A new type of x-ray detector that utilizes a field effect transistor structure will be investigated in this project. This new detector offers the advantage of internal gain, low noise and simple readout electronics. Initial studies show that this detector type would have improved energy resolution over x-ray spectrometers currently in use. The field effect transistor detectors would be very useful in applications in materials science research and materials analysis or wherever a high performance solid state detector is required for x-ray spectrometer applications. Owing to their small size and ease of readout these devices would also be excellent for use in imaging x-ray detectors.