The present invention relates to an apparatus and method for facilitating the connection of integrated optical circuits to external optical components and devices.
Grating couplers are a promising technology for coupling light between integrated optical elements and external components or devices. Grating couplers have advantages for use as optical input and output ports to optical or optoelectronic processing elements. Grating couplers are typically formed from lithographic techniques that create extremely precise positioning of grating couplers to other devices formed on the same substrate. It is not uncommon for current photolithography equipment to place elements with respect to one another with alignment precision on the order of 1-10 nm. For many optical devices, this type of precision far exceeds the tolerance requirements for accurate optical alignment. It is desirable to leverage this accuracy to enable cost-effective, parallel alignment of optical devices to the precisely located grating couplers.
The system, method, and devices of the invention each have several aspects, no single one of which is solely responsible for its desirable attributes. Without limiting the scope of this invention, its more prominent features will now be discussed briefly. After considering this discussion, and particularly after reading the section entitled “Detailed Description of Certain Embodiments” one will understand how the features of this invention provide advantages over other display devices.
One embodiment of the invention comprises an optical apparatus comprising at least one optical device, a photonic integrated circuit chip, and a substantially flux-free bond. The at least one optical device flip-chip is bonded to the photonic integrated circuit chip. The substantially flux-free bond provides electrical connection to the optical device and the photonic integrated circuit chip.
Another embodiment of the invention comprises an optical apparatus comprising at least one optical device, a photonic integrated circuit chip, and substantially optically transmissive filler material. The at least one optical device is flip-chip bonded to the photonic integrated circuit. The photonic integrated circuit chip comprises a least one optical coupler configured to couple light between the at least one optical device and the photonic integrated circuit chip. The substantially optically transmissive filler material is disposed in an optical path between the at least one optical device and the optical coupler.
Another embodiment of the invention comprises an optical apparatus comprising at least one surface emitting laser and a photonic IC chip. The at least one surface emitting laser comprises gain medium disposed in an optical resonant cavity having an optical axis. The surface emitting laser further comprises an output coupling element such that light exits the resonant cavity at an oblique angle with respect to the optical axis. The photonic IC chip comprises an optical coupler. The at least one edge emitting laser is flip-chip bonded to the photonic IC chip so as to form an optical path from the output coupling element of the surface emitting laser to the optical coupler of the photonic IC chip.
Another embodiment of the invention comprises an optical apparatus comprising at least one edge emitting laser, a photonic IC chip, and a beam deflector. The at least one edge emitting laser comprises gain medium disposed between first and second ends of an optical resonant cavity. Light in the resonant cavity can exit through the second end. The photonic IC chip comprises an optical coupler. The at least one edge emitting laser is bonded to the photonic IC chip. The beam deflector is disposed so as to direct light exiting through the second reflector of the edge emitting laser to the optical coupler.
For the purposes of this invention, an array of elements will refer to two or more similar optical devices that are spaced with known positions with respect to one another in a plane and held rigidly in place with a substrate or other mechanical construction. An array containing multiple devices need not be evenly spaced in any dimension, although the relative positions are best well known and controlled in a high-volume assembly environment. However, various preferred embodiments include an array of evenly spaced devices.
Many optical devices that would be advantageously coupled to grating couplers are also formed from lithographic techniques. Examples include surface emitting lasers (e.g., VCSELs), Fabry-Perot lasers, diffractive elements, fiber V-groove substrates, and photodetectors. Furthermore, during the construction of optical devices, including grating couplers, other features, such as bond pads and fiducials can be formed with high relative precision to the optical element. Examples are the bond pads on a photodetector or laser die. Similar features can be placed on a substrate containing grating couplers.
It is desirable to use these fiducials and bond pads to facilitate flip-chip assembly of optical devices over optoelectronic circuits containing grating couplers. The flip-chipping process can use a solder or gold balls in what is commonly referred to as gold stud bumping. This approach has the advantage of also providing electrical and thermal contact between the substrate containing the grating couplers, and the optical device which is affixed on top. When electrical contract is not needed, these approaches are still valid, however additional flexibility, such as attachment via epoxy or other mechanical bonding technique is also acceptable.
It is also possible to grow, deposit or form optical structures over a substrate in what is referred to as an integrated optical circuit chip or photonic integrated circuit chip. These optical structures may be connected by waveguides and may themselves comprise waveguide structures. This integrated optical circuit may also contain a grating coupler or grating coupler array. The waveguides and structure may be formed via techniques involving chemical vapor deposition, physical vapor deposition, epitaxial deposition, sputtering, etching, photolithography, spin coating, screen printing, injection molding, stamping, or other physical processing techniques. A number of these techniques, such as CVD or other epitaxial growth can be self-aligned to the grating couplers.
Photolithographic techniques allow the processing and placement of optical devices over grating couplers with high precision using accurate alignment marks and specialized photolithographic equipment capable of the appropriate accuracy. Accordingly, in various preferred embodiments, the optical devices are also fabricated with photolithographic techniques of adequate precision to allow simultaneous optical alignment of all elements of the array with the array of grating couplers. An example would be an array of photodetectors fabricated on a substrate formed from a III-IV compound. These photodetectors are lithographically defined, and have bonding pads that are also lithographically defined and aligned with respect to the photodetector. The lithographic process easily lends itself to the construction of an array of these devices that is matched in dimension to the grating coupler array, and thus when these two arrays are flip chipped together, it is possible to ensure simultaneous alignment of all of the devices and structures.
During the flip-chipping process, fiducials and a number of active and passive alignment techniques can be used to align only a small number of the devices and/or structures, logically the first and last elements of a linear array, and ensure that all other devices and structures are aligned as well. It does not have to the first and fast elements, but in general the farther apart in the array that the small number of chosen devices and/or structures are, the better the alignment will be. In certain applications it may suffice that a single element, or two elements in the center of an array are aligned.
Examples of benefits derived from flip-chipping an array of optical elements such as VCSELs or photodetectors over a substrate are when the substrate contains both the optical circuit that connects to the optical element, and the electrical circuit that connects to the optical element. An example of an implementation would be a system to generate an electrical signal from optical signals in an array of waveguides in a substrate. A grating coupler array can direct the optical signals to a photodetector array that is flip-chipped over the grating coupler array. The flip-chipping process can simultaneously allow electrical connections to transimpedance amplifiers or other circuitry in the substrate that are used to process the signal from the photodetectors. Various embodiments of the present invention have many advantageous implementations involving all types of lasers, optical amplifiers and photodetectors, although a number of other devices could be used in a similar manner.
For example,
In addition, fiducials 105 are placed on the substrate to facilitate alignment of the optical devices to the grating coupler array. In this embodiment, fiducials 105 are placed that facilitate the flip-chip attachment of an array of optical elements 200 which are formed on a second substrate 201 as shown in
In many cases, electronic circuits have an edge seal comprising, e.g., metal, that seals the electronic circuits and prevents contamination via diffusion of contaminants into nearby photonics and electronics components. In cases where optical devices containing such electronics are butt coupled to photonics chips, this seal is opened to allow light to couple in or out. Contaminants as well, however, can pass through causing severe reliability problems. One advantage of flip-chip mounting and using grating couplers for integration of external optical devices with photonic chips is that the edge seal ring need not be broken. The flow of contaminants is thereby reduced and reliability improved. Additionally, enhanced mode coupling between the optical device and the grating coupler can be provided in various embodiments.
A perspective view of a laser diode array 402 bonded to a photonic integrated circuit chip 404 is shown in
The laser diode array 402 comprises a plurality of surface emitting lasers such as shown in
The laser die may comprise a variety of materials including non-silicon based materials such as III-V semiconductor materials. For example, the laser diode may comprise GaAs, InP or alloys thereof. Other materials may be employed as well. In various embodiments, the photonic integrated circuit chip 504 comprises silicon based material such as silicon, silicon dioxide, or silicon nitride. The photonic integrated circuit chip 504 may include a silicon-on-silicon on oxide (SOI) substrate. Silicon and non-silicon based materials may be formed thereon or therein. Examples of structures that can be included in photonic integrated circuit chips 504 are described in U.S. Pat. No. 6,834,152 entitled “Strip Loaded Waveguide with Low-Index Transition Layer” and U.S. Pat. No. 6,839,488 entitled “Tunable Resonant Cavity Based on Field Effect in Semiconductors”, both of which are incorporated herein by reference in their entirety.
The laser die 502 is bonded to the photonic integrated circuit chip 504 using AuSn solder 512 between the metal contact or pad 506 and the laser die as shown in
The AuSn solder can be applied, for example, by electroplating, evaporation, or using other deposition techniques. The solder can be patterned, for example, using photolithography. Accordingly, the size and position of the solder bond 512 can be precisely controlled. The laser die 502 and photonic integrated circuit chip 504 can be heated to form the bond. Other methods may also be employed.
In certain preferred embodiments, the AuSn solder bond 512 may be about 3 to 5 micrometers thick. Values outside this range are also possible. Advantageously, the reduced thickness results in a short distance between the laser die 502 and the optical coupler on the photonic integrated circuit chip 504. Reduced optical path length increases coupling efficiency. Additionally, thermal resistance between the laser die 502 and the photonic integrated circuit chip 504 is decreased causing higher conduction of heat through the solder bond 512 to the photonic integrated circuit chip 504, which acts as a heatsink.
The plurality of layers may be grown on a substrate 601 to form the laser die 602. The laser die may be flip-chip bonded such that the plurality of layers (not the substrate 601) are closer to the solder bond 612. One of the layers, the uppermost during the growth process (and farthest from the substrate 612), may contact the solder.
In certain embodiments, reflectors 618 are disposed at opposite ends to form an optical cavity. These reflectors 618 may comprise, for example, etched or cleaved surfaces or dielectric coatings. This optical cavity has an optical axis. In
Other types of surface emitting lasers having horizontal cavities may also be used. For example, the reflectors 618 may comprise Bragg reflectors. Alternatively, such reflectors 618 may be excluded in a distributed feedback laser wherein a grating extends along the core region 614. Other types of surface emitting lasers such as Vertical Cavity Surface Emitting Lasers (VCSELS) may also be employed. Still other configurations and designs are possible.
Light propagates within the core region 614 along the Z direction. (In comparison, the light propagates in Y direction in Vertical Cavity Surface Emitting lasers, i.e., VCSELs.) In the surface emitting laser shown, the light is extracted from the core region 614 at an angle and propagates through one of the cladding regions 616, through a portion of the layers. In
As shown in
Advantageously, the filler material 626 may protect the sensitive surfaces of the optical elements (e.g., the lens 624, the output surface 620, and the optical coupler 610). The underfill 626 may also add mechanical strength to the flip-chip bond. The substantially optically transmissive filler material 626 may also improve optical performance. The filler material 626, having an index higher than that of air (1.0), may yield reduced beam divergence. Additionally, losses due to Fresnel reflection at interfaces may also be reduced.
More generally, a wide variety of optical devices can be bonded to the photonic integrated circuit chip 704. These devices may be light sources such as lasers or other types of light sources. Other devices are also possible. Some examples include optical sensors or detectors, modulators, etc.
As shown in
The laser die 802 comprises a plurality of edge emitting lasers. An exemplary edge emitting laser may comprise a plurality of layers, for example, that form a stack. Like the surface emitting laser described above, the edge emitting laser comprises a core region surrounded by cladding. This core region may comprise semiconductor material that provides optical gain. The edge emitting laser may further comprise reflectors on opposite ends that form optical cavity, which includes this optical gain material therein. These reflectors may comprise reflective surfaces disposed at opposite edges of the stack. The reflectors may be cleaved surfaces or dielectric coatings. One of the reflectors may be partially reflecting such that light escapes the optical cavity and is output through the edge of the laser.
Other types of edge emitting lasers may also be used. For example, the reflectors may comprise Bragg reflectors. Alternatively, such reflectors may be excluded in a distributed feedback laser wherein a grating extends along the core region. Anti-reflective (AR) coatings may be disposed at the opposite ends of the resonator cavity. Still other configurations and designs are possible.
The auxiliary optics 801 includes a microlens array 834 that receives the light beam emitted from the edge emitting laser. The microlens array 834 may comprise a silicon microlens array. This microlens array 834 may be actively aligned on the substrate 832 in some embodiments. The auxiliary optics 801 further comprises a deflecting mirror 836 bonded to the substrate 832. This deflecting mirror 836 may include, for example, a Au coated mirror surface. Microlenses in the microlens array 834 and the deflecting mirror 836 may form a plurality of optical paths that are aligned with a plurality of output ports of the edge emitting lasers in the die.
The laser beam 903 exits an output port at the edge of the laser diode die 902. This laser beam 903 propagates through a lens in the lens array 934 and to the deflecting mirror 936 where the beam is deflected in a perpendicular direction through the silicon substrate 932 and to the photonic integrated circuit chip 904. As shown in
The module may provide advantages in manufacturing in some cases. Also, in certain embodiments, the module 900 may have a lid, and the laser diode 902 can be hermetically sealed.
As illustrated in
A variety of types of lens and mirrors may be used for the lens 1034 and deflecting mirror 1036 shown in
As described above, optical devices other than lasers may be bonded to photonic chips as well.
The amplifier device 1102 comprises an optical gain medium comprising, for example, semiconductor material such as III-V semiconductor material. The amplifier 1102 may comprise other types of material including other non-silicon based materials. The amplifier 1102 may be a guided structure comprising a core region, e.g. surrounded by cladding. In the embodiment shown in
The photonic integrated circuit chip 1104 includes an optical coupler 1110 such as, e.g., a grating coupler and a waveguide 1108 coupled to the grating coupler. A second reflector 1150 comprising, for example, a Bragg grating, is disposed in the waveguide 1108. A phase controller 1152 is also inserted in the waveguide 1108.
The first and second reflectors 1140 and 1150 form an optical cavity 1154. The phase controller 1152 can be tuned to provide the appropriate resonance. An optical path extends through this optical cavity 1154 from the first reflector 1140, to the optical coupler 1148, through the port 1142 to the optical coupler 1110, and through the waveguide 1108 to the second reflector 1150. Portions of this optical cavity 1154 are therefore within both the amplifier device 1102 and the photonic integrated circuit chip 1104. Light may be amplified in the amplification device 1102 and resonate and be output as laser light through the second reflector 1150 in the waveguide 1108.
The amplifier 1102 is positioned such that the port 1142 in the amplifier is aligned with an optical coupler (e.g., a grating coupler) 1110 in the photonic integrated circuit chip. The coupling structure 1148 may be configured to substantially optically match the modes in the amplifier to the grating coupler 1110. In certain embodiments, the coupling structure 1148 comprises a mirror having a shape, position, and orientation to provide suitable shape, size, location, and angle of incidence for the beam directed onto the grating coupler 1110. In other embodiments, the coupling structure 1148 may comprise a grating. Other types of structures may be employed. Additional optical elements, such as lens, may also be included.
Similarly, the first and second reflectors 1140, 1150 may be different. For example, the first reflector 1140 may comprise a cleaved surface, a dielectric coating, or may be replaced by a Bragg grating. Still other designs are possible for the reflectors 1140, 1150 and the optical cavity 1154. In other embodiments, for example, the amplifier 1102 may be an edge emitting device such as shown in
A solder bond 1112 joins the amplifier 1102 to the photonic integrated circuit chip 1104. Advantageously, the amplifier 1102 may be passively aligned and bonded to the photonic integrated circuit chip 1104. Fiducials may, for example, permit visual alignment. Alignment may be automated. Because the amplifier 1102 can be passively aligned, no optical signal need be output by the amplifier or input into the amplifier to accomplish such alignment. In other embodiments, such an optical signal is employed to actively align the amplifier 1102.
An amplifier device 1202 may be bonded to a photonic integrated circuit chip 1204 to amplify a signal propagating in the photonic chip as shown in
The amplifier device 1202 comprises an optical gain medium comprising, for example, semiconductor material such as III-V semiconductor material. The amplifier 1202 may comprise other types of material including other non-silicon based materials. The amplifier 1202 may be a guided structure comprising a core region, e.g., surrounded by cladding. In the embodiment shown in
The photonic integrated circuit chip 1204 includes a first and second optical couplers 1209, 1210 comprising, e.g., grating couplers, and first and second waveguide portions 1207, 1208 coupled to the first and second grating couplers, respectively.
An optical path extends from the first waveguide portion 1207 and the first grating coupler 1209 through the input port 1241 to the first coupling structure 1247, through the amplifier 1202 to the second coupling structure 1248, and through the exit port 1242 to the second grating coupler 1210 and the second waveguide portion 1208. Portions of this optical path are therefore within both the amplifier device 1202 and the photonic integrated circuit chip 1204. An optical signal propagating in the photonic integrated circuit chip 1204 may, thus, be directed into the amplifier 1202 where the optical signal is amplified.
The amplifier 1202 is positioned such that the entrance and exit ports 1241, 1242 in the amplifier are aligned with the optical couplers (e.g., a grating coupler) 1209, 1210 on the photonic integrated circuit chip 1204. The coupling structures 1247, 1248 may be configured to substantially optically match the modes in the amplifier 1202 to the grating couplers 1209, 1210. In certain embodiments, the coupling structures 1247, 1248 comprise mirrors or gratings. Other types of structures may be employed. Additional optical elements, such as lens, may also be included.
Still other designs are possible. In other embodiments, for example, the amplifier may be an edge emitting device such as shown in
A solder bond 1210 joins the amplifier 1202 to the photonic integrated circuit chip 1204. Advantageously, the amplifier 1202 may be passively aligned and bonded to the photonic integrated circuit chip 1204. Fiducials may, for example, permit visual alignment. Alignment may be automated. Because the amplifier 1202 can be passively aligned, no optical signal need be output by the amplifier or input into the amplifier to accomplish such alignment. In other embodiments, such an optical signal is employed to actively align the amplifier 1202.
While the above detailed description has shown, described, and pointed out novel features of the invention as applied to various embodiments, it will be understood that various omissions, substitutions, and changes in the form and details of the device or process illustrated may be made by those skilled in the art without departing from the spirit of the invention. As will be recognized, the present invention may be embodied within a form that does not provide all of the features and benefits set forth herein, as some features may be used or practiced separately from others.
This application is a continuation-in-part of U.S. patent application Ser. No. 10/601,147 (Attorney Docket LUX-P004) filed Jun. 19, 2003 entitled “An Array of Active Optical Components Aligned to an Array of Grating Couplers,” which claims priority from U.S. Provisional application No. 60/389,961, filed Jun. 19, 2002, entitled “Active Optical Components Aligned to a Grating Coupler Array,” both of which are incorporated herein by reference in their entirety, and this application also claims priority to U.S. Provisional Application No. 60/598,500 filed Aug. 2, 2004 and entitled “Specification for Light Source Die or Module,” which is also incorporated herein by reference in its entirety.
Number | Date | Country | |
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60389961 | Jun 2002 | US | |
60598500 | Aug 2004 | US |
Number | Date | Country | |
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Parent | 10601147 | Jun 2003 | US |
Child | 11195357 | Aug 2005 | US |