Claims
- 1. A method for fabricating polycrystalline thin films including the steps of:
- forming a film of material on a substrate in a time period such that the temperature of the substrate is not raised above a temperature of about 450.degree. C. for a time period greater than about 100 .mu.s; and
- irradiating at least a portion of the thus formed film with at least one energy pulse to cause heating and recrystallization of at least a portion of the material of the film in a time period such that the temperature of the substrate is not raised above a temperature of about 180.degree. C. for said time period of greater than about 100 .mu.s.
- 2. The method of claim 1, wherein the energy pulse is produced by a homogenized beam source selected from the group of dye lasers, excimer lasers, flashlamp-pumped lasers, and electron-beams.
- 3. The method of claim 2, wherein the homogenized beam source has the capability of applying up to about 100 .mu.s pulses of 01.1-10 Jcm.sup.-2 energy to the film of material.
- 4. The method of claim 1, additionally including the step of forming the substrate from a material incapable of withstanding processing temperatures of higher than about 180.degree. C. for longer than about 100 .mu.s.
- 5. The method of claim 4, wherein said substrate is formed from low-temperature materials selected from the group consisting of E-CTFE, E-TFE, PES, PVDF, PTFE, FFP, and HDPE.
- 6. The method of claim 1, additionally including the step of providing dopant gases during the step of irradiation of the film, thereby producing a doped film.
- 7. The method of claim 1, additionally including the step of providing the film of material with semiconductor or component gases to control stoichiometry of semiconductor materials or to produce heterojunctions.
- 8. The method of claim 1, additionally including the step of providing the film of material with a metal containing gas to help form a contact.
- 9. A method for fabricating thin films for use in solar cells, including the steps of:
- forming at least one film of material on a substrate at a temperature of not greater than about 450.degree. C.; and
- directing at least one pulse of laser radiation onto at least a portion of the at least one film for causing recrystallization and increased crystal grain size of the film material without raising the temperature of the substrate above about 180.degree. C. for longer than about 100 .mu.s.
- 10. The method of claim 9, wherein the at least one film of material was formed to a thickness of not greater than about 10 .mu.m.
- 11. The method of claim 10, wherein the at least one film is formed from material selected from the group of amorphous silicon, cadmium-tellurium, copper-indium-selenium, gallium-arsenic, copper-indium-sulfur, and cadmium-sulfur.
- 12. The method of claim 11, wherein the at least one pulse of laser energy was produced by a laser selected from the group of dye, excimer, and flashlamp-pumped lasers, capable of producing a homogenized beam of up to about 100 .mu.s duration with an energy of up to about 0.1-10 Jcm.sup.-2 to the film material.
- 13. The method of claim 12, wherein the laser is a flashlamp-pumped dye laser, wherein the film of material is of copper-indium-selenium, and wherein the crystal grain size is increased from about 0.5-1 .mu.m to about 2-4 .mu.m by irradiation from the laser pulse.
- 14. The method of claim 12, wherein the laser is a flashlamp-pumped Ti:sapphire laser, and wherein the film of material is of cadmium-tellurium.
- 15. The method of claim 12, wherein the laser is an XeCl excimer laser, wherein the film of material is of amorphous silicon, and wherein the amorphous silicon is crystallized by the laser pulse to form polycrystalline or microcrystalline silicon.
- 16. The method of claim 9, wherein the at least one pulse of laser radiation is produced by a laser operating at a wavelength in the range of about 197-1100 nm, and capable of producing pulses of up to about 100 .mu.s and energy of up to about 10 Jcm.sup.-2 to the film of material.
- 17. The method of claim 9, wherein the substrate is selected from the group of low-temperature materials consisting of E-CTFE, E-TFE, PES, PVDF, PTFE, FFP, and HDPE, and wherein the at least one film is formed on the substrate at a temperature of less than about 180.degree. C.
- 18. Polycrystalline thin films formed by the method of claim 1.
Government Interests
The United States Government has rights in this invention pursuant to Contract No. W-7405-ENG-48 between the United States Department of Energy and the University of California for the operation of Lawrence Livermore National Laboratory.
US Referenced Citations (14)
Non-Patent Literature Citations (1)
Entry |
I.P. Herman, Laser-Assisted Deposition of Thin Films from Gas-Phase and Surface-Adsorbed Molecules, Chem. Rev. 1989, 89, pp. 1323-1357. |