A Support Vector Machine (SVM) is a powerful tool for learning pattern classification. An SVM algorithm accepts as input a training set of labeled data instances. Each data instance is described by a vector of features, which may be of very high dimension, and the label of an instance is a binary variable that separates the instances into two types. The SVM learns a classification rule that can then be used to predict the label of unseen data instances.
For example, in an object recognition task, the algorithm accepts example images of a target object (e.g., a car) and other objects, and learns to classify whether a new image contains a car. The output of the SVM learning algorithm is a weight (which may be positive or negative) that is applied to each of the features, and which is then used for classification. A large positive weight means that the feature is likely to have high values for matching patterns (e.g., a car was detected), and vice versa. The prediction of a label is then made by combining (summing) the weighted votes of all features and comparing the result to a threshold level.
The features used by the algorithm can be raw features (e.g., pixel gray level) or more complex calculated features such as lines, edges, textures. In many real-world applications, there is a huge set of candidates of features (which can easily reach millions). However, working with such a huge set, even on modern computer systems, is usually infeasible, and such a classifier is thus very inefficient.
In various embodiments, a feature selection method is provided for use with support vector machines (SVMs). More specifically, embodiments of the present invention can provide for highly efficient feature selection for large scale learning problems without diminution in accuracy. As will be described further herein, in one implementation a SVM-forward feature selection (SVM-FFS) algorithm may be used to perform machine learning/pattern recognition with high accuracy and efficiency.
For purposes of example, assume a computer is to perform a task for handwritten digital identification. To do this, a learning algorithm is provided, and is given examples of images of the digits, e.g., 1,000 images of the digits. Each such image has multiple features. The type of features in the sample feature in case of images of digits can be the pixel grey level. For example, the first feature may be a first pixel. In other cases, the features may be more complex, for example, decide that a feature is the multiplication of some pixels. For example, the first feature may be a multiplication of the first pixel with another pixel. In general, the number of features may be arbitrarily large. The result of the training is a classifier that can then be used to receive unlabeled data (e.g., a digital image) and perform analysis to recognize the new digit. Some instances of digits are hard to classify and the SVM focuses on the instances that are hard to classify by giving these instances large weights.
As will be described further below, the SVM-FFS algorithm can be used to perform training of a linear SVM on a relatively small, random subset of an entire set of candidate features. Based on the results, a relatively small subset of good features can be selected. In this way, the computation expense of training the SVM on all candidate features of a feature set can be avoided.
That is, SVMs typically operate by performing training on all features of a feature set. During such training, the algorithm accepts as input a labeled sample {{right arrow over (Xi)}, yi}i=1N, where {right arrow over (X)}i=(xi1, . . . , xid)εRd (which is a training vector) and yiε{+1,−1} is a label indicating the class of {right arrow over (X)}i. During training, a weight vector {right arrow over (W)}=(w1, . . . , wd) is optimized to separate between the two classes of vectors. This can be done by standard SVM solver, for example, by solving a quadratic programming problem. The optimal {right arrow over (W)} can be expressed as a linear combination of the training examples:
where N is the number of instances, y is the label, and {right arrow over (X)} is the training vector, and instance weights {αi}i=1N are computed during the training. After training, the classification of a new example is done by calculating the dot product between the weight vector and the new example, i.e., {right arrow over (W)}·{right arrow over (X)}.
Note that a SVM does not calculate feature weights directly, but first assigns a weight to each input instance (e.g., in dual representation). This creates a vector a of length N (corresponding to the number of training instances). The value of {right arrow over (α)} weight assigned to an example reflects its dominance in defining the decision boundary between the two classes. Each feature weight is then computed based on this {right arrow over (α)} vector (multiplied by the label vector) and the N-size vector containing the feature values for all the instances.
When, however, the dimension d of the feature set is very high, the accuracy of the classifier often degrades, and the computational cost of both training and classification can increase dramatically. Thus in various embodiments, a feature selection may be performed to reduce to d to d′, where d′<<d.
Thus the output of a SVM is a set of parameters {αi}i=1N that is used to calculate the weights wj, and the ranking criteria of the jth feature is
We define the quality of features as the square value of weight. Equivalent defining, which leads to the same ranking is the absolute value of weight, as only the order of quality values matters.
In an iterative process, the features with lowest ranking criteria are dropped, and the iterations continue until a much smaller number of remaining features are left. That is, absolute weights that are less than a minimum absolute weight, which may be very close to zero, are excluded from further training, and thus for further iterations these features are not used anymore. However, in conventional recursive feature elimination for SVM (SVM-RFE) implementations to perform this feature selection process, a long time is needed. In some implementations, 10's or even 100's iterations may be needed depending on a context-specific algorithm. Note that typically the first number of iterations takes a long time to be performed, and later iterations are shorter due to a smaller feature set. The computational bottleneck is in the first iterations, when a potentially huge number of features need to be solved by the SVM. The complexity of running R rounds of a conventional SVM is Θ(N2dR), which is prohibitive when both N and d are large.
Thus in various embodiments, instead of repeated feature elimination, a first SVM iteration is performed only on a small subset of features (d′), rather than all of such features d. In this first iteration, this small subset of features is randomly selected from the full feature set. In later iterations, the SVM can be performed on the same size of d′ features, but in this case the features with low absolute weights are replaced with better ones. To realize this, the weights of features that do not participate in a training of SVM can be approximated. There is not a significant difference in the result weight between the weight estimate and the weight determined using all features. In many instances, the weight estimation is good enough to reduce to a subset of four hundred (e.g., of out of a half million features), and then drop the least weighted features. Large performance gains using embodiments of the present invention can be realized, as SVM training is provided on a very small subset of features, rather than all features of training instances.
As such, in a SVM-FFS algorithm an {right arrow over (α)}′ vector can be computed by running the SVM on a relatively small random subset of features (i.e., as performed in block 110 of
Referring now to
The SVM may be trained by computing SVM weights for the working set corresponding to the d′ features. As will be described further below, the output of this training phase may correspond to a weight per instance at dual representation, i.e., α′, where α′ is determined using a standard SVM solver. This weight per instance may create a vector α′ of length N that corresponds to the number of training instances.
Referring still to
Then, the quality of each feature of the entire set of q features may be approximated (block 120). That is, using the approximated q weights αi′ a quality criteria, for example, Qj′, may be determined for each feature q of the entire feature set using the determined weight values α′ according to the following equation:
where y and x are as above in EQ. 1, and α′ is the approximated weight per instance, described above.
Next, all the features may be ranked based on their approximated quality (block 130). Thereafter, a subset of the best qt features may be selected as the new candidate feature set, and the iteration number and may be incremented (block 140). Note that qt is predetermined for each iteration t (as defined in block 105). As one example, suppose that d=1,024,000 d′=1,000, then reasonable values of qt may be qt=1,024,000/(2t-1), for t=1, . . . , 10]. Thus block 140 removes from the subset one or more features having a smallest quality criteria (i.e., one or more features having a smallest Qj′), such that an even smaller subset of features including one or more high-Qj′ values replaces features having lower Qj′ values.
Then it may be determined at diamond 150 if the iteration number, t, is less than a predetermined number of iterations, L. If so, method 100 may conclude. Otherwise, another iteration of blocks 110-140 may be performed, beginning at block 110 (with training with a random subset d′ selected out of the remaining candidate feature set qt). Multiple such iterations may be performed until the remaining set of features approaches the desired size qL. While shown with this particular implementation in the embodiment of
Note that even though the weight approximations are based on a classifier with a small number of features, it can be shown empirically that the approximations are highly accurate for moderate d′ values (e.g., d′ of 100-1000 can be enough for practical purposes, regardless of the size of d). Thus in various embodiments, weight approximation allows a prediction of weights of unseen features based on SVM learned from a small subset of features.
For large data sets, the accuracy of the SVM classifier using a SVM-FFS algorithm can be highly accurate if d′ is not too small. This occurs since the approximated weights are nearly equal to the estimated weights, as shown in
Embodiments of the present invention can be used for feature selection for SVM in a wide variety of pattern recognition applications (e.g., object recognition, visual defect detection, verification, handwritten recognition, medical diagnosis etc.).
Embodiments may be implemented in many different system types. Referring now to
Still referring to
Furthermore, chipset 590 includes an interface 592 to couple chipset 590 with a high performance graphics engine 538, by a P-P interconnect 539. In turn, chipset 590 may be coupled to a first bus 516 via an interface 596. As shown in
Embodiments may be implemented in code and may be stored on a storage medium having stored thereon instructions which can be used to program a system to perform the instructions. The storage medium may include, but is not limited to, any type of disk including floppy disks, optical disks, compact disk read-only memories (CD-ROMs), compact disk rewritables (CD-RWs), and magneto-optical disks, semiconductor devices such as read-only memories (ROMs), random access memories (RAMs) such as dynamic random access memories (DRAMs), static random access memories (SRAMs), erasable programmable read-only memories (EPROMs), flash memories, electrically erasable programmable read-only memories (EEPROMs), magnetic or optical cards, or any other type of media suitable for storing electronic instructions.
While the present invention has been described with respect to a limited number of embodiments, those skilled in the art will appreciate numerous modifications and variations therefrom. It is intended that the appended claims cover all such modifications and variations as fall within the true spirit and scope of this present invention.
This application is a continuation of U.S. patent application Ser. No. 12/152,568, filed May 15, 2008, now U.S. Pat. No. 8,108,324, issued on Jan. 31, 2012, the content of which is hereby incorporated by reference.
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Number | Date | Country | |
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20120095944 A1 | Apr 2012 | US |
Number | Date | Country | |
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Parent | 12152568 | May 2008 | US |
Child | 13334313 | US |