Claims
- 1. A glass-ceramic having celsian as a primary crystal phase, which comprises SiO2, Al2O3, BaO, and TiO2 as primary components and Li2O as a modification component, characterized in that the amount of Li2O falls within a range of 0.05 to 1.0 wt. %.
- 2. A glass-ceramic according to claim 1, which comprises one or more modification components selected from the group consisting of Na2O, P2O5, B2O3, Sb2O3, ZnO, and Bi2O3.
- 3. A glass-ceramic having celsian as a primary crystal phase, which comprises SiO2, Al2O3, BaO, and TiO2 as primary components and Li2O and K2O as modification components, characterized in that the amount of Li2O falls within a range of 0.05 to 1.0 wt. %, and the amount of K2O is 1.5 wt. % or less.
- 4. A glass-ceramic according to claim 3, which comprises one or more modification components selected from the group consisting of Na2O, P2O5, B2O3, Sb2O3, ZnO, and Bi2O3.
- 5. A reflecting mirror substrate on which a thin reflection film is deposited to thereby form a reflecting mirror, the substrate being formed from a glass-ceramic;
the glass-ceramic having celsian as a primary crystal phase, which comprises SiO2, Al2O3, BaO, and TiO2 as primary components and Li2O as a modification component, characterized in that the amount of Li2O falls within a range of 0.05 to 1.0 wt. %.
- 6. A reflecting mirror substrate according to claim 5, wherein the glass-ceramic constituting the substrate comprises one or more modification components selected from the group consisting of Na2O, P2O5, B2O3, Sb2O3, ZnO, and Bi2O3.
- 7. A reflecting mirror substrate according to claim 5, wherein the glass-ceramic constituting the substrate has a thermal expansion coefficient α (×10−7/° C.) of 30 to 45.
- 8. A reflecting mirror substrate according to claim 5, wherein the glass-ceramic constituting the substrate has a crystal grain size of 0.1 to 1 μm.
- 9. A reflecting mirror substrate according to claim 5, which has a flexural strength of 125 to 155 Mpa at room temperature, 145 to 175 Mpa at 300° C., and 180 to 220 Mpa at 600° C., and an elastic modulus of 80 to 85 Gpa at room temperature, 70 to 75 Gpa at 300° C., and 35 to 40 Gpa at 600° C.
- 10. A reflecting mirror substrate according to claim 5, wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 800 nm when the glass-ceramic has a thickness of 0.1 mm.
- 11. A reflecting mirror substrate according to claim 5, wherein the wavelength of light which passes, at a transmittance of 50%, through the glass-ceramic constituting the substrate is at least 850 nm when the glass-ceramic has a thickness of 0.1 mm.
- 12. A reflecting mirror substrate according to claim 5, which has a flexural strength of 125 to 155 Mpa at room temperature, 145 to 175 Mpa at 300° C., and 180 to 220 Mpa at 600° C., and an elastic modulus of 80 to 85 Gpa at room temperature, 70 to 75 Gpa at 300° C., and 35 to 40 Gpa at 600° C., wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 800 nm when the glass-ceramic has a thickness of 0.1 mm, and the wavelength of light which passes, at a transmittance of 50%, through the glass-ceramic constituting the substrate is at least 850 nm when the glass-ceramic has a thickness of 0.1 mm.
- 13. A reflecting mirror substrate according to claim 5, which has a thickness of 3 to 6 mm, wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 850 nm.
- 14. A reflecting mirror substrate according to claim 13, wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 1,000 nm.
- 15. A reflecting mirror substrate on which a thin reflection film is deposited to thereby form a reflecting mirror, the substrate being formed from a glass-ceramic;
the glass-ceramic having celsian as a primary crystal phase, which comprises SiO2, Al2O3, BaO, and TiO2 as primary components and Li2O and K2O as modification components, characterized in that the amount of Li2O falls within a range of 0.05 to 1.0 wt. %, and the amount of K2O is 1.5 wt. % or less.
- 16. A reflecting mirror substrate according to claim 15, wherein the glass-ceramic constituting the substrate comprises one or more modification components selected from the group consisting of Na2O, P2O5, B2O3, Sb2O3, ZnO, and Bi2O3.
- 17. A reflecting mirror substrate according to claim 15, wherein the glass-ceramic constituting the substrate has a thermal expansion coefficient α (×10−7/° C.) of 30 to 45.
- 18. A reflecting mirror substrate according to claim 15, wherein the glass-ceramic constituting the substrate has a crystal grain size of 0.1 to 1 μm.
- 19. A reflecting mirror substrate according to claim 15, which has a flexural strength of 125 to 155 Mpa at room temperature, 145 to 175 Mpa at 300° C., and 180 to 220 Mpa at 600° C., and an elastic modulus of 80 to 85 Gpa at room temperature, 70 to 75 Gpa at 300° C., and 35 to 40 Gpa at 600° C.
- 20. A reflecting mirror substrate according to claim 15, wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 800 nm when the glass-ceramic has a thickness of 0.1 mm.
- 21. A reflecting mirror substrate according to claim 15, wherein the wavelength of light which passes, at a transmittance of 50%, through the glass-ceramic constituting the substrate is at least 850 nm when the glass-ceramic has a thickness of 0.1 mm.
- 22. A reflecting mirror substrate according to claim 15, which has a flexural strength of 125 to 155 Mpa at room temperature, 145 to 175 Mpa at 300° C., and 180 to 220 Mpa at 600° C., and an elastic modulus of 80 to 85 Gpa at room temperature, 70 to 75 Gpa at 300° C., and 35 to 40 Gpa at 600° C., wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 800 nm when the glass-ceramic has a thickness of 0.1 mm, and the wavelength of light which passes, at a transmittance of 50%, through the glass-ceramic constituting the substrate is at least 850 nm when the glass-ceramic has a thickness of 0.1 mm.
- 23. A reflecting mirror substrate according to claim 15, which has a thickness of 3 to 6 mm, wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 850 nm.
- 24. A reflecting mirror substrate according to claim 23, wherein the shortest wavelength of light which passes through the glass-ceramic constituting the substrate is at least 1,000 nm.
Priority Claims (2)
Number |
Date |
Country |
Kind |
2001-228,984 |
Jul 2001 |
JP |
|
2001-362,117 |
Nov 2001 |
JP |
|
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application claims priority from U.S. Provisional Application Serial No. 60/340,022, filed Dec. 10, 2001 and Provisional Application Serial No. 60/309,889, filed Aug. 3, 2001, as well as Japanese Patent Application No. 2001-228984 filed Jul. 30, 2001 and Japanese Patent Application No. 2001-362117 filed Nov. 28, 2001, the entireties of which are incorporated herein by reference.
Provisional Applications (2)
|
Number |
Date |
Country |
|
60309889 |
Aug 2001 |
US |
|
60340022 |
Dec 2001 |
US |