The present invention relates to analog circuits, and more particularly, to analog multiplier circuits utilizing four-gate transistors.
Analog multiplier circuits are useful building blocks in many analog applications, such as signal processing. Typical analog multiplier circuits, such as the so-called Gilbert multiplier, use on average from six to ten transistors for a differential output.
In the description that follows, the scope of the term “some embodiments” is not to be so limited as to mean more than one embodiment, but rather, the scope may include one embodiment, more than one embodiment, or perhaps all embodiments.
Embodiments described herein use a four-gate FET (Field Effect Transistor) as a basic building block in analog multiplier circuits. Four such four-gate FETs are employed to form a differential output multiplier. (Two such four-gate FETs may be employed to form a single-ended output multiplier.) The four-gate FET, denoted as G4-FET, has been described in various publications, such as for example in B. J. Blalcok, et al., “The Multiple-Gate MOS-JFET Transistor”, Int. Journal of High Speed Electronics and Systems, 12 (2), pp. 511-520, 2002; and in K. Akarvardar, et al., “Depletion-All-Around Operation of the SOI Four-Gate Transistor,” IEEE Trans. on Electron Devices, vol. 54, no. 2, Feb., 2007, pp. 323-331. A G4-FET is a SOI (Silicon-On-Insulator) device.
From
The junction gates operate as in a JFET, altering the potential distribution within the body via the lateral depletion regions they induce. On a partially depleted body, if the reverse bias on the junction gates is sufficiently high, they can switch the G4-FET from a normally ON mode to a normally OFF mode. Further increases in the magnitude of the junction gate voltages modulate the threshold voltage related to the front gate (G1). In a normally OFF mode, the saturated drain current of the G4-FET may be expressed as for an accumulation-mode MOSFET by including the threshold voltage modulation by the junction gates:
where Kn is the transconductance parameter given by,
COX is the front gate oxide capacitance, μneff is the effective electron mobility, and Weff is the effective channel width, which is about half of the distance between the two junctions due to the squeezing effect of the junction gates. In the above expressions, the subscript S in the voltages denotes that they are respect to the source. For example, VJG1S is the gate-to-source voltage for junction gate JG1. VT(VJG1S, VJG2S) denotes the threshold voltage of the G4-FET corresponding to the flatband condition at the front interface, and its functional dependence upon VJG1S and VJG2S is displayed.
For the case where VJG1S=VJG2S≡VJGS, the functional dependence of VT upon VJGS in the fully depleted mode has been modeled in K. Akarvardar, et al., “Threshold Voltage Model of the SOI 4-gate Transistor,” IEEE Int. SOI Conf., pp. 89-90, 2004, as
VT(VJGS)=VT0+ξVJGS, (3)
where VT0 and ξ are given in the cited reference. The coupling ξ factor has been found to be a strong function of the device width, and depends weakly on the silicon film thickness. For the case VJG1S≠VJG2S, systematic measurements suggest that
The two input voltages are denoted as VIN1 and VIN2. The front gates (G1) of transistors M1 and M2 are held at bias voltage VBIAS1. The difference in voltages between the front gates of transistors M3 and M1 is −VIN1 using the algebraic sign convention implied in
The output voltage is given by
VOUT=[(I1+I3)−(I2+I4)]RL, (5)
where I1, I2, I3, and I4 denote the source-drain currents of transistors M1, M2, M3 and M4, respectively. Because each transistor has its two junction gate-to-source voltages equal to each other, Eq. (3) is applicable. Using Eq. (3) and Eq. (1) to provide expressions for the source-drain currents in Eq. (5), yields
VOUT=−4KnξRLVIN1VIN2, (6)
indicating that the output voltage is a linear function of the product of the input voltages.
If VBIAS2≠VBIAS3, Eq. (4) is used instead of Eq. (3) as for the previous embodiment to derive an expression for the output voltage. It may then be shown that
VOUT=Knξ2RLVIN1VIN2. (7)
From Eq. (7), it is seen that the output voltage for the embodiment of
The embodiments should be designed so that the drain currents of the G4-FETs satisfy (at least approximately) the expression of Eq. (1). For example, the biasing of the n-channels should be such that there is (1) cut-off prevention: VG1S>VT(VJG1S, VJG2S); (2) drain current saturation: VG1D≦VT(VJG1S, VJG2S); and (3) reverse-bias on the junction gates with respect to the source: VJG1S≦0 and VJG2S≦0. The “D” in the subscript of a voltage denotes drain, so that VG1D is the gate-to-drain voltage for the front gate (G1). The third condition is valid if the body of a G4-FET is fully-depleted. If the body is partially-depleted, the requirement may be more strict: VJG1S and VJG2S should be sufficiently negative to keep the body fully-depleted during operation.
The expressions below are useful for finding an input range of the input voltages such that the above three conditions may be satisfied. To that end, the common source voltage for the circuit of
and the common source voltage for the circuit of
Let VO1 and VO2 denote the voltages at the loads, as indicated in
For the circuit of
With the help of Eqs. (8A), (8B), (9A), (9B), (10A), and (10B), the G4-FET terminal voltages, VG1, VJG1, VJG2, and VG2, may be expressed as a function of the input voltages. These expressions may be applied to the previously described three conditions for the drain currents of the G4-FETs to satisfy the expression of Eq. (1). It has been found that in many applications, for the same circuit and device parameters, the embodiment of
Various modifications may be made to the described embodiments without departing from the scope of the invention as claimed below. For example, single-ended circuits may be employed, where there is only one pair of four-gate transistors instead of two pairs. For example, some embodiments may employ the pair of transistors M1 and M3 and its load, but not the pair of transistors M2 and M4 and its load. In that case, the single-ended voltage output is taken at the load of transistors M1 and M3. In other embodiments, dual circuits may be provided, where p-channel G4-FETs are used instead of n-channel transistors.
In some embodiments, the input voltages may be derived in ways other than suggested in
It is to be understood in these letters patent that the meaning of “A is connected to B”, where A or B may be, for example, a node or device terminal, is that A and B are connected to each other so that the voltage potentials of A and B are substantially equal to each other. For example, A and B may be connected together by an interconnect (transmission line). In integrated circuit technology, the interconnect may be exceedingly short, comparable to the device dimension itself. For example, the gates of two transistors may be connected together by polysilicon, or copper interconnect, where the length of the polysilicon, or copper interconnect, is comparable to the gate lengths. As another example, A and B may be connected to each other by a switch, such as a transmission gate, so that their respective voltage potentials are substantially equal to each other when the switch is ON.
It is also to be understood in these letters patent that the meaning of “A is coupled to B” is that either A and B are connected to each other as described above, or that, although A and B may not be connected to each other as described above, there is nevertheless a device or circuit that is connected to both A and B. This device or circuit may include active or passive circuit elements, where the passive circuit elements may be distributed or lumped-parameter in nature. For example, A may be connected to a circuit element that in turn is connected to B.
It is also to be understood in these letters patent that a “current source” may mean either a current source or a current sink. Similar remarks apply to similar phrases, such as, “to source current”.
It is also to be understood in these letters patent that various circuit components and blocks, such as current mirrors, amplifiers, etc., may include switches so as to be switched in or out of a larger circuit, and yet such circuit components and blocks may still be considered connected to the larger circuit.
This patent application claims the benefit of Provisional Application No. 60/801,875, filed 19 May 2006.
The invention described herein was made in the performance of work under a NASA contract, and is subject to the provisions of Public Law 96-517 (35 USC 202) in which the Contractor has elected to retain title.
Number | Name | Date | Kind |
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5523717 | Kimura | Jun 1996 | A |
5581210 | Kimura | Dec 1996 | A |
5712810 | Kimura | Jan 1998 | A |
Number | Date | Country | |
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20080001658 A1 | Jan 2008 | US |
Number | Date | Country | |
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60801875 | May 2006 | US |