be a conductive element in electrical contact with a material or component. In some embodiments, the electrically conductive contact 114 may resemble a pin. In other embodiments, the electrically conductive contact 114 may be flat, like an electrically conductive pad 110.
An electrically conductive lead 116 may a conducting material which connect two points of a circuit together. In one embodiment, the electrically conductive lead 116 may be a conducting material applied directly to a surface (e.g. etched cladding, vacuum deposition, surface plating, electroplating, etc.). In another embodiment, the electrically conductive lead 116 may be a wire.
A thermoelectric material 118 may be a material which converts a temperature gradient directly into electrical energy, and visa versa. Example thermoelectric materials 118 include, but are not limited to, Bi2Te3, ZnSb, PbTe, Zn4Sb3, AgPb18SbTe20 filled skutterudites, Bi2Te3/Sb2Te3 Superlattices, PbSeTe/PbTe quantum dots, Si1−xGex, CsBi4Te6, AgPbmSbTe2+m, Yb0.19Co4Sb12, and CeFe4−xCoxSb12.
A thermoelectric device, e.g. the flexible thermoelectric device 100 of
Thermoelectric power generation may be a means of generating power by converting thermal energy into electric energy. The efficiency (η) of converting thermal energy into electric energy of the thermoelectric conversion material depends on the ZT value (ZT) of the thermoelectric conversion material. The thermoelectric device may be a heat engine and hence limited by Carnot efficiency {ηc=(TH−TC)/TH}. The ZT value (ZT) is determined by the equation, ZT=(α2σT/K), according to the Seebeck coefficient α, also referred to as “thermoelectric coefficient”, electric conductivity (σ), thermal conductivity (K) of the thermoelectric material, and absolute temperature (T).
The flexible thermoelectric device 100 may reduce thermal conductivity while facilitating use in a number of applications. As shown in
As shown in exploded device view 150 of
A N-type conduit 200 may be a layer or a stack of layered materials within the flexible thermoelectric device 100 which is comprised, at least in part, of one or more thermoelectric materials 118 in which the primary charge carrier is electrons. According to various embodiments, an N-type conduit 200 may comprise thin film N-type thermoelectric materials 210, conductive materials, barrier layers 218, and/or conductive adhesive layers 400.
A P-type conduit 202 may be a layer or a stack of layered materials within the flexible thermoelectric device 100 which is comprised, at least in part, of one or more thermoelectric materials 118 in which the primary charge carrier is positive holes. According to various embodiments, a P-type conduit 202 may comprise thin film P-type thermoelectric materials 212, conductive materials, barrier layers 218, and/or conductive adhesive layers 400.
An internal dielectric layer 203 may be a flexible dielectric material which has poor thermal conductivity and is also electrically insulating. Examples include, but are not limited to, Teflon. An upper dielectric layer 204 may be a flexible dielectric material which provides structure to the flexible thermoelectric device 100. In various embodiments, the upper dielectric layer 204 may have a high thermal conductivity, and is also electrically insulating. In some embodiments, the upper dielectric layer 204 may be identical to the lower dielectric layer 108.
A N-designated conductive pad 206 may be a conductive pad which is intended to connect an N-type conduit 200 in series with other thermoelectric layers. Similarly, a P-designated conductive pad 208 may be a conductive pad which is intended to connect a P-type conduit 202 in series with other thermoelectric layers. In some embodiments, these two types of pads may possess identical materials and properties, and may differ only in appearance, to aid in device construction and testing. For example, in one embodiment, the N-designated and P-designated conductive pads may simply be given different shapes to indicate the material type.
In other embodiments, however, these two pad types may differ in more substantial ways. For example, in one embodiment, the N-designated and P-designated conductive pads may be composed of different conductive materials which are optimized for the N-type and P-type conduits to be deposited upon them (e.g. have a similar crystal structure, etc.). In such an embodiment, the N-designated and P-designated conductive pads 208 may be created using N-designated and P-designated masks, and may be affixed to interconnected conductive pads.
A N-type thermoelectric material 210 may be a thermoelectric material 118 in which the primary charge carrier is electrons. A P-type thermoelectric material 212 may be a thermoelectric material 118 in which the primary charge carrier is positive holes. A metal cladding 214 may be a metallic electroplating applied to a polymer sheet. Examples include, but are not limited to, copper-clad Kapton tape. In some embodiments, the metal cladding 214 may be removed from the polymer sheet using resist 604 and an etchant 608.
A surface plating layer 216 may be a conductive layer applied to a solid material using a chemical technique. Examples include, but are not limited to, electroless nickel immersion gold (i.e. ENIG), and solder (i.e. HASL, or hot air solder leveling).
A barrier layer 218 may be a layer of material which prevents the corruption (e.g. diffusion, sublimation, etc.) of one layer by another, according to one embodiment. It may also be known as a diffusion barrier. In many embodiments, a diffusion barrier may be a thin layer (e.g. micrometers thick) of metal sometimes placed between two other metals. It is done to act as a barrier to protect either one of the metals from corrupting the other. Example barrier layer 218 materials include, but are not limited to, cobalt, nickel, tungsten, ruthenium, tantalum, tantalum nitride, indium oxide, tungsten nitride, and titanium nitride.
In some embodiments, the barrier layer 218 may consist of material with very low thermal conductivity and very high electrical conductivity. Inclusion of a barrier layer 218 of this nature may serve to improve the thermoelectric performance by reducing thermal conductivity, which in turn preserves a larger temperature differential, without sacrificing electrical conductivity. In some embodiments, a barrier layer 218 may serve as both a diffusion barrier and a thermal barrier. Example barrier layer materials with these properties include, but are not limited to, Indium Antimonide (InSb) and other skutterides, which have low thermal conductivity and high electrical conductivity.
The contact hole 220 may be a passage created through material which separates the electrically conductive leads 116 of the upper conduction layer 106 and the thin film thermoelectric conduits 102 of the active layer 101. Specifically, the contact hole 220 may be a passage through the thermal insulator 112 and/or internal dielectric layer 203 which is on top of a thin film thermoelectric conduit 102. In various embodiments, the contact hole 220 may be formed by drilling through the material above a thin film thermoelectric conduit 102, either mechanically or using a laser.
A conductive paste 222 may be a powdered metal compound suspended in a viscous medium. Examples include, but are not limited to, silver or other conductive ink, silver paste, and solder paste. In various embodiments, a conductive paste 222 may be applied using a screen printing process, where the paste is applied using a mask or stencil.
A vacuum deposited metal may be a metal layer deposited using a vacuum deposition process. A vacuum deposition process may be a process in which layers of material are deposited on a solid surface atom-by-atom or molecule-by-molecule, at a pressure well below atmospheric pressure. One example of a vacuum deposition process is sputtering, or sputter deposition, where atoms are ejected from a solid target material due to the bombardment of the target by energetic particles, such as electrons or highly charged ions. Sputter deposition is a physical vapor deposition method for creating thin films. Other examples of vacuum deposition processes include, but are not limited to, laser ablation, chemical vapor deposition, an cathode arc vaporization.
An electroplated layer may be a conduction layer which is created in a process that uses an electric current to reduce dissolved metal cations to form a metal coating on an electrode. This process is known as electroplating, or electrodeposition. An intended temperature range may be a range of temperatures within which it is foreseeable that a device may be operated. A coefficient of thermal expansion describes how the size of an object changes with a change in temperature.
A screen printed layer may be a conduction layer which is created by depositing a viscous conductive material over a mask or stencil (e.g. the lower conduction mask 300 of
As shown, the N-type conduits 200 and the P-type conduits 202 are electrically connected to the electrically conductive pads 110 and electrically conductive contacts 114 which make up the upper conduction layer 106 and the lower conduction layer 104. These pads and contacts are in turn connected through electrically conductive leads 116, resulting in the thin film thermoelectric conduits 102 (e.g. N-type conduits 200, P-type conduits 202, etc.) being connected to each other in series.
The flexible thermoelectric device 100 shown in cross sectional device view 250 of
Magnified view 270 offers a closer look at an exemplary portion of a flexible thermoelectric device 100, according to one embodiment. As shown, the lower conduction layer 104 comprises a lower dielectric layer 108 with metal cladding 214. The metal cladding 214 has been selectively removed using etching, and was then covered with a surface plating layer 216, which may be used for superior electrical conductivity, or possibly because it is more amenable to bonding with the subsequent layer.
As shown in magnified view 270, a number of barrier layers 218 are employed in this example of a flexible thermoelectric device 100. Specifically, there is a barrier layer 218 between the surface plating of the lower conduction layer 104 and the first P-type thermoelectric material 212 (e.g. P-type thermoelectric material 212A). This may prevent the elements and compounds within the surface plating layer 216 from leaching into the thermoelectric material 118, possibly altering its properties. Additional barrier layers 218 are used to separate two different thermoelectric materials 118, as well as the second thermoelectric material 118 and the upper conduction layer 106, here comprising screen printed conductive paste 222. In various embodiments, a barrier layer 218 may be used to prevent the leaching or sublimation of neighboring layers or materials.
A mask (e.g. the lower conduction mask 300 of
A lower conduction mask 300 is a mask which may be used to depose conductive material to create electrically conductive pads 110 and/or electrically conductive leads 116 which bridge electrically conductive pads 110. An N-designated mask 302 may be a mask which may be used to depose material to form one or more N-type conduits 200. A P-designated mask 304 may be a mask which may be used to depose material to form one or more P-type conduits 202.
An upper conduction mask 306 is a mask which may be used to deposit conductive material to create electrically conductive contacts 114 and/or electrically conductive leads 116 which bridge electrically conductive contacts 114.
The various layers of the flexible thermoelectric device 100 of
A conductive adhesive layer 400 may be a thin layer of electrically conductive material which assists in the bonding of one material (e.g. a thermoelectric material 118, a conductive material, a barrier material, etc.) with another material or layer. The conductive adhesive layer 400 may be an epoxy, a polymer film, a metallic compound applied as a thin film, and/or a material with a crystal structure which is intermediate to that of the two surrounding substances. It should be noted that, in
Where two layers or substances require adhesion, maybe because the materials may not be amenable to adhesion through other methods, a conductive adhesive may be introduced to attach them, according to one embodiment. In another embodiment, the physical process of annealing may allow the substances to adhere, where the materials of those layers may allow welding. In some embodiments, cold pressing and annealing may be employed to get the right properties for a higher ZT value of the device depending on the material system. For example, a composite device containing Bismuth Telluride may be annealed in vacuum or inert atmosphere around 300 degrees Celsius.
In operation 502, a lower conduction layer 104 may be created, comprising a plurality of pads and at least one electrically conductive lead 116 on a lower dielectric layer 108. The plurality of electrically conductive pads 110 may comprise N-designated conductive pads 206 and P-designated conductive pads 208, according to various embodiments.
In operation 504, an N-designated mask 302 may be aligned with the lower conduction layer 104 such that the N-designated conductive pads 206 are exposed through the N-designated mask 302. In operation 506, an N-type conduit 200 may be vacuum deposited on top of each of the N-designated conductive pads 206 exposed through the N-designated mask 302. The N-type conduit 200 comprises at least one N-type thermoelectric material 210.
In operation 508, a P-designated mask 304 may be aligned with the lower conduction layer 104 such that the P-designated conductive pads 208 are exposed through the P-designated mask 304. In operation 510, a P-type conduit 202 may be vacuum deposited on top of each of the P-designated conductive pads 208 exposed through the P-designated mask 304. The P-type conduit 202 comprises at least one P-type thermoelectric material 212.
In operation 512, a thermal insulator 112 and an internal dielectric layer 203 may be laminated on top of the N-type conduits 200 and P-type conduits 202, such that the thermal insulator 112 fills at least a space around each N-type conduit 200 and P-type conduit 202. In the context of the present description, lamination may refer to a process which comprises the application of a layered material using heat and/or pressure. As a specific example, a sheet of prepeg (e.g. a thermal insulator 112) may be applied on top of the thin film thermoelectric conduits 102, followed by a sheet of Teflon (e.g. an internal dielectric layer 203). The entire device is pressed at 150 degrees Celsius, until the prepeg has filled all of the space around the thin film thermoelectric conduits 102.
In operation 514, a contact hole 220 may be drilled through the internal dielectric layer 203 and thermal insulator 112 above each N-type conduit 200 and each P-type conduit 202. In the context of the present description, drilling may refer to a process of creating a hole or channel. In one embodiment, the drilling may be performed using a laser drilling system.
In operation 516, an upper conduction layer 106 may be created, comprising an electrically conductive contact 114 coupled to the top of each N-type conduit 200 and P-type conduit 202, and at least one electrically conductive lead 116. The electrically conductive contacts 114 may run through the contact holes 220, according to various embodiments. In operation 518, an upper dielectric layer 204 may be affixed on top of the upper conduction layer 106. In one embodiment, affixing may refer to adhering two surfaces together using a thermal adhesive, such as prepeg or a similar resin.
According to various embodiments, a portion of the upper conduction layer 106 may be between the internal dielectric layer 203 and the upper dielectric layer 204. Furthermore, pairs of electrically conductive pads 110 may be bridged with electrically conductive leads 116, and pairs of electrically conductive contacts 114 may be bridged with electrically conductive leads 116, such that all of the thin film thermoelectric conduits 102 are connected in series.
A metal-clad lower dielectric layer 600 may be a lower dielectric layer material which has been electroplated with a metallic compound (e.g. copper-clad Kapton tape, etc.). A resist station 602 may be a station or system which may be used to apply resist 604 to a metal-clad lower dielectric layer 108 for the purpose of etching a pattern in the metal cladding 214. In some embodiments, the resist station 602 may be automated, as part of an in-line process for efficiently producing flexible thermoelectric devices 100.
In one embodiment, the resist station 602 may apply resist 604 to the metal-clad lower dielectric layer 108, then align a lower conduction mask 300. Once the lower conduction mask 300 is aligned, the resist 604 may be exposed to a particular wavelength of light (e.g. ultraviolet, etc.) to cure the exposed resist, after which the uncured resist is washed off. Another method for applying resist 604 is the use of silk screening methods to apply the resist 604 only to areas where the cladding is desired. These and other methods of applying resist 604 in preparation for etching are known in the microfabrication industry.
A resist 604, or photoresist, may be a chemical which is able to withstand an etchant 608. In some instances, the resist 604 may be light sensitive, for use in photolithography. In other embodiments, the resist 604 may be compatible with a silk screen process, to apply the resist 604 in a particular pattern to create, at least in part, the lower conduction layer 104.
An etching station 606 may be a station or system which may expose a metal-clad lower dielectric layer 108 to an etchant 608 to remove metal cladding 214 not protected by cured resist 604, according to one embodiment. The etching station 606 may be automated, as part of an in-line process for efficiently producing flexible thermoelectric devices 100. An etchant 608 may be an acid or corrosive chemical used in etching.
A surface plating station 610 may be a station or system for applying a conductive layer of surface plating. A vacuum 614 be a space or container from which the air has been completely or partially removed. In the context of the present description, a vacuum 614 may refer to a reduction of air pressure to a level needed for vacuum deposition.
A vacuum system 612 may be a system of containers and pumps which may achieve a vacuum 614. In the context of the present description, a vacuum system 612 may refer to a series of chambers which are all part of the same vacuum 614. An airlock 616 may be a chamber which allows the input and output of materials (e.g. flexible thermoelectric devices 100, etc.) to a vacuum system 612 without requiring the breaking and restoration of the vacuum 614 for the entire system. An interlock 618 may be a chamber or aperture which may be used to separate two chambers within a vacuum system 612. The interlocks 618 may be used to prevent contamination between chambers (e.g. prevents material from a deposition chamber 622 from entering an alignment chamber, etc.).
A mask alignment chamber 620 may be a chamber within a vacuum system 612 where a mask may be aligned with an object (e.g. a lower dielectric layer 108, etc.). In various embodiments, the mask alignment may be accomplished in an automated manner. A deposition chamber 622 may be a chamber within a vacuum system 612 where the deposition of materials may be performed using a vacuum deposition method.
A vacuum deposition device 624 may be a device which may be used to deposit layers of material atom-by-atom or molecule-by-molecule, at pressures well below atmospheric pressure. For example, for the vacuum deposition process known as sputtering, the deposition device bombards a solid target with energetic particles such that atoms are ejected and deposited on a solid surface. An annealing chamber 626 may be a chamber within a vacuum system 612 where annealing (e.g. controlled heating and cooling of a material to change properties, etc.) may be performed.
In the context of the present description, a lamination station 628 may refer to a station or system which applies and/or adheres one or more layers of material onto another surface using heat, pressure, and/or adhesive. As a specific example, the lamination station 628 may be used to apply a layer of thermal insulator 112 (e.g. a sheet of prepeg, etc.) and an internal dielectric layer 203 (e.g. a sheet of Teflon, etc.) on top of a partially assembled device (e.g. on top of the thin film thermoelectric conduits 102, etc.). Thereafter, pressure and heat are applied until the thermal insulator 112 has filled the space surrounding the thin film thermoelectric conduits 102.
The drilling station 630 may be a station of system which may create holes or channels in an object. The drilling may be accomplished through a variety of methods, including but not limited to, laser drilling and mechanical drilling. The screen printing station 632 may be a station where a conductive paste 222 or other conductive material may be applied in a predefined pattern using a mask or stencil, according to various embodiments. The packaging station 634 may be a station where the packaging of a flexible thermoelectric device 100 may be packaged by affixing an upper dielectric layer 204 on top of the internal dielectric layer 203 and/or upper conduction layer 106.
As shown, once the lower conduction layer 104 has been created, it is introduced to the vacuum system 612 through an airlock 616, to reduce the amount of evacuation needed for each breach of the vacuum 614. Each of the chambers is separated by an interlock 618, which may be opened to allow a flexible thermoelectric device 100, at various stages of assembly, to pass through, and then closed to confine the materials associated with the various depositions from contaminating other chambers or devices.
As depicted in
In some cases, a flexible thermoelectric device 100 may need to be annealed, to improve the thermoelectric properties, or possibly the mechanical properties, of the thermoelectric device. According to one embodiment, this may be done in the annealing chamber 626. As an option, this may be done before the application of the upper conduction layer 106, to avoid leaching of the conducting materials into the thermoelectric materials 118. In some circumstances (e.g. barrier layers 218 are being used, etc.), it may not be necessary to delay the application of the upper conduction layer 106 until after annealing.
As depicted in
The production of the flexible thermoelectric device 100 by these means may optimize crystallinity in the physical structure of the flexible thermoelectric device 100, control grain growth, and maintain structural control. The flexible thermoelectric device 100 may be manufactured with these variables in mind and the production of the flexible thermoelectric device 100 may allow the manufacturer to control for these variables according the optimal parameters.
Additionally, according to one embodiment, the flexible thermoelectric device 100 has no size restrictions and thus lends itself to scaling. The flexible thermoelectric device 100 may be sized according to the application.
A temperature 702 may be a comparative measurement of the heat present in an object, or part of an object. A temperature gradient 704 may be an increase or decrease in the temperature 702 observed in passing from one point to another. A voltage 706 may be an electric energy charge difference of electric potential energy transported between two points. An internal resistance 708 may be the resistance which accounts for the voltage drop which occurs when a current is being driven by a power source.
When there may be a temperature gradient 704 through the flexible thermoelectric device 100, with decreasing temperatures 702 at points along the depth of the device, the voltage may be generated. An internal resistance 708 may be present in the electric circuit.
A target platform 700 may be a device intended to receive power from the flexible thermoelectric device 100. One potential class of a target platforms 700 is building materials. The thin nature of the flexible thermoelectric device 100 makes it ideal for placement on windows, harvesting energy from the temperature 702 differential between a climate controlled interior of a home and the sunlit exterior. A window covering need not block all light; in one embodiment, the flexible thermoelectric device 100 could be part of a lattice dividing a window into smaller panes. In other embodiments, the flexible thermoelectric device 100 could be shaped in a decorative pattern. Another example of flexible thermoelectric device 100 being incorporated into building materials is wrapping pipes (e.g. recovering waste heat, etc.),
Another class of target platforms 700 for which the flexible thermoelectric device 100 is well suited is “smart clothing.” Interest in biological sensors used for monitoring health (e.g. heart monitors, skin alkalinity sensors, perspiration sensors, accelerometers, etc.) is increasing, and as these devices and sensors grow smaller, they will likely start to be incorporated into clothing. The flexible thermoelectric device 100 would allow these devices to be powered by the difference between the ambient temperature and the user's body heat.
Other target platforms 700 which may use the flexible thermoelectric device 100 to harvest energy from human body heat include jewelry, handheld devices, and wearable devices. Circuitry may be incorporated into jewelry for a number of reasons (e.g. decorative, health monitoring, digital input such as a microphone, digital output such as a headphone, etc.). However, due to size requirements, a system which can harvest energy for such a device may be preferable over a rechargeable storage system. The flexible thermoelectric device 100 is well suited for use in jewelry, due to its dimensions and its ability to bend fit the shape of the target platform 700. In other embodiments, target platforms may also include a silicon wafer or thin film photovoltaic cell in a solar panel.
Handheld devices, such as remote controls, often do not require large amounts of energy, but instead need small bursts of electricity to send a signal to another device. In one embodiment, a flexible thermoelectric device 100 may be used to power a remote control (e.g. for a television, etc.) by harvesting the heat in the users hand. The flexible thermoelectric device 100 is also well suited for use in small sensors, such as those employed in Internet of Things (IoT) solutions.
Wearable devices are increasing in popularity, but one of the biggest challenges is a practical battery life. According to various embodiments, flexible thermoelectric devices 100 may be incorporated into the band of a smart watch, harvesting energy from the heat within the user's wrist to trickle charge the device. See, for example,
Other examples of target platforms 700 include devices which require power, but must maintain a small form-factor, such as a credit card. As security concerns grow, credit and identification cards will need to employ more sophisticated technology to safeguard against abuse. According to one embodiment, the flexible thermoelectric device 100 of
A thermal adhesive layer may be a layer of material which may be used to attach the flexible thermoelectric device 100 to a target platform 700. According to various embodiments, the thermal adhesive layer may be chosen such that it has a high thermal conductivity, is electrically insulating, and has a coefficient of expansion close enough to that of the target platform 700 that adhesion will not be broken when exposed to the foreseeable temperature range of the target platform 700. Examples of materials which may be used as a thermal adhesive layer include, but are not limited to, ethyl vinyl acrylate (EVA), and a combination of an adhesive (e.g. epoxy, prepeg, etc.) and a dielectric material (e.g. Teflon, etc.). In other embodiments, the thermal adhesive layer may be used to encapsulate the flexible thermoelectric device 100.
The smart watch 800 may be a computerized, wrist-mounted device which functionality which extends beyond timekeeping. Typically, smart watches 800 have higher power requirements than traditional watches or other timekeeping devices. The watch band 802 may be a strap or enclosure which may be used to secure a watch or watch-like device to a user's wrist. The band material 804 may be a material which a watch band 802 is made of. Not shown are the conductive traces which electrically couple the flexible thermoelectric device 100 within the watch band 802 to the power system of the smart watch 800.
Wearable devices, and especially smart watches 800, are becoming increasingly popular. One of the challenges faced by smart watch 800 creators is providing sufficient battery life that charging is not required so often that it is overly disruptive of the user experience. As shown, by embedding a flexible thermoelectric device 100 inside the watch band 802 of a smart watch 800 may augment or possibly replace the power provided by the smart watch battery. Constructing the watch band 802 using a band material 804 that has a high thermal conductivity may improve performance.
The watch band 802 may be designed in such a way that the transfer of thermal energy from the user's body to the atmosphere is directed through the flexible thermoelectric device 100 (which, as previously discussed, may be optimized such that the temperature gradient is localized within the thin film thermoelectric conduits 102 of the active layer 101). For example, in one embodiment, the band material 804 directly above and below the flexible thermoelectric device 100 may have a high thermal conductivity, while the band material 804 along the sides of the watch band 802 may have a low thermal conductivity.
In one embodiment, an energy harvesting thermoelectric watch band 802 may include more than one flexible thermoelectric device 100. For example, a first thermoelectric device may be optimized for a temperature range closer to the average body temperature of a human, while a second thermoelectric device may be optimized for a temperature range closer to average room temperature. These two devices may be layered within the watch band 802 such that the first device is closer to the inside of the watch band 802, and the second device is closer to the outside of the watch band 802. In other embodiments, additional flexible thermoelectric devices 100 may be used within the watch band 802.
Low efficiency, high operating temperature combined with higher cost forbid current thermoelectric devices for wider market adoption. Low efficiency may relegate thermoelectric devices to a few applications where their simplicity and ruggedness may outweigh the inefficiency, such as sensors and waste-heat-energy converters. The potential for thermoelectric devices, however, may be much greater. If their efficiency may be increased and reduce the operational temperatures near room temperature (300K), thermoelectric devices may begin to supplant mechanical compressor refrigeration systems, gasoline generators, geothermal power production, and more. Thermoelectric devices may play a significant role in the energy production, home heating/cooling and general energy management of the future.
Low thermal conductivity with higher electrical conductivity is needed for higher ZT. Unfortunately there are no single materials that possess simultaneously higher electrical conductivity and lower thermal conductivity. Most of the recent efforts in research community thus have been reducing thermal conductivity by phonon blocking and/or phonon scattering and/or reducing phonon free mean path.
Thermoelectric devices may be made out of bulk material in the form of ingots and/or pellets. The ingot may be formed from liquid melt and/or from the powder metallurgy route. Each pellet may be attached on a substrate and form a module.
Recent advancements may be made using a thin-film process that allows forming micro bumps using common semiconductor equipment. This allows thousands of micro bumps to form a thermoelectric device to produce meaningful voltage and power output.
Metal particles may be incorporated in a thermoelectric material 118 to form a composite structure. Nanophase metal particles in a polymer matrix may be utilized to form a composite thermoelectric device. Ceramic nanoparticles may be introduced as phonon scattering centers in a thermoelectric device to improve the figure of merit (ZT), which may occur with nano-carbon material units in a thermoelectric matrix.
Quantum super lattice structures may be limited to expensive composite thermoelectric materials 118 and methods and thus limiting the wide spread use of such devices in common market place. Thermoelectric components may be placed in series, but the thermal conductivity may be diminished because the interconnections between the semiconductors may create thermal shorting.
There may be no material that possesses high electrical conductivity and low thermal conductivity simultaneously. Another limitation in current art is each material may behave differently at different temperatures. A thermoelectric cell approach with a flexible substrate may permit stacking. Stacking allows combining different materials with different properties, and may be with or without a spacer. Thermoelectric elements may be connected electrically in series, but thermally in parallel across a temperature gradient. Stacking may allow manufacturers to control electrical conductivity and thermal conductivity independently, and may be able to stack different materials. In one embodiment, the stacked layer may be a single N-type or P-type stack. Additionally, there may be a super lattice for each layer.
A refrigerating effect may be obtained in the flexible thermoelectric device 100 by passing current along a circuit containing dissimilar materials, according to one embodiment. Heat may be absorbed at one junction of the two materials and heat may be released at the other junction, according to one embodiment.
The transfer of heat may be caused by the change in electron energy levels when electrons access the conduction band as defined by quantum physics. The conduction band varies with each material, which means that conducting electrons in some materials may be at a higher energy level than in other materials. When electrons pass down a circuit of dissimilar materials, the electrons alternately extract energy and/or release energy with each change in the conduction band.
The desired refrigerating effect may occur when electrons move to a higher energy level upon change of material. A reverse effect may also occur when electricity is generated from a circuit of dissimilar materials that may be exposed to a temperature differential. This is the physical principle that forms the basis of the thermocouple and is known as the Seebeck effect. The Peltier and Seebeck effects are complementary manifestations of the same physical phenomenon.
There are other applications for the flexible thermoelectric device 100. Voltage generation from temperature differentials in a wide array of situations in different fields offer the potential for application of the flexible thermoelectric device 100. The flexible thermoelectric device 100 may be used in medical applications, e.g. cochlear hearing replacements and devices, nerve stimulation implants; consumer applications, e.g. watches, self-powered toys and novelties; military applications, e.g. wireless personal area networks, ammunition safety sensors, space programs, building environmental control and security.
The flexible thermoelectric device 100 may be integrated to power industrial and/or commercial devices, e.g. wireless sensor networks, automobile tire pressure monitors, wireless HVAC sensors, wireless lighting an energy controls, wireless industrial process control sensors, and oil and gas well head sensors. The flexible thermoelectric device 100 may provide ecological and/or energy applications, e.g. secondary power generation/recovery, electric generation grid device monitor sensors, and environmental condition sensors.
In the field of building automation, the flexible thermoelectric device 100 may have practical applications in security, HVAC, automatic meter reading, lighting control, and access control. In the area of personal health care, the layer composite may have applications in patient monitoring and fitness monitoring. The flexible thermoelectric device 100 may have industrial control applications, e.g. asset management process control and environmental energy management.
Consumer electronics applications may include televisions, VCRs, DVD/CD remotes and/or players, mobile phones, tablets, laptops, household appliances, computer mice, keyboards, joysticks, and/or personal computers and computing peripherals. Residential/light commercial control applications of the layer composite may include security, HVAC, lighting control, access control, and/or lawn & garden irrigation systems.
In one embodiment, while thermally conductive, the flexible thermoelectric device 100 may effectively maintain the temperature differential between opposite ends of the flexible thermoelectric device 100. Thereby, the flexible thermoelectric device 100 may create temperature differentials that may be persistent and thus may optimize the voltage generation from a temperature gradient.
The resistance to heat transfer attributable to the flexible thermoelectric device 100 perpetuates the overall temperature differential and thus may effectively sustain the temperature gradient across each stratum of the thermoelectric layers and accordingly the flexible thermoelectric device 100 as a whole. Because of this resistance to heat transfer, the flexible thermoelectric device 100 may serve as a more efficient means of voltage generation since the temperature differentials at each layer of thermoelectric material 118 may not require additional heat sinks and/or energy-intensive cooling techniques that may be employed to maintain the temperature differential.
While serving as a thermoelectric device, the material composition of the thermoelectric layer may be altered and adjusted according to the specific needs of each application. The flexible thermoelectric device 100 is material independent, according to one embodiment. If the application of the flexible thermoelectric device 100 requires a specific temperature range, e.g. environments with temperatures higher than 800 degrees K, then a particular material may be employed in the thermoelectric layers. For example, Bismuth Telluride may be appropriate in one temperature range, while Silicon Germanium may be more suitable in another temperature.
The thermoelectric layer may include whatever material is most appropriate and best suited to the conditions of the application. Temperature may be one variable. Other factors may be electrical conductivity, malleability, texture, etc. Because the flexible thermoelectric device 100 is material independent, the material best suited for the relevant application may be chosen, thus optimizing the voltage generation and other properties for each application.
Additionally, because the flexible thermoelectric device 100 is material independent and because of the effectiveness of the flexible thermoelectric device 100 in maintaining a temperature gradient across its strata, multiple types of materials may be employed in composing the thermoelectric layer. For example, the thermoelectric layer may contain Cu2Te, Bi2Te3, and/or Sb2Te3, all in one cell.
Because the thermoelectric layers may maintain a temperature differential effectively, materials impractical at one temperature may still be used in the thermoelectric layer at a different depth with a different temperature where the material may be practical. For example, if the hot surface of the flexible thermoelectric device 100 precludes use of one material because it may melt and/or not be as thermally or electrically conductive at that temperature, that material may still be utilized at the cooler end of the flexible thermoelectric device 100 because the flexible thermoelectric device 100 maintains the temperature differential and the material may be used toward the cool surface of the flexible thermoelectric device 100. Thus, the flexible thermoelectric devices 100 characteristic of sustaining the temperature gradient may permit the combination of different materials and thereby optimize the inherent properties of component materials.
The flexible thermoelectric device 100 may have a stratum-like structure, according to one embodiment. Because the flexible thermoelectric device 100 inhibits the flow of heat across the layers, there may be a relatively smaller temperature differential per each layer. However, because the flexible thermoelectric device 100 may comprise as many layers as a manufacturer and/or consumer desire, according to one embodiment, the temperature differentials across each layer may sum up to a larger overall temperature differential across the entire device.
The flexible thermoelectric device 100 may harvest energy from waste heat at lower costs with a higher ZT value, higher efficiency, lower manufacturing costs, and may be easily integrated into existing manufacturing process systems for applications. Furthermore, because of its flexibility, the device may be used in other wearable electronics to utilize body heat.
A number of embodiments have been described. Nevertheless, it will be understood that various modifications may be made without departing from the spirit and scope of the claimed invention. In addition, the logic flows depicted in the figures do not require the particular order shown, or sequential order, to achieve desirable results. In addition, other steps may be provided, or steps may be eliminated, from the described flows, and other components may be added to, or removed from, the described systems. Accordingly, other embodiments are within the scope of the following claims. Furthermore, the specification and/or drawings may be regarded in an illustrative rather than a restrictive sense.
Number | Name | Date | Kind |
---|---|---|---|
3081361 | Henderson et al. | Mar 1963 | A |
3197342 | Neild, Jr. | Jul 1965 | A |
3458356 | Kummer et al. | Jul 1969 | A |
3508968 | Ovshinsky | Apr 1970 | A |
3554815 | Osborn | Jan 1971 | A |
3618590 | Frank | Nov 1971 | A |
3648152 | Katsunori | Mar 1972 | A |
3666566 | Flaherty | May 1972 | A |
3851381 | Alais et al. | Dec 1974 | A |
3995429 | Peters | Dec 1976 | A |
4036665 | Barr et al. | Jul 1977 | A |
4039352 | Marinescu | Aug 1977 | A |
4095998 | Hanson | Jun 1978 | A |
4106279 | Martin et al. | Aug 1978 | A |
4125122 | Stachurski | Nov 1978 | A |
4213292 | Dolezal et al. | Jul 1980 | A |
4251291 | Gomez | Feb 1981 | A |
4338560 | Lemley | Jul 1982 | A |
4382154 | Thery et al. | May 1983 | A |
4443650 | Takagi et al. | Apr 1984 | A |
4448028 | Chao et al. | May 1984 | A |
4467611 | Nelson et al. | Aug 1984 | A |
4497973 | Heath et al. | Feb 1985 | A |
4551857 | Galvin | Nov 1985 | A |
4673863 | Swarbrick | Jun 1987 | A |
4946511 | Shiloh et al. | Aug 1990 | A |
5180928 | Choi | Jan 1993 | A |
5286304 | Macris et al. | Feb 1994 | A |
5419780 | Suski | May 1995 | A |
5427086 | Brownell | Jun 1995 | A |
5521375 | Jang | May 1996 | A |
5554819 | Baghai-Kermani | Sep 1996 | A |
5563368 | Yamaguchi | Oct 1996 | A |
5625245 | Bass | Apr 1997 | A |
5705770 | Ogasawara et al. | Jan 1998 | A |
5712448 | Vandersande et al. | Jan 1998 | A |
5817188 | Yahatz et al. | Oct 1998 | A |
5889735 | Kawata et al. | Mar 1999 | A |
5892656 | Bass | Apr 1999 | A |
5929372 | Oudoire et al. | Jul 1999 | A |
5950067 | Maegawa et al. | Sep 1999 | A |
5959240 | Yoshida et al. | Sep 1999 | A |
6043423 | Satomura et al. | Mar 2000 | A |
6066902 | Maurio et al. | May 2000 | A |
6075199 | Wong | Jun 2000 | A |
6166317 | Volk, Jr. | Dec 2000 | A |
6207887 | Bass et al. | Mar 2001 | B1 |
6271459 | Yoo | Aug 2001 | B1 |
6281594 | Sarich | Aug 2001 | B1 |
6300150 | Venkatasubramanian | Oct 2001 | B1 |
6304520 | Watanabe | Oct 2001 | B1 |
6307142 | Allen et al. | Oct 2001 | B1 |
6313393 | Drost | Nov 2001 | B1 |
6314741 | Hiraishi | Nov 2001 | B1 |
6320280 | Kanesaka | Nov 2001 | B1 |
6329217 | Watanabe et al. | Dec 2001 | B1 |
6367261 | Marshall et al. | Apr 2002 | B1 |
6407965 | Matoge et al. | Jun 2002 | B1 |
6410971 | Otey | Jun 2002 | B1 |
6426921 | Mitamura | Jul 2002 | B1 |
6433465 | McKnight et al. | Aug 2002 | B1 |
6548894 | Chu et al. | Apr 2003 | B2 |
6598405 | Bell | Jul 2003 | B2 |
6605773 | Kok et al. | Aug 2003 | B2 |
6620994 | Rossi | Sep 2003 | B2 |
6700310 | Maue et al. | Mar 2004 | B2 |
6729183 | Tanimoto et al. | May 2004 | B2 |
6846983 | Warehime | Jan 2005 | B1 |
6870766 | Cho et al. | Mar 2005 | B2 |
6882128 | Rahmel et al. | Apr 2005 | B1 |
6914343 | Hiller et al. | Jul 2005 | B2 |
7081693 | Hamel et al. | Jul 2006 | B2 |
7282384 | Shin et al. | Oct 2007 | B2 |
7360365 | Codecasa et al. | Apr 2008 | B2 |
7397169 | Nersessian et al. | Jul 2008 | B2 |
7400050 | Jovanovic et al. | Jul 2008 | B2 |
7488888 | Mitchell et al. | Feb 2009 | B2 |
7493766 | Yang et al. | Feb 2009 | B2 |
7532937 | Horio et al. | May 2009 | B2 |
7649139 | Mihara et al. | Jan 2010 | B2 |
7770645 | Jeffryes | Aug 2010 | B2 |
7777126 | Chu | Aug 2010 | B2 |
7800194 | Freedman | Sep 2010 | B2 |
7800278 | Ujihara et al. | Sep 2010 | B2 |
7834263 | DeSteese et al. | Nov 2010 | B2 |
7851691 | DeSteese et al. | Dec 2010 | B2 |
7851932 | Rome et al. | Dec 2010 | B2 |
7878283 | Richter et al. | Feb 2011 | B2 |
7939743 | Leng et al. | May 2011 | B2 |
8046993 | Kao | Nov 2011 | B2 |
8216871 | McCann | Jul 2012 | B2 |
8237043 | Kondoh | Aug 2012 | B2 |
8269097 | Asatani et al. | Sep 2012 | B2 |
8269098 | Chu | Sep 2012 | B2 |
8294020 | Mitchell et al. | Oct 2012 | B2 |
8404959 | Donley | Mar 2013 | B2 |
8404960 | Prather et al. | Mar 2013 | B2 |
8421313 | Shih et al. | Apr 2013 | B2 |
8421403 | Newman | Apr 2013 | B2 |
8519505 | Hiroshige et al. | Aug 2013 | B2 |
8519595 | Hunter et al. | Aug 2013 | B2 |
8594803 | Magdych | Nov 2013 | B2 |
8604571 | Uchida et al. | Dec 2013 | B2 |
8653357 | Prather et al. | Feb 2014 | B2 |
8685758 | Suzuki et al. | Apr 2014 | B2 |
8777441 | Vazquez | Jul 2014 | B2 |
8802964 | Meng et al. | Aug 2014 | B2 |
8948870 | Imran | Feb 2015 | B2 |
8952235 | Span et al. | Feb 2015 | B2 |
8975503 | Mitchell et al. | Mar 2015 | B2 |
9215905 | Tseng | Dec 2015 | B2 |
9224936 | Nakamura et al. | Dec 2015 | B2 |
9431593 | Kato et al. | Aug 2016 | B2 |
9455390 | Kurihara et al. | Sep 2016 | B2 |
20020047489 | Oudakker | Apr 2002 | A1 |
20020117198 | Kok et al. | Aug 2002 | A1 |
20020148235 | Bell | Oct 2002 | A1 |
20030223919 | Kwak et al. | Dec 2003 | A1 |
20040045594 | Hightower | Mar 2004 | A1 |
20040094192 | Luo | May 2004 | A1 |
20040177876 | Hightower | Sep 2004 | A1 |
20040183306 | Rome | Sep 2004 | A1 |
20040238022 | Hiller et al. | Dec 2004 | A1 |
20050000559 | Horio et al. | Jan 2005 | A1 |
20050022855 | Raver | Feb 2005 | A1 |
20050087222 | Muller-Werth | Apr 2005 | A1 |
20050115600 | DeSteese et al. | Jun 2005 | A1 |
20050139248 | Strnad | Jun 2005 | A1 |
20050139250 | DeSteese et al. | Jun 2005 | A1 |
20050205125 | Nersessian et al. | Sep 2005 | A1 |
20050236028 | Strnad | Oct 2005 | A1 |
20060048807 | Lee et al. | Mar 2006 | A1 |
20060107990 | Adachi et al. | May 2006 | A1 |
20060118157 | Johnson et al. | Jun 2006 | A1 |
20060130888 | Yamaguchi et al. | Jun 2006 | A1 |
20060201161 | Hirai et al. | Sep 2006 | A1 |
20060207643 | Weaver et al. | Sep 2006 | A1 |
20060208492 | Jovanovic et al. | Sep 2006 | A1 |
20060243317 | Venkatasubramanian | Nov 2006 | A1 |
20060254638 | Carmeli et al. | Nov 2006 | A1 |
20070000068 | Gerard France et al. | Jan 2007 | A1 |
20070028956 | Venkatasubramanian et al. | Feb 2007 | A1 |
20070056622 | Leng et al. | Mar 2007 | A1 |
20070095379 | Taher et al. | May 2007 | A1 |
20070125413 | Olsen et al. | Jun 2007 | A1 |
20070193617 | Taguchi | Aug 2007 | A1 |
20070283702 | Strnad | Dec 2007 | A1 |
20070290287 | Freedman | Dec 2007 | A1 |
20080017238 | Fei et al. | Jan 2008 | A1 |
20080065172 | Magdych | Mar 2008 | A1 |
20080066796 | Mitchell et al. | Mar 2008 | A1 |
20080092937 | Mitchell et al. | Apr 2008 | A1 |
20080173537 | DeSteese et al. | Jul 2008 | A1 |
20080264464 | Lee et al. | Oct 2008 | A1 |
20080283110 | Jin et al. | Nov 2008 | A1 |
20090000652 | von Windheim et al. | Jan 2009 | A1 |
20090025773 | Stark | Jan 2009 | A1 |
20090217960 | Tubel et al. | Sep 2009 | A1 |
20090260358 | Rapp et al. | Oct 2009 | A1 |
20090315335 | Ujihara et al. | Dec 2009 | A1 |
20100063557 | Imran | Mar 2010 | A1 |
20100065096 | Pellegrini | Mar 2010 | A1 |
20100154855 | Nemir et al. | Jun 2010 | A1 |
20100186399 | Huttinger | Jul 2010 | A1 |
20100257871 | Venkatasubramanian et al. | Oct 2010 | A1 |
20100300504 | Ceron Parisi et al. | Dec 2010 | A1 |
20100319745 | Meng et al. | Dec 2010 | A1 |
20110084349 | Uchida et al. | Apr 2011 | A1 |
20110094556 | Stark | Apr 2011 | A1 |
20110139398 | Bauer et al. | Jun 2011 | A1 |
20110140458 | Arnold et al. | Jun 2011 | A1 |
20110169372 | Lim | Jul 2011 | A1 |
20110220162 | Siivola | Sep 2011 | A1 |
20110220164 | Guha | Sep 2011 | A1 |
20110275165 | Suzuki | Nov 2011 | A1 |
20120000500 | Iida et al. | Jan 2012 | A1 |
20120081066 | Newman | Apr 2012 | A1 |
20120139076 | Shankar | Jun 2012 | A1 |
20120160290 | Chen et al. | Jun 2012 | A1 |
20120192910 | Fowler et al. | Aug 2012 | A1 |
20120227779 | Miao et al. | Sep 2012 | A1 |
20120291425 | Mitchell et al. | Nov 2012 | A1 |
20120312343 | VanVechten et al. | Dec 2012 | A1 |
20130019460 | Mayes | Jan 2013 | A1 |
20130021002 | Mayes | Jan 2013 | A1 |
20130021788 | Mayes | Jan 2013 | A1 |
20130074897 | Yang | Mar 2013 | A1 |
20130081663 | Yang | Apr 2013 | A1 |
20130087180 | Stark et al. | Apr 2013 | A1 |
20130206199 | Lassiter et al. | Aug 2013 | A1 |
20130249301 | Smoot et al. | Sep 2013 | A1 |
20130298957 | Hiroshige et al. | Nov 2013 | A1 |
20140015470 | Lim et al. | Jan 2014 | A1 |
20140020728 | Chung | Jan 2014 | A1 |
20140090150 | Skertic | Apr 2014 | A1 |
20140096810 | Nakamura et al. | Apr 2014 | A1 |
20140137917 | Al-Merbati et al. | May 2014 | A1 |
20140159637 | Ebersold | Jun 2014 | A1 |
20140246066 | Chen et al. | Sep 2014 | A1 |
20140299169 | Schneider et al. | Oct 2014 | A1 |
20140326287 | Wiant et al. | Nov 2014 | A1 |
20140345666 | Konnai et al. | Nov 2014 | A1 |
20140348453 | Bartl et al. | Nov 2014 | A1 |
20140360548 | Bartl et al. | Dec 2014 | A1 |
20140373888 | Boukai et al. | Dec 2014 | A1 |
20140375246 | Boysen, III et al. | Dec 2014 | A1 |
20150048249 | Hedler et al. | Feb 2015 | A1 |
20150162517 | Kasichainula | Jun 2015 | A1 |
20150179912 | Maeshima | Jun 2015 | A1 |
20150188019 | Corrado et al. | Jul 2015 | A1 |
20150214823 | Shastry et al. | Jul 2015 | A1 |
20150282227 | Yousef et al. | Oct 2015 | A1 |
20150324181 | Segal | Nov 2015 | A1 |
20160006123 | Li et al. | Jan 2016 | A1 |
20160233402 | Suda et al. | Aug 2016 | A1 |
20160336501 | Kasichainula | Nov 2016 | A1 |
20160367150 | Koch et al. | Dec 2016 | A1 |
20170012195 | Grishin | Jan 2017 | A1 |
Number | Date | Country |
---|---|---|
1505252 | Jun 2004 | CN |
1975448 | Jun 2007 | CN |
101454914 | Jun 2009 | CN |
201739025 | Feb 2011 | CN |
201781448 | Mar 2011 | CN |
201830182 | May 2011 | CN |
202005376 | Oct 2011 | CN |
102629842 | Aug 2012 | CN |
202602564 | Dec 2012 | CN |
102891635 | Jan 2013 | CN |
202651208 | Jan 2013 | CN |
202713203 | Jan 2013 | CN |
202978757 | Jun 2013 | CN |
203086385 | Jul 2013 | CN |
203119810 | Aug 2013 | CN |
103325935 | Sep 2013 | CN |
103534826 | Jan 2014 | CN |
204168184 | Feb 2015 | CN |
104638742 | May 2015 | CN |
103178754 | Jul 2015 | CN |
204669251 | Sep 2015 | CN |
2355863 | May 1974 | DE |
3735410 | May 1989 | DE |
3807633 | Sep 1989 | DE |
4118979 | Dec 1992 | DE |
4208358 | Sep 1993 | DE |
4313827 | Nov 1994 | DE |
19919023 | Dec 2000 | DE |
102006014414 | Oct 2007 | DE |
102006039024 | Feb 2008 | DE |
102006057662 | Jun 2008 | DE |
102008030758 | Jan 2009 | DE |
102008005334 | Jul 2009 | DE |
102008009979 | Sep 2009 | DE |
202010003713 | Jul 2010 | DE |
102008031266 | May 2013 | DE |
102007017461 | Apr 2014 | DE |
0644599 | Mar 1995 | EP |
0935334 | Aug 1999 | EP |
2764268 | Aug 2015 | EP |
2003102186 | Apr 2003 | JP |
3447915 | Sep 2003 | JP |
2005228160 | Aug 2005 | JP |
2006086510 | Mar 2006 | JP |
2013225550 | Oct 2013 | JP |
3196069 | Feb 2015 | JP |
20160109658 | Sep 2016 | KR |
1985005406 | Dec 1985 | WO |
1989007836 | Aug 1989 | WO |
1995030246 | Nov 1995 | WO |
1997045882 | Dec 1997 | WO |
1999007024 | Feb 1999 | WO |
1999010937 | Mar 1999 | WO |
2001082343 | Nov 2001 | WO |
2003007391 | Jan 2003 | WO |
2003015186 | Feb 2003 | WO |
2005086246 | Sep 2005 | WO |
2005098225 | Oct 2005 | WO |
2006003956 | Jan 2006 | WO |
2006110858 | Oct 2006 | WO |
2008013584 | Jan 2008 | WO |
2008134022 | Nov 2008 | WO |
2009151000 | Dec 2009 | WO |
2010048066 | Apr 2010 | WO |
2010101049 | Sep 2010 | WO |
2010113257 | Oct 2010 | WO |
2010138835 | Dec 2010 | WO |
2011091620 | Aug 2011 | WO |
2012130568 | Oct 2012 | WO |
2012165990 | Dec 2012 | WO |
2013050415 | Apr 2013 | WO |
2013108518 | Jul 2013 | WO |
2013109729 | Jul 2013 | WO |
2013135447 | Sep 2013 | WO |
2014064755 | May 2014 | WO |
2014082028 | May 2014 | WO |
WO-2014199541 | Dec 2014 | WO |
2015045500 | Apr 2015 | WO |
2015103483 | Jul 2015 | WO |
2015126272 | Aug 2015 | WO |
2015148411 | Oct 2015 | WO |
2015164903 | Nov 2015 | WO |
2015193177 | Dec 2015 | WO |
2015193634 | Dec 2015 | WO |
2016003482 | Jan 2016 | WO |
2016147918 | Sep 2016 | WO |
Entry |
---|
Parylene Conformal Coating Specifications and Properties, Evidentiary Reference. |
CRC Handbook of Chemistry and Physics, 2015-2016, 96th Ed., “The Elements”—Evidentiary Reference. |
Bismuth Telluride Semiconductors, Evidentiary Reference. |
MIT. “Material Property Database: Polyimide.” http://www.mit.edu/˜6.777/matprops/polyimide.htm. Accessed online May 9, 2017. |
Oxford Dictionary. “Definition of Sensor.” https://en.oxforddictionaries.com/definition/sensor. Accessed online May 10, 2017. |
“A Shoe-Embedded Piezoelectric Energy Harvester for Wearable Sensors”, Sensors, Jul. 11, 2014 by Jingling Zhao et al. (pp. 9) http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4168512/. |
“Evaluating Energy-Harvesting Technologies for Wearable Designs”, Article Library, Contributed by Publitek Marketing Communications, Dec. 3, 2014 by European Editors (pp. 4) http://www.digikey.com/en/articles/techzone/2014/dec/evaluating-energy-harvesting-technologies-for-wearable-designs. |
“Energy Harvesting Moves into Wearable Electronics”, Article Library, Contributed by Publitek Marketing Communications, Feb. 15, 2012 by European Editors (pp. 5) http://www.digikey.com/en/articles/techzone/2012/feb/energy-harvesting-moves-into-wearable-electronics. |
“Top 5 Energy Harvesting Options for Wearable Devices”, Avnet, 2016 by James C. Hess (pp. 2) http://www.em.avnet.com/en-us/design/technical-articles/Pages/Articles/Top-5-Energy-Harvesting-Options-for-Wearable-Devices.aspx. |
“Miniaturized Thermoelectric Power Sources”, 34th Intersociety Energy Conversion Engineering Conference Proc., Vancouver, BC, Canada, 1999 by J. P. Fleurial et al. (pp. 5) http://www.thermoelectrics.caltech.edu/publications/pdf/IECEC-992569-Paper.pdf. |
“Energy Harvesting Technology Can Be the Wave of the Future”, Wearable Technologies Conference, San Fransisco, Jul. 13, 2015 by by Spela Kosir (pp. 8) https://www.wearable-technologies.com/2015/07/energy-harvesting-technology-can-be-the-wave-of-the-future/. |
“Thermoelectric Energy Harvesting 2014-2024: Devices, Applications, Opportunities”, IDTechEx by Dr Harry Zervos (pp. 3) http://www.idtechex.com/research/reports/thermoelectric-energy-harvesting-2014-2024-devices-applications-opportunities-000392.asp. |
“TEGwear™ Technology”, Perpetua—Renewable Energy Solutions for Wireless Sensors, 2015 (p. 1) http://www.perpetuapower.com/technology.htm. |
“Thin-film Thermoelectric—Energy Harvesting for Internet of Things”, Thermogen, 2016 (pp. 4) http://www.thermogentech.com/#services. |
“Thermoelectric Fabrics: Toward Power Generating Clothing”, Scientific Reports 5, Article No. 6411, Mar. 23, 2015 by Yong Du et al. (pp. 15) http://www.nature.com/articles/srep06411. |
“Energy harvesting for assistive and mobile applications”, Energy Science and Engineering, vol. 3, Issue 3, Feb. 17, 2015 by Vikrant Bhatnagar et al. (pp. 14) http://onlinelibrary.wiley.com/doi/10.1002/ese3.63/full |
“A Shoe-Embedded Piezoelectric Energy Harvester for Wearable Sensors”, Sensors, Jul. 11, 2014 by Jingjing Zhao et al. (pp. 9) http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4168512/. |
“Energy Harvesting Peltier Ring”, HackADay, Feb. 2, 2016 by James Hobson (p. 1) http://hackaday.com/2013/12/02/energy-harvesting-peltier-ring/. |
“Flexible Thin-film Thermoelectric Generator Inserting cr Buffer Layer”, National Institute of Advanced Industrial Science and Technology, Dec. 2, 2012 by M. Mizoshiri et al. (pp. 4) http://cap.ee.ic.ac.uk/˜pdm97/powermems/2012/poster/P-058.pdf. |
Number | Date | Country | |
---|---|---|---|
20160336501 A1 | Nov 2016 | US |