Claims
- 1. An evaporation material in the form of a wire consisting of a cobalt metal consisting of cobalt and unavoidable impurities;
- wherein said evaporation material in the form of a wire has a wire diameter of at least 1.0 mm and not more than 10 mm, a tensile strength of at least 400 MPa and not more than 1500 MPa, an elongation of at least 5% under a gauge length of 100 mm, and a reduction of area of at least 5%,
- and has a crystal structure satisfying a formula of 0.1.ltoreq.f1/(f1+h1+h2).ltoreq.1 at room temperature, where f1, h1 and h2 represent respective diffraction peak intensity levels of a (200) plane of a face centered cubic lattice, a (100) plane of a close-packed hexagonal lattice and a (101) plane of a close-packed hexagonal lattice in an X-ray diffraction result.
- 2. The evaporation material in accordance with claim 1, wherein the surface roughness of said wire is not more than 50 .mu.m, the deviation of said wire diameter is not more than 0.1 mm, and the longitudinal waviness of said wire is not more than 0.2 mm per 1 mm of length of said wire.
- 3. The evaporation material in accordance with claim 1, wherein said crystal structure further satisfies a formula of 0.3.ltoreq.f1/(f1+h1+h2)<1 at room temperature.
- 4. An evaporation material in the form of a wire consisting of a cobalt-based metal,
- wherein said cobalt-based metal consists of cobalt, at least 0.01 weight % and not more than 0.1 weight % of an element selected from the group consisting of Mn, Cr, Mg, Zr and Ca and unavoidable impurities, and
- wherein said evaporation material in the form of a wire has a wire diameter of at least 1.0 mm and not more than 10 mm, a tensile strength of at least 400 MPa and not more than 1500 MPa, an elongation of at least 5% under a gauge length of 100 mm, and a reduction of area of at least 5%.
- 5. The evaporation material in accordance with claim 4, having a crystal structure satisfying a formula of 0.1.ltoreq.f1/(f1+h1+h2).ltoreq.1 at room temperature, where f1, h1 and h2 represent respective diffraction peak intensity levels of a (200) plane of a face centered cubic lattice, a (100) plane of a close-packed hexagonal lattice and a (101) plane of a close-packed hexagonal lattice in an X-ray diffraction result.
- 6. The evaporation material in accordance with claim 5, wherein said crystal structure further satisfies a formula of 0.3.ltoreq.f1/(f1+h1+h2)<1 at room temperature.
- 7. The evaporation material in accordance with claim 4, having a crystal structure including a close-packed hexagonal structure.
- 8. The evaporation material in accordance with claim 7, wherein said close-packed hexagonal structure is the predominant crystal structure.
- 9. The evaporation material in accordance with claim 4, wherein said element is selected from the group consisting of Cr, Mg, Zr and Ca.
- 10. An evaporation material in the form of a wire consisting of a cobalt--nickel alloy consisting of cobalt, not more than 20.3 weight % of nickel, and unavoidable impurities,
- wherein said evaporation material in the form of a wire has a wire diameter of at least 1.0 mm and not more than 10 mm, a tensile strength of at least 400 MPa and not more than 1500 MPa, an elongation of at least 5% under a gauge length of 100 mm, and a reduction of area of at least 5%,
- and has a crystal structure satisfying a formula of 0.1.ltoreq.f1/(f1+h1+h2).ltoreq.1 at room temperature, where f1, h1 and h2 represent respective diffraction peak intensity levels of a (200) plane of a face centered cubic lattice, a (100) plane of a close-packed hexagonal lattice and a (101) plane of a close-packed hexagonal lattice in an X-ray diffraction result.
- 11. The evaporation material in accordance with claim 10, wherein said wire has a surface roughness of not more than 50 .mu.m, a deviation of said wire diameter of not more than 0.1 mm, and a longitudinal waviness of not more than 0.2 mm per 1 mm of length of said wire.
- 12. The evaporation material in accordance with claim 10, wherein said unavoidable impurities in said cobalt--nickel alloy contain a positive amount of oxygen in a concentration of not more than 0.004 weight %, and wherein said crystal structure further satisfies a formula of 0.3.ltoreq.f1/(f1+h1+h2).ltoreq.1 at room temperature, and has a crystal grain size of not more than 80 .mu.m.
- 13. The evaporation material in accordance with claim 10, wherein said crystal structure further satisfies a formula of 0.3.ltoreq.f1/(f1+h1+h2)<1 at room temperature.
- 14. The evaporation material in accordance with claim 10, wherein said crystal structure further satisfies 0.1.ltoreq.f.sub.1 /(f.sub.1 +h.sub.1 +h.sub.2).ltoreq.0.7.
- 15. An evaporation material in the form of a wire consisting of a cobalt--nickel alloy,
- wherein said cobalt--nickel alloy consists of cobalt, not more than 20.3 weight % of nickel, at least 0.01 weight % and not more than 0.1 weight % of an element selected from the group consisting of Mn, Cr, Mg, Zr and Ca, and a remainder consisting of unavoidable impurities,
- wherein said evaporation material in the form of a wire has a wire diameter of at least 1.0 mm and not more than 10 mm, a tensile strength of at least 400 MPa and not more than 1500 MPa, an elongation of at least 5% under a gauge length of 100 mm, and a reduction of area of at least 5%.
- 16. The evaporation material in accordance with claim 15, having a crystal structure satisfying a formula of 0.1.ltoreq.f1/(f1+h1+h2).ltoreq.1 at room temperature, where f1, h1 and h2 represent respective diffraction peak intensity levels of a (200) plane of a face centered cubic lattice, a (100) plane of a close-packed hexagonal lattice and a (101) plane of a close-packed hexagonal lattice in an X-ray diffraction result.
- 17. The evaporation material in accordance with claim 16, wherein said crystal structure further satisfies a formula of 0.3.ltoreq.f1/(f1+h1+h2)<1 at room temperature.
- 18. The evaporation material in accordance with claim 15, having a crystal structure including a close-packed hexagonal structure.
- 19. The evaporation material in accordance with claim 18, wherein said close-packed hexagonal structure is the predominant crystal structure.
- 20. The evaporation material in accordance with claim 15, wherein said element is selected from the group consisting of Cr, Mg, Zr and Ca.
Priority Claims (8)
Number |
Date |
Country |
Kind |
4-146502 |
May 1992 |
JPX |
|
4-146503 |
May 1992 |
JPX |
|
4-146504 |
May 1992 |
JPX |
|
4-286677 |
Sep 1992 |
JPX |
|
4-328526 |
Nov 1992 |
JPX |
|
5-100277 |
Apr 1993 |
JPX |
|
5-107728 |
Apr 1993 |
JPX |
|
5-113749 |
Apr 1993 |
JPX |
|
CROSS-REFERENCE TO RELATED APPLICATION
This is application is a FILE-WRAPPER-CONTINUATION of U.S. application Ser. No.: 08/442,660; Filed On.: May 17, 1995, now abandoned which is a DIVISIONAL of U.S. patent application Ser. No. 08/178,277, filed on Jan. 4, 1994, now U.S. Pat. No. 5,441,010, issued on Aug. 15, 1995.
US Referenced Citations (3)
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Non-Patent Literature Citations (3)
Entry |
The abstract of CA 893627 is provided in place of DE 1558632. |
Diderrich, E; Drapier, J. M.; Coutosouradis, D.; Habraken, L, Low-alloy ductile cobalt for hard facing electrodes, cobalt (Engl. Ed.) (1975), (1), 7-16 (abstract only), 1975. |
Diderrich, E; Drapier, J. M.; Coutosouradis, D.; Habraken, L, Low-alloy ductile cobalt for hard facing electrodes, cobalt (Engl. Ed.) (1975), (1), 7-16, 1975. |
Divisions (1)
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Number |
Date |
Country |
Parent |
178277 |
Jan 1994 |
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Continuations (1)
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Number |
Date |
Country |
Parent |
442660 |
May 1995 |
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