Claims
- 1. A method of preventing adverse effects of an environmental condition on an electronic device comprising:
- monitoring said environmental condition;
- monitoring a self-test initialization criterion;
- performing an automatic device self-test if said self-test initialization criterion is met and if said environmental condition is within a predetermined range of values; and
- not performing said automatic device self-test if said self-test initialization criterion is met and if said environmental condition is outside said predetermined range of values.
- 2. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 1 further comprising, after the not performing step, performing said automatic device self-test if said environmental condition returns to said predetermined range of values after being outside said predetermined range of values.
- 3. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 2 further comprising scheduling an additional automatic device self-test after said environmental condition returns to said predetermined range of values after being outside said predetermined range of values.
- 4. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 1 further comprising, before the performing step, waking up said electronic device from a stand-by mode.
- 5. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 1 further comprising providing an indication of device operating status.
- 6. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 5 further comprising changing said indication of device operating status if said automatic self-test is not performed.
- 7. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 5 further comprising changing said indication of device operating status if said environmental condition is outside said predetermined range of values.
- 8. A method of preventing adverse effects of an environmental condition on an electronic device according to claim 1 wherein said environmental condition comprises temperature.
CROSS REFERENCE TO RELATED APPLICATIONS
This is a continuation of application Ser. No. 08/912,034 filed on Aug. 8, 1997 now U.S. Pat. No. 5,868,792.
US Referenced Citations (17)
Foreign Referenced Citations (1)
Number |
Date |
Country |
WO9427674 |
Dec 1994 |
WOX |
Continuations (1)
|
Number |
Date |
Country |
Parent |
912034 |
Aug 1997 |
|