This is a continuation of copending application Ser. No. 07/466,030, filed on Jan. 17, 1990, now abandoned.
Entry |
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Tate, G. et al., "EDC Chip Boosts Memory Reliability", Electronic Design, Sep. 1, 1980, pp. 151-155. |
Twaddel, W., "Error-Checking and-Correcting ICs See Wider Use as Memory Size Grows", EDN, Mar. 4, 1981, pp. 31-40. |
Bazes, M. et al., "Keep Memory Design Simple Yet Call Single-Bit Errors", Electronic Design, Sep. 30, 1981, pp. 195-201. |
Number | Date | Country | |
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Parent | 466030 | Jan 1990 |