Claims
- 1. A method of forming a gas sensor for detecting a designated gas, the method comprising:
- providing a semiconductor substrate;
- providing an insulator layer disposed on the semiconductor substrate;
- providing a catalytic metallic gate layer disposed on the insulator layer; and
- providing a protective layer disposed on the catalytic metal gate layer, the protective layer being formed from a material that provides protection of the sensor from at least one of corrosive gases and interference from at least one of foreign matter and water, the protective layer comprising a single atomic monolayer of iodine atoms;
- wherein the protective layer alters at least one of a surface chemical and surface physical property of the sensor, permits the designated gas to interact with the catalytic metallic gate layer, and reduces passage of at least one of foreign matter, water and gases other than the designated gas.
- 2. A method according to claim 1, wherein the providing the catalytic metallic gate layer further comprises selecting a material from the group consisting of:
- platinum, palladium, iridium, ruthenium, nickel, copper, rhodium, molybdenum, iron, cobalt, titanium, vanadium, tantalum, tungsten, chromium, manganese, gold, silver, aluminum, tin, osmium, magnesium, zinc, alloys of the materials, and combinations of the materials.
Parent Case Info
This application is a division of application Ser. No. 09/123,760, filed Jul. 27, 1998, which is hereby incorporated by reference in its entirety.
US Referenced Citations (13)
Foreign Referenced Citations (1)
Number |
Date |
Country |
63128247 |
May 1981 |
JPX |
Divisions (1)
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Number |
Date |
Country |
Parent |
123760 |
Jul 1998 |
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