This application claims priority to and the benefit of Korean Patent Application No. 10-2005-0098332, filed on Oct. 18, 2005, in the Korean Intellectual Property Office, the entire content of which is incorporated herein by reference.
1. Field of the Invention
The present invention relates to a flat panel display device having a thermostat.
2. Discussion of Related Art
An electron emission display has a triple electrode structure having a cathode, an anode, and a gate electrode. The cathode electrode serving as a scan electrode is formed on a substrate, an insulator layer having a hole is formed on the cathode electrode, and the gate electrode generally serving as a data electrode is formed on the cathode electrode. Moreover, in the hole, an electron emitter is formed and contacts the cathode electrode.
Such an electron emission display concentrates a high electric field to the emitter to emit electrons due to the quantum mechanical tunnel effect, and the electrons from the emitter are accelerated by voltage applied between the cathode electrode and the anode electrode and collide against an RGB luminescent layer such that a phosphor of the RGB luminescent layer is illuminated to display an image.
When temperature increases, resistance decreases, causing the voltage to decrease and the electron emission scattering between the electron emission sources to increase.
Thus, the resistance of the resist layer of the electron emission device cannot be adjusted uniformly and managed steadily during the operation, so that the uniformity between the pixels is affected.
A flat panel display device includes an electron emission substrate; an image forming substrate spaced apart from the electron emission substrate; a spacer disposed between the electron emission substrate and the image forming substrate; a measuring device including a measuring line formed in a displaying region on the electron emission substrate concurrently with a cathode line, and a first measuring pad formed on a first side and a second measuring pad formed on a second side of a non-displaying region concurrently with a cathode pad; a power supply connected to the first measuring pad to supply a voltage or current thereto; a detector connected to the second measuring pad to detect the voltage or current supplied from the power source; a temperature controlling part for converting the voltage or current detected by the detector into a temperature value and for controlling a temperature of the electron emission substrate; and a cooler for cooling the flat panel display device to be at the temperature controlled by the temperature controlling part.
In one embodiment, the temperature controlling part includes: a temperature converter for converting the voltage or current detected by the detector into the temperature value; a temperature comparator for comparing the temperature value converted by the temperature converter with a reference temperature; and a temperature controller for controlling the temperature of the electron emission substrate.
The detector may be adapted to detect the voltage or current at opposite ends of the measuring line, and the measuring line and the cathode line are formed in the displaying region.
The flat panel display device may also include a second cathode pad formed on the second side of the non-displaying region, wherein the second measuring pad is formed between the cathode pads. The cooler may include a thermoelectric semiconductor device or cooling fan. In one embodiment, the voltage or current supplied to the first measuring pad is supplied during a sensing time when a scan signal is applied to the cathode line.
Another embodiment of a flat panel display device includes an electron emission substrate; an image forming substrate spaced apart from the electron emission substrate; a spacer disposed between the electron emission substrate and the image forming substrate; a measuring device including measuring lines formed in respective corners of a displaying region of the electron emission substrate, and measuring pads connected to ends of the measuring lines in a non-displaying region; a power supply connected to respective first sides of the measuring pads to supply a voltage or current thereto; a detector connected to respective second sides of the measuring pads to detect the voltage or current supplied from the power source; a temperature controlling part for converting the voltage or current detected by the detector into a temperature value and for controlling a temperature of the electron emission substrate; and a cooler for cooling the flat panel display device to be at the temperature controlled by the temperature controlling part.
Yet another flat panel display device includes an electron emission substrate; an image forming substrate spaced apart from the electron emission substrate; a spacer disposed between the electron emission substrate and the image forming substrate; a thermometer or a thermocouple attached to the spacer to measure a temperature value of the electron emission substrate; a temperature controlling part for receiving the temperature value from the thermometer or thermocouple and for controlling a temperature of the electron emission substrate; and a cooler for cooling the flat panel display device to be at the temperature controlled by the temperature controlling part.
Still yet another flat panel display device includes an electron emission substrate; an image forming substrate spaced apart from the electron emission substrate; a spacer disposed between the electron emission substrate and the image forming substrate; a cathode line formed in a displaying region on the electron emission substrate; a first cathode pad formed on a first side and a second cathode pad formed on a second side of a non-displaying region; a power supply connected to the cathode line and the first cathode pad to supply a voltage or current thereto; a detector connected to the cathode line and the second cathode pad to detect the voltage or current supplied from the power source; a temperature controlling part for converting the voltage or current detected by the detector into a temperature value and for controlling a temperature of the electron emission substrate; and a cooler for cooling the flat panel display device to be at the temperature controlled by the temperature controlling part.
The voltage or current supplied to the cathode line may be supplied during a sensing time when a scan signal is applied to the cathode line.
One embodiment of a flat panel display device includes an electron emission substrate; an image forming substrate spaced apart from the electron emission substrate; a spacer disposed between the electron emission substrate and the image forming substrate; a detector coupled to the electron emission substrate for detecting a temperature value of the flat panel display device; a temperature controlling part for receiving the receiving the temperature value and for controlling a temperature of the electron emission substrate based on the received temperature value; and a cooler for cooling the flat panel display device to be at the temperature controlled by the temperature controlling part.
The detector may include a thermometer or thermocouple connected to the spacer for thermally detecting the temperature value.
In one embodiment, the detector includes: a cathode line electrically coupling a first cathode pad and a second cathode pad; a power supply for supplying a voltage or current to the first cathode pad; a voltage or current detector for detecting the voltage or current supplied by the power supply; and a temperature converter for converting the voltage or current detected by the voltage or current detector into the temperature value of the electron emission substrate. The first cathode pad is positioned on a first side and the second cathode pad is positioned on a second side of a non-displaying region of the electron emission substrate and the cathode line is positioned in a displaying region of the electron emission substrate.
In another embodiment, the detector includes: a measuring line electrically coupling a first measuring pad and a second measuring pad; a power supply for supplying a voltage or current to the first measuring pad; a voltage or current detector for detecting the voltage or current supplied by the power supply; and a temperature converter for converting the voltage or current detected by the voltage or current detector into the temperature value of the electron emission substrate. The first measuring pad and the second measuring pad are positioned in a non-displaying region of the electron emission substrate and the measuring line is positioned in a displaying region of the electron emission substrate.
In one embodiment, the first measuring pad is positioned on a first side of the non-displaying region and the second measuring pad is positioned on a second, opposite side of the non-displaying region. Alternatively, the first measuring pad and the second measuring pad may be positioned on a same side of the non-displaying region.
The cooler may include cooling fins. One embodiment of the flat panel display device also includes a temperature comparator for receiving the temperature value, comparing the temperature value to a reference value, and the temperature controlling part controls the temperature of the electron emission substrate based on the comparison.
These and/or other features and aspects of the invention will become apparent and more readily appreciated from the following description of examples of embodiments, taken in conjunction with the accompanying drawings of which:
Hereinafter, a flat panel display device according to examples of embodiments of the present invention will be described with reference to the attached drawings.
As shown in
The flat panel display device 310 includes the electron emission substrate 301 spaced apart from the image forming substrate 302 by a distance, which may be predetermined, and a spacer disposed therebetween. The electron emission substrate 301 of the flat panel display device 310 includes the cathode line 303 having a desired shape, for example, a stripe shape, and formed in a display region on a transparent substrate. The electron emission device includes an electron emitter (not shown) formed at a crossing of the cathode line 303 and the gate line. The cathode line 303 becomes a cathode electrode of the electron emission device and is formed using indium tin oxide (ITO) in one embodiment. At that time, the cathode line 303 and the measuring line 306 of the measuring device are formed concurrently or simultaneously in this embodiment.
Moreover, a resist layer (not shown) is further formed between the cathode electrode and the electron emitter.
In the non-displaying region of the electron emission substrate 301, the cathode pad 304 is formed to supply signals to the cathode line 303. At that time, in a desired region between the cathode pads 304, the measuring pads 305 and 307 of the measuring device are formed simultaneously.
Additionally, the image forming substrate 302 includes a transparent substrate, the anode electrode 308 formed on the transparent substrate, phosphors (not shown) formed on the anode electrode 308 to emit light due to electrons emitted from the electron emitter, and a light shield layer (not shown) formed between the phosphors.
The flat panel display device 310 further includes a frit 309 for sealing the electron emission substrate 301 and the image forming substrate 302 to maintain a vacuum thereof and for supporting the two substrates.
The measuring device includes the measuring line 306 formed in the displaying region like the cathode line 303, and the measuring pads 305 and 307 formed in the upper and lower sides of the non-displaying region like the cathode pad 304 and between the cathode pads 304. The measuring pads 305 and 307 are connected to respective ends of the measuring line 306.
The power source 320 supplies electric power to the measuring pad 305 connected to the upper end of the measuring line 306. At that time, the power source can operate as a current source or a voltage source to the measuring pad 305.
As shown in
In other words, the current of the measuring device passing through the electron emission substrate 301 can be measured with reference to the voltage source of the power source 320, and the voltage of the measuring device can be measured with reference to the current source.
The detector 330 detects current or voltage between both ends of the measuring line after the current or the voltage supplied from the power source 320 has passed through the measuring device.
The temperature converter 340 converts the current or the voltage detected by the detector 330 into a temperature value. Here, the detected current or voltage can be obtained from a table presetting the relationship between current or voltage and temperature. Thus, when a certain current or voltage is detected, the temperature converter converts the detected value into a corresponding temperature value.
The temperature comparator 350 determines whether the temperature value converted by the temperature converter 340 corresponds to the reference temperature of the electron emission substrate 301. In other words, it is compared and determined whether or not the temperature value of the electron emission substrate 301 is over the reference temperature.
When the temperature comparator 350 determines that the temperature of the electron emission substrate is increased, the temperature controller 360 outputs a driving signal to decrease the temperature to below the reference temperature so that current is prevented from decreasing due to an increase of resistance of the resist layer of the electron emission substrate.
The cooler 370 cools the electron emission substrate such that temperature of the electron emission substrate is decreased according to the driving signal output by the temperature controller 360.
The cooler 370 may include cooling fins or a cooling fan installed on the rear side of the electron emission substrate or may include a thermoelectric semiconductor using the Peltier effect and deposited on the rear side of the electron emission substrate.
Specifically, when current is applied to a closed circuit including a semiconductor connected to two different metals, heat different from Joule's heat is generated or absorbed at the junction. This phenomenon is called to Peltier effect.
The Peltier effect refers to the heat emission or heat absorption occurring when current flows through the junction between two different materials. If heat is generated when current flows in one direction, heat is absorbed when the current flows in the opposite direction. The Peltier effect is reversible. In other words, when current flows in the opposite direction, heat generation and heat absorption reverse. For example, when iron and copper are connected to the ends and current flows therethrough, heat is generated from a junction and heat is absorbed from the exterior of the opposite junction so that ambient temperature decreases.
Heat absorbed and emitted due to the Peltier effect can be expressed by the following formula.
|Qp|=αab×Tj×I=π×I
Here, π=αab×Tj is a Pelter coefficient, I is current, αab is relative thermoelectric power of two metals a and b according to ambient temperature, and |Qp| is an absolute value of heat generated in a unit time.
When the current of the Peltier thermoelectric semiconductor is applied in the opposite direction, the cooling fins serve as a heat radiator pad and the heat radiator fins serve as a cooling pad.
In the embodiment shown in
Additional description of elements similar to those discussed above in reference to
In the embodiment shown in
Additional description of elements similar to those described above in relation to
This structure allows to easily design the measuring device without changing the design of the displaying region.
Although the measuring device is formed to measure temperature in the described embodiments, a device for measuring temperature of the electron emission substrate may include a thermometer or thermocouple. In other words, a small thermometer or thermocouple may be attached to the spacer formed between the electron emission substrate and the image forming substrate to measure temperature.
Although only some examples of embodiments of the present invention have been disclosed for illustrative purposes, those skilled in the art will appreciate that various modifications, additions and substitutions are possible, without departing from the scope and spirit of the invention as defined in the accompanying claims and their equivalents.
Number | Date | Country | Kind |
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10-2005-0098332 | Oct 2005 | KR | national |
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Number | Date | Country | |
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20070085813 A1 | Apr 2007 | US |