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4540903 | Cooke et al. | Sep 1985 | |
4975595 | Roberts et al. | Dec 1990 | |
5068881 | Dervisoglu et al. | Nov 1991 | |
5130568 | Miller et al. | Jul 1992 |
Number | Date | Country |
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2-117205 | May 1990 | JPX |
2-134916 | May 1990 | JPX |
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Yashwant K. Malaiya and Ramesh Narayanaswamy, "Testing for Timing Faults in Syncronous Sequential Integrated Circuits," IEEE 1983 International Test Conference, Paper 19.3, pp. 560-571. |