The present disclosure relates to a method of evaluating a rubber material.
It is known that small voids (cavities) may be formed in a rubber material when strain is applied thereto (see, for example, Non-Patent Literatures 1 and 2).
In Non-Patent Literatures 1 and 2, the change in scattering intensity of a rubber material that occurs with void formation is measured by small-angle X-ray scattering analysis (SAXS analysis) to quantitatively evaluate voids. Such methods require measurements over a wide region of wavenumbers. In practice, however, since the area of the view plane of the detector is limited, the wavenumber region to be measured is limited. Thus, there is still room for improvement in that voids within some region cannot be observed.
The present disclosure aims to solve the aforementioned problem and provide an evaluation method that can easily evaluate the percentage of voids in a rubber material.
The present disclosure relates to an evaluation method, including evaluating a percentage of voids in a rubber material with a strain applied thereto based on a φvoid calculated from the following Equation (1) using a transmittance and thickness of the rubber material with no strain applied thereto and a transmittance and thickness of the rubber material with the strain applied thereto,
According to the present disclosure, the percentage of voids in a rubber material with a strain applied thereto can be easily evaluated based on the φvoid calculated from Equation (1) using the transmittance and thickness of the rubber material with no strain applied thereto and the transmittance and thickness of the rubber material with the strain applied thereto.
The present disclosure relates to an evaluation method including evaluating the percentage of voids in a rubber material with a strain applied thereto based on the φvoid calculated from the following Equation (1) using the transmittance and thickness of the rubber material with no strain applied thereto and the transmittance and thickness of the rubber material with the strain applied thereto,
When voids are formed in a rubber material, the rubber material usually has an increased volume while maintaining the mass, resulting in a lower density (ρs<ρ0). Thus, a rubber material having a higher percentage of voids has a larger φvoid calculated by “1−ρs/ρ0”. This relationship may be used to evaluate (quantitatively evaluate) the percentage of voids from φvoid. Moreover, since φvoid can be calculated only from the transmittance and thickness of the rubber material, the percentage of voids can be evaluated easily. Furthermore, since according to the present disclosure, the voids present in the volume irradiated with X-rays are evaluable, the voids in the entire rubber material can be evaluated by irradiating the entire rubber material with X-rays.
Here, the transmittance (I/I0) of the material is generally determined by the formulation of the material and represented by Equation (2) below. Thus, “1−ρs/ρ0” may be transformed into an equation consisting of transmittance and thickness using Equation (2):
The thickness (ts) of the rubber material with the strain applied thereto in Equation (1) may be determined by measuring the actual thickness, or may be calculated from the following Equation (3):
t
s
=t
0/√{square root over (∈/100)} (3)
Assuming that the rubber material deforms at a Poisson's ratio of 0.5, since the volume does not change, the rubber material can be regarded to deform at the same rate in the direction orthogonal to the strain. Thus, the thickness (ts) of the rubber material with the strain applied thereto can be calculated from Equation (3). The use of Equation (3) makes it possible to more easily evaluate the percentage of voids in the rubber material.
Here, the voids of all sizes that occupy the volume can be evaluated based on φvoid. There is no lower limit of the evaluable size, while the upper limit thereof is the volume irradiated with X-rays.
Examples of the beam used to irradiate the rubber material include X-rays and light, with X-rays being preferred.
When X-rays are used as the beam, the transmittance and scattering intensity of the rubber material may be measured by SAXS analysis. The scattering angle for the SAXS analysis is usually not more than 10 degrees.
The SAXS analysis is usually performed in a region of q represented by the following equation:
The region of q preferably includes 0.001 Å−1<q<0.05 Å−1.
The X-rays scattered in the SAXS analysis may be detected by an X-ray detector, and the X-ray detection data from the X-ray detector may be used to generate an image using an image processor or the like.
Examples of the X-ray detector include two-dimensional detectors such as X-ray films, nuclear emulsion plates, X-ray image pickup tubes, X-ray fluorescent amplifiers, X-ray image intensifiers, X-ray imaging plates, X-ray CCDs, and X-ray amorphous materials; and line sensor one-dimensional detectors. The X-ray detector may be selected appropriately depending on the type or conditions of the polymer material to be analyzed, or other factors.
The image processor may appropriately be a common one that can generate X-ray scattering images based on the X-ray detection data from the X-ray detector.
The strain to be applied to the rubber material is preferably an elongational strain, more preferably a uniaxial elongational strain. For example, a uniaxial elongational strain may be applied, for example, by holding the rubber material between a pair of opposing jigs and then elongating the rubber material with the jigs in the respective opposing directions, or by holding the rubber material between a pair of opposing jigs and then elongating the rubber material with one of the jigs, with the other jig being fixed.
The elongation rate at which the elongational strain is applied to the rubber material is usually 100 mm/min to 500 mm/min.
Although the rubber material may have any shape, it preferably has a plate shape or a dumbbell shape as set forth in JIS K 6251 because such a shape facilitates the application of a uniform elongational strain.
The thickness of the rubber material with no strain applied thereto is usually 1 mm to 2 mm.
Examples of rubber components that may be contained in the rubber material include diene rubbers such as isoprene-based rubbers, styrene-butadiene rubbers (SBR), polybutadiene rubbers (BR), acrylonitrile-butadiene rubbers (NBR), chloroprene rubbers (CR), butyl rubbers (IIR), and styrene-isoprene-butadiene copolymer rubbers (SIBR). Each of these rubbers may be used alone, or two or more of these may be used in combination.
The rubber material may contain a filler. Examples of the filler include silica, carbon black, calcium carbonate, talc, alumina, clay, aluminum hydroxide, aluminum oxide, and mica. Preferred among these is silica or carbon black.
The rubber material may contain additives such as stearic acid, zinc oxide, sulfur, and vulcanization accelerators, in addition to the rubber components and fillers.
The rubber material can be prepared by a usual method. Specifically, for example, the rubber material may be prepared by kneading the compounding materials using a kneading machine such as a Banbury mixer or an open roll mill, and then vulcanizing the kneaded mixture.
The present disclosure will be specifically described with reference to examples. The examples are not intended to limit the scope of the present disclosure.
Following the formulation recipe, the compounding components other than the sulfur and vulcanization accelerators were kneaded in a 1.77 L internal Banbury mixer for 3 to 5 minutes until the temperature reached 150° C., to obtain a base-kneaded rubber compound. Next, the base-kneaded rubber compound was kneaded with the sulfur and vulcanization accelerators in an open roll mill, and the resulting kneaded mixture was vulcanized to obtain a rubber material.
The rubber material was sliced into a thickness of 1 mm and then punched into a dumbbell shape as set forth in JIS K 6251 to prepare a specimen, which was used in the following measurements.
The experiments were conducted at BL20XU of SPring-8. Ion chambers were disposed in front of and behind the specimen, and the specimen was irradiated with X-rays for an exposure time of one second at two-second intervals to determine the scattering intensity and transmittance.
Separately, the same procedure was followed while applying a uniaxial elongational strain to the specimen, to determine the scattering intensity and transmittance. The elongation rate of the specimen was 50 mm/min. The following describes the other conditions.
Equation (1) was used to calculate the φvoid. Table 1 shows the results.
Here, the ts was calculated from the amount (%) of strain using Equation (3).
Table 1 shows that in the example the φvoid increases as the amount of strain increases. Thus, it was demonstrated that the quantitative evaluation of voids can be achieved by comparing the values of φvoid.
The noise and background were subtracted from the scattering intensity measured in the example, and the (ovoid was calculated using equations (1) to (3) of Non-Patent Literature 2. The change in specimen thickness due to the elongation was corrected using the thickness obtained from the transmittance.
In the comparative example, since the observable wavenumber region was narrow, no quantitative data within the unobserved region was obtained.
Exemplary embodiments of the present disclosure include:
Embodiment 1. An evaluation method, including evaluating a percentage of voids in a rubber material with a strain applied thereto based on a φvoid calculated from the following Equation (1) using a transmittance and thickness of the rubber material with no strain applied thereto and a transmittance and thickness of the rubber material with the strain applied thereto,
Embodiment 2. The evaluation method according to Embodiment 1,
Embodiment 3. The evaluation method according to Embodiment 1 or 2,
Embodiment 4. The evaluation method according to Embodiment 3,
Embodiment 5. The evaluation method according to Embodiment 3 or 4,
Embodiment 6. The evaluation method according to any combination with any one of Embodiments 1 to 5,
Embodiment 7. The evaluation method according to Embodiment 6,
Embodiment 8. The evaluation method according to Embodiment 7,
Embodiment 9. The evaluation method according to Embodiment 8,
Embodiment 10. The evaluation method according to any combination with any one of Embodiments 1 to 9,
Embodiment 11. The evaluation method according to Embodiment 10,
Embodiment 12. The evaluation method according to any combination with any one of Embodiments 1 to 11,
Embodiment 13. The evaluation method according to any combination with any one of Embodiments 1 to 12,
Embodiment 14. The evaluation method according to any combination with any one of Embodiments 1 to 13,
Number | Date | Country | Kind |
---|---|---|---|
2022-032075 | Mar 2022 | JP | national |