This is a continuation of copending application Ser. No. 07/466,030, filed on Jan. 17, 1990, now abandoned.
| Entry |
|---|
| Tate, G. et al., "EDC Chip Boosts Memory Reliability", Electronic Design, Sep. 1, 1980, pp. 151-155. |
| Twaddel, W., "Error-Checking and-Correcting ICs See Wider Use as Memory Size Grows", EDN, Mar. 4, 1981, pp. 31-40. |
| Bazes, M. et al., "Keep Memory Design Simple Yet Call Single-Bit Errors", Electronic Design, Sep. 30, 1981, pp. 195-201. |
| Number | Date | Country | |
|---|---|---|---|
| Parent | 466030 | Jan 1990 |