Claims
- 1. A film thickness controller for use in an extrusion molding apparatus and a flowing type molding apparatus including a die having a slot along which a plurality of operating terminal devices of a discharge amount adjusting mechanism of molten plastic are disposed and a thickness gauge for detecting variation of thickness after the lapse of a dead time corresponding to a time required for movement of the film between the die and the thickness gauge, comprising a thickness data memory for storing thickness data measured by said thickness gauge, a distributor for receiving an output of said thickness data memory and an arrival end identification signal which is produced by the thickness gauge to identify whether the thickness gauge reaches either of both ends of the film, a plurality of basic control means for receiving an output of said distributor and the arrival end identification signal produced by the thickness gauge, a plurality of command value memories each receiving an output of each of said plurality of basic control means, a superposition adder for receiving an output of each of said command value memories, and an operation value memory for receiving an output of said superposition adder and for supplying an output of said operation value memory to said plurality of basic control means.
- 2. A film thickness controller according to claim 1, wherein:
- the thickness gauge in the extrusion molding apparatus forms means for moving in a reciprocating manner along the width of film to detect thickness of film and to obtain thickness data over the width of film each time the thickness gauge reaches the end of film and for supplying the thickness data over the width of film; to the thickness data memory;
- said thickness gauge further constituting means for furnishing the arrival end identification signal to indicate the end which the thickness gauge has reached to the distributor and the basic control systems each time the thickness gauge has reached the end of film;
- said distributor constituting means responsive to the arrival of an end identification signal from the thickness gauge for reading out a set of thickness data necessary for the basic control systems from the thickness data memory and for supplying the set of thickness data to the predetermined basic control systems;
- said basic control means are for receiving the set of thickness data from the distributor and data of the operation value memory and for identifying the end of film which the thickness gauge has reached on the basis of the arrival end identification signal to select a correct dead time;
- said control means being further for calculating a predetermined number of command values of heat and storing the values in the command value memories;
- said superposition adder constituting means for responding to supply to the command value memories of the command values of heat from said basic control systems and for adding outputs of the command value memories for each heater;
- said superposition adder further constituting means for calculating an average value to define a final command value S of heat for each heater;
- said operation value memory constituting means for storing the command value S of the superposition adder;
- said distributor constituting means for responding to the thickness gauge reaching the opposite end of film;
- said distributor further consituting means for producing a new arrival end identification signal; to operate the basic control systems and the superposition adder again as to update all command values of heat.
- 3. A controller according to claim 1, wherein each of said basic control means includes:
- a subtracter for producing a difference between a thickness value detected by the thickness gauge in a predetermined position along the width of the film and a set value of thickness in the predetermined position,
- an integrator for time-integrating the difference of thickness produced by said subtracter,
- a memory for storing past time sequence data of operation amounts of the control mechanism during a time equal to a sum of the dead time L.sub.1 and a time L.sub.2 until the thickness gauge reaches an end of the film after detection of thickness in the predetermined position,
- an operational calculator for producing the past time sequence data of operation amounts of the control mechanism stored in said memory and an estimated value of state variable at a time earlier than a time when the set value of the detected thickness value of a film has been inputted by a dead time L,
- a state shifter for receiving an output of said integrator and an output of said operational calculator and multiplying a coefficient for shifting the state by the dead time L to produce a state estimated value at a predetermined time,
- a state prediction device for receiving the past time sequence data of operation amounts of the control mechanism stored in said memory to produce state variation based on establishment of input from a certain time to a time after the lapse of the dead time L,
- an adder for adding an output of said state shifter and an output of said state prediction device to produce the state estimated value at the predetermined time, and
- an operation amount commander for multiplying a state estimated value at a certain time produced from said adder by a state feedback gain to produce an operation amount command value for the control mechanism
- (1) a detector for detecting, from said thickness gauge, a value y(k+1) of film thickness composed of y.sub.1 (k+1), y.sub.2 (k+1), y.sub.3 (k+1), y.sub.4 (k+1) and y.sub.5 (k+1), at a calculation execution time t=t.sub.k+1 of a time interval T for each calculation execution time t=t.sub.k+1 each time the thickness gauge reaches an edge of the film and for producing an end identification signal d which indicates the end which the thickness gauge has reached;
- (2) said detector being arranged for supplying the value y.sub.3 (k+1) of the detected film thickness value y(k+1) to said subtracter for producing thickness deviation (k+1)=r.sub.3 (k+1)-y.sub.3 (k+1) between the detected value y.sub.3 (k+1) and a set value of thickness r.sub.3 (k+1);
- (3) said subtractor being arranged for supplying the integrator 102 is supplied with the thickness deviation (k+1) from the subtractor 101 and producing a time-integrated value of the thickness deviation from the following equation;
- X.sub.I (k+1)=x.sub.I (k)+0.5(t.sub.K+1 -t.sub.K){(k)+(k+1)}(40)
- where .epsilon.(k) is thickness deviation at the last thickness detection time (t=t.sub.k) and X.sub.1 (k) is an output of the integrator 102 at t=t.sub.k ;
- said control mechanism including a heater, the integrator includes an external disturbance compensator to compensate external heat varying the thickness y with heat generated by the heater so that the thickness y is always maintained to be a set value;
- (4) said operational calculator being arranged to calculate, when the thickness gauge reaches either end of the film and the thickness gauge produces the arrival end identification signal d, a value .omega.(k+1) from the past time sequence data of heat generated by the heater stored in said memory and produce an estimated value X(t.sub.k+1 -L)=.omega.(k+1) of the state variable at time t(.sub.k+1 -L) earlier than time t.sub.k+1 by the dead time L determined by the arrival end identification signal d produced by the thickness gauge;
- (5) said state shifter being arranged to multiply the state estimated value [X.sub.I (k+1), .omega.(k+1)].sup.T at time (t.sub.k+1 -L) by a coefficient e .sup.L for shifting the state by the dead time L to obtain the state estimated value e .sup.L [X.sub.I (k+1), .omega.(k+1).sup.T ] at time t.sub.k+1 in response to the output X.sub.I (k+1) of the integrator and the output .omega.(k+1) of the operational calculator determined by the arrival end identification signal d of the thickness gauge to obtain the state estimated value at time t.sub.k+1 ; wherein the magnitude of the dead time L depends on the end of the film which the thickness gauge reaches and the coefficient e .sup.L is different depends on the arrival end identification signal d of the thickness gauge;
- said state predicting device being arranged to respond to the state shift for the dead time L to produce a value I(k+1)
- (6) said memory being arranged to store an amount of shift of states in the form of time sequence input data expressed as u(k-2), u(k-1) and u(k) applied to the time domain from time t(.sub.k+1 -L) to time t.sub.k+1 ;
- said state predicting device being arranged to calculate I(k+1) depending on the arrival end identification signal produced by the thickness gauge; the past time-sequential data u(K-2), u(k-1) and u(k) being generated by the heater and determined by the magnitude of the dead time L stored in the memory and being supplied to the state prediction device from time (t.sub.k+1 -L) to time t.sub.k+1 ;
- (7) said adder being aranged for adding the output e .sup.L [X.sub.I (k+1), .omega.(k+1)].sup.T of the state shifter 105 and output I(k+1) of the state prediction device to produce the state estimated value [X.sub.I (k+1), X(k+1)].sup.T at time t.sub.k+1 ;
- (8) operating amount commander being arranged to generate an amount u(k+1) of heat generated by the heater from time t.sub.k+1 to next calculation time t.sub.k+2 is defined by the following equation using state feedback gain (f.sub.1, F.sub.2);
- u(k+1)=-f.sub.1 X.sub.1 (k+1)-F.sub.2 X(k+1) (41)
- the adder being arranged to supply the state estimated value [X(k+1), X(k+1).sup.T ] at time t.sub.k+1 to said operation amount commander 108 for heat generated by the heater; said operation amount commander being arranged to multiply the state estimated value [X(k+1), X(k+1)].sup.T by the state feedback gain to determine a command value of heat generated by the heater; and
- (9) the above control calculation is executed after the next detected value y(k+2) of film thickness is obtained from the sampler 100 at time t=t.sub.k+2 of calculation execution when the thickness gauge is moved along the width of the film after the time period T and reaches the opposite film end.
- 4. A controller according to claim 1, wherein each of said basic control means includes:
- a subtracter for producing a difference between a thickness value detected by the thickness gauge in a predetermined position along the width of the film and a set value of thickness in the predetermined position,
- an integrator for time-integrating the difference of thickness produced by said subtracter,
- a memory for storing past time sequence data of operation amounts of the control mechanism during a time equal to a sum of the dead time L.sub.1 and a time L.sub.2 until the thickness gauge reaches an end of the film after detection of thickness in the predetermined position,
- an operational calculator for producing the past time sequence data of operation amounts of the control mechanism stored in said memory and an estimated value of state variable at a time earlier than a time when the set value of the detected thickness value of a film has been inputted by a dead time L,
- a state shifter for receiving an output of said integrator and an output of said operational calculator and multiplying a coefficient for shifting the state by the dead time L to produce a state estimated value at a predetermined time,
- a state prediction device for receiving the past time sequence data of operation amounts of the control mechanism stored in said memory to produce state variation based on establishment of input from a certain time to a time after the lapse of the dead time L,
- an adder for adding an output of said state shifter and an output of said state prediction device to produce the state estimated value at the predetermined time, and
- an operation amount commander for multiplying a state estimated value at a certain time produced from said adder by a state feedback gain to produce an operation amount command value for the control mechanism
- (1) the thickness gauge constitutes means for producing the detected value y(k+1) of film thickness (vector consisting of y.sub.1 (k+1), y.sub.2 (k+1), y.sub.3 (k+1), y.sub.4 (k+1) and y.sub.5 (k+1) at the calculation execution time t=t.sub.k+1 of the time interval T each time the thickness gauge reaches an end B or C of the film width and produces the arrival end identification signal d which indicates the end which the gauge has reached;
- (2) said subtractor consitutes means to receive a value y.sub.3 (k+1) of the detected film thickness value y(k+1) and produces thickness deviation .epsilon.(k+1)=r.sub.3 (k+1)-y.sub.3 (k+1) between the detected value y.sub.3 (k+1) and a set value of a thickness r.sub.3 (k+1);
- (3) the integrator constitutes means for receiving the thickness deviation .DELTA.(k+1) from the subtracter and producing a time-integrated value of the thickness deviation from the following equation;
- X.sub.I (k+1)=XC.sub.I (k)+0.5(t.sub.k+1 -t.sub.k){.epsilon.(k)+.epsilon.(k+1)}
- where .epsilon.(k) is thickness deviation at the last thickness detection time (t+t.sub.k) and X.sub.I (k) is an output of the integrator 102 at t=t.sub.k ;
- said control mechanism includes a heater;
- the integrator includes means for forming a function of an external disturbance compensator and serves to compensate external heat varying the thickness y.sub.3 with heat generated by the heater so that the thickness y.sub.3 is always maintained at a set value;
- (4) the thickness gauge constitutes means to produce an arrival end identification signal d in response to the thickness gauge reaching either end of the film the operational calculator constitutes means to respond to the identification signal d and to the past time sequence data u(k-2) and u(k-1) of heat generated by the heater stored in said memory together with the film thickness value y(k+1),
- said operational calculator consituting means for producing an estimated value X(t.sub.k+1 -L)=.omega.(k+1) of the state variable at time t(.sub.k+1 -L) earlier than time t.sub.k+1 by the dead time L determined by the arrival end identification signal d produced by the thickness gauge;
- (5) said operational calculator consituting means for calculating the state estimated value [X.sub.I (k+1), .omega.(k+1)].sup.T at time (t.sub.kjl -L) by a coefficient e .sup.L or shifting the state by an average dead time L to obtain the state estimated value e .sup.L [K.sub.I (k+1), .omega.(k+1)].sup.T at time t.sub.k+1 ;
- said state shifter constituting means for multiplying the output X.sub.I (k+1) of the integrator and the output .omega.(k+1) of the operational calculator by the coefficient for shifting the state by the average dead time L for both end of the film to obtain the state estimated value at time t.sub.k+1 ;
- said state prediction device consituting means for correcting the state shift of the input u(k) applied in time domain for only the average dead time L;
- (6) wherein the term I(k+1) represent the shift of states for time sequence input data u(k-1) and u(k) applied to the time domain of the average dead time L from time (t.sub.k+1 -L) to time t.sub.k+1 said memory consituting means for supplying the past time sequence data of the heat generated by the heater determined by the magnitude of the dead time L to the state prediction device from time (t.sub.k+1 -L) to time t.sub.k+1 ;
- (7) said adder further constituting means for adding the output e .sup.L [K.sub.I (k+1), .omega.(k+1)].sup.T of the state shifter and output I(k+1) of the state prediction device to produce the state estimated value [X.sub.I (k+1), X(k+1)].sup.T at time t.sub.k+1 ; said state shifter further constituting means for integrating the state estimated value at time t.sub.k+1 ;
- (8) an amount u(k+1) of heat generated by the heater from time t.sub.k+1 to next calculation time t.sub.k+2 is defined by the following equation using state feedback gain (f.sub.1, F.sub.2);
- u(k+1)=-f.sub.1 X.sub.1 (k+1)-F.sub.2 X(k+1)
- said operation amount commander constituting means responsive to the state estimated value [X(k+1), X(k+1)].sup.T at time t.sub.k+1 from the adder, of heat generated by the heater, for multiplying the state estimated value [X(k+1), X(k+1))].sup.T by the state feedback gain to define a command value of heat generated by the heater after obtaining the next detected value y(k+2) of film thickness from the sampler at time t=t.sub.k+2 when the thickness gauge is moved along the width of the film after the time period T and reaches the opposite film end.
Parent Case Info
This is a division of application Ser. No. 311,223 filed Feb. 15, 1989.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
4680089 |
Arai et al. |
Jul 1987 |
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Divisions (1)
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Number |
Date |
Country |
Parent |
311223 |
Feb 1989 |
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